2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
D
State-of-the-Art Advanced BiCMOS
Technology (ABT)
Widebus
Design for
2.5-V and 3.3-V Operation and Low Static
Power Dissipation
D
Support Mixed-Mode Signal Operation (5-V
Input and Output Voltages With 2.3-V to
3.6-V V
D
Typical V
<0.8 V at V
D
Power Off Disables Outputs, Permitting
)
CC
(Output Ground Bounce)
OLP
= 3.3 V, TA = 25°C
CC
Live Insertion
D
High-Impedance State During Power Up
and Power Down Prevents Driver Conflict
D
Uses Bus Hold on Data Inputs in Place of
External Pullup/Pulldown Resistors to
Prevent the Bus From Floating
D
Output Ports Have Equivalent 30-Ω Series
Resistors, So No External Resistors Are
Required
D
Auto3-State Eliminates Bus Current
Loading When Output Exceeds V
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model; and Exceeds 1000 V
Using Charged-Device Model, Robotic
Method
The ’AL VTH162827 devices are 20-bit buffers/line drivers designed for 2.5-V or 3.3-V VCC operation, but with
the capability to provide a TTL interface to a 5-V system environment.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus is a trademark of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
1
SN54ALVTH162827, SN74ALVTH162827
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
description (continued)
The devices are composed of two 10-bit sections with separate output-enable signals. For either 10-bit buffer
section, the two output-enable (1OE1
Y outputs to be active. If either output-enable input is high, the outputs of that 10-bit buffer section are in the
high-impedance state.
When V
is between 0 and 1.2 V , the device is in the high-impedance state during power up or power down.
CC
However, to ensure the high-impedance state above 1.2 V, OE
the minimum value of the resistor is determined by the current-sinking capability of the driver.
All outputs are designed to sink up to 12 mA, and include equivalent 30-Ω resistors to reduce overshoot and
undershoot.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN54ALVTH162827 is characterized for operation over the full military temperature range of –55°C to
125°C. The SN74ALVTH162827 is characterized for operation from –40°C to 85°C.
and 1OE2, or 2OE1 and 2OE2) inputs must be low for the corresponding
should be tied to VCC through a pullup resistor;
FUNCTION TABLE
(each 10-bit section)
INPUTS
OE1OE2A
LLLL
LLH H
HXX Z
XHX Z
OUTPUT
Y
logic diagram (positive logic)
1
1OE1
56
1OE2
55
1A1
To Nine Other ChannelsTo Nine Other Channels
28
2OE1
29
2OE2
2
1Y1
2A1
42
15
2Y1
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
UNIT
SN54ALVTH162827, SN74ALVTH162827
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in
or power-off state, V
Voltage range applied to any output in the high state, V
Output current in the low state, I
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54ALVTH162827, SN74ALVTH162827
UNIT
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
recommended operating conditions, VCC = 3.3 V ± 0.3 V (see Note 3)
SN54ALVTH162827SN74ALVTH162827
MINTYPMAXMINTYPMAX
V
CC
V
IH
V
IL
V
I
I
OH
I
OL
∆t/∆vInput transition rise or fall rateOutputs enabled1010ns/V
∆t/∆V
T
A
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
Control inputs
V
CC
SN54ALVTH162827, SN74ALVTH162827
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
electrical characteristics over recommended operating free-air temperature range,
= 2.5 V ± 0.2 V (unless otherwise noted)
V
CC
SN54ALVTH162827SN74ALVTH162827
MIN TYP†MAXMIN TYP†MAX
V
IK
V
OH
V
OL
I
I
Data inputsVCC = 2.7 V
I
off
‡
I
BHL
§
I
BHH
¶
I
BHLO
#
I
BHHO
||
I
EX
I
OZ(PU/PD)
I
OZH
I
OZL
I
CC
C
i
C
o
†
All typical values are at VCC = 2.5 V, TA = 25°C.
‡
The bus-hold circuit can sink at least the minimum low sustaining current at VIL max. I
then raising it to VIL max.
§
The bus-hold circuit can source at least the minimum high sustaining current at VIH min. I
then lowering it to VIH min.
