ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Latch-Up Performance Exceeds 250 mA Per
JESD 17
D
Package Options Include Plastic
Small-Outline (D), Thin Very Small-Outline
D, DGV, OR PW PACKAGE
(TOP VIEW)
1A
1
1B
2
1Y
3
2A
4
2B
5
2Y
6
GND
7
(DGV), and Thin Shrink Small-Outline (PW)
Packages
description
This quadruple 2-input positive-OR gate is designed for 1.65-V to 3.6-V VCC operation.
The SN74ALVC32 performs the Boolean function Y+A • B or Y+A)B in positive logic.
The SN74ALVC32 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each gate)
INPUTS
AB
HXH
XHH
LLL
OUTPUT
Y
14
13
12
11
10
V
CC
4B
4A
4Y
3B
3A
9
3Y
8
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
1A
1B
2A
2B
3A
3B
4A
4B
1
2
4
5
9
10
12
13
≥ 1
logic diagram, each gate (positive logic)
A
B
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
3
1Y
6
2Y
8
3Y
11
4Y
Y
EPIC is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2000, Texas Instruments Incorporated
1
SN74ALVC32
IOHHigh-level output current
mA
IOLLow-level output current
mA
QUADRUPLE 2-INPUT POSITIVE-OR GATE
SCES108E – JULY 1997 – REVISED MARCH 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. This value is limited to 4.6 V maximum.
3. The package thermal impedance is calculated in accordance with JESD 51.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONS
IOH = –100 µA1.65 V to 3.6 V VCC–0.2
IOH = –4 mA1.65 V1.2
IOH = –6 mA2.3 V2
V
OH
IOH = –12 mA
IOH = –24 mA3 V2
IOL = 100 µA1.65 V to 3.6 V0.2
IOL = 4 mA1.65 V0.45
OL
I
I
I
CC
∆I
CC
C
†
All typical values are at VCC = 3.3 V, TA = 25°C.
i
IOL = 6 mA2.3 V0.4
= 12
OL
IOL = 24 mA3 V0.55
VI = VCC or GND3.6 V±5µA
VI = VCC or GND,IO = 03.6 V10µA
One input at VCC – 0.6 V,Other inputs at VCC or GND3 V to 3.6 V750µA
VI = VCC or GND3.3 V4pF
V
CC
2.3 V1.7
2.7 V2.2
3 V2.4
2.3 V0.7
2.7 V0.4
MIN TYP†MAXUNIT
V
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (see Figures 1 through 3)
PARAMETER
t
pd
FROM
A or B
TO
VCC = 1.8 V
± 0.15 V
MINMAXMINMAXMINMAXMINMAX
Y
14.713.12.912.8ns
VCC = 2.5 V
± 0.2 V
VCC = 2.7 V
VCC = 3.3 V
± 0.3 V
UNIT
operating characteristics, T
PARAMETER
C
Power dissipation capacitance per gateCL = 0,f = 10 MHz232426pF
pd
= 25°C
A
TEST CONDITIONS
VCC = 1.8 V
± 0.15 V
TYPTYPTYP
VCC = 2.5 V
± 0.2 V
VCC = 3.3 V
± 0.3 V
UNIT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN74ALVC32
QUADRUPLE 2-INPUT POSITIVE-OR GATE
SCES108E – JULY 1997 – REVISED MARCH 2000
PARAMETER MEASUREMENT INFORMATION
V
= 1.8 V ± 0.15 V
CC
2 × V
From Output
Under Test
CL = 30 pF
(see Note A)
1 kΩ
1 kΩ
S1
Open
GND
CC
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
Open
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 1. Load Circuit and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
CL = 30 pF
(see Note A)
QUADRUPLE 2-INPUT POSITIVE-OR GATE
SCES108E – JULY 1997 – REVISED MARCH 2000
PARAMETER MEASUREMENT INFORMATION
= 2.5 V ± 0.2 V
V
CC
2 × V
500 Ω
500 Ω
S1
Open
GND
CC
TESTS1
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
Open
2 × V
GND
SN74ALVC32
CC
LOAD CIRCUIT
Timing
Input
t
Data
Input
Input
t
PLH
Output
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2 ns, tf≤2 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
PLZ
F. t
PZL
G. t
PLH
VCC/2
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VCC/2VCC/2
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
and t
PHZ
and t
PZH
and t
PHL
VCC/2
t
su
are the same as t
are the same as ten.
are the same as tpd.
h
VCC/2
VCC/2VCC/2
.
dis
t
PHL
V
0 V
V
0 V
V
0 V
V
V
CC
CC
CC
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 2 × V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
CC
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VCC/2
t
w
V
0 V
V
0 V
V
V
V
0 V
CC
CC
CC
OL
OH
VCC/2VCC/2
VCC/2VCC/2
t
PLZ
VOL + 0.15 V
t
PHZ
VOH – 0.15 V
Figure 2. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN74ALVC32
QUADRUPLE 2-INPUT POSITIVE-OR GATE
SCES108E – JULY 1997 – REVISED MARCH 2000
PARAMETER MEASUREMENT INFORMATION
V
= 2.7 V AND 3.3 V ± 0.3 V
CC
From Output
Under Test
CL = 50 pF
(see Note A)
Timing
Input
Data
Input
Input
t
PLH
Output
500 Ω
500 Ω
LOAD CIRCUIT
1.5 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
t
h
S1
t
PHL
6 V
GND
2.7 V
0 V
2.7 V
0 V
2.7 V
0 V
V
V
Open
OH
OL
Input
Output
Control
(low-level
enabling)
Output
Waveform 1
S1 at 6 V
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
TESTS1
t
w
1.5 V
1.5 V
Open
6 V
GND
1.5 V1.5 V
t
pd
t
PLZ/tPZL
t
PHZ/tPZH
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PZL
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
2.7 V
0 V
2.7 V
0 V
3 V
V
OL
V
OH
0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR≤10 MHz, ZO = 50 Ω, tr≤2.5 ns, tf≤2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
G. t
PLZ
PZL
PLH
and t
and t
and t
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
dis
Figure 3. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
.
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
Customers are responsible for their applications using TI components.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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