ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
description
The ’AHCT373 devices are octal-transparent
D-type latches. When the latch-enable (LE) input
is high, the Q outputs follow the data (D) inputs.
When LE is low, the Q outputs are latched at the
logic levels of the D inputs.
A buffered output-enable (OE
to place the eight outputs in either a normal logic
state (high or low) or the high-impedance state. In
the high-impedance state, the outputs neither
load nor drive the bus lines significantly. The
high-impedance state and increased drive
provide the capability to drive bus lines without
interface or pullup components.
) input can be used
SN74AHCT373 . . . DB, DGV, DW, N, OR PW PACKAGE
SN54AHCT373 ...J OR W PACKAGE
(TOP VIEW)
LE
20
19
18
17
16
15
14
13
12
11
V
CC
5Q
V
8Q
8D
7D
7Q
6Q
6D
5D
5Q
LE
8Q
18
17
16
15
14
5D
CC
8D
7D
7Q
6Q
6D
OE
1
1Q
2
1D
3
2D
4
2Q
5
6
3Q
7
3D
8
4D
9
4Q
10
GND
SN54AHCT373 . . . FK PACKAGE
(TOP VIEW)
1D1QOE
2D
2Q
3Q
3D
4D
3 2 1 20 19
4
5
6
7
8
9 10 11 12 13
4Q
GND
OE
does not affect the internal operations of the latches. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
T o ensure the high-impedance state during power up or power down, OE should be tied to V
through a pullup
CC
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
The SN54AHCT373 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74AHCT373 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each latch)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
INPUTS
OELED
LHHH
LHL L
LLX Q
HXXZ
OUTPUT
Q
0
Copyright 2000, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54AHCT373, SN74AHCT373
OCTAL TRANSPARENT D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCLS239K – OCTOBER 1995 – REVISED JANUARY 2000
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
OE
LE
1D
2D
3D
4D
5D
6D
7D
8D
1
11
3
4
7
8
13
14
17
18
EN
C1
1D
logic diagram (positive logic)
1
OE
11
LE
12
15
16
19
2
1Q
5
2Q
6
3Q
9
4Q
5Q
6Q
7Q
8Q
1D
3
To Seven Other Channels
C1
1D
2
1Q
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
IOH = –50 mA
IOH = –8 mA
IOL = 50 mA
IOL = 8 mA
VO = VCC or GND5.5 V±0.25±2.5±2.5
VI = VCC or GND0 V to 5.5 V±0.1±1*±1
VI = VCC or GND, IO = 05.5 V44040
One input at 3.4 V ,
†
Other inputs at VCC or GND
VI = VCC or GND5 V41010pF
VO = VCC or GND5 V9pF
I
I
I
∆I
C
C
OH
OL
OZ
I
CC
CC
i
o
, literature number SCBA004.
CC
5.5 V1.351.51.5mA
TA = 25°CSN54AHCT373 SN74AHCT373
MINTYPMAXMINMAXMINMAX
4.44.54.44.4
3.943.83.8
0.10.10.1
0.360.440.44
CC
0V
CC
V
m
A
m
A
m
A
timing requirements over recommended operating free-air temperature range, V
(unless otherwise noted) (see Figure 1)
TA = 25°CSN54AHCT373SN74AHCT373
MINMAXMINMAXMINMAX
t
w
t
su
t
h
Pulse duration, LE high6.56.56.5ns
Setup time, data before LE↓
Hold time, data after LE↓3.53.53.5ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1.51.51.5ns
= 5 V ± 0.5 V
CC
3
SN54AHCT373, SN74AHCT373
PARAMETER
UNIT
DQC
15 pF
ns
LEQC
15 pF
ns
OE
Q
C
pF
ns
OE
Q
C
15 pF
ns
DQC
pF
ns
LEQC
pF
ns
OE
Q
C
pF
ns
OE
Q
C
pF
ns
PARAMETER
UNIT
OCTAL TRANSPARENT D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCLS239K – OCTOBER 1995 – REVISED JANUARY 2000
switching characteristics over recommended operating free-air temperature range,
V
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
CC
FROMTOLOAD
(INPUT)(OUTPUT) CAPACITANCE
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
sk(o)
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
** On products compliant to MIL-PRF-38535, this parameter does not apply.
NOTE 4: Characteristics are for surface-mount packages only.
Quiet output, maximum dynamic V
Quiet output, minimum dynamic V
Quiet output, minimum dynamic V
High-level dynamic input voltage2V
Low-level dynamic input voltage0.8V
operating characteristics, V
C
Power dissipation capacitanceNo load,f = 1 MHz17pF
pd
= 5 V, C
CC
CC
PARAMETERTEST CONDITIONSTYPUNIT
= 50 pF, TA = 25°C (see Note 4)
L
OL
OL
OH
= 5 V, T
= 25°C
A
SN74AHCT373
MINTYPMAX
0.81.2V
–0.8–1.2V
4.1V
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN54AHCT373, SN74AHCT373
OCTAL TRANSPARENT D-TYPE LATCHES
WITH 3-STATE OUTPUTS
SCLS239K – OCTOBER 1995 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
V
Test
Point
C
L
From Output
Under Test
(see Note A)
C
L
RL = 1 kΩ
S1
CC
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open Drain
Open
V
CC
GND
V
CC
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
t
w
Input
Input
In-Phase
Output
Out-of-Phase
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PLH
50% V
CC
t
PHL
50% V
CC
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
3-STATE AND OPEN-DRAIN OUTPUTS
LOAD CIRCUIT FOR
3 V
0 V
3 V
0 V
t
PHL
V
t
PLH
CC
CC
OH
V
OL
V
OH
V
OL
50% V
50% V
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at V
(see Note B)
Waveform 2
(see Note B)
CC
Output
S1 at GND
1.5 V
t
CC
CC
h
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V1.5 V1.5 V
t
PZL
50% V
t
PZH
50% V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
3 V
0 V
3 V
0 V
3 V
0 V
≈V
V
OL
V
OH
≈0 V
CC
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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