¶
An external driver must source at least I
#
An external driver must sink at least I
||
Current into an output in the high state when VO > V
k
High-impedance state during power up or power down
k
VCC = 2.3 V,II = –18 mA–1.2–1.2V
VCC = 2.3 V to 2.7 V,IOH = –100 µAVCC–0.2VCC–0.2
= 2.3
CC
VCC = 2.3 V to 2.7 V,IOL = 100 µA0.20.2
= 2.3
CC
VCC = 2.7 V,VI = VCC or GND±1±1
p
VCC = 0 or 2.7 V,VI = 5.5 V1010
VCC = 0,VI or VO = 0 to 4.5 V±100µA
VCC = 2.3 V,VI = 0.7 V115115µA
VCC = 2.3 V,VI = 1.7 V–10–10µA
VCC = 2.7 V,VI = 0 to V
VCC = 2.7 V,VI = 0 to V
VCC = 2.3 V,VO = 5.5 V125125µA
VCC ≤ 1.2 V, VO = 0.5 V to VCC,
VI = GND or VCC, OE
VCC = 2.7 V
VCC = 2.7 V
=
= 2.7 V,
IO = 0,
VI = VCC or GND
VCC = 2.5 V,VI = 2.5 V or 03.53.5pF
VCC = 2.5 V,VO = 2.5 V or 066pF
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54ALVTH162827, SN74ALVTH162827
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
Control inputs
V
CC
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
electrical characteristics over recommended operating free-air temperature range,
= 3.3 V ± 0.3 V (unless otherwise noted)
V
CC
SN54ALVTH162827SN74ALVTH162827
MIN TYP†MAXMIN TYP†MAX
V
IK
V
OH
V
OL
I
I
Data inputsVCC = 3.6 V
I
off
‡
I
BHL
§
I
BHH
¶
I
BHLO
#
I
BHHO
||
I
EX
I
OZ(PU/PD)
I
OZH
I
OZL
I
CC
∆I
CC
C
i
C
o
†
All typical values are at VCC = 3.3 V, TA = 25°C.
‡
The bus-hold circuit can sink at least the minimum low sustaining current at VIL max. I
then raising it to VIL max.
§
The bus-hold circuit can source at least the minimum high sustaining current at VIH min. I
then lowering it to VIH min.
¶
An external driver must source at least I
#
An external driver must sink at least I
||
Current into an output in the high state when VO > V
k
High-impedance state during power up or power down
h
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
k
h
VCC = 3 V,II = –18 mA–1.2–1.2V
VCC = 3 V to 3.6 V,IOH = –100 µAVCC–0.2VCC–0.2
= 3
CC
VCC = 3 V to 3.6 V,IOL = 100 µA0.20.2
= 3
CC
VCC = 3.6 V,VI = VCC or GND±1±1
p
VCC = 0 or 3.6 V,VI = 5.5 V1010
VCC = 0,VI or VO = 0 to 4.5 V±100µA
VCC = 3 V,VI = 0.8 V7575µA
VCC = 3 V,VI = 2 V–75–75µA
VCC = 3.6 V,VI = 0 to V
VCC = 3.6 V,VI = 0 to V
VCC = 3 V,VO = 5.5 V125125µA
VCC ≤ 1.2 V, VO = 0.5 V to VCC,
VI = GND or VCC, OE
VCC = 3.6 V
VCC = 3.6 V
=
= 3.6 V,
IO = 0,
VI = VCC or GND
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VCC = 3.3 V,VI = 3.3 V or 03.53.5pF
VCC = 3.3 V,VO = 3.3 V or 066pF
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
UNIT
A
Y
ns
OE
Y
ns
OE
Y
ns
PARAMETER
UNIT
A
Y
ns
OE
Y
ns
OE
Y
ns
SN54ALVTH162827, SN74ALVTH162827
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
switching characteristics over recommended operating free-air temperature range, CL = 30 pF , V
= 2.5 V ± 0.2 V (unless otherwise noted) (see Figure 1)
SN54ALVTH162827 SN74ALVTH162827
MINMAXMINMAX
1.74.11.74.1
1.641.64
2.14.82.14.8
1.94.81.94.8
2.462.46
1.751.75
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
FROMTO
(INPUT)(OUTPUT)
switching characteristics over recommended operating free-air temperature range, CL = 50 pF , V
= 3.3 V ± 0.3 V (unless otherwise noted) (see Figure 2)
SN54ALVTH162827 SN74ALVTH162827
MINMAXMINMAX
13.913.9
1.53.71.53.7
15.615.6
1.74.11.74.1
3.66.33.66.3
1.75.11.75.1
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
FROMTO
(INPUT)(OUTPUT)
CC
CC
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN54ALVTH162827, SN74ALVTH162827
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
PARAMETER MEASUREMENT INFORMATION
V
From Output
Under Test
CL = 30 pF
(see Note A)
500 Ω
500 Ω
S1
= 2.5 V ± 0.2 V
CC
2 × V
CC
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
VCC/2
t
su
h
VCC/2
VCC/2VCC/2
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 1. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
SN54ALVTH162827, SN74ALVTH162827
2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS
SCES079E – JULY 1996 – REVISED DECEMBER 1998
PARAMETER MEASUREMENT INFORMATION
V
= 3.3 V ± 0.3 V
CC
6 V
500 Ω
500 Ω
S1
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
WITH 3-STATE OUTPUTS
Open
6 V
GND
LOAD CIRCUIT
Timing
Input
Data
Input
Input
Output
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform22 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
VOLTAGE WAVEFORMS
1.5 V
t
su
t
h
t
PLH
1.5 V1.5 V
t
PHL
3 V
0 V
3 V
0 V
3 V
0 V
V
V
OH
OL
Input
Output Control
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
t
w
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
1.5 V
VOL + 0.3 V
VOH – 0.3 V
t
PLZ
t
PHZ
3 V
0 V
3 V
0 V
3 V
V
OL
V
OH
≈ 0 V
Figure 2. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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