ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015
D
Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), Thin
Shrink Small-Outline (PW), and Ceramic
Flat (W) Packages, Ceramic Chip Carriers
(FK), and Standard Plastic (N) and Ceramic
(J) DIPs
description
The ’AHCT126 devices are quadruple bus buffer
gates featuring independent line drivers with
3-state outputs. Each output is disabled when the
associated output-enable (OE) input is low. When
OE is high, the respective gate passes the data
from the A input to its Y output.
T o ensure the high-impedance state during power
up or power down, OE should be tied to GND
through a pulldown resistor; the minimum value of
the resistor is determined by the current-sourcing
capability of the driver.
SN54AHCT126 ...J OR W PACKAGE
SN74AHCT126 . . . D, DB, DGV, N, OR PW PACKAGE
SN54AHCT126 . . . FK PACKAGE
1Y
NC
2OE
NC
2A
NC – No internal connection
(TOP VIEW)
1OE
1
1A
2
1Y
3
2OE
4
2A
5
6
2Y
GND
7
(TOP VIEW)
1A
3212019
4
5
6
7
8
910111213
2Y
1OE
GND
NC
NC
14
13
12
11
10
9
8
V
3Y
CC
V
CC
4OE
4A
4Y
3OE
3A
3Y
4OE
18
17
16
15
14
3A
4A
NC
4Y
NC
3OE
The SN54AHCT126 is characterized for
operation over the full military temperature range
of –55°C to 125°C. The SN74AHCT126 is
characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
FUNCTION TABLE
(each buffer)
INPUTS
OEA
HHH
HLL
LXZ
OUTPUT
Y
Copyright 2000, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54AHCT126, SN74AHCT126
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS265M – DECEMBER 1995 – REVISED JANUARY 2000
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, DB, DGV, J, N, PW, and W packages.
†
1OE
1A
2OE
2A
3OE
3A
4OE
4A
1
2
4
5
10
9
13
12
EN
1
logic diagram (positive logic)
1
1OE
2
1A1Y
4
2OE
3
3OE
3A3Y
4OE
10
9
13
3
1Y
6
2Y
8
3Y
11
4Y
8
5
2A2Y
Pin numbers shown are for the D, DB, DGV, J, N, PW, and W packages.
6
12
4A4Y
11
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
IOH = –50 mA
IOH = –8 mA
IOL = 50 mA
IOL = 8 mA
VI = VCC or GND0 V to 5.5 V±0.1±1*±1
VO = VCC or GND5.5 V±0.25±2.5±2.5
VI = VCC or GND,IO = 05.5 V22020
One input at 3.4 V ,
†
Other inputs at VCC or GND
VI = VCC or GND5 V41010pF
VO = VCC or GND5 V15pF
I
I
I
∆I
C
C
OH
OL
I
OZ
CC
CC
i
o
, literature number SCBA004.
CC
5.5 V1.351.51.5mA
TA = 25°CSN54AHCT126SN74AHCT126
MINTYPMAXMINMAXMINMAX
4.44.54.44.4
3.943.83.8
0.10.10.1
0.360.440.44
CC
0V
CC
V
m
A
m
A
m
A
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54AHCT126, SN74AHCT126
PARAMETER
UNIT
AYC
15 pF
ns
OE
Y
C
15 pF
ns
OE
Y
C
pF
ns
AYC
pF
ns
OE
Y
C
pF
ns
OE
Y
C
pF
ns
PARAMETER
UNIT
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS265M – DECEMBER 1995 – REVISED JANUARY 2000
switching characteristics over recommended operating free-air temperature range,
V
= 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
CC
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
sk(o)
* On products compliant to MIL-PRF-38535, this parameter is not production tested.
** On products compliant to MIL-PRF-38535, this parameter does not apply.
CL = 50 pF1**1ns
=
L
=
L
= 15
L
= 50
L
= 50
L
= 50
L
p
p
p
p
p
p
TA = 25°CSN54AHCT126SN74AHCT126
MINTYPMAXMINMAXMINMAX
3.8*5.5*1*6.5*16.5
3.8*5.5*1*6.5*16.5
3.6*5.1*1*6*16
3.6*5.1*1*6*16
4.6*6.8*1*8*18
4.6*6.8*1*8*18
5.37.518.518.5
5.37.518.518.5
5.17.11818
5.17.11818
6.18.8110110
6.18.8110110
noise characteristics, V
V
OL(P)
V
OL(V)
V
OH(V)
V
IH(D)
V
IL(D)
NOTE 4: Characteristics are for surface-mount packages only.
Quiet output, maximum dynamic V
Quiet output, minimum dynamic V
Quiet output, minimum dynamic V
High-level dynamic input voltage2V
Low-level dynamic input voltage0.8V
operating characteristics, V
C
Power dissipation capacitanceNo load,f = 1 MHz14pF
pd
= 5 V, CL = 50 pF, TA = 25°C (see Note 4)
CC
OL
OL
OH
= 5 V, T
CC
PARAMETERTEST CONDITIONSTYPUNIT
= 25°C
A
SN74AHCT126
MINMAX
0.8V
–0.8V
4.4V
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
From Output
Under Test
(see Note A)
SN54AHCT126, SN74AHCT126
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS265M – DECEMBER 1995 – REVISED JANUARY 2000
PARAMETER MEASUREMENT INFORMATION
V
Test
Point
C
L
From Output
Under Test
(see Note A)
C
L
RL = 1 kΩ
S1
CC
Open
GND
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
Open Drain
Open
V
CC
GND
V
CC
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
t
w
Input
Input
In-Phase
Output
Out-of-Phase
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
t
PLH
50% V
t
PHL
50% V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
3-STATE AND OPEN-DRAIN OUTPUTS
CC
CC
LOAD CIRCUIT FOR
3 V
0 V
3 V
0 V
t
PHL
V
t
PLH
CC
CC
OH
V
OL
V
OH
V
OL
50% V
50% V
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at V
(see Note B)
Waveform 2
(see Note B)
CC
Output
S1 at GND
1.5 V
t
CC
CC
h
t
PLZ
VOL + 0.3 V
t
PHZ
VOH – 0.3 V
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V1.5 V1.5 V
t
PZL
50% V
t
PZH
50% V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
3 V
0 V
3 V
0 V
3 V
0 V
≈V
V
OL
V
OH
≈0 V
CC
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
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pertaining to warranty, patent infringement, and limitation of liability.
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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intellectual property right of TI covering or relating to any combination, machine, or process in which such
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Copyright 2000, Texas Instruments Incorporated
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