Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs
description
These octal buffers and line drivers are designed
to have the performance of the popular
SN54ALS240A/SN74ALS240A series and, at the
same time, offer a pinout with inputs and outputs
on opposite sides of the package. This
arrangement greatly facilitates printed-circuitboard layout.
The 3-state control gate is a 2-input NOR such that
if either output-enable (OE1
all eight outputs are in the high-impedance state.
The SN74ALS540 provides inverted data. The
′ALS541 provide true data at the outputs.
The -1 versions of SN74ALS540 and
SN74ALS541 are identical to the standard
versions, except that the recommended maximum
I
is increased to 48 mA. There is no -1 version
OL
of the SN54ALS541.
or OE2) input is high,
SN74ALS540, SN74ALS541 . . . DW OR N PACKAGE
SN54ALS541 ...J PACKAGE
(TOP VIEW)
Y8
20
19
18
17
16
15
14
13
12
11
V
CC
Y7
V
CC
OE2
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
18
17
16
15
14
Y6OE2
OE1
1
A1
2
A2
3
A3
4
A4
5
A5
6
A6
7
A7
8
A8
9
GND
SN54ALS541 . . . FK PACKAGE
A3
A4
A5
A6
A7
10
(TOP VIEW)
A2A1OE1
3 2 1 20 19
4
5
6
7
8
910111213
A8
GND
Y1
Y2
Y3
Y4
Y5
The SN54ALS541 is characterized for operation over the full military temperature range of –55°C to 125°C. The
SN74ALS540 and SN74ALS541 are characterized for operation from 0°C to 70°C.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 1995, Texas Instruments Incorporated
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
1
SN54ALS541, SN74ALS540, SN74ALS541
OCTAL BUFFERS AND LINE DRIVERS
WITH 3-STATE OUTPUTS
SDAS025C – APRIL 1982 – REVISED JANUARY 1995
logic symbols
1
OE1
19
OE2
2
A1
3
A2
4
A3
5
A4
6
A5
7
A6
8
A7
9
A8
†
These symbols are in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
SN74ALS540
&
EN
18
17
16
15
14
13
12
11
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
OE1
OE2
A1
A2
A3
A4
A5
A6
A7
A8
1
19
2
3
4
5
6
7
8
9
logic diagrams (positive logic)
SN74ALS540′ALS541
1
OE1
OE2
19
OE1
OE2
1
19
′ALS541
&
EN
18
17
16
15
14
13
12
11
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
A1
2
To Seven Other Channels
18
Y1
A1
2
To Seven Other Channels
18
Y1
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
B. W aveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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