Datasheet SN65LVDS95DGG, SN65LVDS95DGGR Datasheet (Texas Instruments)

SN65LVDS95
LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
D
21:3 Data Channel Compression at up to
D
Suited for Point-to-Point Subsystem Communication With Very Low EMI
D
21 Data Channels Plus Clock in Low-Voltage TTL and 3 Data Channels Plus Clock Out Low-Voltage Differential
D
Operates From a Single 3.3-V Supply and 250 mW (Typ)
D
5-V Tolerant Data Inputs
D
’LVDS95 Has Rising Clock Edge Triggered Inputs
D
Bus Pins Tolerate 6-kV HBM ESD
D
Packaged in Thin Shrink Small-Outline Package With 20 Mil Terminal Pitch
D
Consumes <1 mW When Disabled
D
Wide Phase-Lock Input Frequency Range
20 MHz to 65 MHz
D
No External Components Required for PLL
D
Inputs Meet or Exceed the Requirements of ANSI EIA/TIA-644 Standard
D
Industrial Temperature Qualified
T
A
= –40°C to 85°C
D
Replacement for the National DS90CR215
description
The SN65L VDS95 L VDS serdes (serializer/deserializer) transmitter contains three 7-bit parallel-load serial-out shift registers, a 7× clock synthesizer, and four low-voltage dif ferential signaling (LVDS) line drivers in a single integrated circuit. These functions allow 21 bits of single-ended LVTTL data to be synchronously transmitted over 4 balanced-pair conductors for receipt by a compatible receiver, such as the SN65LVDS96.
When transmitting, data bits D0 through D20 are each loaded into registers of the SN65L VDS95 on the rising edge of the input clock signal (CLKIN). The frequency of CLKIN is multiplied seven times and then used to serially unload the data registers in 7-bit slices. The three serial streams and a phase-locked clock (CLKOUT) are then output to LVDS output drivers. The frequency of CLKOUT is the same as the input clock, CLKIN.
The SN65LVDS95 requires no external components and little or no control. The data bus appears the same at the input to the transmitter and output of the receiver with data transmission transparent to the user(s). The only user intervention is the possible use of the shutdown/clear (SHTDN
) active-low input to inhibit the clock and shut off the L VDS output drivers for lower power consumption. A low level on this signal clears all internal registers to a low level.
The SN65LVDS95 is characterized for operation over ambient air temperatures of –40°C to 85°C.
Copyright 2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25
D4
V
CC
D5 D6
GND
D7 D8
V
CC
D9
D10
GND
D11 D12
V
CC
D13 D14
GND
D15 D16 D17
V
CC
D18 D19
GND
D3 D2 GND D1 D0 NC LVDSGND Y0M Y0P Y1M Y1P LVDSV
CC
LVDSGND Y2M Y2P CLKOUTM CLKOUTP LVDSGND PLLGND PLLV
CC
PLLGND SHTDN CLKIN D20
DGG PACKAGE
(TOP VIEW)
SN65LVDS95 LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
functional block diagram
Serial/LOAD
CLK
Parallel-Load 7-Bit
Shift Register
D0–6
Serial/LOAD
CLK
Parallel-Load 7-Bit
Shift Register
D7–13
Serial/LOAD
CLK
Parallel-Load 7-Bit
Shift Register
D14–20
CLKINH
7×CLK
7× Clock/PLL
CLKIN
Control Logic
SHTDN
CLK
A,B, ...G
A,B, ...G
A,B, ...G
7
7
7
Y0M
Y0P
Y1M
Y1P
Y2M
Y2P
CLKOUTM
CLKOUTP
SN65LVDS95
LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
CLKOUT
D0-1
D6 D5 D4 D3 D2 D1 D0 D6+1
D7-1
D13 D12 D11 D10 D9 D8 D7 D13+1
D14-1
D20 D19 D18 D17 D16 D15 D14 D20+1
Current Cycle NextPrevious Cycle
Y2
Y1
Y0
CLKIN
’LVDS95
Dn
Figure 1. ’LVDS95 Load and Shift Sequences
equivalent input and output schematic diagrams
V
CC
7 V
300 k
50
D or
SHTDN
50
V
CC
YnP or YnM
7 V
10 k
SN65LVDS95 LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage range, VCC (see Note 1) –0.5 V to 4 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range at any output terminal, VO –0.5 V to V
CC
+ 0.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range at any input terminal, V
I
–0.5 V to 5.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Electrostatic discharge (see Note 2): Bus pins (Class 3A) 6 KV. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Bus pins (Class 2B) 400 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
All pins (Class 3A) 6 KV. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
All pins (Class 2B) 200 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous total power dissipation (see Dissipation Rating Table). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, T
A
–40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values are with respect to the GND terminals.
