Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These devices contain two independent 4-input
positive-AND gates. They perform the Boolean
functions Y = A • B • C • D or Y = A
in positive logic.
The SN54ALS21A and SN54AS21 are
characterized for operation over the full military
temperature range of –55°C to 125°C. The
SN74ALS21A and SN74AS21 are characterized
for operation from 0°C to 70°C.
FUNCTION TABLE
(each gate)
INPUTS
ABCD
HHHHH
LXXX L
XLXX L
XXLX L
XXXL L
+ B + C + D
OUTPUT
Y
SN54ALS21A, SN54AS21 ...J PACKAGE
SN74ALS21A, SN74AS21 ...D OR N PACKAGE
SN54ALS21A, SN54AS21 . . . FK PACKAGE
NC
NC
1C
NC
1D
NC – No internal connection
1A
1B
NC
1C
1D
1Y
GND
3 2 1 20 19
4
5
6
7
8
9 10 11 12 13
(TOP VIEW)
1
14
2
13
3
12
4
11
5
10
6
7
(TOP VIEW)
1B1ANC
1Y
NC
GND
V
CC
2D
2C
NC
2B
2A
9
2Y
8
CC
V
2D
18
2C
17
NC
16
NC
15
NC
14
2B
2Y
2A
logic symbol
1
1A
2
1B
4
1C
5
1D
9
2A
10
2B
12
2C
13
2D
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
†
&
6
8
1Y
2Y
logic diagram (positive logic)
1
1A
2
1B
1C
1D
2A
2B
2C
2D
4
5
9
10
12
13
6
8
1Y
2Y
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1994, Texas Instruments Incorporated
1
SN54ALS21A, SN54AS21, SN74ALS21A, SN74AS21
UNIT
PARAMETER
TEST CONDITIONS
UNIT
V
V
V
V
(
)
(
)
(INPUT)
(OUTPUT)
A, B, C, or D
Y
ns
DUAL 4-INPUT POSITIVE-AND GATES
SDAS085B – APRIL 1982 – REVISED DECEMBER 1994
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
Input voltage, V
Operating free-air temperature range, T
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.
D. All input pulses have the following characteristics: PRR ≤ 1 MHz, tr = tf = 2 ns, duty cycle = 50%.
E. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuits and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOL VE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.