Small-Outline (DW) Packages and Standard
Plastic (NT) 300-mil DIPs
description
This 10-bit latch is designed specifically for storing
the contents of the input data bus and providing
the capability of reading back the stored data onto
the input data bus.
The ten latches are transparent D-type latches.
While the latch-enable (LE) input is high, the
Q outputs follow the data (D) inputs.
Read back is provided through the output-enable (OERB
the output of the data latches passes back onto the input data bus. When OERB
data latches is isolated from the D inputs. OERB
does not affect the internal operation of the latches; however ,
precautions should be taken to avoid a bus conflict.
The SN74ALS994 is characterized for operation from 0°C to 70°C.
logic symbol
†
) input. When OERB is taken low, the data present at
DW OR NT PACKAGE
(TOP VIEW)
OERB
1D
2D
3D
4D
5D
6D
7D
8D
9D
10D
GND
1
2
3
4
5
6
7
8
9
10
11
12
is taken high, the output of the
24
23
22
21
20
19
18
17
16
15
14
13
V
CC
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
9Q
10Q
LE
LE
1D
2D
3D
4D
5D
6D
7D
8D
9D
10D
1
13
2
3
4
5
6
7
8
9
10
11
OERB
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
EN2
C1
1D
2
23
22
21
20
19
18
17
16
15
14
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
9Q
10Q
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
‡
ten = t
§
t
= t
dis
FROM
(INPUT)
TO
(OUTPUT)
CL = 50 pF,
TA = MIN to MAX
MINMAX
314
418
621
827
421
216
UNIT
†
2–4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN74ALS994
10-BIT D-TYPE TRANSPARENT READ-BACK LATCH
SDAS237A – OCTOBER 1984 – REVISED JANUARY 1995
PARAMETER MEASUREMENT INFORMATION
7 V
S1
1 kΩ
Test
Point
C
L
500 Ω
From Output
Under Test
(see Note A)
C
L
Test
Point
1 kΩ
Timing
Input
Data
Input
Input
In-Phase
Output
Out-of-Phase
Output
(see Note B)
LOAD CIRCUIT FOR Q OUTPUTS
1.3 V
t
t
su
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.3 V1.3 V
t
PLH
t
PHL
1.3 V1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
h
1.3 V1.3 V
1.3 V1.3 V
t
3.5 V
0.3 V
3.5 V
0.3 V
t
PHL
PLH
3.5 V
0.3 V
V
OH
V
OL
V
OH
V
OL
LOAD CIRCUIT FOR D OUTPUTS
High-Level
Pulse
Low-Level
Pulse
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note C)
Waveform 2
S1 Open
(see Note C)
t
PZL
t
PZH
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
1.3 V1.3 V
t
w
1.3 V1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V1.3 V
1.3 V
t
PHZ
1.3 V
VOLTAGE WAVEFORMS
t
PLZ
3.5 V
0.3 V
3.5 V
0.3 V
0.3 V
0.3 V
3.5 V
0.3 V
[
3.5 V
V
OL
V
OH
[
0 V
NOTES: A. CL includes probe and jig capacitance.
B. When measuring propagation delay times of 3-state outputs, switch S1 is open.
C. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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