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description
The SN74CBT16233 is a 16-bit 1-of-2 FET
multiplexer/demultiplexer used in applications in
which two separate data paths must be
multiplexed onto, or demultiplexed from, a single
path. This device can be used for memory
interleaving, where two different banks of memory
need to be addressed simultaneously . The device
can be used as two 8-bit to 16-bit multiplexers or
as one 16-bit to 32-bit multiplexer.
Two select (SEL1 and SEL2) inputs control the
data flow. When the TEST inputs are asserted, the
A port is connected to both the B1 and the B2
ports. SEL1, SEL2, and the TEST inputs can be
driven with a 5-V CMOS, a 5-V TTL, or a
low-voltage TTL driver.
The device is specified by design not to have
through current when switching directions.
The SN74CBT16233 is characterized for
operation from 0°C to 70°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
FUNCTION TABLE
(each multiplexer/demultiplexer)
INPUTS
SELTEST
LLA = B1
HLA = B2
XHA = B1 and A = B2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
SN74CBT16233
16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MA Y 1995 – REVISED OCT OBER 1998
logic diagram (positive logic)
1A
8A
SEL1
TEST1
1
45
30
27
56
55
12
15
9A
1B1
1B2
11
8B1
8B2
TEST2
16A
SEL2
31
29
28
42
41
25
26
9B1
9B2
16B1
16B2
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Input clamp current, I
Package thermal impedance, θ
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
2
Supply voltage4.755.25V
CC
High-level control input voltage2V
IH
Low-level control input voltage0.8V
IL
Operating free-air temperature070°C
A
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
I
§
V
0
PARAMETER
MIN
MAX
UNIT
SN74CBT16233
16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MA Y 1995 – REVISED OCT OBER 1998
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONSMIN TYP†MAXUNIT
V
IK
I
I
CC
‡
∆I
CC
C
i
C
io(OFF)
r
on
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
§
Measured by the voltage drop between A and B terminals at the indicated current through the switch. On-state resistance is determined by the
lower of the voltages of the two (A or B) terminals.
Control inputsVCC = 5.5 V,One input at 3.4 V,Other inputs at VCC or GND2.5mA
Control inputsVI = 3 V or 04.5pF
switching characteristics over recommended operating free-air temperature range, CL = 50 pF
(unless otherwise noted) (see Figure 1)
The propagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance, when
driven by an ideal voltage source (zero output impedance).
dis
A or BB or A0.25ns
SELA1.65.3ns
TEST or SELB1.35.2ns
TEST or SELB15.3ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN74CBT16233
16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MA Y 1995 – REVISED OCT OBER 1998
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
and t
PLZ
PZL
PLH
and t
and t
PHZ
PZH
PHL
500 Ω
500 Ω
1.5 V1.5 V
are the same as t
are the same as ten.
are the same as tpd.
dis
.
S1
t
PHL
7 V
Open
GND
3 V
0 V
V
OH
V
OL
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
t
PZL
1.5 V
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
PLZ
t
PHZ
1.5 V
Open
7 V
Open
1.5 V1.5 V
VOL + 0.3 V
VOH – 0.3 V
3 V
0 V
3.5 V
V
OL
V
OH
0 V
Figure 1. Load Circuit and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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