Texas Instruments SN74CBTS6800DBR, SN74CBTS6800DGVR, SN74CBTS6800DW, SN74CBTS6800DWR, SN74CBTS6800PWR Datasheet
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SN74CBTS6800
10-BIT FET BUS SWITCH
WITH PRECHARGED OUTPUTS AND SCHOTTKY DIODE CLAMPING
SCDS102A – JUNE 1999 – REVISED JUL Y 1999
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
D
5-Ω Switch Connection Between Two Ports
D
TTL-Compatible Input Levels
D
Outputs Are Precharged by Bias Voltage to
Minimize Signal Distortion During Live
Insertion
D
Schottky Diodes on the I/Os to Clamp
Undershoots up to –2 V
D
Package Options Include Plastic Shrink
Small-Outline (DB, DBQ), Thin Very
Small-Outline (DGV), Small-Outline (DW),
and Thin Shrink Small-Outline (PW)
Packages
description
The SN74CBTS6800 provides ten bits of
high-speed TTL-compatible bus switching with
Schottky diodes on the I/Os to clamp undershoot.
The low on-state resistance of the switch allows bidirectional connections to be made, while adding near-zero
propagation delay . The device also precharges the B port to a user-selectable bias voltage (BIASV) to minimize
live-insertion noise.
The SN74CBTS6800 is organized as one 10-bit switch with a single enable (ON
) input. When ON is low, the
switch is on, and port A is connected to port B. When ON
is high, the switch between port A and port B is open.
When ON
is high or VCC is 0 V, B port is precharged to BIASV through the equivalent of a 10-kΩ resistor.
The SN74CBTS6800 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
ON
B1–B10 FUNCTION
L A1–A10 Connect
H BIASV Precharge
logic diagram (positive logic)
ON
A1
A10
B1
BIASV
B10
2
11
1
13
23
14
DB, DBQ, DGV, DW, OR PW PACKAGE
(TOP VIEW)
ON
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
GND
V
CC
B1
B2
B3
B4
B5
B6
B7
B8
B9
B10
BIASV
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
Copyright 1999, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SN74CBTS6800
10-BIT FET BUS SWITCH
WITH PRECHARGED OUTPUTS AND SCHOTTKY DIODE CLAMPING
SCDS102A – JUNE 1999 – REVISED JUL Y 1999
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
†
Supply voltage range, V
CC
–0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Bias voltage range, BIASV –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
(see Note 1) –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous channel current 128 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0) –50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance, θ
JA
(see Note 2): DB package 104°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DBQ package 103°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DGV package 139°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DW package 81°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
PW package 120°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
recommended operating conditions (see Note 3)
MIN MAX UNIT
V
CC
Supply voltage 4 5.5 V
BIASV Supply voltage 1.3 V
CC
V
V
IH
High-level control input voltage 2 V
V
IL
Low-level control input voltage 0.8 V
T
A
Operating free-air temperature –40 85 °C
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP‡MAX UNIT
A or B inputs
–0.7
V
IK
Control inputs
V
CC
=
4.5 V
,
I
I
= –
18 mA
–1.2
V
I
IL
VCC = 5.5 V, VI = GND –5 µA
I
IH
VCC = 5.5 V, VI = 5.5 V 150 µA
I
O
VCC = 4.5 V, BIASV = 2.4 V , VO= 0 0.25 mA
I
CC
VCC = 5.5 V, IO = 0, VI = VCC or GND 3 µA
∆I
CC
§
Control inputs VCC = 5.5 V, One input at 3.4 V , Other inputs at VCC or GND 2.5 mA
C
i
Control inputs VI = 3 V or 0 3.5 pF
C
io(OFF)
VO = 3 V or 0, ON = V
CC
4.5 pF
VCC = 4 V,
TYP at VCC = 4 V
VI = 2.4 V, II = 15 mA 11 20
r
¶
II = 64 mA 3 7
Ω
on
VCC = 4.5 V
V
I
=
0
II = 30 mA 3 7
VI = 2.4 V, II = 15 mA 6 15
‡
All typical values are at VCC = 5 V (unless otherwise noted), TA = 25°C.
§
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
¶
Measured by the voltage drop between the A and B terminals at the indicated current through the switch. On-state resistance is determined by
the lower of the voltages of the two (A or B) terminals.
SN74CBTS6800
10-BIT FET BUS SWITCH
WITH PRECHARGED OUTPUTS AND SCHOTTKY DIODE CLAMPING
SCDS102A – JUNE 1999 – REVISED JUL Y 1999
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
PARAMETER
TEST
FROM
TO
VCC = 4 V
VCC = 5 V
± 0.5 V
UNIT
CONDITIONS
(INPUT)
(OUTPUT)
MIN MAX MIN MAX
t
pd
†
A or B B or A 0.35 0.25 ns
t
PZH
BIASV = GND
6 2 5.1
t
PZL
BIASV = 3 V
ON
A or B
6 2 5.6
ns
t
PHZ
BIASV = GND
5.5 1 5
t
PLZ
BIASV = 3 V
ON
A or B
5.5 2 5.9
ns
†
The propagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance, when
driven by an ideal voltage source (zero output impedance).
PARAMETER MEASUREMENT INFORMATION
V
OH
V
OL
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
7 V
Open
GND
500 Ω
500 Ω
t
PLH
t
PHL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
t
PZL
t
PZH
t
PLZ
t
PHZ
3 V
0 V
V
OH
V
OL
0 V
VOL + 0.3 V
VOH – 0.3 V
0 V
Input
3 V
3.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
Output
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
7 V
Open
TEST S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤2.5 ns, tf ≤2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
and t
PHZ
are the same as t
dis
.
F. t
PZL
and t
PZH
are the same as ten.
G. t
PLH
and t
PHL
are the same as tpd.
1.5 V 1.5 V
1.5 V 1.5 V
1.5 V 1.5 V
1.5 V
1.5 V
Figure 1. Load Circuit and Voltage Waveforms
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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Copyright 1999, Texas Instruments Incorporated
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