2. This rating is measured using MIL-STD-883C Method, 3015.7.
DISSIPATION RATING T ABLE
PACKAGE
TA 25°C
POWER RATING
DERATING FACTOR
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
DGG 1316 mW 13.1 mW/°C 724 mW 526 mW
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
recommended operating conditions
MIN NOM MAX UNIT
Supply voltage, V
CC
3 3.3 3.6 V
High-level input voltage, V
IH
2 V
Low-level input voltage, V
IL
0.8 V
Differential load impedance, Z
L
90 132
Operating free-air temperature, T
A
–40 85 °C
SN65LVDS95
LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
V
IT
Input voltage threshold 1.4 V
|VOD| Differential steady-state output voltage magnitude 247 454 |VOD|
Change in the steady-state differential output voltage magnitude between opposite binary states
RL = 100 , See Figure 3
50
mV
V
OC(SS)
Steady-state common-mode output voltage
1.125 1.375 V
V
OC(PP)
Peak-to-peak common-mode output voltage
See Figure 3
80 150 mV
I
IH
High-level input current VIH = V
CC
20 µA
I
IL
Low-level input current VIL = 0 V ±10 µA
p
VOY = 0 V ±24 mA
IOSShort-circuit output current
VOD = 0 V ±12 mA
I
OZ
High-impedance state output current VO = 0 V to V
CC
±10 µA
Disabled, all inputs at GND 280 µA
I
CC(AVG)
Quiescent current (average)
Enabled, RL = 100 (4 places), Worst-case pattern (see Figure 4), tc = 15.38 ns
85 110 mA
C
i
Input capacitance 3 pF
All typical values are VCC = 3.3 V, TA = 25°C.
timing requirements
MIN NOM MAX UNIT
t
c
Input clock period 15.4 t
c
50 ns
t
w
High-level input clock pulse width duration 0.4t
c
0.6t
c
ns
t
t
Input signal transition time 5 ns
t
su
Data setup time, D0 through D27 before CLKIN (’95) (see Figure 2) 3 ns
t
h
Data hold time, D0 through D27 after CLKIN (’95) (see Figure 2) 1.5 ns
SN65LVDS95 LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
switching characteristics over recommended operating conditions (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP
MAX UNIT
t
0
Delay time, CLKOUT serial bit position 0 –0.20 0 0.20 ns
t
1
Delay time, CLKOUT serial bit position 1 1/7tc–0.20 1/7tc+0.20 ns
t
2
Delay time, CLKOUT serial bit position 2 2/7tc–0.20 2/7tc+0.20 ns
t
3
Delay time, CLKOUT serial bit position 3
tc = 15.38 ns (±0.2%),
p
p
3/7tc–0.20 3/7tc+0.20 ns
t
4
Delay time, CLKOUT serial bit position 4
|I
nput clock
jitter|
< 50 ps‡,
See
Figure
5
4/7tc–0.20 4/7tc+0.20 ns
t
5
Delay time, CLKOUT serial bit position 5
See Figure 5
5/7tc–0.20 5/7tc+0.20 ns
t
6
Delay time, CLKOUT serial bit position 6 6/7tc–0.20 6/7tc+0.20 ns
t
sk(o)
Output skew, tn –n/7 t
c
–0.20 0.20 ns
t
7
Delay time, CLKIN to CLKOUT
tc = 15.38 ns (±0.2%), |Input clock jitter| < 50 ps‡, See Figure 5
4.2 ns
tc = 15.38 ns + 0.75 sin(2π500E3t)
±0.05 ns, See Figure 6
±80 ps
t
C(O)
Output clock
cycle-to-cycle
jitt
er
§
tc = 15.38 ns + 0.75 sin(2π2E6t)
±0.05 ns, See Figure 6
±300 ps
t
w
High-level output clock pulse duration 4/7 t
c
ns
t
t
Differential output voltage transition time (tr or tf) See Figure 3 260 700 1500 ps
t
en
Enable time, SHTDN to phase lock (Yn valid) See Figure 7 1 ms
t
dis
Disable time, SHTDN to off-state (CLKOUT low) See Figure 8 250 ns
All typical values are VCC = 3.3 V, TA = 25°C.
|Input clock jitter| is the magnitude of the change in the input clock period.
