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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
CC
2AI8
2AI6
2AI7
GND
2AO7
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
2AO8
GND
2AI9
2AO9
VV
2OEA
2OEA
2LEBA
2LEAB
2CLKBA
2CLKAB
CC
NC
2B9
2OEB
GND
2OEB
BIAS V
Copyright 1999, Texas Instruments Incorporated
1
SN74FB1650
FUNCTION
B-bus isolation
A-bus isolation
FUNCTION
18-BIT TTL/BTL UNIVERSAL STORAGE TRANSCEIVER
SCBS178L – AUGUST 1992 – REVISED SEPTEMBER 1999
description
The SN74FB1650 device contains two 9-bit transceivers designed to translate signals between TTL and
backplane transceiver-logic (BTL) environments. It is designed specifically to be compatible with
IEEE Std 1 194.1-1991.
The B port operates at BTL-signal levels. The open-collector B ports are specified to sink 100 mA. Two output
enables (OEB and OEB
the B port is turned off.
) are provided for the B outputs. When OEB is low, OEB is high, or VCC is less than 2.1 V ,
The A port operates at TTL-signal levels. The A outputs reflect the inverse of the data at the B
A-port output enable (OEA) is high. When OEA is low or when V
is less than 2.1 V , the A outputs are in the
CC
high-impedance state.
BIAS V
establishes a voltage between 1.62 V and 2.1 V on the BTL outputs when VCC is not connected.
CC
BG VCC and BG GND are the supply inputs for the bias generator.
The SN74FB1650 is characterized for operation from 0°C to 70°C.
Function Tables
TRANSCEIVER
INPUTS
OEAOEAOEBOEB
XXHLA data to B bus
LHXXB data to A bus
LHHLA data to B bus, B data to A bus
XXLX
XXXH
HXXX
XLXX
STORAGE MODE
INPUTS
LECLK
HXTransparent
L↑Store data
LLStorage
port when the
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
functional block diagram
SN74FB1650
18-BIT TTL/BTL UNIVERSAL STORAGE TRANSCEIVER
SCBS178L – AUGUST 1992 – REVISED SEPTEMBER 1999
1OEB
1OEB
1CLKAB
1LEAB
1LEBA
1CLKBA
1OEA
1OEA
1AI1
1AO1
81
80
83
82
85
84
87
86
90
89
C1
1D
C2
1D
C2
C1
76
1B1
To Eight Other Channels
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Current applied to any single output in the low state, IO: A port 48 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance, θ
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The package thermal impedance is calculated in accordance with JESD 51.
output in the disabled or power-off state, VO –0.5 V to 3.5 V. . . . . . . . . . . . . .
B portVCC = 4.5 V,II = –18 mA–1.2
Except B portVCC = 4.5 V,II = –40 mA–0.5
p
AO portVCC = 4.5 V,IOL = 24 mA0.350.5
port
Except B portVCC = 5.5 V,VI = 5.5 V50µA
Except B portVCC = 5.5 V,VI = 2.7 V50µA
Except B portVCC = 5.5 V,VI = 0.5 V–50
B portVCC = 5.5 V,VI = 0.75 V–100
AO portVCC = 5.5 V,VO = 2.7 V50µA
AO portVCC = 5.5 V,VO = 0.5 V–50µA
AO portVCC = 0 to 2.1 V,VO = 0.5 V to 2.7 V50µA
AO portVCC = 2.1 V to 0,VO = 0.5 V to 2.7 V–50µA
B portVCC = 0 to 5.5 V,VO = 2.1 V100µA
A portVCC = 5.5 V,VO = 0–30–150mA
A port to B port
B port to A port
AI port
Control inputs
AO portsVO = VCC or GND5.5pF
B port per IEEE Std 1194.1-1991
, literature number SCBA004.
