ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
D
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
SN74AHCT273 . .. DB, DGV, DW, N, OR PW PACKAGE
SN54AHCT273 ...J OR W PACKAGE
(TOP VIEW)
CLR
GND
SN54AHCT273 . . . FK PACKAGE
2D
2Q
3Q
3D
4D
1
1Q
2
1D
3
2D
4
2Q
5
3Q
6
3D
7
4D
8
9
4Q
10
(TOP VIEW)
1D1QCLR
3 2 1 20 19
4
5
6
7
8
9 10 11 12 13
20
19
18
17
16
15
14
13
12
11
V
CC
8Q
8D
7D
7Q
6Q
6D
5D
5Q
CLK
CC
V
8Q
8D
18
7D
17
16
7Q
15
6Q
14
6D
description
4Q
GND
CLK
5Q
5D
These devices are positive-edge-triggered D-type
flip-flops with a direct clear (CLR) input.
Information at the data (D) inputs meeting the setup time requirements is transferred to the Q outputs on the
positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a particular voltage level and is not
directly related to the transition time of the positive-going pulse. When CLK is at either the high or low level, the
D input has no effect at the output.
The SN54AHCT273 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74AHCT273 is characterized for operation from –40°C to 85 °C.
FUNCTION TABLE
(each flip-flop)
INPUTS
CLKD
CLR
LXXL
H↑HH
H↑LL
HLXQ
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
OUTPUT
Q
0
EPIC is a trademark of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2000, Texas Instruments Incorporated
1
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
CLR
CLK
1D
2D
3D
4D
5D
6D
7D
8D
1
11
3
4
7
8
13
14
17
18
R
C1
1D
logic diagram (positive logic)
CLK
1D
347813141718
11
1D
C1
R
2D
1D
C1
R
3D
1D
R
C1
4D
5D
1D
C1
R
1D
R
C1
12
15
16
19
2
1Q
5
2Q
6
3Q
9
4Q
5Q
6Q
7Q
8Q
6D
1D
C1
R
7D
1D
R
C1
8D
1D
C1
R
1
CLR
256912151619
1Q
2Q
3Q
logic diagram, each flip-flop (positive logic)
C
D
CLK(I)
R
TG
C
C
TG
C
C
C
4Q
TG
5Q
C
C
C
TG
C
6Q
7Q
8Q
Q
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
UNIT
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54AHCT273, SN74AHCT273
PARAMETER
TEST CONDITIONS
V
UNIT
V
4.5 V
V
V
4.5 V
V
UNIT
twPulse duration
ns
t
Set
ns
PARAMETER
UNIT
f
MH
CLKQC
pF
ns
CLKQC
pF
ns
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
CC
OH
OL
I
I
I
CC
∆I
CC
C
i
* On products compliant to MIL-PRF-38535, this parameter is not production tested at VCC = 0 V.
†
This is the increase in supply current for each input at one of the specified TTL voltage levels rather than 0 V or VCC.
IOH = –50 mA
IOH = –8 mA
IOL = 50 mA
IOL = 8 mA
VI = VCC or GND0 V to 5.5 V±0.1±1*±1
VI = VCC or GND,IO = 05.5 V44040
One input at 3.4 V ,
‡
Other inputs at VCC or GND
VI = VCC or GND5 V2.51010pF
5.5 V1.351.51.5
timing requirements over recommended operating free-air temperature range, VCC = 5 V ± 0.5 V
(unless otherwise noted) (see Figure 1)
CLR low566
CLK high or low56.56.5
su
t
h
up time
Hold time, data after CLK↑000ns
Data before CLK↑
CLR
before CLK↑
TA = 25°CSN54AHCT273SN74AHCT273
MINTYPMAXMINMAXMINMAX
4.44.54.44.4
3.943.83.8
0.10.10.1
0.360.440.44
TA = 25°CSN54AHCT273SN74AHCT273
MINMAXMINMAXMINMAX
555
2.52.52.5
m
A
m
A
m
A
switching characteristics over recommended operating free-air temperature range,
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
V
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
max
t
PHL
t
PLH
t
PHL
t
PHL
t
PLH
t
PHL
t
sk(o)
** On products compliant to MIL-PRF-38535, this parameter is not production tested.
*** On products compliant to MIL-PRF-38535, this parameter does not apply.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
UNIT
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
noise characteristics, V
V
OL(P)
V
OL(V)
V
OH(V)
V
IH(D)
V
IL(D)
NOTE 4: Characteristics are for surface-mount packages only .
Quiet output, maximum dynamic V
Quiet output, minimum dynamic V
Quiet output, minimum dynamic V
High-level dynamic input voltage2V
Low-level dynamic input voltage0.8V
= 5 V, CL = 50 pF, TA = 25°C (see Note 4)
CC
OL
OL
OH
operating characteristics, TA = 25°C
PARAMETERTEST CONDITIONSTYPUNIT
C
Power dissipation capacitanceNo load,f = 1 MHz27pF
pd
SN74AHCT273
MINTYPMAX
0.76V
–0.48V
4.4V
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54AHCT273, SN74AHCT273
OCTAL D-TYPE FLIP-FLOPS
WITH CLEAR
SCLS375D – JUNE 1997 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
(see Note A)
Test
Point
C
L
From Output
Under Test
(see Note A)
C
V
RL = 1 kΩ
L
S1
CC
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open Drain
Open
V
CC
GND
V
CC
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
t
w
Input
Input
In-Phase
Output
Out-of-Phase
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. W aveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PLH
50% V
t
PHL
50% V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
3-STATE AND OPEN-DRAIN OUTPUTS
CC
CC
t
PHL
50% V
t
PLH
50% V
LOAD CIRCUIT FOR
Timing Input
3 V
0 V
3 V
0 V
V
OH
CC
V
V
CC
V
OL
OH
OL
(see Note B)
(see Note B)
Data Input
Output
Control
Output
Waveform 1
S1 at V
CC
Output
Waveform 2
S1 at GND
1.5 V
t
CC
CC
h
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V1.5 V1.5 V
t
PZL
50% V
t
PZH
50% V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
3 V
0 V
3 V
0 V
3 V
0 V
≈V
V
OL
V
OH
≈0 V
CC
Figure 1. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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