VCCBIAS Pin Minimizes Signal Distortion
During Live Insertion
D
Internal Pullup Resistor on OE Keeps
Outputs in High-Impedance State During
Power Up or Power Down
D
Distributed VCC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D
Equivalent 25-Ω Series Damping Resistor
on B Port
D
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
D
Package Options Include Plastic Shrink
Small-Outline (DL) and Thin-Shrink
Small-Outline (DGG) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
SN54ABTE16246 . . . WD PACKAGE
SN74ABTE16246 . . . DGG OR DL PACKAGE
1 1DIR
1 1OE
11B
GND
10B
9B
V
CC
8BI
8BO
GND
7BO
6BI
6BO
5BO
GND
4BO
4BI
V
CC
3BO
2BI
GND
2BO
1BO
1BI
(TOP VIEW)
1
48
2
47
3
46
4
45
5
44
6
43
7
42
8
41
9
40
10
39
11
38
12
37
13
36
14
35
15
34
16
33
17
32
18
31
19
30
20
29
21
28
22
27
23
26
24
25
V
CC
11A
10DIR
GND
10A
9A
V
CC
9DIR
8A
GND
7A
7BI
6A
5A
GND
5BI
4A
V
CC
3A
3BI
GND
2A
1A
OE
BIAS
description
The ’ABTE16246 devices are 11-bit noninverting transceivers designed for asynchronous two-way
communication between buses. These devices have open-collector and 3-state outputs. They allow data
transmission from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at the
direction-control (DIR) input. The output-enable (OE
are effectively isolated. When OE
is low, the device is active.
The B port has an equivalent 25-Ω series output resistor to reduce ringing. Active bus-hold inputs on the B port
hold unused or floating inputs at a valid logic level.
The A port provides for the precharging of the outputs via V
and 1.7 V when V
is not connected.
CC
The SN54ABTE16246 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ABTE16246 is characterized for operation from –40°C to 85°C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus and EPICΙΙ-B are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
) input can be used to disable the device so that the buses
BIAS, which establishes a voltage between 1.3 V
CC
Copyright 1999, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54ABTE16246, SN74ABTE16246
OPERATION
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
FUNCTION TABLE
INPUTS
OE9DIR10DIR11DIR11OE
HXXXXIsolation
LXX XX
LLXXX9A data to 9B bus
LHXXX9B data to 9A bus
LXLXX10A data to 10B bus
LXHXX10B data to 10A bus
LXXLL11A data to 11B bus
LXXLH11A, 11B isolation
LXXHX11B data to 11A bus
†
OC = Open-collector outputs
1BI–8BI data to 1A–8A bus (OC†),
1A–8A data to 1BO–8BO bus
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
logic diagram (positive logic)
SN54ABTE16246, SN74ABTE16246
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
11OE
11DIR
11B
OE
10DIR
10B
9DIR
9B
1
2
3
25
46
5
41
6
47
44
43
11A
10A
9A
1BI
1BO
24
23
To Seven Other Channels
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
26
1A
3
SN54ABTE16246, SN74ABTE16246
UNIT
VIHHigh-level input voltage
V
VILLow-level input voltage
V
IOHHigh-level output current
mA
IOLLow-level output current
mA
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high or power-off state, V
Current into any output in the low state, I
Input clamp current, I
Output clamp current, I
Package thermal impedance, θ
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
∆t/∆vInput transition rise or fall rateOutputs enabled1010ns/V
T
NOTE 3: All unused control inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Supply voltage4.555.54.555.5V
CC
p
p
High-level output voltage1A–8A5.505.5V
OH
Input voltage0V
I
p
p
Operating free-air temperature–55125–4085°C
A
Implications of Slow or Floating CMOS Inputs
OE22
Except OE1.61.6
OE0.80.8
Except OE1.41.4
CC
B bus–12–12
9A–11A–24–64
B bus1212
A bus6490
, literature number SCBA004.
0V
CC
V
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
V
4.5 V
B port
V
V
V
V
A port
V
V
V
V
()
I
V
V
V
GND
A
I
V
V
V
mA
V
CC
I
A or B ports
CC
,
SN54ABTE16246, SN74ABTE16246
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54ABTE16246SN74ABTE16246
V
IK
B port
OH
9A–11A
I
OH
V
I
I(hold)
I
I
OZH
I
OZL
O
I
off
I
CC
CCD
C
C
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
The parameters I
1A–8AVCC = 4.5 V,VOH = 5.5 V2020µA
p
OL
p
hys
B port
Control inputs
A or B ports
‡
9A–11AVCC = 5.5 V,VO = 2.7 V1010µA
‡
9A–11AVCC = 5.5 V,VO = 0.5 V–10–10µA
A port
B port
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54ABTE16246, SN74ABTE16246
PARAMETER
TEST CONDITIONS
UNIT
I
(VCCBIAS)
A
VOA port
V
0
V
IOA port
V
0
A
(INPUT)
(OUTPUT)
A
B
ns
9B–11B
9A–11A
ns
OE
ns
OE
B
ns
OE
ns
OE
B
ns
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
live-insertion specifications over recommended operating free-air temperature range
SN54ABTE16246SN74ABTE16246
MIN TYP†MAXMIN TYP†MAX
VCC = 0 to 4.5 V,
CC
†
All typical values are at VCC = 5 V, TA = 25°C.