= 4.5
CC
= 4.5
CC
= 5.5 V,
CC
=
or
I
CC
VCC = 0 to 5.5 V5.5pF
B port1.622.3
Except B port2
B port0.751.47
Except B port0.8
A port24
B port100
IOH = –1 mA
IOH = –3 mA2.53.3
IOL = 80 mA0.751.1
IOL = 100 mA1.15
=
O
100
120
5.5
5.5
V
µ
p
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
I
(BIAS VCC)
V
V
(BIAS VCC)
V
A
tsuSetup time
ns
thHold time
ns
SN74FB1650
18-BIT TTL/BTL UNIVERSAL STORAGE TRANSCEIVER
SCBS178L – AUGUST 1992 – REVISED SEPTEMBER 1999
live-insertion specifications over recommended operating free-air temperature range
PARAMETERTEST CONDITIONSMINMAXUNIT
VCC = 0 to 4.5 V
VCC = 4.5 V to 5.5 V
VCC = 0 ,VB = 1 V,VI (BIAS VCC) = 4.5 V to 5.5 V–1
VCC = 0 to 5.5 V,OEB = 0 to 0.8 V100
VCC = 0 to 2.2 V,OEB = 0 to 5 V100
= 0 to 2 V,
B
I
= 4.5 V to 5.5
V
I
CC
O
O
B portVCC = 0,VI (BIAS VCC) = 5 V1.622.1V
B port
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
VCC = 5 V,
f
clock
t
w
TA = 25°C
MINMAX
Clock frequency150150MHz
Pulse durationCLK or LE3.33.3ns
p
Data before LE4.84.8
Data before CLK↑4.94.9
Data after LE1.81.8
Data after CLK↑1.11.1
MINMAXUNIT
450
10
µ
µA
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN74FB1650
(INPUT)
(OUTPUT)
AI
B
ns
LEAB
B
ns
CLKAB
B
ns
B
AO
ns
LEBA
AO
ns
CLKBA
AO
ns
OEB
B
ns
OEB
B
ns
OEA
AO
ns
OEA
AO
ns
OEA
AO
ns
OEA
AO
ns
t
ns
18-BIT TTL/BTL UNIVERSAL STORAGE TRANSCEIVER
SCBS178L – AUGUST 1992 – REVISED SEPTEMBER 1999
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
PARAMETER
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PZH
t
PZL
t
PHZ
t
PLZ
†
t
sk(p)
†
t
sk(o)
t
Transition time
B-port input pulse rejection11ns
†
Skew values are applicable for through mode only.
Pulse skew,AI to B or B to AO1ns
Pulse skew, AI to B or B to AO0.5ns
B outputs (1.3 V to 1.8 V)0.91.73.10.54.6
AO outputs (10% to 90%)0.523.60.44.2
FROM
TO
VCC = 5 V,
TA = 25°C
MINTYPMAX
150150MHz
1.83.75.31.86.2
2.94.462.97.2
2.74.25.82.76.4
3.556.53.57.3
2.33.95.52.36
2.94.56.12.96.7
3.55.97.93.58.6
2.23.75.32.25.7
1.83.24.61.85.1
1.734.41.74.7
1.83.14.61.85.1
1.73.14.61.74.9
2.74.66.42.76.7
2.94.15.92.96.6
2.64.36.22.66.6
3.44.66.43.47
1.42.94.41.44.9
1.42.641.44.6
1.73.45.11.75.8
2.23.652.25.5
1.73.34.71.75.5
1.73.14.41.75.1
1.52.94.51.55.1
23.14.624.8
MINMAXUNIT
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN74FB1650
18-BIT TTL/BTL UNIVERSAL STORAGE TRANSCEIVER
SCBS178L – AUGUST 1992 – REVISED SEPTEMBER 1999
PARAMETER MEASUREMENT INFORMATION
2.1 V
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT FOR A OUTPUTS
Input
Input1.5 V1.5 V
Output
PROPAGATION DELAY TIMES (A TO B)
Input
Output
PROPAGATION DELAY TIMES (B TO A)
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
VOLTAGE WAVEFORMS
500 Ω
500 Ω
t
w
t
PHL
t
PHL
1.5 V1.5 V
7 V
S1
1.55 V1.55 V
t
1.55 V1.55 V
t
Open
GND
PLH
PLH
3 V
0 V
From Output
Under Test
CL = 30 pF
(see Note A)
LOAD CIRCUIT FOR B OUTPUTS
Timing Input
3 V
0 V
V
V
2 V
1 V
V
V
OH
OL
OH
OL
Data Input
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
ENABLE AND DISABLE TIMES (A PORT)
16.5 Ω
Test
Point
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
1.5 V
t
h
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
Open
7 V
Open
3 V
0 V
3 V
0 V
3 V
0 V
3.5 V
V
OL
V
OH
≈ 0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: TTL inputs: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns,
tf≤ 2.5 ns; BTL inputs: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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