Latch-Up Performance Exceeds 500 mA
Per JEDEC Standard JESD-17
D
Typical V
(Output Ground Bounce)
OLP
< 1 V at VCC = 5 V, TA = 25°C
D
Distributed VCC and GND Pin Configuration
Minimizes High-Speed Switching Noise
D
Flow-Through Architecture Optimizes
PCB Layout
D
High-Drive Outputs (–32-mA IOH, 64-mA IOL)
D
Parity-Error Flag With Parity
Generator/Checker
D
Register for Storage of Parity-Error Flag
D
Package Options Include Plastic 300-mil
Shrink Small-Outline (DL) and Thin Shrink
Small-Outline (DGG) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings
description
The ’ABT16833 consist of two noninverting 8-bit
to 9-bit parity bus transceivers and are designed
for communication between data buses. For each
transceiver, when data is transmitted from the
A bus to the B bus, an odd-parity bit is generated
and output on the parity I/O pin (1PARITY or
2PARITY). When data is transmitted from the
B bus to the A bus, 1PARITY (or 2PARITY) is
configured as an input and combined with the
B-input data to generate an active-low error flag if
odd parity is not detected.
or 2ERR) output is configured as an open-collector output. The B-to-A parity-error flag is
clocked into 1ERR (or 2ERR) on the low-to-high transition of the clock (1CLK or 2CLK) input. 1ERR (or 2ERR)
is cleared (set high) by taking the clear (1CLR or 2CLR) input low.
The output-enable (OEA and OEB) inputs can be used to disable the device so that the buses are effectively
isolated. When both OEA and OEB are low, data is transferred from the A bus to the B bus and inverted parity
is generated. Inverted parity is a forced error condition that gives the designer more system diagnostic
capability.
T o ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
SN54ABT16833, SN74ABT16833
LHX
X
NANAAHNA
HLH↑NA
BNANA
H
H
XZZ
Z
Isolati
§
LLX
X
NANAALNA
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
description (continued)
The SN54ABT16833 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ABT16833 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
INPUTS
OEBOEACLR
XXLXXXXNANAHCheck error-flag register
NA = not applicable, NC = no change, X = don’t care
†
Summation of high-level inputs includes PARITY along with Bi inputs.
‡
Output states shown assume ERR
§
In this mode, ERR
CLK
HNo↑XNC
LNo↑X
H↑Odd
H↑EvenL
(when clocked) shows inverted parity of the A bus.
Ai
Σ OF H
Odd
Even
Odd
Even
was previously high.
†
Bi
Σ OF H
Odd
Even
OUTPUT AND I/O
ABPARITY
L
H
ERR
H
L
H
H
‡
FUNCTION
A data to B bus and
generate parity
B data to A bus and
check parity
on
A data to B bus and
generate inverted parity
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54ABT16833, SN74ABT16833
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
logic symbol
†
Φ
PARITY XCVR
SN74ABT16833
1CLK
1CLR
1OEA
1OEB
2CLK
2CLR
2OEA
2OEB
1
A BusB Bus
8
1ERR
1PARITY
2ERR
2PARITY
3
1ERR
54
1PARITY
26
2ERR
31
2PARITY
52
1
8
51
49
48
47
45
44
43
1B1
1B2
1B3
1B4
1B5
1B6
1B7
1B8
1CLK
1CLR
1OEA
1OEB
2CLK
2CLR
2OEA
2OEB
1A1
1A2
1A3
1A4
1A5
1A6
1A7
1A8
2
55
56
1
27
30
29
28
5
6
8
9
10
12
13
14
15
2A1
16
2A2
17
2A3
19
2A4
20
2A5
21
2A6
23
2A7
24
2A8
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
1
A BusB Bus
8
42
1
8
41
40
38
37
36
34
33
2B1
2B2
2B3
2B4
2B5
2B6
2B7
2B8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54ABT16833, SN74ABT16833
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
logic diagram (positive logic)
1A1–1A8
1OEB
1OEA
1CLK
1CLR
1
56
2
55
8
8x
EN
8
8
MUX
1
1
1
1
G1
8x
EN
8
2k
9
8
P
1D
C1
R
54
3
1B1–1B8
1PARITY
1ERR
2A1–2A8
2OEB
2OEA
2CLK
2CLR
28
29
27
30
8
8x
EN
8
8
MUX
1
1
1
1
G1
8x
EN
8
2k
9P
8
1D
C1
R
31
26
2B1–2B8
2PARITY
2ERR
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
ERR
FUNCTION
error-flag waveforms
OEB
OEA
Bi + PARITY
SN54ABT16833, SN74ABT16833
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
ERROR-FLAG FUNCTION TABLE
INPUTS
CLR
H↑HHH
H↑XLL
H↑LXL
LXXXHClear
†
State of ERR before changes at CLR, CLK, or point P
t
INTERNAL
TO DEVICE
CLKPOINT PERR
su
OUTPUT
PRE-STATE
†
n–1
OUTPUT
FUNCTION
Sample
H
L
H
L
Even
Odd
CLK
CLR
ERR
t
PHL
t
h
t
w
t
w
t
PLH
t
su
H
L
H
L
H
L
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
SN54ABT16833, SN74ABT16833
UNIT
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high or power-off state, VO –0.5 V to 5.5 V. . . . . . . . . . . . . . . . . . .
