Designed Specifically for High-Speed
Memory Decoders and Data Transmission
Systems
D
Incorporate Two Enable Inputs to Simplify
Cascading and/or Data Reception
D
Package Options Include Plastic
Small-Outline (D), Thin Shrink
Small-Outline (PW), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
The ’HC139 are designed for high-performance
memory-decoding or data-routing applications
requiring very short propagation delay times. In
high-performance memory systems, these
decoders can minimize the effects of system
decoding. When employed with high-speed
memories utilizing a fast enable circuit, the delay
time of these decoders and the enable time of the
memory are usually less than the typical access
time of the memory . This means that the effective
system delay introduced by the decoders is
negligible.
The ’HC139 comprise two individual 2-line to
4-line decoders in a single package. The
active-low enable (G
line in demultiplexing applications. These
decoders/demultiplexers feature fully buffered
inputs, each of which represents only one
normalized load to its driving circuit.
) input can be used as a data
SN54HC139 ...J OR W PACKAGE
SN74HC139 . . . D, N, OR PW PACKAGE
SN54HC139 . . . FK PACKAGE
1B
1Y0
NC
1Y1
1Y2
NC – No internal connection
(TOP VIEW)
1G
1
1A
2
1B
3
1Y0
4
5
1Y1
6
1Y2
7
1Y3
GND
8
(TOP VIEW)
1A1GNC
3212019
4
5
6
7
8
910111213
1Y3
GND
NC
16
15
14
13
12
11
10
9
CC
V
2Y3
V
CC
2G
2A
2B
2Y0
2Y1
2Y2
2Y3
2G
18
17
16
15
14
2Y2
2A
2B
NC
2Y0
2Y1
The SN54HC139 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74HC139 is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
FUNCTION TABLE
INPUTS
SELECT
BAY0Y1Y2Y3
HXXHHHH
LLLLHHH
LLHHLHH
LHLHHLH
LHHHHHL
Copyright 1997, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54HC139, SN74HC139
DUAL 2-LINE TO 4-LINE DECODERS/DEMUL TIPLEXERS
SCLS108B – DECEMBER 1982 – REVISED MA Y 1997
logic symbols (alternatives)
X/Y
2
1A
3
1B
1
1G
14
2A
13
2B
15
2G
†
These symbols are in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, PW, and W packages.
1
2
EN
†
4
12
11
10
1Y0
5
1Y1
6
1Y2
7
1Y3
2Y0
2Y1
2Y2
9
2Y3
1A
1B
1G
2A
2B
2G
2
3
1
14
13
15
0
1
2
3
logic diagram (positive logic)
1
1G
DMUX
0
G
1
0
0
1
3
2
3
4
1Y0
5
1Y1
12
11
10
4
1Y0
5
1Y1
6
1Y2
7
1Y3
2Y0
2Y1
2Y2
9
2Y3
2
1A
3
1B
15
2G
14
2A
13
2B
Pin numbers shown are for the D, J, N, PW, and W packages.
12
11
10
6
1Y2
7
1Y3
2Y0
2Y1
2Y2
9
2Y3
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
UNIT
SN54HC139, SN74HC139
DUAL 2-LINE TO 4-LINE DECODERS/DEMUL TIPLEXERS
SCLS108B – DECEMBER 1982 – REVISED MA Y 1997
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
FROMTO
(INPUT)(OUTPUT)
A or BY
pd
GY
t
t
Y
CC
2 V47175255220
4.5 V14355144
6 V12304438
2 V39175255220
4.5 V11355144
6 V10304438
2 V387511095
4.5 V8152219
6 V6131916
TA = 25°CSN54HC139SN74HC139
MINTYPMAXMINMAXMINMAX
ns
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitance per decoderNo load25pF
pd
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Input
From Output
Under Test
LOAD CIRCUIT
90%90%
t
r
DUAL 2-LINE TO 4-LINE DECODERS/DEMUL TIPLEXERS
SCLS108B – DECEMBER 1982 – REVISED MA Y 1997
PARAMETER MEASUREMENT INFORMATION
Test
Point
CL = 50 pF
(see Note A)
V
50%50%
CC
10%10%
0 V
t
f
Out-of-Phase
Input
In-Phase
Output
Output
50%
t
t
PLH
PHL
SN54HC139, SN74HC139
V
50%
t
PHL
90%90%
t
r
t
PLH
50%50%
10%10%
t
f
50%50%
CC
0 V
V
OH
10%10%
V
OL
t
f
V
OH
90%90%
V
OL
t
r
VOLTAGE WAVEFORM
INPUT RISE AND FALL TIMES
NOTES: A. CL includes probe and test-fixture capacitance.
B. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
C. The outputs are measured one at a time with one input transition per measurement.
D. t
PLH
and t
are the same as tpd.
PHL
Figure 1. Load Circuit and Voltage Waveforms
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
VOLTAGE WAVEFORMS
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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