TEXAS INSTRUMENTS SN54ABT16244 Technical data

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FEATURES

SN54ABT16244. . . WD PACKAGE

SN74ABT16244A. . . DGG, DGV, OR DL PACKAGE

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1OE

1Y1
1Y2

GND

1Y3
1Y4
V

CC

2Y1
2Y2

GND

2Y3
2Y4
3Y1
3Y2

GND

3Y3
3Y4
V

CC

4Y1
4Y2

GND

4Y3
4Y4

4OE

2OE
1A1
1A2
GND
1A3
1A4
V

CC

2A1
2A2
GND
2A3
2A4
3A1
3A2
GND
3A3
3A4
V

CC

4A1
4A2
GND
4A3
4A4
3OE

• Members of the Texas Instruments

Widebus™ Family

• State-of-the-Art EPIC-IIB™ BiCMOS Design

Significantly Reduces Power Dissipation

• Latch-Up Performance Exceeds 500 mA Per

JESD 70

• Typical V

at V

CC

• Distributed V

Minimizes High-Speed Switching Noise

• Flow-Through Architecture Optimizes PCB

Layout

• High-Drive Outputs (–32-mA IOH, 64-mA IOL)

• Package Options Include Plastic 300-mil

Shrink Small-Outline (DL), Thin Shrink
Small-Outline (DGG), and Thin Very
Small-Outline (DGV) Packages and 380-mil
Fine-Pitch Ceramic Flat (WD) Package
Using 25-mil Center-to-Center Spacings

(Output Ground Bounce) <1 V

OLP

= 5 V, T

= 25 ° C

A

and GND Pin Configuration

CC

SN54ABT16244, SN74ABT16244A

16-BIT BUFFERS/DRIVERS

WITH 3-STATE OUTPUTS

SCBS073H – SEPTEMBER 1991 – REVISED AUGUST 2005

DESCRIPTION

The SN54ABT16244 and SN74ABT16244A are 16-bit
buffers and line drivers designed specifically to
improve both the performance and density of 3-state
memory address drivers, clock drivers, and
bus-oriented receivers and transmitters. These
devices can be used as four 4-bit buffers, two 8-bit
buffers, or one 16-bit buffer. These devices provide
true outputs and symmetrical OE (active-low
output-enable) inputs.

To ensure the high-impedance state during power up or power down, OE should be tied to V
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN54ABT16244 is characterized for operation over the full military temperature range of –55 ° C to 125 ° C.
The SN74ABT16244A is characterized for operation from –40 ° C to 85 ° C.

Widebus, EPIC-IIB are trademarks of Texas Instruments.

PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

FUNCTION TABLE

(EACH BUFFER)

INPUTS

OE A

L H H
L L L
H X Z

through a pullup

CC

OUTPUT

Y

Copyright © 1991–2005, Texas Instruments Incorporated

On products compliant to MIL-PRF-38535, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.

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47

1A1

46

1A2

44

1A3

43

1A4

1Y1

2

1Y2

3

1Y3

5

1Y4

6

41

2A1

40

2A2

38

2A3

37

2A4

2Y1

8

2Y2

9

2Y3

11

2Y4

12

36

3A1

35

3A2

33

3A3

32

3A4

3Y1

13

3Y2

14

3Y3

16

3Y4

17

30

4A1

29

4A2

27

4A3

26

4A4

4Y1

19

4Y2

20

4Y3

22

4Y4

23

EN1

1

EN4

24

1OE
2OE

3OE
4OE

EN2

48

EN3

25

(1) This symbol is in accordance with ANSI/IEEE Std 91-1984 and

IEC Publication 617-12.

1

1

1

1

1

2

3

4

SN54ABT16244, SN74ABT16244A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS

SCBS073H – SEPTEMBER 1991 – REVISED AUGUST 2005

LOGIC SYMBOL

(1)

2

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1OE

1A1

1A2

1A3

1A4

1Y1

1Y2

1Y3

1Y4

1

47

46

44

43

2

3

5

6

2OE

2A1

2A2

2A3

2A4

2Y1

2Y2

2Y3

2Y4

48

41

40

38

37

8

9

11

12

3OE

3A1

3A2

3A3

3A4

3Y1

3Y2

3Y3

3Y4

25

36

35

33

32

13

14

16

17

4OE

4A1

4A2

4A3

4A4

4Y1

4Y2

4Y3

4Y4

24

30

29

27

26

19

20

22

23

LOGIC DIAGRAM (POSITIVE LOGIC)

SN54ABT16244, SN74ABT16244A

16-BIT BUFFERS/DRIVERS

WITH 3-STATE OUTPUTS

SCBS073H – SEPTEMBER 1991 – REVISED AUGUST 2005

Absolute Maximum Ratings

(1)

over operating free-air temperature range (unless otherwise noted)

V
V
V

I

I
I

θ

T

(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

(2) The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(3) The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD 51.