§
The output clock jitter is the change in the output clock period from one cycle to the next cycle observed over 15,000 cycles.
PARAMETER MEASUREMENT INFORMATION
Dn
t
su
CLKIN
t
h
CLKSEL HIGH
NOTE: All input timing is defined at 1.4 V on an input signal with a 10% to 90% rise or fall time of less than 5 ns.
Figure 2. Setup and Hold Time Definition
SN65LVDS95
LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
0 V
YP
YM
V
ID
49.9 ±1%
(2 Places)
V
OC
CL = 10 pF MAX (2 Places)
V
OD(L)
V
OD(H)
V
OC(PP)
0 V
V
OC(SS)
V
OC(SS)
t
f
t
r
100% 80%
20% 0%
NOTE: The lumped instrumentation capacitance for any single ended voltage
measurement is less than or equal to 10 pF. When making measurements at YP or YM, the complementary output shall be similarly loaded.
Figure 3. Test Load and Voltage Definitions for LVDS Outputs
CLKIN
EVEN Dn
ODD Dn
T
VIH = 2 V and VIL = 0.8 V
Figure 4. Worst-Case‡ Power Test Pattern
The worst-case test pattern produces nearly the maximum switching frequency for all of the LV-TTL outputs.
SN65LVDS95 LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
CLKIN
V
OD(H)
0 V
t
7
t
0
t
6
t
5
t
4
t
3
t
2
t
1
V
OD(L)
1.4 V
t
7
t0–t
6
CLKOUT
Yn
CLKIN
CLKOUT
or Xn
Figure 5. Timing Definitions
HP8656B Signal
Generator,
0.1 MHz–990 MHz RF Output
OutputModulation Input CLKOUT
HP8665A Synthesized
Signal Generator,
0.1 MHz–4200 MHz
Device Under
Test
CLKIN Input
DTS2070C
Digital Time
Scope
Device
Under
Test
VCO
Reference
Modulation
v(t) = A sin(2πf
mod
t)
Σ
+
+
Figure 6. Clock Jitter Test Setup
SN65LVDS95
LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
CLKIN
Dn
SHTDN
Yn
t
en
Invalid
Valid
Figure 7. Enable Time Measurement Definition
t
dis
CLKIN
SHTDN
CLKOUT
Figure 8. Disable Time Measurement Definition
TYPICAL CHARACTERISTICS
I
CC
60
40
20
0
30 40 50 60 70
80
100
f – Frequency – MHz
– Supply Current – mA
WORST-CASE SUPPLY CURRENT
vs
FREQUENCY
VCC = 3 V
VCC = 3.3 V
VCC = 3.6 V
Figure 9
SN65LVDS95 LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
10
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
16-bit bus extension
In a 16-bit bus application (Figure 10), TTL data and clock coming from bus transceivers that interface the backplane bus arrive at the Tx parallel inputs of the L VDS serdestransmitter. The clock associated with the bus is also connected to the device. The on-chip PLL synchronizes this clock with the parallel data at the input. The data is then multiplexed into three different line drivers which perform the TTL to LVDS conversion. The clock is also converted to L VDS and presented to a separate driver. This synchronized LVDS data and clock at the receiver, which recovers the LVDS data and clock, performs a conversion back to TTL. Data is then demultiplexed into a parallel format. An on-chip PLL synchronizes the received clock with the parallel data, and then all are presented to the parallel output port of the receiver.
