Datasheet SN74ALS994DW, SN74ALS994NT Datasheet (Texas Instruments)

SN74ALS994
10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A – OCTOBER 1984 – REVISED JANUARY 1995
3-State I/O-Type Read-Back Inputs
True Logic Outputs
Package Options Include Plastic
Small-Outline (DW) Packages and Standard Plastic (NT) 300-mil DIPs
description
This 10-bit latch is designed specifically for storing the contents of the input data bus and providing the capability of reading back the stored data onto the input data bus.
The ten latches are transparent D-type latches. While the latch-enable (LE) input is high, the Q outputs follow the data (D) inputs.
Read back is provided through the output-enable (OERB the output of the data latches passes back onto the input data bus. When OERB data latches is isolated from the D inputs. OERB
does not affect the internal operation of the latches; however ,
precautions should be taken to avoid a bus conflict. The SN74ALS994 is characterized for operation from 0°C to 70°C.
logic symbol
) input. When OERB is taken low, the data present at
DW OR NT PACKAGE
(TOP VIEW)
OERB
1D 2D 3D 4D 5D 6D 7D 8D 9D
10D
GND
1 2 3 4 5 6 7 8 9 10 11 12
is taken high, the output of the
24 23 22 21 20 19 18 17 16 15 14 13
V
CC
1Q 2Q 3Q 4Q 5Q 6Q 7Q 8Q 9Q 10Q LE
LE
1D
2D 3D 4D 5D 6D 7D 8D 9D
10D
1 13
2
3 4 5 6 7 8 9 10
11
OERB
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
EN2 C1
1D
2
23
22 21 20 19 18 17 16 15 14
1Q
2Q 3Q 4Q 5Q 6Q 7Q 8Q 9Q 10Q
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 1995, Texas Instruments Incorporated
2–1
SN74ALS994 10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A – OCTOBER 1984 – REVISED JANUAR Y 1995
logic diagram (positive logic)
timing diagram
Data Bus
LE
OERB
OERB
1
13
LE
223
1D
To Nine Other Channels
Input Data Read Back Input Data
t
su
t
su
t
h
1D C1
t
dis
1Q
t
pd
Q
This setup time ensures that the read-back circuit will not create a conflict on the input data bus.
t
pd
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V Input voltage, V
Voltage applied to D inputs 5.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
(OERB and LE) 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A
2–2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
SN74ALS994
IOHHigh-level output current
mA
IOLLow-level output current
mA
tsuSetup time
ns
V
V
D
V
V
V
V
Q
V
V
I
V
V
mA
I
V
V
V
A
I
V
V
V
mA
I
CC
mA
10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A – OCTOBER 1984 – REVISED JANUARY 1995
recommended operating conditions
MIN NOM MAX UNIT
V
CC
V
IH
V
IL
t
w
t
h
T
A
This setup time ensures that the read-back circuit will not create a conflict on the input data bus.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
V
IK
OH
OL
I
IH
IL
I
O
CC
All typical values are at VCC = 5 V, TA = 25°C.
§
For I/O ports (QA thru QH), the parameters IIH and IIL include the off-state output current.
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
Supply voltage 4.5 5 5.5 V High-level input voltage 2 V Low-level input voltage 0.8 V
p
p
Pulse duration, LE high 10 ns
p
Hold time, data after LE 5 ns Operating free-air temperature 0 70 °C
PARAMETER TEST CONDITIONS MIN TYP‡MAX UNIT
VCC = 4.5 V, II = –18 mA –1.2 V
All outputs VCC = 4.5 V to 5.5 V, IOH = – 0.4 mA VCC –2
VCC = 4.5 V, IOH = – 2.6 mA 2.4 3.2
= 4.5
CC
= 4.5
CC
= 5.5
CC
= 5.5 V,
CC
= 5.5 V,
CC
VCC = 5.5 V, VO = 2.25 V –30 –112 mA VCC = 5.5 V,
OERB high
Q
OERB, LE D inputs OERB, LE D inputs OERB, LE D inputs
§
§
Q –2.6 D –0.4 Q 24 D 8
Data before LE 10 Data before OERB
IOL = 4 mA 0.25 0.4 IOL = 8 mA 0.35 0.5 IOL = 12 mA 0.25 0.4 IOL = 24 mA 0.35 0.5 VI = 7 V 0.1 VI = 5.5 V 0.1
= 2.7
I
= 0.4
I
Q outputs high 30 50 Q outputs low 52 82
10
–0.1 –0.1
20 20
µ
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
2–3
SN74ALS994
()
()
D
Q
ns
LE
Q
ns
OERB
D
ns
10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A – OCTOBER 1984 – REVISED JANUAR Y 1995
switching characteristics (see Figure 1)
VCC = 4.5 V to 5.5 V,
PARAMETER
t
PLH
t
PHL
t
PLH
t
PHL
t
en
§
t
PZH
PHZ
or t
or t
dis
PZL
PLZ
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
ten = t
§
t
= t
dis
FROM
(INPUT)
TO
(OUTPUT)
CL = 50 pF, TA = MIN to MAX
MIN MAX
3 14 4 18 6 21 8 27 4 21 2 16
UNIT
2–4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN74ALS994
10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A – OCTOBER 1984 – REVISED JANUARY 1995
PARAMETER MEASUREMENT INFORMATION
7 V
S1
1 k
Test Point
C
L
500
From Output
Under Test
(see Note A)
C
L
Test Point
1 k
Timing
Input
Data
Input
Input
In-Phase
Output
Out-of-Phase
Output
(see Note B)
LOAD CIRCUIT FOR Q OUTPUTS
1.3 V
t
t
su
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.3 V 1.3 V
t
PLH
t
PHL
1.3 V 1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
h
1.3 V1.3 V
1.3 V1.3 V
t
3.5 V
0.3 V
3.5 V
0.3 V
t
PHL
PLH
3.5 V
0.3 V
V
OH
V
OL
V
OH
V
OL
LOAD CIRCUIT FOR D OUTPUTS
High-Level
Pulse
Low-Level
Pulse
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note C)
Waveform 2
S1 Open
(see Note C)
t
PZL
t
PZH
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
1.3 V 1.3 V
t
w
1.3 V 1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V1.3 V
1.3 V
t
PHZ
1.3 V
VOLTAGE WAVEFORMS
t
PLZ
3.5 V
0.3 V
3.5 V
0.3 V
0.3 V
0.3 V
3.5 V
0.3 V
[
3.5 V
V
OL
V
OH
[
0 V
NOTES: A. CL includes probe and jig capacitance.
B. When measuring propagation delay times of 3-state outputs, switch S1 is open. C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. All input pulses have the following characteristics: PRR 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
2–5
SN74ALS994 10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A OCTOBER 1984 – REVISED JANUAR Y 1995
2–6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
Loading...