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SN74ALS00ADBR
Datasheet
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Texas Instruments JM38510-37001BCA, JM38510-37001B2A, SN54ALS00AJ, SN54AS00J, SN74ALS00AD Datasheet

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SN54ALS00A, SN54AS00, SN74ALS00A, SN74AS00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SDAS187A – APRIL 1982 – REVISED DECEMBER 1994
• Package Options Include Plastic
description
These devices contain four independent 2-input positive-NAND gates. They perform the Boolean functions Y = A
The SN54ALS00A and SN54AS00 are characterized for operation over the full military temperature range of –55°C to 125°C. The SN74ALS00A and SN74AS00 are characterized for operation from 0°C to 70°C.
logic symbol
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
• B or Y = A + B in positive logic.
FUNCTION TABLE (each gate)
INPUTS
A B
H H L
L XH
XLH
OUTPUT
Y
†
&
SN54ALS00A, SN54AS00 ...J PACKAGE
SN74ALS00A, SN74AS00 ...D OR N PACKAGE
SN54ALS00A, SN54AS00 . . . FK PACKAGE
1Y
NC
2A
NC
2B
3
1Y
6
2Y
8
3Y
11
4Y
NC – No internal connection
1A 1B 1Y 2A 2B 2Y
GND
3 2 1 20 19
4 5 6 7 8
9 10 11 12 13
(TOP VIEW)
1
14
2
13
3
12
4
11
5
10 6 7
(TOP VIEW)
1B1ANC
2Y
NC
GND
V
CC
4B 4A 4Y 3B 3A
9
3Y
8
CC
V
4B
18
4A
17
NC
16
4Y
15
NC
14
3B
3Y
3A
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1994, Texas Instruments Incorporated
1
SN54ALS00A, SN54AS00, SN74ALS00A, SN74AS00
UNIT
VILLow-level input voltage
V
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SDAS187A – APRIL 1982 – REVISED DECEMBER 1994
logic diagram (positive logic)
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
Pin numbers shown are for the D, J, and N packages.
3
1Y
6
2Y
8
3Y
11
4Y
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V Input voltage, V Operating free-air temperature range, T
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
: SN54ALS00A –55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A
SN74ALS00A 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
recommended operating conditions
SN54ALS00A SN74ALS00A
MIN NOM MAX MIN NOM MAX
V
CC
V
IH
I
OH
I
OL
T
A
‡
Applies over temperature range –55°C to 70°C
§
Applies over temperature range 70°C to 125°C
Supply voltage 4.5 5 5.5 4.5 5 5.5 V High-level input voltage 2 2 V
‡
p
High-level output current –0.4 –0.4 mA Low-level output current 4 8 mA Operating free-air temperature –55 125 0 70 °C
0.8
0.7
§
0.8
†
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ALS00A, SN54AS00, SN74ALS00A, SN74AS00
PARAMETER
TEST CONDITIONS
UNIT
V
V
4.5 V
V
(
)
(
)
(INPUT)
(OUTPUT)
A or B
Y
ns
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SDAS187A – APRIL 1982 – REVISED DECEMBER 1994
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
SN54ALS00A SN74ALS00A
MIN TYP†MAX MIN TYP†MAX
V
IK
V
OH
OL
I
I
I
IH
I
IL
‡
I
O
I
CCH
I
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
CCL
switching characteristics (see Figure 1)
PARAMETER
t
PLH
t
§
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
PHL
VCC = 4.5 V, II = –18 mA –1.2 –1.5 V VCC = 4.5 V to 5.5 V, IOH = –0.4 mA VCC –2 VCC –2 V
=
CC
VCC = 5.5 V, VI = 7 V 0.1 0.1 mA VCC = 5.5 V, VI = 2.7 V 20 20 µA VCC = 5.5 V, VI = 0.4 V –0.1 –0.1 mA VCC = 5.5 V, VO = 2.25 V –20 –112 –30 –112 mA VCC = 5.5 V, VI = 0 0.5 0.85 0.5 0.85 mA VCC = 5.5 V, VI = 4.5 V 1.5 3 1.5 3 mA
FROM INPUT
IOL = 4 mA 0.25 0.4 0.25 0.4 IOL = 8 mA 0.35 0.5
VCC = 4.5 V to 5.5 V, CL = 50 pF,
TO
OUTPUT
RL = 500 Ω, TA = MIN to MAX
SN54ALS00A SN74ALS00A
MIN MAX MIN MAX
3 15 3 11 2 9 2 8
§
UNIT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54ALS00A, SN54AS00, SN74ALS00A, SN74AS00
UNIT
PARAMETER
TEST CONDITIONS
UNIT
(
)
(
)
(INPUT)
(OUTPUT)
A or B
Y
ns
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SDAS187A – APRIL 1982 – REVISED DECEMBER 1994
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V Input voltage, V Operating free-air temperature range, T
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
CC
7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I
: SN54AS00 –55°C to 125°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
A
†
SN74AS00 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
SN54AS00 SN74AS00
MIN NOM MAX MIN NOM MAX
V V V I I T
CC IH
IL OH OL
A
Supply voltage 4.5 5 5.5 4.5 5 5.5 V High-level input voltage 2 2 V Low-level input voltage 0.8 0.8 V High-level output current –2 –2 mA Low-level output current 20 20 mA Operating free-air temperature –55 125 0 70 °C
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
SN54AS00 SN74AS00
MIN TYP‡MAX MIN TYP‡MAX
V
IK
V
OH
V
OL
I
I
I
IH
I
IL
§
I
O
I
CCH
I
‡
All typical values are at VCC = 5 V, TA = 25°C.
