Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These synchronous, presettable, 4-bit decade
and binary counters feature an internal carry
look-ahead circuitry for application in high-speed
counting designs. The SN54ALS162B is a 4-bit
decade counter. The ′ALS161B, ′ALS163B,′AS161, and ′AS163 are 4-bit binary counters.
Synchronous operation is provided by having all
flip-flops clocked simultaneously so that the
outputs change coincidentally with each other
when instructed by the count-enable (ENP, ENT)
inputs and internal gating. This mode of operation
eliminates the output counting spikes normally
associated with asynchronous (ripple-clock)
counters. A buffered clock (CLK) input triggers the
four flip-flops on the rising (positive-going) edge of
the clock input waveform.
These counters are fully programmable; they may
be preset to any number between 0 and 9 or 15.
Because presetting is synchronous, setting up a
low level at the load (LOAD
counter and causes the outputs to agree with the
setup data after the next clock pulse, regardless of
the levels of the enable inputs.
) input disables the
SN54ALS161B, SN54ALS162B, SN54ALS163B, SN54AS161,
SN54ALS161B, SN54ALS162B, SN54ALS163B, SN54AS161,
SN54AS163 ...J PACKAGE
SN74ALS161B, SN74ALS163B, SN74AS161,
SN74AS163 ...D OR N PACKAGE
SN54AS163 . . . FK PACKAGE
A
B
NC
C
D
NC – No internal connection
(TOP VIEW)
CLR
1
CLK
2
A
3
B
4
C
5
D
6
ENP
7
GND
8
(TOP VIEW)
CLK
3212019
4
5
6
7
8
910111213
ENP
CLR
GND
NC
NC
16
15
14
13
12
11
10
9
CC
V
LOAD
V
CC
RCO
Q
A
Q
B
Q
C
Q
D
ENT
LOAD
RCO
18
17
16
15
14
ENT
Q
Q
NC
Q
Q
A
B
C
D
The clear function for the ′ALS161B and ′AS161 is asynchronous. A low level at the clear (CLR
four of the flip-flop outputs low, regardless of the levels of the CLK, LOAD
for the SN54ALS162B, ′ALS163B, and ′AS163 is synchronous, and a low level at CLR
, or enable inputs. The clear function
sets all four of the flip-flop
) input sets all
outputs low after the next clock pulse, regardless of the levels of the enable inputs. This synchronous clear
allows the count length to be modified easily by decoding the Q outputs for the maximum count desired. The
active-low output of the gate used for decoding is connected to CLR
to synchronously clear the counter to
0000 (LLLL).
The carry look-ahead circuitry provides for cascading counters for n-bit synchronous applications without
additional gating. ENP and ENT inputs and a ripple-carry (RCO) output are instrumental in accomplishing this
function. Both ENP and ENT must be high to count, and ENT is fed forward to enable RCO. RCO, thus enabled,
produces a high-level pulse while the count is maximum (9 or 15 with Q
high). The high-level overflow
A
ripple-carry pulse can be used to enable successive cascaded stages. Transitions at ENP or ENT are allowed,
regardless of the level of CLK.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
These counters feature a fully independent clock circuit. Changes at control inputs (ENP, ENT, or LOAD) that
modify the operating mode have no effect on the contents of the counter until clocking occurs. The function of
the counter (whether enabled, disabled, loading, or counting) is dictated solely by the conditions meeting the
stable setup and hold times.
The SN54ALS161B, SN54ALS162B, SN54ALS163B, SN54AS161, and SN54AS163 are characterized for
operation over the full military temperature range of – 55°C to 125°C. The SN74ALS161B, SN74ALS163B,
SN74AS161, and SN74AS163 are characterized for operation from 0°C to 70°C.
logic symbols
′ALS161B AND ′AS161 BINARY COUNTERS
1
CLR
ENT
ENP
CLK
9
10
7
2
3
A
4
B
5
C
6
D
LOAD
†
WITH DIRECT CLEAR
CTRDIV16
CT=0
M1
M2
G3
G4
1, 5D
3CT=15
C5/2,3,4+
[1]
[2]
[4]
[8]
LOAD
CLR
ENT
ENP
CLK
′ALS163B AND ′AS163 BINARY COUNTERS
WITH SYNCHRONOUS CLEAR
1
CLR
ENT
ENP
CLK
9
10
7
2
3
A
4
B
5
C
6
D
15
14
13
12
11
15
RCO
14
Q
A
13
Q
B
12
Q
C
11
Q
D
SN54ALS162B DECADE COUNTER
WITH SYNCHRONOUS CLEAR
1
9
10
7
2
3
A
4
B
5
C
6
D
CTRDIV10
5CT=0
M1
M2
G3
G4
C5/2,3,4+
1, 5D
LOAD
3CT=9
[1]
[2]
[4]
[8]
CTRDIV16
5CT=0
M1
M2
G3
G4
C5/2,3,4+
1, 5D
RCO
Q
A
Q
B
Q
C
Q
D
3CT=15
[1]
[2]
[4]
[8]
15
14
13
12
11
RCO
Q
A
Q
B
Q
C
Q
D
†
These symbols are in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
This application demonstrates how the ripple-mode carry circuit (see Figure 1) and the carry-look-ahead circuit
(see Figure 2) can be used to implement a high-speed n-bit counter. The SN54ALS162B counts in BCD. The
′ALS161B, ′AS161, ′ALS163B, and ′AS163 count in binary. When additional stages are added, the f
decreases in Figure 1, but remains unchanged in Figure 2.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 3. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
13
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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