ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Package Options Include Plastic 300-mil
Shrink Small-Outline (DL), Thin Shrink
Small-Outline (DGG), and Thin Very
Small-Outline (DGV) Packages
description
This 12-bit universal bus driver is designed for
2.3-V to 3.6-V V
The SN74AL VCH16903 has dual outputs and can
operate as a buffer or an edge-triggered register .
In both modes, parity is checked on AP AR, which
arrives one cycle after the data to which it applies.
The YERR
output, which is produced one cycle
after APAR, is open drain.
operation.
CC
DGG, DGV, OR DL PACKAGE
P AROE
OE
1Y1
1Y2
GND
2Y1
2Y2
V
CC
3Y1
3Y2
4Y1
GND
4Y2
5Y1
5Y2
6Y1
6Y2
7Y1
GND
7Y2
8Y1
8Y2
V
CC
9Y1
9Y2
GND
10Y1
10Y2
(TOP VIEW)
1
56
2
55
3
54
4
53
5
52
6
51
7
50
8
49
9
48
10
47
11
46
12
45
13
44
14
43
15
42
16
41
17
40
18
39
19
38
20
37
21
36
22
35
23
34
24
33
25
32
26
31
27
30
28
29
CLK
1A
1 1A/YERREN
GND
1 1Y1
1 1Y2
V
CC
2A
3A
4A
GND
12A
12Y1
12Y2
5A
6A
7A
GND
APAR
8A
YERR
V
CC
9A
MODE
GND
10A
P ARI/O
CLKEN
MODE selects one of the two data paths. When MODE is low, the device operates as an edge-triggered register .
On the positive transition of the clock (CLK) input and when the clock-enable (CLKEN
) input is low, data set up
at the A inputs is stored in the internal registers. On the positive transition of CLK and when CLKEN
data set up at the 9A–12A inputs is stored in their internal registers. When MODE is high, the device operates
as a buffer and data at the A inputs passes directly to the outputs. 1 1A/YERREN
as a normal data bit and also enables YERR
When used as a single device, parity output enable (PAROE
data to be clocked into the YERR output register.
) must be tied high; when parity input/output
serves a dual purpose; it acts
(PARI/O) is low, even parity is selected and when PARI/O is high, odd parity is selected. When used in pairs
and P AROE
used in pairs and PAROE
A buffered output-enable (OE
is low, the parity sum is output on PARI/O for cascading to the second SN74ALVCH16903. When
is high, PARI/O accepts a partial parity sum from the first SN74AL VCH16903.
) input can be used to place the 24 outputs and YERR in either a normal logic state
(high or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor
drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive
bus lines without need for interface or pullup components.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC and Widebus are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 1998, Texas Instruments Incorporated
is high, only
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN74ALVCH16903
OUTPUT
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
description (continued)
OE does not affect the internal operation of the device. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
T o ensure the high-impedance state during power up or power down, OE
should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN74ALVCH16903 is characterized for operation from 0°C to 70°C.
This table applies to the first device of a cascaded pair
of ALVCH16903 devices.
13
5
(1A–10A)
Σ OF INPUTS
1A – 10A = H
13
(1A–11A/YERREN
12
11
APAR
10
Parity
Check
DQ
DQ
DQ
†
APAR
, APAR)
APAR
PARI/O
(1A–12A)
12
11A/YERREN
XOR
12
DQ
1Y1–12Y1
1Y2–12Y2
36
YERR
PAROE
28
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
30
PARI/O
3
SN74ALVCH16903
VIHHigh-level input voltage
V
VILLow-level input voltage
V
Y port
IOHHigh-level output current
mA
V
V
Y port
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Output voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through each V
Package thermal impedance, θ
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. This value is limited to 4.6 V maximum.
3. The package thermal impedance is calculated in accordance with JESD 51.
PARI/O before CLK↑Both modes2.421.7
11A/YERREN before CLK↑Buffer mode21.91.6
CLKEN before CLK↑Register mode2.52.62.2
1A–12A after CLK↑Register mode0.40.250.55
1A–10A after CLK↑Buffer mode0.250.250.25
ter
ter
11A/YERREN after CLK↑Buffer mode0.250.250.4
CLKEN after CLK↑Register mode0.250.50.4
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
UNIT
ns
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 and 4)
PARAMETER
f
max
Buffer modeAY14.44.21.13.8
t
pd
†
t
pd
t
pd
t
PLH
t
PHL
dis
t
PLH
t
PHL
†
See Figures 2 and 5 for the load specification.