‡
VCC – 0.5 V < VCCBIAS
VCCBIAS = 4.5 V to 5.5 V, I
VCC = 4.5 V to 5.5 V‡,
VCCBIAS = 4.5 V to 5.5 V, I
p
p
CC
CC
=
=
VCCBIAS = 4.5 V to 5.5 V1.11.51.91.11.51.9
VCCBIAS = 4.75 V to 5.25 V1.31.51.71.31.51.7
VO = 0,VCCBIAS = 4.5 V–20–100–20–100
VO = 3 V,VCCBIAS = 4.5 V2010020100
O(DC)
O(DC)
= 0
= 0
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
PARAMETER
t
PLH
t
PHL
t
PLH
t
PHL
§
t
PLH
¶
t
PLH
t
PHL
t
PZH
t
PZL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PHZ
t
PLZ
§
Measurement point is VOL + 0.3 V.
¶
Measurement point is VOL + 1.5 V.
= 50 pF (unless otherwise noted) (see Figure 2)
L
FROM
1B–8B1A–8A
TO
9A–11A24.35.326.426.2
1A–11A24.45.42726.8
9A–11A24.25.92726.7
1A–11A23.54.625.425.1
VCC = 5 V
TA = 25°C
MINTYPMAXMINMAXMINMAX
1.53.14.21.55.41.55.2
1.53.54.61.55.41.55.2
1.533.81.54.71.54.5
1.53.241.54.71.54.5
1.53.241.54.71.54.5
7.58.99.77.510.67.510.3
1.53.241.54.71.54.5
24.3627.327.1
24.56.427.527.3
2.54.36.22.57.22.57
23.6525.825.5
250700250700
2020
SN54ABTE16246SN74ABTE16246
µ
µ
UNIT
ns
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
(INPUT)
(OUTPUT)
9B–11B
9A–11A
R
Ω
ns
9B–11B
9A–11A
R
Ω
ns
9B–11B
1A–8A
R
56 Ω
ns
)
sk()
)
sk(o)
PARAMETER
TEST CONDITIONS
LOAD
UNIT
t
CC
,
ns
SN54ABTE16246, SN74ABTE16246
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
extended switching characteristics over recommended ranges of supply voltage and operating
= 50 pF (unless otherwise noted) (see Figure 2)
free-air temperature, C
PARAMETER
t
PLH
t
PHL
t
PHL
t
PLH
t
PHL
t
PHL
t
PLH
t
PHL
t
PHL
t
sk(p
t
sk(o
†
t
t
‡
t
t
†
tt is measured between 1 V and 2 V of the output waveform.
‡
tt is measured between 10% and 90% of the output waveform.
extended output characteristics over recommended ranges of supply voltage and operating
= 50 pF (see Figures 1 and 2)
free-air temperature, C
FROMTO
(INPUT)(OUTPUT)
sk(temp)
t
sk(load)
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
AB
BA
BA
L
SN54ABTE16246SN74ABTE16246
MINMAXMINMAX
V
= constant,
∆TA = 20°C
VCC = constant,
Temperature = constant
RX = 56 Ω4.54
RX = 13, 26,
or 56 Ω
32.5
4.54ns
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN54ABTE16246, SN74ABTE16246
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
PARAMETER MEASUREMENT INFORMATION
A
Device 1
Y1
B
Device
1 – Y1
t
PLH1
Device
1 – Yn
t
PLH2
Device
n – Yn
NOTES: A. Pulse skew, t
operating conditions.
B. Output skew, t
direction (e.g., |t
C. Temperature skew, t
temperature differences of 20°C.
D. Load skew, t
A
t
PHL1
, is defined as the difference in propagation delay times t
sk(p)
, is defined as the difference in propagation delay of any two outputs of the same device switching in the same
sk(o)
– t
PLH1
sk(temp)
, is measured with RX in Figure 2 at 13 Ω for one unit and 56 Ω for the other unit.
sk(load)
|) .
PLH2
, is the output skew of two devices, both having the same value of VCC ± 1% and with package
In
Device n
B
PLH1
and t
on the same terminal at identical
PHL1
Y2
Yn
t
sk(load)
t
sk(temp)
Y1
Y2
Yn
t
sk(o)
Figure 1. Voltage Waveforms for Extended Characteristics
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABTE16246, SN74ABTE16246
11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS
WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS
SCBS227F – JULY 1993 – REVISED JUNE 1999
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 50 pF
(see Note A)
RX = 13, 26, or 56 Ω
Input
t
PLH
Output
500 Ω
500 Ω
1.5 V
7 V
Open
R
X
S2
S1
LOAD CIRCUIT
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
3.65 V
t
1.5 V
PHL
94 Ω
2 nF
3 V
0 V
V
OH
V
OL
SWITCHING TABLE LOADS
t
PLH/tPHL
t
PHZ/tPZH
SWITCHING TABLE LOADS
Output
Control
(low-level
enabling)
Output
Waveform 1
S2 at 7 V
(see Note B)
Output
Waveform 2
S2 at Open
(see Note B)
(9A–11A and B port)
t
PLH/tPHL
t
PLH/tPHL/tsk
t
PLH/tPHL/tsk
tt (A port) (see Note E)
tt (B port) (see Note F)
t
PZL
t
PZH
(1A–8A)
t
PLZ/tPZL
(except 1A–8A)
EXTENDED
(A port)
(B port)
1.5 V
1.5 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
S1
Up
Up
Up
Up
S1S2
Down
Up
Down
Up
1.5 V1.5 V
t
VOL + 0.3 V
t
VOH – 0.3 V
PLZ
PHZ
S2
Open
7 V
7 V
Open
X
Open
X
Open
3 V
0 V
3.5 V
V
OL
V
OH
≈ 0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
E. tt is measured between 1 V and 2 V of the output waveform.
F. tt is measured between 10% and 90% of the output waveform.Figure 1
Figure 2. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MA Y INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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