LOW-VOLTAGE 4-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS040D – DECEMBER 1997 – REVISED NOVEMBER 1999
D
Functionally Equivalent to QS3257
D
5-Ω Switch Connection Between Two Ports
D
Isolation Under Power-Off Conditions
D
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
D
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
D
Package Options Include Thin Very
Small-Outline (DGV), Small-Outline (D),
D, DBQ, DGV, OR PW PACKAGE
1B1
1B2
1A
2B1
2B2
2A
GND
(TOP VIEW)
1
S
2
3
4
5
6
7
8
16
15
14
13
12
11
10
V
CC
OE
4B1
4B2
4A
3B1
3B2
9
3A
Shrink Small-Outline (DBQ), and Thin
Shrink Small-Outline (PW) Packages
description
The SN74CBTL V3257 is a 4-bit 1-of-2 high-speed FET multiplexer/demultiplexer . The low on-state resistance
of the switch allows connections to be made with minimal propagation delay.
The select (S) input controls the data flow. The FET multiplexers/demultiplexers are disabled when the
output-enable (OE) input is high.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
The SN74CBTLV3257 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OES
LLA port = B1 port
LHA port = B2 port
HXDisconnect
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1999, Texas Instruments Incorporated
1
SN74CBTLV3257
LOW-VOLTAGE 4-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS040D – DECEMBER 1997 – REVISED NOVEMBER 1999
logic diagram (positive logic)
4
7
9
12
SW
SW
SW
SW
SW
SW
SW
SW
11
10
14
13
2
1B11A
3
1B2
5
2B12A
6
2B2
3B13A
3B2
4B14A
4B2
1
S
15
OE
simplified schematic, each FET switch
A
B
(OE)
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
VIHHigh-level control input voltage
V
VILLow-level control input voltage
V
C
V
3 V
OE
V
pF
V
0
TYP at V
CC
V
r
¶
Ω
V
0
SN74CBTLV3257
LOW-VOLTAGE 4-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS040D – DECEMBER 1997 – REVISED NOVEMBER 1999
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Supply voltage2.33.6V
CC
p
p
Operating free-air temperature–4085°C
A
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
VCC = 2.3 V to 2.7 V1.7
VCC = 2.7 V to 3.6 V2
VCC = 2.3 V to 2.7 V0.7
VCC = 2.7 V to 3.6 V0.8
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONSMIN TYP‡MAXUNIT
V
IK
I
I
I
off
I
CC
§
∆I
CC
C
i
io(OFF)
on
‡
All typical values are at VCC = 3.3 V (unless otherwise noted), TA = 25°C.
§
This is the increase in supply current for each input that is at the specified voltage level rather than VCC or GND.
¶
Measured by the voltage drop between the A and the B terminals at the indicated current through the switch. On-state resistance is determined
by the lower of the voltages of the two (A or B) terminals.
Control inputsVCC = 3.6 V,One input at 3 V,Other inputs at VCC or GND300µA
Control inputsVI = 3 V or 03pF
A port
B port
VCC = 3 V,II = –18 mA–1.2V
VCC = 3.6 V,VI = VCC or GND±1µA
VCC = 0,VI or VO= 0 to 4.5 V10µA
VCC = 3.6 V,IO = 0,VI = VCC or GND10µA
or 0,
=
O
VCC = 2.3 V,
VCC = 3 V
= 2.5
=
CC
=
I
VI = 1.7 V,II = 15 mA2740
=
I
VI = 2.4 V,II = 15 mA1015
II = 64 mA58
II = 24 mA58
II = 64 mA57
II = 24 mA57
5.5
10.5
p
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN74CBTLV3257
(INPUT)
(OUTPUT)
LOW-VOLTAGE 4-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS040D – DECEMBER 1997 – REVISED NOVEMBER 1999
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 and 2)
PARAMETER
t
pd
t
en
t
dis
t
en
t
dis
†
The propagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance, when
driven by an ideal voltage source (zero output impedance).
FROM
A or B
S
S
S
OE
OE
†
TO
B or A0.350.25
A or B1.86.11.85.3
A or B1.76.11.75.3ns
A or B14.814.5ns
A or B1.95.625ns
A or B15.51.65.5ns
VCC = 2.5 V
± 0.2 V
MINMAXMINMAX
PARAMETER MEASUREMENT INFORMATION
V
= 2.5 V ± 0.2 V
CC
VCC = 3.3 V
± 0.3 V
UNIT
ns
From Output
Under Test
CL = 30 pF
(see Note A)
LOAD CIRCUIT
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
and t
PLZ
PZL
PLH
and t
and t
PHZ
PZH
PHL
500 Ω
500 Ω
VCC/2VCC/2
are the same as t
are the same as ten.
are the same as tpd.
S1
dis
.
2 × V
Open
GND
t
PHL
CC
V
0 V
V
V
CC
OH
OL
Output
Control
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
Open
2 × V
GND
CC
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
V
0 V
V
V
V
0 V
CC
CC
OL
OH
4
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
PARAMETER MEASUREMENT INFORMATION
500 Ω
500 Ω
LOAD CIRCUIT
SN74CBTLV3257
LOW-VOLTAGE 4-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS040D – DECEMBER 1997 – REVISED NOVEMBER 1999
= 3.3 V ± 0.3 V
V
CC
2 × V
S1
CC
Open
GND
Output
Control
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
CC
V
VCC/2VCC/2
CC
0 V
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
VCC/2VCC/2
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
PLZ
PZL
PLH
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
.
Figure 2. Load Circuit and Voltage Waveforms
t
PHL
V
0 V
V
V
CC
OH
OL
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
V
V
V
0 V
CC
OL
OH
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
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Copyright 1999, Texas Instruments Incorporated
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