Datasheet SN64BCT757DW, SN64BCT757DWR, SN64BCT757N Datasheet (Texas Instruments)

SN64BCT757
OCTAL BUFFER/DRIVER
WITH OPEN-COLLECTOR OUTPUTS
SCBS479 – MARCH 1993 – REVISED MAY 1994
Copyright 1994, Texas Instruments Incorporated
3–1
BiCMOS Design Significantly Reduces I
CCZ
ESD Protection Exceeds 2000 V Per
MIL-STD-883C, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
High-Impedance State During Power Up
and Power Down
Open-Collector Outputs Drive Bus Lines
or Buffer-Memory Address Registers
Package Options Include Plastic
Small-Outline (DW) Packages and Standard Plastic and Ceramic 300-mil DIPs (N)
description
This octal buffer and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The device provides complementary output-enable (OE and OE) inputs and noninverting outputs.
The SN64BCT757 is characterized for operation from –40°C to 85°C and 0°C to 70°C.
FUNCTION TABLES
INPUTS
OUTPUT
1OE 1A
1Y
H X H L LL L H H
INPUTS
OUTPUT
2OE 2A
2Y
L X H H LL H H H
DW OR N PACKAGE
(TOP VIEW)
1 2 3 4 5 6 7 8 9 10
20 19 18 17 16 15 14 13 12 11
1OE
1A1 2Y4 1A2 2Y3 1A3 2Y2 1A4 2Y1
GND
V
CC
2OE 1Y1 2A4 1Y2 2A3 1Y3 2A2 1Y4 2A1
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
SN64BCT757 OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS
SCBS479 – MARCH 1993 – REVISED MAY 1994
3–2
logic symbol
logic diagram (positive logic)
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
2
1A1
4
1A2
6
1A3
8
1A4
EN
1
1Y1
18
1Y2
16
1Y3
14
1Y4
12
11
2A1
13
2A2
15
2A3
17
2A4
EN
19
2OE
2Y1
9
2Y2
7
2Y3
5
2Y4
3
1OE
1
2
4
6
8
19
11
13
15
17
3
5
7
9
12
14
16
18
1A1
1A2
1A3
1A4
1Y1
2OE
2A1
2A2
2A3
2A4
2Y1
1Y2
1Y3
1Y4
2Y2
2Y3
2Y4
1OE
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
–0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, VI (see Note 1) –0.5 V to 7 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range applied to any output in the disabled or power-off state, V
O
–0.5 V to 5.5 V. . . . . . . . . . . . . . . .
Voltage range applied to any output in the high state, V
O
–0.5 V to V
CC
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0) –30 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Current into any output in the low state, IO 128 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range –65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input negative-voltage ratings may be exceeded if the input clamp-current ratings are observed.
SN64BCT757
OCTAL BUFFER/DRIVER
WITH OPEN-COLLECTOR OUTPUTS
SCBS479 – MARCH 1993 – REVISED MAY 1994
3–3
recommended operating conditions (see Note 2)
MIN NOM MAX UNIT
V
CC
Supply voltage 4.5 5 5.5 V
V
IH
High-level input voltage 2 V
V
IL
Low-level input voltage 0.8 V
V
OH
High-level output voltage 5.5 V
I
IK
Input clamp current –18 mA
I
OL
Low-level output current 64 mA
t/V
CC
Power-up ramp rate 2 µs/V
T
A
Operating free-air temperature –40 85 °C
NOTE 2: Unused or floating inputs must be held high or low.
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP†MAX UNIT
V
IK
VCC = 4.5 V, II = –18 mA –1.2 V
I
OH
VCC = 4.5 V, VOH = 5.5 V 0.1 mA
V
OL
VCC = 4.5 V, IOL = 64 mA 0.42 0.55 V
I
OZ
VCC = 0 to 2.3 V (power up), VO = 2.7 V, OE = 0.8 V or OE = 2 V 50 µA
I
OZ
VCC = 1.8 V to 0 (power down), VO = 2.7 V, OE = 0.8 V or OE = 2 V 50 µA
I
I
VCC = 5.5 V, VI = 7 V 0.1 mA
I
IH
VCC = 5.5 V, VI = 2.7 V 20 µA
I
IL
VCC = 5.5 V, VI = 0.5 V –1 mA
Outputs high 34
I
CC
VCC = 5.5 V, Outputs open
Outputs low
77
mA
OE and OE inactive 10
C
i
VCC = 5 V, VI = 2.5 V or 0.5 V 6 pF
C
o
VCC = 5 V, VO = 2.5 V or 0.5 V 4 pF
All typical values are at VCC = 5 V, TA = 25°C.
switching characteristics over recommended range of supply voltage, CL = 50 pF (unless otherwise noted) (see Note 3)
PARAMETER
FROM
TO
VCC = 5 V,
TA = 25°C
TA = –40°C
to 85°C
TA = 0°C
to 70°C
UNIT
(INPUT)
(OUTPUT)
MIN TYP MAX MIN MAX MIN MAX
t
PLH
6.9 8.3 9.6 6.5 11.2 6.6 10.1
t
PHL
A
Y
2.4 4.2 6 1.9 7 2 6.6
ns
t
PLH
11 14.8 17.9 10.4 21.3 10.8 19.7
t
PHL
2OE
Y
2.9 4.6 6.2 2.6 7.5 2.6 6.9
ns
t
PLH
11.4 13.9 16.1 8.9 19.9 10 18
t
PHL
1OE
Y
4.4 6.1 7.8 4 9.2 4 8.5
ns
NOTE 3: Load circuits and voltage waveforms are shown in Section 1.
SN64BCT757 OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS
SCBS479 – MARCH 1993 – REVISED MAY 1994
3–4
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
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In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
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Copyright 1998, Texas Instruments Incorporated
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