Current into any output in the low state, I
Input clamp current, I
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD51.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
4.5 V
VOLV
V
V
I
V
5.5 V, V
V
or GND
A
,
V
CC
5.5V,
SN54ABT16833, SN74ABT16833
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
TA = 25°CSN54ABT16833SN74ABT16833
MINTYP†MAXMINMAXMINMAX
V
IK
All outputs
OH
except ERR
V
hys
I
OH
I
off
I
CEX
I
I
IL
I
O
I
OZH
I
OZL
I
CC
∆I
C
C
* On products compliant to MIL-PRF-38535, this parameter does not apply.
†
All typical values are at VCC = 5 V.
‡
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
§
The parameters I
¶
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
ERRVCC = 4.5 V,VOH = 5.5 V202020µA
Outputs highVCC = 5.5 V,VO = 5.5 V505050µA
Control inputs
A or B ports
A or B portsVCC = 0,VI = GND–50–50–50µA
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
SN54ABT16833, SN74ABT16833
↑
(INPUT)
(OUTPUT)
A or B
B or A
ns
OE
A or B
ns
OE
A or B
ns
A
OE
PARITY
ns
OE
PARITY
ns
OE
PARITY
ns
ERR
ns
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
VCC = 5 V,
TA = 25°C
MINMAXMINMAXMINMAX
t
w
t
su
t
h
Pulse duration, CLK high or low333ns
A port4.54.54.5
Setup time before CLK
Hold time after CLK↑A port or OEA000ns
CLR111
OEA555
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
.
SN54ABT16833, SN74ABT16833
DUAL 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS
SCBS097D – FEBRUARY 1991 – REVISED JANUARY 1997
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 50 pF
(see Note A)
Input
Input
Output
Output
INVERTING AND NONINVERTING OUTPUTS
500 Ω
500 Ω
LOAD CIRCUIT
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
1.5 V1.5 V
t
PLH
1.5 V
t
PHL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
S1
1.5 V
1.5 V1.5 V
t
PHL
t
PLH
7 V
3 V
0 V
V
V
V
V
Open
GND
3 V
0 V
OH
OL
OH
OL
Timing Input
Data Input
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
TESTS1
PLZ
PHZ
1.5 V
Open
7 V
Open
1.5 V
t
7 V
7 V
h
1.5 V
VOL + 0.3 V
VOH – 0.3 V
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
ERRS1
t
(see Note E)
PHL
t
(see Note F)
PLH
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V
t
PZL
t
1.5 V
t
PZH
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
t
VOLTAGE WAVEFORMS
3 V
0 V
3 V
0 V
3 V
0 V
3.5 V
V
OL
V
OH
≈ 0 V
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns
D. The outputs are measured one at a time with one transition per measurement.
E. t
F. t
is measured at 1.5 V.
PHL
is measured at VOL + 0.3 V.
PLH
Figure 1. Load Circuit and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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