TEXAS INSTRUMENTS SN74AUC2G125 Technical data

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FEATURES

DCT OR DCU PACKAGE

(TOP VIEW)

1
2
3
4

8
7
6
5

1OE

1A
2Y

GND

V

CC

2OE
1Y
2A

4
3
2
1

5
6
7
8

GND

2Y
1A

1OE

2A
1Y
2OE
V

CC

YEP OR YZP PACKAGE

(BOTTOM VIEW)

• Available in the Texas Instruments

NanoStar™ and NanoFree™ Packages

• Optimized for 1.8-V Operation and Is 3.6-V I/O

Tolerant to Support Mixed-Mode Signal
Operation

• I

• Sub-1-V Operable

• Max tpdof 1.8 ns at 1.8 V

• Low Power Consumption, 10 µ A at 1.8 V

• ±8-mA Output Drive at 1.8 V

• Latch-Up Performance Exceeds 100 mA Per

• ESD Protection Exceeds JESD 22

Supports Partial-Power-Down Mode

off

Operation

JESD 78, Class II

– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)

SN74AUC2G125

DUAL BUS BUFFER GATE

WITH 3-STATE OUTPUTS

SCES532A – DECEMBER 2003 – REVISED MARCH 2005

DESCRIPTION/ORDERING INFORMATION

This dual bus buffer gate is operational at 0.8-V to 2.7-V V
V

operation.

CC

The SN74AUC2G125 features dual line drivers with 3-state outputs. The outputs are disabled when the
associated output-enable ( OE) input is high.

NanoStar™ and NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the
die as the package.

To ensure the high-impedance state during power up or power down, OE should be tied to V
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

This device is fully specified for partial-power-down applications using I
preventing damaging current backflow through the device when it is powered down.

For more information about AUC Little Logic devices, please refer to the TI application report, Applications of
Texas Instruments AUC Sub-1-V Little Logic Devices, literature number SCEA027.

–40°C to 85°C

(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at

www.ti.com/sc/package.

(2) DCT: The actual top-side marking has three additional characters that designate the year, month, and assembly/test site.

DCU: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one following
character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition (1 = SnPb, ⋅ = Pb-free).

T

, but is designed specifically for 1.65-V to 1.95-V

CC

through a pullup

CC

. The I

off

circuitry disables the outputs,

off

ORDERING INFORMATION

A

NanoStar™ – WCSP (DSBGA)

0.23-mm Large Bump – YEP
NanoFree™ – WCSP (DSBGA)

0.23-mm Large Bump – YZP (Pb-free)
SSOP – DCT Tape and reel SN74AUC2G125DCTR U25_ _ _
VSSOP – DCU Tape and reel SN74AUC2G125DCUR UM_

PACKAGE

(1)

Tape and reel SN74AUC2G125YEPR

Tape and reel SN74AUC2G125YZPR

ORDERABLE PART NUMBER TOP-SIDE MARKING

_ _ _UM_

(2)

NanoStar, NanoFree are trademarks of Texas Instruments.

PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

Copyright © 2003–2005, Texas Instruments Incorporated

www.ti.com

1A 1Y

1OE

1

2 6

2A 2Y

2OE

7

5 3

SN74AUC2G125
DUAL BUS BUFFER GATE
WITH 3-STATE OUTPUTS

SCES532A – DECEMBER 2003 – REVISED MARCH 2005

FUNCTION TABLE

(EACH BUFFER)

INPUTS

OE A

L H H
L L L

H X Z

LOGIC DIAGRAM (POSITIVE LOGIC)

OUTPUT

Y

2

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SN74AUC2G125

DUAL BUS BUFFER GATE

WITH 3-STATE OUTPUTS

SCES532A – DECEMBER 2003 – REVISED MARCH 2005

Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

V

CC

V

I

V

O

V

O

I

IK

I

OK

I

O

θ

JA

T

stg

(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

(2) The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
(3) The package thermal impedance is calculated in accordance with JESD 51-7.

Supply voltage range –0.5 3.6 V
Input voltage range
Voltage range applied to any output in the high-impedance or power-off state
Output voltage range
Input clamp current VI< 0 –50 mA
Output clamp current VO< 0 –50 mA
Continuous output current ±20 mA
Continuous current through V

Package thermal impedance

Storage temperature range –65 150 °C

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(1)

MIN MAX UNIT

(2)

(2)

(2)

or GND ±100 mA

CC

–0.5 3.6 V
–0.5 3.6 V
–0.5 V

+ 0.5 V

CC

DCT package 220

(3)

DCU package 227 °C/W
YEP/YZP package 102

Recommended Operating Conditions

V

V

V

V

V

I

OH

I

OL

Supply voltage 0.8 2.7 V

CC

High-level input voltage V

IH

Low-level input voltage V

IL

Input voltage 0 3.6 V

I

Output voltage V

O

High-level output current V

Low-level output current V

(1)

∆ t/ ∆ v Input transition rise or fall rate V

T

A

(1) All unused inputs of the device must be held at V

Operating free-air temperature –40 85 °C

or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

CC

(2) The data was taken at CL= 15 pF, RL= 2 k Ω (see Figure 1 ).
(3) The data was taken at CL= 30 pF, RL= 500 Ω (see Figure 1 ).

