ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Package Options Include Plastic Shrink
Small-Outline (DL) and Thin Shrink
Small-Outline (DGG) Packages
description
This 12-bit to 24-bit registered bus exchanger is
designed for 1.65-V to 3.6-V VCC operation.
The SN74AL VCH16269 is used in applications in
which two separate ports must be multiplexed
onto, or demultiplexed from, a single port. The
device is particularly suitable as an interface
between synchronous DRAMs and high-speed
microprocessors.
Data is stored in the internal B-port registers on
the low-to-high transition of the clock (CLK) input
when the appropriate clock-enable (CLKENA
inputs are low. Proper control of these inputs
allows two sequential 12-bit words to be
presented as a 24-bit word on the B port. For data
transfer in the B-to-A direction, a single storage
register is provided. The select (SEL
) line selects 1B or 2B data for the A outputs. The register on the A output
permits the fastest possible data transfer, extending the period during which the data is valid on the bus. The
control terminals are registered so that all transactions are synchronous with CLK. Data flow is controlled by
the active-low output enables (OEA
, OEB1, OEB2).
To ensure the high-impedance state during power up or power down, a clock pulse should be applied as soon
as possible, and OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is
determined by the current-sinking capability of the driver. Due to OE being routed through a register , the active
state of the outputs cannot be determined before the arrival of the first clock pulse.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The SN74ALVCH16269 is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC and Widebus are trademarks of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1999, Texas Instruments Incorporated
1
SN74ALVCH16269
12-BIT TO 24-BIT REGISTERED BUS EXCHANGER
WITH 3-STATE OUTPUTS
SCES019I – JULY 1995 – REVISED SEPTEMBER 1999
Function Tables
OUTPUT ENABLE
INPUTS
CLKOEAOEBA1B, 2B
↑HHZZ
↑HL ZActive
↑LHActiveZ
↑LLActiveActive
OUTPUTS
A-TO-B STORAGE
INPUTS
CLKENA1CLKENA2CLKA1B2B
LH↑LL2B
LH↑HH2B
LL↑LLL
LL↑HHH
HL↑L1B
HL↑H1B
HHXX1B
†
Output level before the indicated steady-state input
conditions were established
B-TO-A STORAGE (OEA
INPUTS
CLKSEL1B2B
XHXXA
XLXX A
↑HLX L
↑HHX H
↑LXL L
↑LXHH
†
Output level before the indicated steady-state
input conditions were established
(OEB
= L)
= L)
OUTPUT
OUTPUTS
†
0
†
0
†
2B
0
A
†
0
†
0
†
0
†
0
L
H
†
0
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
29
CLK
2
OEB1
56
OEB2
SN74ALVCH16269
12-BIT TO 24-BIT REGISTERED BUS EXCHANGER
WITH 3-STATE OUTPUTS
SCES019I – JULY 1995 – REVISED SEPTEMBER 1999
C1
1D
C1
1D
CLKENA1
CLKENA2
SEL
OEA
A1
30
55
28
1
8
C1
1D
C1
1D
C1
1D
1 of 12 Channels
G1
1
1
CE
C1
1D
23
1B1
6
2B1
CE
C1
1D
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN74ALVCH16269
IOHHigh-level output current
mA
IOLLow-level output current
mA
12-BIT TO 24-BIT REGISTERED BUS EXCHANGER
WITH 3-STATE OUTPUTS
SCES019I – JULY 1995 – REVISED SEPTEMBER 1999
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. This value is limited to 4.6 V maximum.
3. The package thermal impedance is calculated in accordance with JESD 51.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONSV
IOH = –100 µA1.65 V to 3.6 V VCC–0.2
IOH = –4 mA1.65 V1.2
IOH = –6 mA2.3 V2
V
OH
IOH = –12 mA
IOH = –24 mA3 V2
IOL = 100 µA1.65 V to 3.6 V0.2
IOL = 4 mA1.65 V0.45
OL
I
I
I
I(hold)
§
I
OZ
I
CC
∆I
CC
C
C
†
All typical values are at VCC = 3.3 V, TA = 25°C.
