Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs
description
These octal bus transceivers are designed for
asynchronous two-way communication between
data buses. The control-function implementation
minimizes external timing requirements.
The devices allow data transmission from the
A bus to the B bus or from the B bus to the A bus
depending upon the logic level at the
direction-control (DIR) input. The output-enable
(OE
) input can be used to disable the device so
that the buses are effectively isolated.
The -1 version of the SN74ALS245A is identical to
the standard version, except that the
recommended maximum I
48 mA. There is no -1 version of the
SN54ALS245A.
The SN54ALS245A and SN54AS245 are
characterized for operation over the full military
temperature range of –55°C to 125°C. The
SN74ALS245A and SN74AS245 are
characterized for operation from 0°C to 70°C.
is increased to
OL
SN54ALS245A, SN54AS245 ...J PACKAGE
SN74ALS245A, SN74AS245 . . . DW OR N PACKAGE
SN54ALS245A, SN54AS245 . . . FK PACKAGE
A3
A4
A5
A6
A7
(TOP VIEW)
1
DIR
2
A1
3
A2
4
A3
5
A4
6
A5
7
A6
8
A7
9
A8
10
GND
(TOP VIEW)
A2A1DIR
3212019
4
5
6
7
8
910111213
A8
B8
20
19
18
17
16
15
14
13
12
11
CC
V
B7
V
OE
B1
B2
B3
B4
B5
B6
B7
B8
OE
18
17
16
15
14
B6
CC
B1
B2
B3
B4
B5
GND
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
FUNCTION TABLE
INPUTS
OEDIR
LLB data to A bus
LHA data to B bus
HXIsolation
Copyright 1994, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54ALS245A, SN54AS245, SN74ALS245A, SN74AS245
UNIT
IOLLow-level output current
mA
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SDAS272 – NOVEMBER 1994
19
1
2
3
4
5
6
7
8
9
†
G3
3EN1[BA]
3EN2[AB]
1
2
18
17
16
15
14
13
12
11
logic diagram (positive logic)
1
DIR
B1
B2
B3
B4
B5
B6
B7
B8
A1
2
To Seven Other Channels
19
18
OE
B1
logic symbol
OE
DIR
A1
A2
A3
A4
A5
A6
A7
A8
†
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
FROM
(INPUT)
TO
(OUTPUT)
R1 = 500 Ω,
R2 = 500 Ω,
TA = MIN to MAX
SN54AS245SN74AS245
MINMAXMINMAX
29.527.5
2927
21129
210.528.5
27.525.5
21229.5
SDAS272 – NOVEMBER 1994
†
UNIT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54ALS245A, SN54AS245, SN74ALS245A, SN74AS245
OCTAL BUS TRANSCEIVERS
WITH 3-STATE OUTPUTS
SDAS272 – NOVEMBER 1994
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
V
CC
R
L
From Output
Under Test
(see Note A)
C
L
Test
Point
R
L
From Output
Under Test
(see Note A)
Test
Point
C
L
From Output
Under Test
(see Note A)
7 V
RL = R1 = R2
S1
R1
C
L
Test
Point
R2
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
Timing
Input
t
su
Data
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
t
PZL
t
PZH
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
VOLTAGE WAVEFORMS
1.3 V
t
PHZ
1.3 V
1.3 V
t
1.3 V1.3 V
1.3 V1.3 V
FOR OPEN-COLLECTOR OUTPUTS
h
t
PLZ
LOAD CIRCUIT
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
[
3.5 V
V
OL
0.3 V
V
OH
0.3 V
[
0 V
High-Level
Low-Level
Out-of-Phase
(see Note C)
Pulse
Pulse
Input
In-Phase
Output
Output
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
1.3 V1.3 V
t
w
1.3 V1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V1.3 V
t
PLH
t
PHL
1.3 V1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.3 V1.3 V
t
PHL
t
PLH
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
V
V
V
V
OH
OL
OH
OL
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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