Dynamically Changes Output Impedance,
Resulting in Noise Reduction Without
Speed Degradation
D
Dynamic Drive Capability Is Equivalent to
Standard Outputs With IOH and IOL of
±24 mA at 2.5-V V
D
Overvoltage-Tolerant Inputs/Outputs Allow
CC
Mixed-Voltage-Mode Data Communications
description
A Dynamic Output Control (DOC) circuit is implemented, which, during the transition, initially lowers the output
impedance to effectively drive the load and, subsequently, raises the impedance to reduce noise. Figure 1
shows typical V
circuit. At the beginning of the signal transition, the DOC circuit provides a maximum dynamic drive that is
equivalent to a high-drive standard-output device. For more information, refer to the TI application reports,
Logic Family T echnology and Applications
Circuitry Technology and Applications
vs IOL and VOH vs IOH curves to illustrate the output impedance and drive capability of the
OL
, literature number SCEA006, and
, literature number SCEA009.
D
I
Supports Partial-Power-Down Mode
off
Operation
D
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
D
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
D
Package Options Include Plastic Thin
Shrink Small-Outline (DGG) and Thin Very
Small-Outline (DGV) Packages
Dynamic Output Control (DOC)
AVC
3.2
2.8
2.4
2.0
1.6
1.2
– Output Voltage – V
OL
0.8
V
0.4
TA = 25°C
Process = Nominal
VCC = 1.8 V
IOL – Output Current – mA
VCC = 2.5 V
VCC = 3.3 V
136
17015311910285685134170
2.8
2.4
2.0
1.6
1.2
– Output Voltage – V
OH
0.8
V
0.4
TA = 25°C
Process = Nominal
VCC = 3.3 V
–128–144–160
IOH – Output Current – mA
VCC = 2.5 V
VCC = 1.8 V
–80–96–112–32–48–640–16
Figure 1. Output Voltage vs Output Current
This 16-bit edge-triggered D-type flip-flop is operational at 1.2-V to 3.6-V VCC, but is designed specifically for
1.65-V to 3.6-V VCC operation.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
DOC, EPIC, and Widebus are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2000, Texas Instruments Incorporated
1
SN74AVC16374
16-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP
WITH 3-STATE OUTPUTS
SCES158F – DECEMBER 1998 – REVISED FEBRUARY 2000
description (continued)
The SN74AVC16374 is particularly suitable for implementing buffer registers, I/O ports, bidirectional bus
drivers, and working registers. It can be used as two 8-bit flip-flops or one 16-bit flip-flop. On the positive
transition of the clock (CLK) input, the Q outputs of the flip-flop take on the logic levels at the data (D) inputs.
OE
can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the
high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly .
The high-impedance state and the increased drive provide the capability to drive bus lines without need for
interface or pullup components.
OE does not affect internal operations of the flip-flop. Old data can be retained or new data can be entered while
the outputs are in the high-impedance state.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
This device is fully specified for partial-power-down applications using I
off
preventing damaging current backflow through the device when it is powered down.
The SN74AVC16374 is characterized for operation from –40°C to 85°C.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.
2. The output positive-voltage rating may be exceeded up to 4.6 V maximum if the output current rating is observed.
3. The package thermal impedance is calculated in accordance with JESD 51.