High-Current 3-State Noninverting Outputs
Drive Bus Lines Directly or up to 15 LSTTL
Loads
D
Bus-Structured Pinout
D
Package Options Include Plastic
Small-Outline (DW), Thin Shrink
Small-Outline (PW), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These octal edge-triggered D-type flip-flops
feature 3-state outputs designed specifically for
bus driving. They are particularly suitable for
implementing buffer registers, I/O ports,
bidirectional bus drivers, and working registers.
The eight flip-flops enter data on the low-to-high
transition of the clock (CLK) input.
A buffered output-enable (OE
to place the eight outputs in either a normal logic
state (high or low logic levels) or the
high-impedance state. In the high-impedance
state, the outputs neither load nor drive the bus
lines significantly. The high-impedance state and
increased drive provide the capability to drive bus
lines without interface or pullup components.
) input can be used
SN54HC574 ...J OR W PACKAGE
SN74HC574 ...DW, N, OR PW PACKAGE
SN54HC574 . . . FK PACKAGE
3D
4D
5D
6D
7D
(TOP VIEW)
OE
1
1D
2
2D
3
3D
4
4D
5
5D
6
6D
7
7D
8
8D
9
GND
10
(TOP VIEW)
2D1DOE
3212019
4
5
6
7
8
910111213
8D
GND
20
19
18
17
16
15
14
13
12
11
CLK
CC
V
8Q
V
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
CLK
1Q
18
17
16
15
14
7Q
CC
2Q
3Q
4Q
5Q
6Q
OE
does not affect the internal operations of the flip-flops. Old data can be retained or new data can be entered
while the outputs are in the high-impedance state.
The SN54HC574 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74HC574 is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each flip-flop)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
INPUTS
OECLKD
L↑HH
L↑LL
LH or LXQ
HXXZ
OUTPUT
Q
0
Copyright 1998, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54HC574, SN74HC574
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS148C – DECEMBER 1982 – REVISED JANUARY 1998
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
OE
CLK
1D
2D
3D
4D
5D
6D
7D
8D
1
11
2
3
4
5
6
7
8
9
EN
C1
1D
logic diagram (positive logic)
1
OE
11
CLK
C1
1D
2
1D
19
18
17
16
15
14
13
12
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
19
1Q
To Seven Other Channels
absolute maximum ratings over operating free-air temperature range
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51, except for through-hole packages, which use a trace
length of zero.
SN54HC574, SN74HC574
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS148C – DECEMBER 1982 – REVISED JANUARY 1998
4
SN54HC574, SN74HC574
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS148C – DECEMBER 1982 – REVISED JANUARY 1998
5
SN54HC574, SN74HC574
OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS
WITH 3-STATE OUTPUTS
SCLS148C – DECEMBER 1982 – REVISED JANUARY 1998
PARAMETER MEASUREMENT INFORMATION
V
CC
50%
50%
S1
S2
V
0 V
V
0 V
CC
CC
From Output
Under Test
(see Note A)
High-Level
Pulse
Low-Level
Pulse
Test
Point
C
L
LOAD CIRCUIT
50%
50%
VOLTAGE WAVEFORMS
PULSE DURATIONS
R
L
t
w
PARAMETERC
t
Data
t
PZH
t
PZL
t
PHZ
t
PLZ
t
en
t
dis
tpd or t
Reference
Input
Input
SETUP AND HOLD AND INPUT RISE AND FALL TIMES
R
L
1 kΩ
1 kΩ
t
su
90%90%
VOLTAGE WAVEFORMS
t
r
L
50 pF
or
150 pF
50 pF
50 pF
or
150 pF
50%
S1
OpenClosed
ClosedOpen
OpenClosed
ClosedOpen
OpenOpen––
t
h
50%50%
S2
V
CC
0 V
V
CC
10%10%
0 V
t
f
Input
In-Phase
Output
Out-of-
Phase
Output
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
NOTES: A. CL includes probe and test-fixture capacitance.
50%
t
PLH
90%90%
t
PHL
50%50%
10%10%
VOLTAGE WAVEFORMS
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. Phase relationships between waveforms were chosen arbitrarily. All input pulses are supplied by generators having the following
characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr = 6 ns, tf = 6 ns.
D. For clock inputs, f
E. The outputs are measured one at a time with one input transition per measurement.
F. t
G. t
H. t
PLZ
PZL
PLH
and t
and t
and t
max
are the same as t
PHZ
are the same as ten.
PZH
are the same as tpd.
PHL
50%
t
PHL
50%50%
t
r
t
PLH
t
f
is measured when the input duty cycle is 50%.
.
dis
V
CC
0 V
V
OH
10%10%
V
OL
t
f
V
OH
90%90%
V
OL
t
r
Output
Control
(Low-Level
Enabling)
t
PZL
Output
Waveform 1
(See Note B)
t
PZH
Output
Waveform 2
(See Note B)
ENABLE AND DISABLE TIMES FOR 3-STATE OUTPUTS
50%
≈ V
CC
50%
50%
VOLTAGE WAVEFORMS
50%
t
PLZ
10%
90%
t
PHZ
V
CC
0 V
≈ V
V
OL
V
OH
≈ 0 V
CC
Figure 1. Load Circuit and Voltage Waveforms
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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