Dual Independent FIFOs Organized as:
64 Words by 1 Bit Each – SN74ACT2226
256 Words by 1 Bit Each – SN74ACT2228
D
Free-Running Read and Write Clocks Can
Be Asynchronous or Coincident on Each
FIFO
D
Input-Ready Flags Synchronized to Write
Clocks
D
Output-Ready Flags Synchronized to Read
Clocks
D
Half-Full and Almost-Full/Almost-Empty
Flags
D
Support Clock Frequencies up to 22 MHz
D
Access Times of 20 ns
D
Low-Power Advanced CMOS Technology
D
Packaged in 24-Pin Small-Outline
1AF/AE
1WRTCLK
1WRTEN
1RESET
2RDEN
2RDCLK
DW PACKAGE
1HF
1IR
1D
GND
2Q
2OR
(TOP VIEW)
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
1RDCLK
1RDEN
1OR
1Q
2RESET
V
CC
2D
2IR
2WRTEN
2WRTCLK
2AF/AE
2HF
Integrated-Circuit Package
description
The SN74ACT2226 and SN74ACT2228 are dual FIFOs suited for a wide range of serial-data buffering
applications, including elastic stores for frequencies up to T2 telecommunication rates. Each FIFO on the chip
is arranged as 64 ×1 (SN74ACT2226) or 256 ×1 (SN74ACT2228) and has control signals and status flags for
independent operation. Output flags for each FIFO include input ready (1IR or 2IR), output ready (1OR or 2OR),
half full (1HF or 2HF), and almost full/almost empty (1AF/AE or 2AF/AE).
Serial data is written into a FIFO on the low-to-high transition of the write-clock (1WRTCLK or 2WRTCLK) input
when the write-enable (1WRTEN or 2WRTEN) input and input-ready flag (1IR or 2IR) output are both high.
Serial data is read from a FIFO on the low-to-high transition of the read-clock (1RDCLK or 2RDCLK) input when
the read-enable (1RDEN or 2RDEN) input and output-ready flag (1OR or 2OR) output are both high. The read
and write clocks of a FIFO can be asynchronous to one another.
Each input-ready flag (1IR or 2IR) is synchronized by two flip-flop stages to its write clock (1WRTCLK or
2WRTCLK), and each output-ready flag (1OR or 2OR) is synchronized by three flip-flop stages to its read clock
(1RDCLK or 2RDCLK). This multistage synchronization ensures reliable flag-output states when data is written
and read asynchronously.
A half-full flag (1HF or 2HF) is high when the number of bits stored in its FIFO is greater than or equal to half
the depth of the FIFO. An almost-full/almost-empty flag (1AF/AE or 2AF/AE) is high when eight or fewer bits
are stored in its FIFO and when eight or fewer empty locations are left in the FIFO. A bit present on the data
output is not stored in the FIFO.
The SN74ACT2226 and SN74ACT2228 are characterized for operation from –40°C to 85°C.
For more information on this device family, see the application report
FIFOs With a Word Width of One Bit
(literature number SCAA006).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Almost-full/almost-empty flag. AF/AE is high when the memory is eight locations or less from a full or empty
O
state. AF/AE is set high after reset.
IData input
Half-full flag. HF is high when the number of bits stored in memory is greater than or equal to half the FIFO
O
depth. HF is set low after reset.
Input-ready flag. IR is synchronized to the low-to-high transition of WRTCLK. When IR is low , the FIFO is full
and writes are disabled. IR is set low during reset and is set high on the second low-to-high transition of
O
WRTCLK after reset.
Output-ready flag. OR is synchronized to the low-to-high transition of RDCLK. When OR is low, the FIFO is
empty and reads are disabled. Ready data is present on the data output when OR is high. OR is set low during
O
reset and set high on the third low-to-high transition of RDCLK after the first word is loaded to empty memory.
Data outputs. After the first valid write to empty memory, the first bit is output on the third rising edge of RDCLK.
O
OR for the FIFO is asserted high to indicate ready data.
Read clock. RDCLK is a continuous clock and can be independent of any other clock on the device. A
low-to-high transition of RDCLK reads data from memory when the FIFO RDEN and OR are high. OR is
I
synchronous with the low-to-high transition of RDCLK.
Read enable. When the RDEN and OR of a FIFO are high, data is read from the FIFO on the low-to-high
I
transition of RDCLK.
Reset. T o reset the FIFO, four low-to-high transitions of RDCLK and four low-to-high transitions of WR TCLK
must occur while RESET
I
be reset after power up.
Write clock. WRTCLK is a continuous clock and can be independent of any other clock on the device. A
low-to-high transition of WRTCLK writes data to memory when WRTEN and IR are high. IR is synchronous
I
with the low-to-high transition of WRTCLK.