Both modesCLKPARI/O16.85.21.34.5ns
Both modesMODEY15.95.81.34.9ns
FROM
OE
PAROE
OE
PAROE
TO
YERR15.74.91.44.4
PARI/O1.28.67.91.76.6
Y1.16.56.41.45.4
PARI/O15.6614.8
Y16.45.21.75
PARI/O13.23.81.23.8
VCC = 2.5 V
± 0.2 V
MINMAXMINMAXMINMAX
125125125MHz
16.15.51.24.8
15.94.91.24.6
13.64.21.94
1.25.14.91.54.2
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
UNIT
ns
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
(INPUT)
(OUTPUT)
Register mode
CLK
Y
ns
CpdPower dissipation capacitance
C
pF
CpdPower dissipation capacitance
C
pF
SN74ALVCH16903
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
simultaneous switching characteristics (see Figures 3 and 6)
PARAMETER
t
PLH
t
PHL
†
All outputs switching
operating characteristics for buffer mode, T
p
FROM
PARAMETER
p
A
Outputs enabled
Outputs disabled
operating characteristics for register mode, T
PARAMETER
p
p
Outputs enabled
Outputs disabled
TO
= 25°C
= 25°C
A
VCC = 2.5 V
± 0.2 V
MINMAXMINMAXMINMAX
1.86.56.11.85
1.45.95.11.74.5
TEST CONDITIONS
= 0,f = 10 MHz
L
TEST CONDITIONS
= 0,f = 10 MHz
L
†
VCC = 2.7 V
VCC = 2.5 V
± 0.2 V
TYPTYP
57.565
VCC = 2.5 V
± 0.2 V
TYPTYP
16.534
VCC = 3.3 V
± 0.3 V
VCC = 3.3 V
± 0.3 V
1517.5
VCC = 3.3 V
± 0.3 V
5787.5
UNIT
UNIT
p
UNIT
p
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN74ALVCH16903
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.5 V ± 0.2 V
CC
2 × V
t
PHL
Open
GND
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
From Output
Under Test
CL = 30 pF
(see Note A)
Timing
Input
Data
Input
Input
Output
LOAD CIRCUIT
t
su
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
t
PLH
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
500 Ω
VCC/2
t
500 Ω
h
S1
VCC/2
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
YERRS1
t
(see Note H)
PHL
t
(see Note I)
PLH
VCC/2
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
Open
2 × V
GND
CC
2 × V
CC
2 × V
CC
VCC/2VCC/2
VOL + 0.15 V
VOH – 0.15 V
VCC/2
t
PLZ
t
PHZ
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
H. t
and t
PLZ
and t
PZL
and t
PLH
is measured at VCC/2.
PHL
I. t
is measured at VOL + 0.15 V.
PLH
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
Figure 1. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
.
SN74ALVCH16903
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.5 V ± 0.2 V
CC
From Output
Under Test
PARI/O
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
C. t
PLH
and t
Test
Point
PHL
CL = 0.6 pF
(see Note A)
Output
are the same as tpd.
Input
t
PLH
Figure 2. Load Circuit and Voltage Waveforms
ZO = 52 Ω
Td = 63 ps
LOAD CIRCUIT
VCC/2VCC/2
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
CL = 0.6 pF
(see Note A)
V
0 V
t
PHL
V
V
PARI/O of
Second
ALVCH16903
CC
OH
OL
From Output
Under Test
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
Test
Point
LOAD CIRCUIT
RL = 10 Ω
CL = 30 pF
(see Note A)
Figure 3. Load Circuit and Voltage Waveforms
Input
Output
t
PLH
VCC/2VCC/2
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
PHL
V
0 V
V
V
CC
OH
OL
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
SN74ALVCH16903
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.7 V AND 3.3 V ± 0.3 V
CC
From Output
Under Test
(see Note A)
Timing
Input
Data
Input
Input
t
Output
CL = 50 pF
LOAD CIRCUIT
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
PLH
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
500 Ω
1.5 V
500 Ω
t
h
S1
t
PHL
6 V
GND
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
V
Open
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Nte B)
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
YERRS1
t
(see Note H)
PHL
t
(see Note I)
PLH
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
w
1.5 V
1.5 V
Open
6 V
GND
6 V
6 V
1.5 V1.5 V
t
PLZ
VOL + 0.3 V
t
PHZ
VOH –0.3 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
H. t
and t
I. t
PLZ
PZL
PLH
PHL
PLH
PHZ
and t
PZH
and t
PHL
is measured at 1.5 V.
is measured at VOL + 0.3 V.
are the same as t
are the same as ten.
are the same as tpd.
dis
Figure 4. Load Circuit and Voltage Waveforms
10
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
.
SN74ALVCH16903
3.3-V 12-BIT UNIVERSAL BUS DRIVER
WITH PARITY CHECKER AND DUAL 3-STATE OUTPUTS
SCES095C – MARCH 1997 – REVISED MA Y 1998
PARAMETER MEASUREMENT INFORMATION
V
= 2.7 V AND 3.3 V ± 0.3 V
CC
From Output
Under Test
PARI/O
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
C. t
PLH
and t
Test
Point
PHL
CL = 0.6 pF
(see Note A)
Output
are the same as tpd.
Input
t
PLH
Figure 5. Load Circuit and Voltage Waveforms
ZO = 52 Ω
Td = 63 ps
LOAD CIRCUIT
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
CL = 0.6 pF
(see Note A)
2.7 V
0 V
t
PHL
V
V
PARI/O of
Second
ALVCH16903
OH
OL
From Output
Under Test
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
Test
Point
LOAD CIRCUIT
RL = 10 Ω
CL = 50 pF
(see Note A)
Figure 6. Load Circuit and Voltage Waveforms
Input
Output
t
PLH
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
PHL
2.7 V
0 V
V
OH
V
OL
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
11
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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