‡
This is the bus-hold maximum dynamic current. It is the minimum overdrive current required to switch the input from one state to another.
§
For I/O ports, the parameter IOZ includes the input leakage current.
Control inputsVI = VCC or GND3.3 V3.5pF
i
A or B portsVO = VCC or GND3.3 V9pF
io
IOL = 6 mA2.3 V0.4
= 12
OL
IOL = 24 mA3 V0.55
VI = VCC or GND3.6 V±5µA
VI = 0.58 V1.65 V25
VI = 1.07 V1.65 V–25
VI = 0.7 V2.3 V45
VI = 1.7 V2.3 V–45
VI = 0.8 V3 V75
VI = 2 V3 V–75
VI = 0 to 3.6 V
VO = VCC or GND3.6 V±10µA
VI = VCC or GND,IO = 03.6 V40µA
One input at VCC – 0.6 V,Other inputs at VCC or GND3 V to 3.6 V750µA
‡
CC
2.3 V1.7
2.7 V2.2
3 V2.4
2.3 V0.7
2.7 V0.4
3.6 V±500
MINTYP†MAXUNIT
V
µA
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN74ALVCH16269
(INPUT)
(OUTPUT)
tpdCLK
ns
t
CLK
ns
t
CLK
ns
PARAMETER
TEST CONDITIONS
UNIT
C
C
50 pF
pF
12-BIT TO 24-BIT REGISTERED BUS EXCHANGER
WITH 3-STATE OUTPUTS
SCES019I – JULY 1995 – REVISED SEPTEMBER 1999
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (see Figures 1 through 3)
f
clock
t
w
t
su
t
h
†
This information was not available at the time of publication.
Clock frequency
Pulse duration, CLK high or low
A data before CLK↑
B data before CLK↑
Setup time
Hold time
SEL
before CLK↑
CLKENA1 or CLKENA2 before CLK↑
OE before CLK↑
A data after CLK↑
B data after CLK↑
SEL
after CLK↑
CLKENA1 or CLKENA2 after CLK↑
OE after CLK↑
VCC = 1.8 V
MINMAXMINMAXMINMAXMINMAX
†
†
†
†
†
†
†
†
†
†
†
VCC = 2.5 V
± 0.2 V
†
3.33.33.3ns
221.7
2.22.11.8
1.61.61.3
11.20.9
1.51.61.3
0.70.60.6
0.70.60.6
1.10.70.7
10.81.1
0.80.80.8
VCC = 2.7 V
135135135MHz
VCC = 3.3 V
± 0.3 V
UNIT
ns
ns
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
PARAMETER
f
max
en
dis
†
This information was not available at the time of publication.
operating characteristics, T
Power dissipation
p
capacitance
pd
per exchanger
†
This information was not available at the time of publication.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN74ALVCH16269
12-BIT TO 24-BIT REGISTERED BUS EXCHANGER
WITH 3-STATE OUTPUTS
SCES019I – JULY 1995 – REVISED SEPTEMBER 1999
PARAMETER MEASUREMENT INFORMATION
= 2.5 V ± 0.2 V
V
CC
2 × V
CC
Open
GND
From Output
Under Test
CL = 30 pF
(see Note A)
500 Ω
500 Ω
S1
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 2. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 50 pF
(see Note A)
12-BIT TO 24-BIT REGISTERED BUS EXCHANGER
SCES019I – JULY 1995 – REVISED SEPTEMBER 1999
PARAMETER MEASUREMENT INFORMATION
= 2.7 V AND 3.3 V ± 0.3 V
V
CC
6 V
500 Ω
500 Ω
S1
Open
GND
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
SN74ALVCH16269
WITH 3-STATE OUTPUTS
Open
6 V
GND
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
Output
PROPAGATION DELAY TIMES
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
VOLTAGE WAVEFORMS
and t
PHZ
and t
PZH
and t
PHL
1.5 V
t
t
PLH
h
.
dis
su
1.5 V1.5 V
are the same as t
are the same as ten.
are the same as tpd.
t
PHL
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
V
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PZL
1.5 V
t
PZH
1.5 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
2.7 V
0 V
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
Figure 3. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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