Write enable. When WRTEN and IR are high, data is written to the FIFO on a low-to-high transition of
I
WRTCLK.
is low. This sets HF , IR, and OR low and AF/AE high. Before it is used, a FIFO must
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Output voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through V
Package thermal impedance, θ
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded provided that the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETERTEST CONDITIONSMIN TYP‡MAXUNIT
V
OH
FlagsVCC = 4.5 V,IOL = 8 mA0.5
OL
Q outputsVCC = 4.5 V,IOL = 16 mA0.5
I
I
I
OZ
I
CC
§
∆I
CC
C
i
C
o
‡
All typical values are at VCC = 5 V, TA = 25°C.
§
This is the supply current when each input is at one of the specified TTL voltage levels rather than 0 V or VCC.
VCC = 4.5 V,IOH = –8 mA2.4V
VCC = 5.5 V,VI = VCC or 0±5µA
VCC = 5.5 V,VO = VCC or 0±5µA
VI = VCC – 0.2 V or 0400µA
VCC = 5.5 V,One input at 3.4 V ,Other inputs at VCC or GND1mA
VI = 0,f = 1 MHz4pF
VO = 0,f = 1 MHz8pF
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
twPulse duration
ns
1AF/AE, 2AF/AE
1HF, 2HF
ns
1RESET, 2RESET low
ns
SN74ACT2226, SN74ACT2228
DUAL 64 × 1, DUAL 256 × 1
CLOCKED FIRST-IN, FIRST-OUT MEMORIES
SCAS219C – JUNE 1992 – REVISED OCTOBER 1997
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figures 1 through 3)
MINMAXUNIT
f
clock
t
su
t
h
†
Requirement to count the clock edge as one of at least four needed to reset a FIFO
Clock frequency22MHz
1WRTCLK, 2WRTCLK high or low15
1RDCLK, 2RDCLK high or low15
1D before 1WRTCLK↑ and 2D before 2WRTCLK↑6
1WRTEN before 1WRTCLK↑and 2WR TEN before 2WRTCLK↑6
Setup time
Hold time
1RDEN before 1RDCLK↑ and 2RDEN before 2RDCLK↑6
1RESET low before 1WRTCLK↑ and 2RESET low before 2WRTCLK↑
1RESET low before 1RDCLK↑ and 2RESET low before 2RDCLK↑
1D after 1WRTCLK↑ and 2D after 2WRTCLK↑0
1WRTEN after 1WRTCLK↑and 2WRTEN after 2WRTCLK↑0
1RDEN after 1RDCLK↑ and 2RDEN after 2RDCLK↑0
1RESET low after 1WRTCLK↑ and 2RESET low after 2WRTCLK↑
1RESET low after 1RDCLK↑ and 2RESET low after 2RDCLK↑
†
†
†
†
6
6
6
6
ns
ns
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
Data for Figure 5 is taken with one FIFO active and one FIFO idle on the device. The active FIFO has both writes
and reads enabled with its read clock (RDCLK) and write clock (WRTCLK) operating at the rate specified by
f
. The data input rate and data output rate are half the f
clock
close approximation of the total device power can be found by using Figure 5, determining the capacitive load
on the data output and determining the number of SN74ACT2226/2228 inputs driven by TTL high levels.
rate, and the data output is disconnected. A
clock
With I
taken from Figure 5, the maximum power dissipation (PT) of one FIFO on the SN74ACT2226 or
CC(f)
SN74ACT2228 can be calculated by:
= VCC × [I
P
T
+ (N ×∆ICC × dc)] + (CL × V
CC(f)
where:
N= number of inputs driven by TTL levels
∆I
= increase in power-supply current for each input at a TTL high level
CC
dc= duty cycle of inputs at a TTL high level of 3.4 V
C
An example of concentrating two independent serial-data signals into a single composite data signal with the use of
an SN74ACT2226 or SN74ACT2228 device is shown in Figure 6. The input data to the FIFOs share the same average
(mean) frequency and the mean frequency of the SYS_CLOCK is greater than or equal to the sum of the individual
mean input rates. A single-bit FIFO is needed for each additional input data signal that is time-division multiplexed
into the composite signal.
The FIFO memories provide a buffer to absorb clock jitter generated by the transmission systems of incoming signals
and synchronize the phase-independent inputs to one another. FIFO half-full (HF) flags are used to signal the
multiplexer to start fetching data from the buffers. The state of the flags also can be used to indicate when a FIFO
read should be suppressed to regulate the output flow (pulse-stuffing control). The FIFO almost-full/almost-empty
(AF/AE) flags can be used in place of the half-full flags to reduce transmission delay.
SN74ACT2226
Serial
Data
Stream
Serial
Data
Stream
+5 V
or
SN74ACT2228
1HF
1WRTCLK
1WRTEN
1D
2WRTCLK
2WRTEN
2D
2HF
1RDCLK
1RDEN
1Q
2RDCLK
2RDEN
2Q
READY_1
SELECT_1
DATA_1
Time-Division
Multiplexer
SELECT_2
DATA_2
READY_2
SYS_CLOCK
Composite
Data Stream
Figure 6. Time-Division Multiplexing Using the SN74ACT2226 or SN74ACT2228
12
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MA Y INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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