Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D
Latch-Up Performance Exceeds 500 mA Per
JEDEC Standard JESD-17
D
Typical V
< 0.8 V at V
(Output Ground Bounce)
OLP
= 5 V, TA = 25°C
CC
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
D
High-Impedance State During Power Up
and Power Down
D
Distributed VCC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D
High-Drive Outputs (–32-mA IOH, 64-mA IOL)
D
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Package Options Include 80-Pin Plastic
Thin Quad Flat (PN) Package With
12 × 12-mm Body Using 0.5-mm Lead Pitch
and 84-Pin Ceramic Quad Flat (HT) Package
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+, EPIC-ΙΙB, and UBE are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
LEB
OEB
SELB
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
B2
CLKB
V
CC
B3
GND
B5B6B7
B4
B8
B9
GND
B10
Copyright 1997, Texas Instruments Incorporated
1
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
The ’ABTH32318 consist of three 18-bit registered input/output (I/O) ports. These registers combine D-type
latches and flip-flops to allow data flow in transparent, latch, and clock modes. Data from one input port can be
exchanged to one or more of the other ports. Because of the universal storage element, multiple combinations
of real-time and stored data can be exchanged among the three ports.
Data flow in each direction is controlled by the output-enable (OEA
SELB, and SELC), latch-enable (LEA, LEB, and LEC), and clock (CLKA, CLKB, and CLKC) inputs. The A data
register operates in the transparent mode when LEA is high. When LEA is low, data is latched if CLKA is held
at a high or low logic level. If LEA is low, data is stored on the low-to-high transition of CLKA. Output data
selection is accomplished by the select-control pins. All three ports have active-low output enables, so when
the output-enable input is low, the outputs are active; when the output-enable input is high, the outputs are in
the high-impedance state.
When V
is between 0 and 2.1 V , the device is in the high-impedance state during power up or power down.
CC
However, to ensure the high-impedance state above 2.1 V, OE
the minimum value of the resistor is determined by the current-sinking capability of the driver.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
, OEB, and OEC), select-control (SELA,
should be tied to VCC through a pullup resistor;
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
OUTPUT
OUTPUT A
OUTPUT B
OUTPUT C
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
description (continued)
The SN54ABTH32318 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ABTH32318 is characterized for operation from –40°C to 85°C.
Function Tables
STORAGE
INPUTS
CLKALEAA
↑LLL
↑LH H
H LX Q
L LX Q
X HL L
X HH H
†
A-port register shown. B and C ports are
similar but use CLKB, CLKC, LEB, and
LEC.
‡
Output level before the indicated
steady-state input conditions were
established
A-PORT OUTPUT
INPUTS
OEA SELA
HXZ
LHOutput of C register
LLOutput of B register
†
0
0
‡
‡
B-PORT OUTPUT
INPUTS
OEB SELB
HXZ
LHOutput of A register
LLOutput of C register
C-PORT OUTPUT
INPUTS
OEC SELC
HXZ
LHOutput of B register
LLOutput of A register
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
logic diagram (positive logic)
77
OEC
SELC
76
CLKC
LEC
C1
OEB
SELB
CLKB
LEB
B1
74
75
52
24
25
27
26
28
LE
LE
CLK
CLK
Q
D
Q
D
78
OEA
LEA
A1
79
22
23
80
SELA
CLKA
Pin numbers shown are for the PN package.
4
Q
CLK
LE
D
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1 of 18 Channels
UNIT
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high or power-off state, V
Current into any output in the low state, I
Input clamp current, I
Output clamp current, I
Package thermal impedance, θ
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD51.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54ABTH32318, SN74ABTH32318
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
4.5 V
VOLV
V
V
I
A
I
A, B, or C ports
V
V
A
V
CC
∆I
¶
CC
0.5
0.5
mA
UNIT
twPulse duration
ns
tsuSetup time
ns
thHold time
ns
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54ABTH32318SN74ABTH32318
MIN TYP†MAXMIN TYP†MAX
V
IK
OH
V
hys
I
I(hold)
I
OZPU
I
OZPD
I
off
I
CEX
I
O
I
CC
C
C
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
This parameter is specified by characterization.
§
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
¶
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
Control inputsVCC = 0 to 5.5 V,VI = VCC or GND±1±1
A, B, or C portsVCC = 2.1 V to 5.5 V,VI = VCC or GND±20±20
VCC = 0 to 2.1 V, VO = 0.5 V to 2.7 V, OE = X±50±50µA
VCC = 2.1 V to 0, VO = 0.5 V to 2.7 V, OE = X±50±50µA
VCC = 0,VI or VO ≤ 4.5 V±100±100µA
VCC = 5.5 V, VO = 5.5 VOutputs high5050µA
VCC = 5.5 V,VO = 2.5 V–50–100–180–50–100–180mA
=
= 5.5 V,
IO = 0,
VI = VCC or GND
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
f
clock
Clock frequency150150MHz
p
SN54ABTH32318 SN74ABTH32318
MINMAXMINMAX
LE high3.33.3
CLK high or low3.33.3
A, B, or C before CLK↑2.42.4
A, B, or C before LE↓2.12.1
A, B, or C after CLK↑1.41.4
A, B, or C after LE↓2.12.1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
UNIT
A, B, or C
C, B, or A
ns
SEL
A, B, or C
ns
LE
A, B, or C
ns
CLK
A, B, or C
ns
OE
A, B, or C
ns
OE
A, B, or C
ns
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
f
max
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
= 50 pF (unless otherwise noted) (see Figure 1)
L
FROMTO
(INPUT)(OUTPUT)
SN54ABTH32318 SN74ABTH32318
MINMAXMINMAX
150150MHz
1.46.51.46.1
1.16.81.16.6
1.46.71.46.5
1.86.81.86.5
2.682.67.5
2.67.42.66.9
2.582.57.4
2.57.22.56.7
1.46.91.46.8
2.47.22.47.1
16.416.2
26.426
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN54ABTH32318, SN74ABTH32318
18-BIT TRI-PORT UNIVERSAL BUS EXCHANGERS
SCBS180E – JUNE 1992 – REVISED MA Y 1997
PARAMETER MEASUREMENT INFORMATION
500 Ω
t
w
1.5 V
500 Ω
1.5 V
1.5 V1.5 V
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
Input
Input
Output
Output
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω , tr ≤ 2.5 ns, tf≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PLH
t
PHL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
S1
t
PHL
1.5 V
t
PLH
3 V
0 V
V
V
V
V
7 V
OH
OL
OH
OL
Open
GND
3 V
0 V
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
t
PZL
t
PLZ
1.5 V
t
t
PZH
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
PHZ
1.5 V
Open
Open
1.5 V
t
7 V
h
1.5 V1.5 V
VOL + 0.3 V
VOH – 0.3 V
3 V
0 V
3 V
0 V
3 V
0 V
3.5 V
V
OL
V
OH
≈ 0 V
Figure 1. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOL VE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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