Supply voltage range –0.5 7 V

CC

Input voltage range

I

Voltage range applied to any output in the high or power-off state –0.5 5.5 V

O

Current into any output in the low state mA

O

Input clamp current VI< 0 –18 mA

IK

Output clamp current VO< 0 –50 mA

OK

Package thermal impedance

JA

Storage temperature range –65 150 ° C

stg

(2)

SN54ABT16244 96

(3)

SN74ABT16244A 128

DGG package 89
DGV package 93 ° C/W
DL package 94

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability

MIN MAX UNIT

–0.5 7 V

3

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SN54ABT16244, SN74ABT16244A
16-BIT BUFFERS/DRIVERS
WITH 3-STATE OUTPUTS

SCBS073H – SEPTEMBER 1991 – REVISED AUGUST 2005

Recommended Operating Conditions

V
V
V
V
I

OH

I

OL

∆ t/ ∆ v Input transition rise or fall rate Outputs enabled 10 10 ns/V
T

(1) All unused inputs of the device must be held at V

Supply voltage 4.5 5.5 4.5 5.5 V

CC

High-level input voltage 2 2 V

IH

Low-level input voltage 0.8 0.8 V

IL

Input voltage 0 V

I

High-level output current –24 –32 mA
Low-level output current 48 64 mA

Operating free-air temperature –55 125 –40 85 ° C

A

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

Electrical Characteristics

over recommended operating free-air temperature range (unless otherwise noted)

PARAMETER TEST CONDITIONS UNIT

V

IK

V

OH

V

OL

V

hys

I

I

I

OZH

I

OZL

I

off

I

CEX

(5)

I

O

I

CC

Data One input at 3.4 V,
inputs Other inputs at

(6)

∆ I

CC

Control V
inputs Other inputs at V

C

i

C

o

(1) Characteristics for TA= 25 ° C apply to the SN74ABT16244A only.
(2) All typical values are at V
(3) On products compliant to MIL-PRF-38535, this parameter does not apply.
(4) This data-sheet limit may vary among suppliers.
(5) Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
(6) This is the increase in supply current for each input that is at the specified TTL voltage level rather than V

V

= 4.5 V, II= –18 mA –1.2 –1.2 –1.2 V

CC

V

= 4.5 V, IOH= –3 mA 2.5 2.5 2.5

CC

V

= 5 V, IOH= –3 mA 3 3 3

CC

V

= 4.5 V

CC

V

= 4.5 V V

CC

V

= 5.5 V, VI= V

CC

V

= 5.5 V, VO= 2.7 V 10

CC

V

= 5.5 V, VO= 0.5 V –10

CC

V

= 0, VIor VO≤ 5.5 V ± 100 ± 100 µ A

CC

V

= 5.5 V,

CC

VO= 5.5 V
V

= 5.5 V, VO= 2.5 V –50 –100 –180 –50 –180 –50 –180 mA

CC

V

= 5.5 V,

CC

IO= 0, Outputs low 32 32 32 mA
VI= V

V

V

or GND

CC

= 5.5 V, Outputs enabled 0.05 1.5 0.05

CC

or GND

CC

= 5.5 V, One input at 3.4 V,

CC

IOH= –24 mA 2 2
IOH= –32 mA 2
IOL= 48 mA 0.55 0.55
IOL= 64 mA 0.55

or GND ± 1 ± 1 ± 1 µ A

CC

Outputs high 50 50 50 µ A

Outputs high 3 2 3

Outputs disabled 3 2 3

Outputs disabled 0.05 1 0.05

or GND

CC

VI= 2.5 V or 0.5 V 3 pF
VO= 2.5 V or 0.5 V 6 pF

= 5 V.

CC

(1)

SN54ABT16244 SN74ABT16244A

MIN MAX MIN MAX

CC

or GND to ensure proper device operation. Refer to the TI application report,

CC

TA= 25 ° C

MIN TYP

(3)

(1)

(2)

SN54ABT16244 SN74ABT16244A

MAX MIN MAX MIN MAX

(3)

100 mV

(4)
(4)

10 10

–10 –10

0.05 1.5 0.05

CC

0 V

2

0.55

or GND.

UNIT

V

CC

V

(4)

µ A

(4)

µ A

mA

4