Open-Collector Driver for Indicator Lamps
and Relays
D
Inputs Fully Compatible With Most TTL
Circuits
D
Package Options Include Ceramic Flat (W)
SN5407, SN5417 ...J OR W PACKAGE
SN7407, SN7417 ...N PACKAGE
1A
1Y
2A
2Y
3A
3Y
GND
(TOP VIEW)
1
14
2
13
3
12
4
11
5
10
6
7
9
8
V
6A
6Y
5A
5Y
4A
4Y
CC
Package and Plastic (N) and Ceramic (J)
DIPs
description
These monolithic TTL hex buffers/drivers feature high-voltage open-collector outputs for interfacing with
high-level circuits (such as MOS), or for driving high-current loads (such as lamps or relays), and also are
characterized for use as buffers for driving TTL inputs. The SN5407 and SN7407 have minimum breakdown
voltages of 30 V , and the SN5417 and SN7417 have minimum breakdown voltages of 15 V . The maximum sink
current is 30 mA for the SN5407 and SN5417 and 40 mA for the SN7407 and SN7417.
These circuits are completely compatible with most TTL families. Inputs are diode clamped to minimize
transmission-line effects, which simplifies design. Typical power dissipation is 145 mW and average
propagation delay time is 14 ns.
The SN5407 and SN5417 are characterized for operation over the full military temperature range of –55°C to
125°C. The SN7407 and SN7417 are characterized for operation from 0°C to 70°C.
logic symbol
†
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
†
1A
2A
3A
4A
5A
6A
1
3
5
9
11
13
10
12
2
1Y
4
2Y
6
3Y
8
4Y
5Y
6Y
logic diagram, each buffer/driver (positive logic)
AY
Y = A
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
SN5407, SN5417, SN7407, SN7417
VOHHigh-level output voltage
V
HEX BUFFERS/DRIVERS
WITH OPEN-COLLECTOR HIGH-VOLTAGE OUTPUTS
SDLS032A – DECEMBER 1983 – REVISED NOVEMBER 1997
schematic
V
CC
6 kΩ
Input A
100 Ω
1 kΩ
Resistor values shown are nominal.
3.4 kΩ1.6 kΩ
Output Y
GND
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage, V
Input voltage, V
Output voltage, V
Operating free-air temperature range, T
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. All voltage values are with respect to GND.
2. This is the maximum voltage that should be applied to any output when it is in the off state.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN5407
PARAMETER
V
IK
OH
V
OL
I
I
I
IH
I
IL
I
CCH
I
†
‡
CCL
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
All typical values are at VCC = 5 V, TA = 25°C.
VOH = 30 V (SN5407, SN7407)0.250.25
VOH = 15 V (SN5417, SN7417)0.250.25
IOL = 16 mA0.40.4
IOL = 30 mA (SN5407, SN5417)0.70.7
IOL = 40 mA (SN7407, SN7417)0.70.7
SN5417
MIN TYP‡MAXMIN TYP‡MAX
SN7407
SN7417
UNIT
V
switching characteristics, VCC = 5 V, TA = 25°C (see Figure 1)
PARAMETER
t
PLH
t
PHL
t
PLH
t
PHL
FROM
(INPUT)
TO
(OUTPUT)
TEST CONDITIONSMINTYPMAXUNIT
=
=
,
,
L
L
= 15 p
L
= 50 p
L
615
2026
15
26
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3
SN5407, SN5417, SN7407, SN7417
HEX BUFFERS/DRIVERS
WITH OPEN-COLLECTOR HIGH-VOLTAGE OUTPUTS
SDLS032A – DECEMBER 1983 – REVISED NOVEMBER 1997
PARAMETER MEASUREMENT INFORMATION
V
CC
R
L
From Output
Under Test
C
L
(see Note A)
LOAD CIRCUIT
Test Point
Timing
Input
Data
Input
Input
In-Phase
Output
Out-of-Phase
Output
(see Note E)
t
su
1.5 V
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
1.5 V1.5 V
t
PLH
1.5 V1.5 V
t
PHL
1.5 V1.5 V
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.5 V
t
h
1.5 V
t
PHL
t
PLH
3 V
0 V
3 V
0 V
3 V
0 V
V
V
V
V
OH
OL
OH
OL
High-Level
Pulse
Low-Level
Pulse
VOLTAGE WAVEFORMS
Output
Control
(low-level
enabling)
t
PZL
Waveform 1
(see Note B)
Waveform 2
(see Note B)
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS
S1 Closed,
S2 Open
t
PZH
S1 Open,
S2 Closed
VOLTAGE WAVEFORMS
1.5 V1.5 V
t
w
1.5 V1.5 V
PULSE WIDTHS
1.5 V1.5 V
t
PLZ
≈ 4.5 V
1.5 V
t
PHZ
1.5 V
≈ 0 V
3 V
0 V
S1 and
S2 Closed
≈ 1.5 V
V
OL
0.5 V
0.5 V
V
OH
≈ 1.5 V
S1 and
S2 Closed
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. In the examples above, the phase relationships between inputs and outputs have been chosen arbitrarily.
D. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1 MHz, ZO = 50 Ω, tr ≤ 7 ns, tf≤ 7 ns.
E. When measuring propagation delay times of 3-state outputs, switches S1 and S2 are closed.
F. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOL VE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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