§
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, IOS.
CCL
VCC = 4.5 V, II = –18 mA –1.2 –1.2 V VCC = 4.5 V to 5.5 V, IOH = –2 mA VCC –2 VCC –2 V VCC = 4.5 V, IOL = 20 mA 0.35 0.5 0.35 0.5 V VCC = 5.5 V, VI = 7 V 0.1 0.1 mA VCC = 5.5 V, VI = 2.7 V 20 20 µA VCC = 5.5 V, VI = 0.4 V –0.5 –0.5 mA VCC = 5.5 V, VO = 2.25 V –30 –112 –30 –112 mA VCC = 5.5 V, VI = 0 2 3.2 2 3.2 mA VCC = 5.5 V, VI = 4.5 V 10.8 17.4 10.8 17.4 mA
switching characteristics (see Figure 1)
PARAMETER
t
PLH
t
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
4
PHL
FROM INPUT
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TO
OUTPUT
VCC = 4.5 V to 5.5 V, CL = 50 pF, RL = 500 Ω, TA = MIN to MAX
SN54AS00 SN74AS00
MIN MAX MIN MAX
1 5 1 4.5 1 5 1 4
UNIT
From Output
Under Test
(see Note A)
SN54ALS00A, SN54AS00, SN74ALS00A, SN74AS00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SDAS187A – APRIL 1982 – REVISED DECEMBER 1994
PARAMETER MEASUREMENT INFORMATION
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES
7 V
V
CC
S1
R
L
Test Point
C
L
R
L
From Output
Under Test
(see Note A)
Test Point
C
L
From Output
Under Test
(see Note A)
R1
C
L
RL = R1 = R2
Test Point
R2
LOAD CIRCUIT FOR
BI-STATE
TOTEM-POLE OUTPUTS
Timing
Input
t
su
Data
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
Output
Control
(low-level
enabling)
Waveform 1
S1 Closed
(see Note B)
Waveform 2
S1 Open
(see Note B)
t
PZL
t
PZH
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
VOLTAGE WAVEFORMS
1.3 V
t
PHZ
1.3 V
1.3 V
t
1.3 V1.3 V
1.3 V1.3 V
FOR OPEN-COLLECTOR OUTPUTS
h
t
PLZ
LOAD CIRCUIT
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
[
3.5 V
V
OL
0.3 V
V
OH
0.3 V
[
0 V
High-Level
Low-Level
Out-of-Phase
(see Note C)
Pulse
Pulse
Input
In-Phase
Output
Output
LOAD CIRCUIT
FOR 3-STATE OUTPUTS
1.3 V 1.3 V
t
w
1.3 V 1.3 V
VOLTAGE WAVEFORMS
PULSE DURATIONS
1.3 V 1.3 V
t
PLH
t
PHL
1.3 V 1.3 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.3 V1.3 V
t
PHL
t
PLH
3.5 V
0.3 V
3.5 V
0.3 V
3.5 V
0.3 V
V
V
V
V
OH
OL
OH
OL
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. When measuring propagation delay items of 3-state outputs, switch S1 is open. D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%. E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
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TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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