SN74AS1008A
QUADRUPLE 2-INPUT POSITIVE-AND BUFFER/DRIVER
SDAS071B – DECEMBER 1982 – REVISED JANUARY 1995
• Driver V ersion of ′AS08
• Offers High Capacitive-Drive Capability
• Package Options Include Plastic
Small-Outline (D) Packages and Standard
Plastic (N) 300-mil DIPs
description
This device contains four independent 2-input
positive-AND buffers/drivers. It performs the
Boolean functions Y = A • B or Y = A
logic.
The SN74AS1008A is characterized for operation
from 0°C to 70°C.
logic symbol
†
+ B in positive
FUNCTION TABLE
(each gate)
INPUTS
A B
H H H
L XL
XLL
OUTPUT
Y
logic diagram (positive logic)
D OR N PACKAGE
(TOP VIEW)
1A
1
1B
2
1Y
3
2A
4
2B
5
2Y
6
GND
7
14
13
12
11
10
V
CC
4B
4A
4Y
3B
3A
9
3Y
8
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
&
3
1Y
6
2Y
8
3Y
11
4Y
1A
1B
2A
2B
3A
3B
4A
4B
1
2
4
5
9
10
12
13
3
1Y
6
2Y
8
3Y
11
4Y
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
Input voltage, V
Operating free-air temperature range, T
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
‡
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A
‡
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
1
SN74AS1008A
V
V
A or B
Y
ns
QUADRUPLE 2-INPUT POSITIVE-AND BUFFER/DRIVER
SDAS071B – DECEMBER 1982 – REVISED JANUARY 1995
recommended operating conditions
V
CC
V
IH
V
IL
I
OH
I
OL
T
A
†
This high sink- or source-current device is not recommended for use above 40 MHz.
Supply voltage 4.5 5 5.5 V
High-level input voltage 2 V
Low-level input voltage 0.8 V
High-level output current –48 mA
Low-level output current 48 mA
Operating free-air temperature 0 70 °C
†
MIN NOM MAX UNIT
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP‡MAX UNIT
V
IK
V
OH
V
OL
I
I
I
IH
I
IL
§
I
O
I
CCH
I
‡
All typical values are at VCC = 5 V, TA = 25°C.
§
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
CCL
VCC = 4.5 V, II = –18 mA –1.2 V
VCC = 4.5 V to 5.5 V, IOH = –2 mA VCC –2
= 4.5
CC
VCC = 4.5 V, IOL = 48 mA 0.35 0.5 V
VCC = 5.5 V, VI = 7 V 0.1 mA
VCC = 5.5 V, VI = 2.7 V 20 µA
VCC = 5.5 V, VI = 0.4 V –0.5 mA
VCC = 5.5 V, VO = 2.25 V –50 –200 mA
VCC = 5.5 V, VI = 4.5 V 5.6 9.5 mA
VCC = 5.5 V, VI = 0 13.5 22 mA
IOH = –3 mA 2.4 3.2
IOH = –48 mA 2
V
switching characteristics (see Figure 1)
VCC = 4.5 V to 5.5 V,
PARAMETER
t
PLH
t
¶
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
PHL
FROM
(INPUT)
TO
(OUTPUT)
CL = 50 pF,
RL = 500 Ω,
TA = MIN to MAX
MIN MAX
1 6
1 6
UNIT
¶
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN74AS1008A
QUADRUPLE 2-INPUT POSITIVE-AND BUFFER/DRIVER
SDAS071B – DECEMBER 1982 – REVISED JANUARY 1995
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
7 V
V
CC
S1
R
L
Test
Point
C
L
R
L
From Output
Under Test
C
(see Note A)
Test
Point
L
From Output
Under Test
(see Note A)
R1
C
L
RL = R1 = R2
Test
Point
R2
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
Timing
Input
t
su
Data
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
t
PZL
t
PZH
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
VOLTAGE WAVEFORMS
1.3 V
t
PHZ
1.3 V
1.3 V
t
1.3 V1.3 V
1.3 V1.3 V
FOR OPEN-COLLECTOR OUTPUTS
h
t
PLZ
LOAD CIRCUIT
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
[
3.5 V
V
OL
0.3 V
V
OH
0.3 V
[
0 V
High-Level
Low-Level
Out-of-Phase
(see Note C)
Pulse
Pulse
Input
In-Phase
Output
Output
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
1.3 V 1.3 V
t
w
1.3 V 1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V 1.3 V
t
PLH
t
PHL
1.3 V 1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.3 V1.3 V
t
PHL
t
PLH
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
V
V
V
V
OH
OL
OH
OL
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
Loading...