Strobe (Enable) Line Provided for
Cascading (N Lines to n Lines)
D
Package Options Include Plastic
Small-Outline (D), Thin Shrink
Small-Outline (PW), and Ceramic Flat
(W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
Each of these data selectors/multiplexers
contains inverters and drivers to supply full binary
decoding data selection to the AND-OR gates.
Separate strobe (G
of the two 4-line sections.
The SN54HC153 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74HC153 is characterized for
operation from –40°C to 85°C.
) inputs are provided for each
SN54HC153 ...J OR W PACKAGE
SN74HC153 . . . D, N, OR PW PACKAGE
SN54HC153 . . . FK PACKAGE
1C3
1C2
NC
1C1
1C0
(TOP VIEW)
1G
1
B
2
1C3
3
1C2
4
5
1C1
6
1C0
7
1Y
GND
8
(TOP VIEW)
B1GNC
3212019
4
5
6
7
8
910111213
16
15
14
13
12
11
10
9
CC
V
V
2G
A
2C3
2C2
2C1
2C0
2Y
2G
18
17
16
15
14
CC
A
2C3
NC
2C2
2C1
NC – No internal connection
FUNCTION TABLE
INPUTS
SELECT
BAC0C1C2C3
XXXXXXHL
LLLXXXL L
LLHXXXL H
LHXLXXL L
LHXHXXL H
HLXXLXL L
HLXXHXL H
HHXXXLL L
HHXXXHLH
†
Select inputs A and B are common to both sections.
†
DATA
1Y
GND
NC
2Y
2C0
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
SN54HC153, SN74HC153
DUAL 4-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS
SCLS112B – DECEMBER 1982 – REVISED MAY 1997
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, PW, and W packages.
†
1G
1C0
1C1
1C2
1C3
2G
2C0
2C1
2C2
2C3
14
A
2
B
1
6
5
4
3
15
10
11
12
13
0
1
EN
0
1
2
3
G
0
3
MUX
7
1Y
9
2Y
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
14
A
2
B
1
1G
6
1C0
5
1C1
4
1C2
3
1C3
SN54HC153, SN74HC153
DUAL 4-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS
SCLS112B – DECEMBER 1982 – REVISED MAY 1997
TG
TG
TG
7
1Y
TG
TG
TG
15
2G
10
2C0
11
2C1
12
2C2
13
2C3
Pin numbers shown are for the D, J, N, PW, and W packages.
TG
TG
TG
TG
TG
TG
9
2Y
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54HC153, SN74HC153
UNIT
DUAL 4-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS
SCLS112B – DECEMBER 1982 – REVISED MAY 1997
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
A or BY
t
pd
t
t
Data
GY
Y
Y
CC
2 V90150225190
4.5 V21304538
6 V17263832
2 V73126189158
4.5 V17284235
6 V14233529
2 V3895150125
4.5 V11192824
6 V9162420
2 V20609075
4.5 V8121815
6 V6101513
TA = 25°CSN54HC153SN74HC153
MINTYPMAXMINMAXMINMAX
ns
ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54HC153, SN74HC153
PARAMETER
V
UNIT
(Any C)
DUAL 4-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS
SCLS112B – DECEMBER 1982 – REVISED MAY 1997
switching characteristics over recommended operating free-air temperature range, CL = 150 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
A or BY
t
pd
t
t
Data
GY
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitance per multiplexerNo load40pF
pd
CC
2 V105235355295
4.5 V27477159
6 V21416051
2 V93220335274
Y
Y
4.5 V23446755
6 V19385748
2 V60185280230
4.5 V17375646
6 V14324840
2 V45210315265
4.5 V17426353
6 V13365345
TA = 25°CSN54HC153SN74HC153
MINTYPMAXMINMAXMINMAX
ns
ns
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
LOAD CIRCUIT
Input
NOTES: A. CL includes probe and test-fixture capacitance.
90%90%
t
r
VOLTAGE WAVEFORM
INPUT RISE AND FALL TIMES
B. Phase relationships between waveforms were chosen arbitrarily . All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
C. The outputs are measured one at a time with one input transition per measurement.
D. t
PLH
and t
PHL
Test
Point
C
L
(see Note A)
50%50%
are the same as tpd.
Figure 1. Load Circuit and Voltage Waveforms
V
CC
10%10%
0 V
t
f
Input
In-Phase
Output
Out-of-Phase
Output
V
50%
t
PLH
90%90%
t
PHL
50%50%
10%10%
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
VOLTAGE WAVEFORMS
50%
t
PHL
50%50%
t
r
t
PLH
t
f
CC
0 V
V
OH
10%10%
V
OL
t
f
V
OH
90%90%
V
OL
t
r
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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