Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK) and Flatpacks (W), and
Plastic (N) and Ceramic (J) 300-mil DIPs
description
The SN54BCT541 and SN74BCT541A octal
buffers and line drivers are ideal for driving bus
lines or buffering memory-address registers. The
devices feature inputs and outputs on opposite
sides of the package to facilitate printed-circuitboard layout.
The 3-state control gate is a 2-input AND gate with
active-low inputs so that if either output-enable
(OE1
or OE2) input is high, all eight outputs are in
the high-impedance state.
The SN54BCT541 is characterized for operation
over the full military temperature range of –55°C
to 125°C. The SN74BCT541A is characterized for
operation from 0°C to 70°C.
SN54BCT541 ...J OR W PACKAGE
SN74BCT541A . . . DW OR N PACKAGE
SN54BCT541 . . . FK PACKAGE
A3
A4
A5
A6
A7
(TOP VIEW)
OE1
1
A1
2
A2
3
A3
4
A4
5
6
A5
7
A6
8
A7
9
A8
GND
10
(TOP VIEW)
A2A1OE1
3212019
4
5
6
7
8
9 10 11 12 13
A8
Y8
20
19
18
17
16
15
14
13
12
11
V
Y7
CC
V
CC
OE2
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
18
17
16
15
14
Y6OE2
Y1
Y2
Y3
Y4
Y5
GND
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
FUNCTION TABLE
INPUTS
OE1OE2A
LLLL
LLH H
HXX Z
XHXZ
OUTPUT
Y
Copyright 1994, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54BCT541, SN74BCT541A
UNIT
OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS011D – JULY 1988 – REVISED SEPTEMBER 1994
1
19
2
3
4
5
6
7
8
9
†
&
EN
1
18
17
16
15
14
13
12
11
logic diagram (positive logic)
OE1
OE2
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
1
19
2
A1Y1
18
To Seven Other Channels
logic symbol
OE1
OE2
A1
A2
A3
A4
A5
A6
A7
A8
†
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
FROM
(INPUT)
TO
(OUTPUT)
R1 = 500 Ω,
R2 = 500 Ω,
TA = 25°C
′BCT541SN54BCT541 SN74BCT541A
MINTYPMAXMINMAXMINMAX
2.13.75.31.76.31.76
3.75.57.53.28.73.48.2
4.57.29.34.4113.910.7
5810.45.412.44.411.5
3.55.67.639.138.6
3.45.27.239.438.6
VCC = 4.5 V to 5.5 V,
CL = 50 pF,
R1 = 500 Ω,
R2 = 500 Ω,
TA = MIN to MAX
§
UNIT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54BCT541, SN74BCT541A
OCTAL BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCBS011D – JULY 1988 – REVISED SEPTEMBER 1994
PARAMETER MEASUREMENT INFORMATION
7 V (t
S1
From Output
Under Test
C
(see Note A)
3-STATE AND OPEN-COLLECTOR OUTPUTS
Timing Input
(see Note B)
Data Input
(see Note B)
L
LOAD CIRCUIT FOR
t
su
1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
, t
PZL
Open
(all others)
R1
1.5 V
, O.C.)
PLZ
Test
Point
R2
RL = R1 = R2
t
h
1.5 V
3 V
0 V
3 V
0 V
From Output
Under Test
(see Note A)
High-Level
Pulse
(see Note B)
Low-Level
Pulse
C
L
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
1.5 V
t
w
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
R1
Test
Point
3 V
1.5 V
0 V
3 V
1.5 V
0 V
Input
(see Note B)
t
In-Phase
(see Note D)
Out-of-Phase
(see Note D)
NOTES: A. CL includes probe and jig capacitance.
PLH
Output
t
PHL
Output
PROPAGATION DELAY TIMES (see Note D)
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, tr = tf≤ 2.5 ns, duty cycle = 50%.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. The outputs are measured one at a time with one transition per measurement.
E. When measuring propagation delay times of 3-state outputs, switch S1 is open.
1.5 V1.5 V
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
Figure 1. Load Circuits and Voltage Waveforms
t
PHL
t
PLH
3 V
0 V
V
V
V
V
OH
(see Notes C and D)
OL
OH
(see Notes C and D)
OL
Output
Control
(low-level enable)
Waveform 1
Waveform 2
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
t
PHZ
3 V
1.5 V1.5 V
0 V
t
PLZ
3.5 V
V
OL
0.3 V
V
OH
0.3 V
0 V
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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