ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
SN54AHCT125 ...J OR W PACKAGE
SN74AHCT125 . . . D, DB, DGV, N, NS,
OR PW PACKAGE
(TOP VIEW)
1OE
1
2
1A
3
1Y
4
2OE
5
2A
6
2Y
GND
7
14
13
12
11
10
V
CC
4OE
4A
4Y
3OE
9
3A
8
3Y
SN74AHCT125 . . . RGY PACKAGE
1A
1Y
2OE
2A
2Y
(TOP VIEW)
1OE3YV
114
2
3
4
5
6
78
CC
13
12
10
4OE
4A
11
4Y
3OE
9
3A
GND
SN54AHCT125 . . . FK PACKAGE
1Y
NC
2OE
NC
2A
NC – No internal connection
(TOP VIEW)
1A
1OE
NC
3212019
4
5
6
7
8
910111213
2Y
NC
GND
description/ordering information
The ’AHCT125 devices are quadruple bus buffer gates featuring independent line drivers with 3-state outputs.
Each output is disabled when the associated output-enable (OE
gate passes the data from the A input to its Y output.
T o ensure the high-impedance state during power up or power down, OE
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMA TION
T
A
QFN – RGYTape and reelSN74AHCT125RGYRHB125
PDIP – NTubeSN74AHCT125NSN74AHCT125N
–40°C to 85°C
–55°C to 125°C
†
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
SOP – NSTape and reelSN74AHCT125NSRAHCT125
SSOP – DBTape and reelSN74AHCT125DBRHB125
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2003, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
SN54AHCT125, SN74AHCT125
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS264O – DECEMBER 1995 – REVISED JULY 2003
logic diagram (positive logic)
1
1OE
FUNCTION TABLE
(each buffer)
INPUTS
OEA
LHH
LLL
HXZ
OUTPUT
Y
2
1A1Y
4
2OE
5
2A2Y
10
3OE
9
3A3Y
13
4OE
12
4A4Y
Pin numbers shown are for the D, DB, DGV, J, N, NS, PW, RGY, and W packages.
3
6
8
11
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
UNIT
SN54AHCT125, SN74AHCT125
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS264O – DECEMBER 1995 – REVISED JULY 2003
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Output voltage range, V
Input clamp current, I
Output clamp current, I
Continuous output current, I
Continuous current through V
Package thermal impedance, θ
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
3. The package thermal impedance is calculated in accordance with JESD 51-5.
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
CC
0V
CC
V
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN54AHCT125, SN74AHCT125
PARAMETER
TEST CONDITIONS
V
UNIT
V
4.5 V
V
V
4.5 V
V
PARAMETER
UNIT
AYC
15 pF
ns
OE
Y
C
15 pF
ns
OE
Y
C
15 pF
ns
AYC
50 pF
ns
OE
Y
C
50 pF
ns
OE
Y
C
50 pF
ns
PARAMETER
UNIT
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS264O – DECEMBER 1995 – REVISED JULY 2003
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
CC
OH
OL
I
I
I
OZ
I
CC
∆I
CC
C
i
C
o
* On products compliant to MIL-PRF-38535, this parameter is not production tested at VCC = 0 V.
†
This is the increase in supply current for each input at one of the specified TTL voltage levels, rather than 0 V or VCC.
IOH = –50 mA
IOH = –8 mA
IOL = 50 mA
IOL = 8 mA
VI = 5.5 V or GND0 V to 5.5 V±0.1±1*±1
VO = VCC or GND5.5 V±0.25±2.5±2.5
VI = VCC or GND,IO = 05.5 V22020
One input at 3.4 V ,
†
Other inputs at VCC or GND
VI = VCC or GND5 V41010pF
VO = VCC or GND5 V15pF
5.5 V1.351.51.5mA
TA = 25°CSN54AHCT125SN74AHCT125
MINTYPMAXMINMAXMINMAX
4.44.54.44.4
3.943.83.8
0.10.10.1
0.360.440.44
m
A
m
A
m
A
switching characteristics over recommended operating free-air temperature range,
VCC = 5 V ± 0.5 V (unless otherwise noted) (see Figure 1)
FROMTOLOAD
(INPUT)(OUTPUT)CAPACITANCE
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
sk(o)
** On products compliant to MIL-PRF-38535, this parameter is not production tested.
*** On products compliant to MIL-PRF-38535, this parameter does not apply.
noise characteristics, V
V
OL(P)
V
OL(V)
V
OH(V)
V
IH(D)
V
IL(D)
NOTE 5: Characteristics are for surface-mount packages only.
Quiet output, maximum dynamic V
Quiet output, minimum dynamic V
Quiet output, minimum dynamic V
High-level dynamic input voltage2V
Low-level dynamic input voltage0.8V
= 5 V, CL = 50 pF, TA = 25°C (see Note 5)
CC
CL = 50 pF1***1ns
OL
OL
OH
p
=
L
p
=
L
p
=
L
p
=
L
p
=
L
p
=
L
TA = 25°CSN54AHCT125SN74AHCT125
MINTYPMAXMINMAXMINMAX
3.8**5.5**1**6.5**16.5
3.8**5.5**1**6.5**16.5
3.6**5.1**1**6**16
3.6**5.1**1**6**16
4.6**6.8**1**8**18
4.6**6.8**1**8**18
5.37.518.518.5
5.37.518.518.5
5.17.11818
5.17.11818
6.18.8110110
6.18.8110110
SN74AHCT125
MINMAX
4.4V
0.8V
–0.8V
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54AHCT125, SN74AHCT125
QUADRUPLE BUS BUFFER GATES
WITH 3-STATE OUTPUTS
SCLS264O – DECEMBER 1995 – REVISED JULY 2003
operating characteristics, V
C
Power dissipation capacitanceNo load,f = 1 MHz14pF
pd
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
(see Note A)
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
Input
Test
Point
C
L
t
w
1.5 V1.5 V
VOLTAGE WAVEFORMS
PULSE DURATION
= 5 V, TA = 25°C
CC
PARAMETERTEST CONDITIONSTYPUNIT
V
CC
Open
GND
Open Drain
t
su
1.5 V1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
TESTS1
t
PLH/tPHL
t
PLZ/tPZL
t
PHZ/tPZH
1.5 V
t
h
Open
V
CC
GND
V
CC
From Output
Under Test
C
(see Note A)
L
LOAD CIRCUIT FOR
3-STATE AND OPEN-DRAIN OUTPUTS
RL = 1 kΩ
3 V
0 V
S1
Timing Input
Data Input
3 V
0 V
3 V
0 V
Input
t
PLH
In-Phase
Output
t
PHL
Out-of-Phase
Output
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns.
D. The outputs are measured one at a time with one input transition per measurement.
E. All parameters and waveforms are not applicable to all devices.