SN74FB2032
8
D0–D7
8
D8–D15
SN65LVDS95
LVDS
Interface
0 To 10 Meters
(Media Dependent)
TTL
Interface
16-Bit BTL Bus Interface
CLK
Backplane
Bus
8
D0–D7
8
D8–D15
CLK
Backplane
Bus
TTL
Interface
16-Bit
BTL Bus
Interface
XMIT Clock RCV Clock
SN74FB2032
SN65LVDS96
SN74FB2032
SN74FB2032
Figure 10. 16-Bit Bus Extension
16-bit bus extension with parity
In the previous application we did not have a checking bit that would provide assurance that the data crosses the link. If we add a parity bit to the previous example, we would have a diagram similar to the one in Figure 11. The device following the SN74FB2032 is a low cost parity generator. Each transmit-side transceiver/parity generator takes the L VTTL data from the corresponding transceiver, performs a parity calculation over the byte, and then passes the bits with its calculated parity value on the parallel input of the LVDS serdes transmitter. Again, the on-chip PLL synchronizes this transmit clock with the eighteen parallel bits (16 data + 2 parity) at the input. The synchronized LVDS data/parity and clock arrive at the receiver.
The receiver performs the conversion from L VDS to LVTTL and the transceiver/parity generator performs the parity calculations. These devices compare their corresponding input bytes with the value received on the parity bit. The transceiver/parity generator will assert its parity error output if a mismatch is detected.
SN65LVDS95
LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
11
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
APPLICATION INFORMATION
SN74FB2032
8
D0–D7
8
D8–D15
SN65LVDS95
LVDS
Interface
0 To 10 Meters
(Media Dependent)
TTL Interface W/Parity
16-Bit BTL Bus Interface
CLK
Backplane
Bus
8
D0–D7
8
D8–D15
CLK
Backplan
e
Bus
TTL
Interface
16-Bit BTL Bus Interface
XMIT Clock RCV Clock
9 Bit Latchable
Transceiver/ With
Parity Generator
Parity
Parity
TTL
Interface
Parity
Parity
Parity
Error
TTL
Interface
W/Parity
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
SN74FB2032
SN74FB2032
9 Bit Latchable
Transceiver/ With
Parity Generator
9 Bit Latchable
Transceiver/ With
Parity Generator
SN65LVDS96
Figure 11. 16-Bit Bus Extension With Parity
low cost virtual backplane transceiver
Figure 12 represents L VDS serdes in an application as a virtual backplane transceiver (VBT). The concept of a VBT can be achieved by implementing individual LVDS serdes chipsets in both directions of subsystem serialized links.
Depending on the application, the designer will face varying choices when implementing a VBT. In addition to the devices shown in Figure 12, functions such as parity and delay lines for control signals could be included. Using additional circuitry, half-duplex or full-duplex operation can be achieved by configuring the clock and control lines properly.
The designer may choose to implement an independent clock oscillator at each end of the link and then use a PLL to synchronize LVDS serdes’s parallel I/O to the backplane bus. Resynchronizing FIFOs may also be required.
Bus
Transceivers
LVDS Serdes
Transmitter
LVDS Serdes
Receiver
Bus
Transceivers
TTL Inputs Up To
21 or 28
Bits
LVDS
Serial Links
4 or 5
Pairs
TTL
Outputs
Up To
21 or 28
Bits
Bus
Transceivers
LVDS Serdes
Transmitter
LVDS Serdes
Receiver
Bus
Transceivers
Backplane
Bus
Backplane Bus
Figure 12. Virtual Backplane Transceiver
SN65LVDS95 LVDS SERDES TRANSMITTER
SLLS297F – MAY 1998 – REVISED FEBRUAR Y 2000
12
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
MECHANICAL DATA
DGG (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
4040078/F 12/97
48 PIN SHOWN
0,25
0,15 NOM
Gage Plane
6,00
6,20
8,30 7,90
0,75 0,50
Seating Plane
25
0,27 0,17
24
A
48
1
1,20 MAX
M
0,08
0,10
0,50
0°–8°
56
14,10
13,90
48
DIM
A MAX
A MIN
PINS **
12,40
12,60
64
17,10
16,90
0,15 0,05
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice. C. Body dimensions do not include mold protrusion not to exceed 0,15. D. Falls within JEDEC MO-153
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICA TIONS IS UNDERSTOOD T O BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
Loading...