Texas Instruments SN74CBT16233DGGR, SN74CBT16233DGVR, SN74CBT16233DL, SN74CBT16233DLR Datasheet

FUNCTION
SN74CBT16233
16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MA Y 1995 – REVISED OCT OBER 1998
D
D
TTL-Compatible Input Levels
D
Package Options Include Plastic Thin Shrink Small-Outline (DGG), Thin Very Small-Outline (DGV), and 300-mil Shrink Small-Outline (DL) Packages
description
The SN74CBT16233 is a 16-bit 1-of-2 FET multiplexer/demultiplexer used in applications in which two separate data paths must be multiplexed onto, or demultiplexed from, a single path. This device can be used for memory interleaving, where two different banks of memory need to be addressed simultaneously . The device can be used as two 8-bit to 16-bit multiplexers or as one 16-bit to 32-bit multiplexer.
Two select (SEL1 and SEL2) inputs control the data flow. When the TEST inputs are asserted, the A port is connected to both the B1 and the B2 ports. SEL1, SEL2, and the TEST inputs can be driven with a 5-V CMOS, a 5-V TTL, or a low-voltage TTL driver.
The device is specified by design not to have through current when switching directions.
The SN74CBT16233 is characterized for operation from 0°C to 70°C.
DGG, DGV, OR DL PACKAGE
TEST1 TEST2
1A 2B1 2B2
3A 4B1 4B2
5A 6B1 6B2
7A 8B1 8B2
GND
V
CC
9A
10B1 10B2
11A 12B1 12B2
13A 14B1 14B2
15A 16B1 16B2
(TOP VIEW)
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
30
28
29
1B1 1B2 2A 3B1 3B2 4A 5B1 5B2 6A 7B1 7B2 8A GND V
CC
9B1 9B2 10A 1 1B1 1 1B2 12A 13B1 13B2 14A 15B1 15B2 16A SEL1 SEL2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
FUNCTION TABLE
(each multiplexer/demultiplexer)
INPUTS
SEL TEST
L L A = B1 H L A = B2 X H A = B1 and A = B2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
SN74CBT16233 16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MA Y 1995 – REVISED OCT OBER 1998
logic diagram (positive logic)
1A
8A
SEL1
TEST1
1
45
30
27
56
55
12
15
9A
1B1
1B2
11
8B1
8B2
TEST2
16A
SEL2
31
29
28
42
41
25
26
9B1
9B2
16B1
16B2
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V Input voltage range, V
Continuous channel current 128 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I Package thermal impedance, θ
Storage temperature range, T
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
–0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
(see Note 1) –0.5 V to VCC + 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
(V
< 0) –50 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
IK
I
(see Note 2): DGG package 81°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
JA
DGV package 86°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DL package 74°C/W. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
stg
recommended operating conditions (see Note 3)
MIN MAX UNIT
V V V T
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
2
Supply voltage 4.75 5.25 V
CC
High-level control input voltage 2 V
IH
Low-level control input voltage 0.8 V
IL
Operating free-air temperature 0 70 °C
A
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
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