MIN MAX UNIT

V

= 0.8 V V

CC

= 1.1 V to 1.95 V 0.65 × V

CC

V

= 2.3 V to 2.7 V 1.7

CC

V

= 0.8 V 0

CC

= 1.1 V to 1.95 V 0.35 × V

CC

V

= 2.3 V to 2.7 V 0.7

CC

CC
CC

Active state 0 V
3-state 0 3.6
V

= 0.8 V –0.7

CC

V

= 1.1 V –3

CC

= 1.4 V –5 mA

CC

V

= 1.65 V –8

CC

V

= 2.3 V –9

CC

V

= 0.8 V 0.7

CC

V

= 1.1 V 3

CC

= 1.4 V 5 mA

CC

V

= 1.65 V 8

CC

V

= 2.3 V 9

CC

V

= 0.8 V to 1.65 V

CC

= 1.65 V to 1.95 V

CC

V

= 2.3 V to 2.7 V

CC

(2)

(3)

(3)

V

V

CC

CC

20
20 ns/V
15

3

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SN74AUC2G125
DUAL BUS BUFFER GATE
WITH 3-STATE OUTPUTS

SCES532A – DECEMBER 2003 – REVISED MARCH 2005

Electrical Characteristics

over recommended operating free-air temperature range (unless otherwise noted)

PARAMETER TEST CONDITIONS V

IOH= –100 µ A 0.8 V to 2.7 V V
IOH= –0.7 mA 0.8 V 0.55

V

OH

V

OL

I

I

I

off

I

OZ

I

CC

C
C

A or OE inputs VI= V

i
o

(1) All typical values are at TA= 25°C.

IOH= –3 mA 1.1 V 0.8
IOH= –5 mA 1.4 V 1
IOH= –8 mA 1.65 V 1.2
IOH= –9 mA 2.3 V 1.8
IOL= 100 µ A 0.8 V to 2.7 V 0.2
IOL= 0.7 mA 0.8 V 0.25
IOL= 3 mA 1.1 V 0.3
IOL= 5 mA 1.4 V 0.4
IOL= 8 mA 1.65 V 0.45
IOL= 9 mA 2.3 V 0.6

or GND 0 to 2.7 V ±5 µ A

CC

VIor VO= 2.7 V 0 ±10 µ A
VO= V
VI= V
VI= V
VO= V

or GND 2.7 V ±10 µ A

CC

or GND, IO= 0 0.8 V to 2.7 V 10 µ A

CC

or GND 2.5 V 2.5 pF

CC

or GND 2.5 V 5.5 pF

CC

CC

MIN TYP

– 0.1

CC

(1)

MAX UNIT

V

V

Switching Characteristics

over recommended operating free-air temperature range, CL= 15 pF (unless otherwise noted) (see Figure 1 )

V

= 1.2 V V

V

= 0.8 V

PARAMETER UNIT

t

pd

t

en

t

dis

FROM TO

(INPUT) (OUTPUT)

A Y 5.1 1 3.6 0.7 2.3 0.6 1 1.8 0.5 1.3 ns
OE Y 5.9 1.1 4.1 1 2.6 0.9 1.3 2 0.8 1.5 ns
OE Y 6.6 2 4.8 1.5 3.5 1.8 2.6 3.7 1.4 2.9 ns

CC

TYP MIN MAX MIN MAX MIN TYP MAX MIN MAX

CC

± 0.1 V ± 0.1 V ± 0.15 V ± 0.2 V

= 1.5 V V

CC

= 1.8 V V

CC

= 2.5 V

CC

Switching Characteristics

over recommended operating free-air temperature range, CL= 30 pF (unless otherwise noted) (see Figure 1 )

V

= 1.8 V V

PARAMETER UNIT

t

pd

t

en

t

dis

FROM TO

(INPUT) (OUTPUT)

A Y 0.8 1.6 2.6 0.7 1.8 ns
OE Y 1.1 1.7 2.9 0.9 2.2 ns
OE Y 1.7 2.3 3.6 0.8 2 ns

CC

± 0.15 V ± 0.2 V

MIN TYP MAX MIN MAX

= 2.5 V

CC

4