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TI warrants performance of its hardware products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI
deems necessary to support this warranty . Except where mandated by government requirements, testing of all
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TMS320C24x, Code Composer Studio, DSP/BIOS, and MicroStar BGA are trademarks of Texas Instruments.
†
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this
component beyond specified performance and environmental limits.
‡
IEEE Standard 1149.1−1990, IEEE Standard Test-Access Port
March 2004 − Revised October 2004SGUS051A
11
Introduction
−55°C to 125°C
2Introduction
This section provides a summary of each device’s features, lists the pin assignments, and describes the
function of each pin. This document also provides detailed descriptions of peripherals, electrical
specifications, parameter measurement information, and mechanical data about the available packaging.
2.1Description
The SM320F2810-EP, SM320F2811-EP, SM320F2812-EP, SM320C2810-EP, SM320C2811-EP, and
SM320C2812-EP devices, members of the TMS320C28x DSP generation, are highly integrated,
high-performance solutions for demanding control applications. The functional blocks and the memory maps
are described in Section 3, Functional Overview.
Throughout this document, SM320F2810-EP, SM320F2811-EP, and SM320F2812-EP are abbreviated as
F2810, F2811, and F2812, respectively. F281x denotes all three Flash devices. SM320C2810-EP,
SM320C2811-EP, and SM320C2812-EP are abbreviated as C2810, C2811, and C2812, respectively . C281x
denotes all three ROM devices. 2810 denotes both F2810 and C2810 devices; 2811 denotes both F2811 and
C2811 devices; and 2812 denotes both F2812 and C2812 devices.
ORDERING INFORMATION
T
A
†
Package drawings, standard packing quantities, thermal data,
symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
The TMS320F2810, TMS320F2811, and TMS320F2812 Digital Signal Processors Silicon Errata (literature number SPRZ193) has been posted
on the Texas Instruments (TI) website. It will be updated as needed.
‡
On C281x devices, OTP is replaced by a 1K X 16 block of ROM.
§
M stands for −55°C to 125°C military range.
¶
See Section 5.1, Device and Development Support Nomenclature for descriptions of TMS and TMX stages.
#
PP: Product Preview. Electrical specifications of F2810/11/12 devices are to be considered as advance information for C2810/11/12 devices.
||
TMX: The status of each device is indicated on the page(s) specifying its electrical characteristics and is not necessarily representative of the
final device’s electrical specifications.
§
125°C
¶
18K18K18K18K18K18K
YesYesYesYesYesYes
EVA, EVBEVA, EVBEVA, EVBEVA, EVBEVA, EVBEVA, EVB
179-ball GHH
176-pin PGF
NoNoYesNoNoNo
PP
#
PP
#
†
128-pin PBK128-pin PBK
SMTMX
‡
||
Yes
TMX
‡
||
‡
Yes
179-ball GHH
176-pin PGF
||
TMX
March 2004 − Revised October 2004SGUS051A
13
Introduction
2.3Pin Assignments
Figure 2−1 illustrates the ball locations for the 179-ball GHH ball grid array (BGA) package. Figure 2−2 shows
the pin assignments for the 176-pin PGF low-profile quad flatpack (LQFP) and Figure 2−3 shows the pin
assignments for the 128-pin PBK LQFP. Table 2−2 describes the function(s) of each pin.
2.3.1Terminal Assignments for the GHH Package
See Table 2−2 for a description of each terminal’s function(s).
The 320F2812 and 320C2812 176-pin PGF low-profile quad flatpack (LQFP) pin assignments are shown in
Figure 2−2. See Table 2−2 for a description of each pin’s function(s).
Figure 2−2. 320F2812 and 320C2812 176-Pin PGF LQFP (Top View)
March 2004 − Revised October 2004SGUS051A
15
Introduction
2.3.3Pin Assignments for the PBK Package
The 320F2810, 320F2811, 320C2810, and 320C2811 128-pin PBK low-profile quad flatpack (LQFP) pin
assignments are shown in Figure 2−3. See Table 2−2 for a description of each pin’s function(s).
Figure 2−3. 320F2810, 320F2811, 320C2810, and 320C2811 128-Pin PBK LQFP
(Top View)
March 2004 − Revised October 2004SGUS051A
2.4Signal Descriptions
‡
§
19-bit XINTF Address Bus
Table 2−2 specifies the signals on the F281x and C281x devices. All digital inputs are TTL-compatible. All
outputs are 3.3 V with CMOS levels. Inputs are not 5-V tolerant. A 100-µA (or 20-µA) pullup/pulldown is used.
Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
179-PIN
GHH
176-PIN
PGF
128-PIN
PBK
I/O/Z
XINTF SIGNALS (2812 ONLY)
PU/PD
19-bit XINTF Address Bus
16-bit XINTF Data Bus
†
DESCRIPTION
March 2004 − Revised October 2004SGUS051A
17
Introduction
Table 2−2. Signal Descriptions
PIN NO.
‡
NAMEDESCRIPTIONPU/PD
NAMEDESCRIPTIONPU/PD
XMP/MCF117−IPD
XHOLDE7159−IPU
XHOLDAK1082−O/Z−
XZCS0AND1P144−O/Z−
XZCS2P1388−O/Z−
XZCS6AND7B13133−O/Z−
XWEN1184−O/Z−
XRDM342−O/Z−
XR/WN451−O/Z−
†
Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
179-PIN
GHH
176-PIN
PGF
128-PIN
PBK
XINTF SIGNALS (2812 ONLY) (CONTINUED)
I/O/Z
I/O/Z
‡
†
(Continued)
§
§
Microprocessor/Microcomputer Mode Select. Switches
between microprocessor and microcomputer mode. When
high, Zone 7 is enabled on the external interface. When low,
Zone 7 is disabled from the external interface, and on-chip
boot ROM may be accessed instead. This signal is latched
into the XINTCNF2 register on a reset and the user can modify
this bit in software. The state of the XMP/MC
after reset.
External Hold Request. XHOLD, when active (low), requests
the XINTF to release the external bus and place all buses and
strobes into a high-impedance state. The XINTF will release
the bus when any current access is complete and there are no
pending accesses on the XINTF.
External Hold Acknowledge. XHOLDA is driven active (low)
when the XINTF has granted a XHOLD
buses and strobe signals will be in a high-impedance state.
XHOLDA is released when the XHOLD signal is released.
External devices should only drive the external bus when
XHOLDA
XINTF Zone 0 and Zone 1 Chip Select. XZCS0AND1 is active
(low) when an access to the XINTF Zone 0 or Zone 1 is
performed.
XINTF Zone 2 Chip Select. XZCS2 is active (low) when an
access to the XINTF Zone 2 is performed.
XINTF Zone 6 and Zone 7 Chip Select. XZCS6AND7 is active
(low) when an access to the XINTF Zone 6 or Zone 7 is
performed.
Write Enable. Active-low write strobe. The write strobe
waveform is specified, per zone basis, by the Lead, Active,
and Trail periods in the XTIMINGx registers.
Read Enable. Active-low read strobe. The read strobe
waveform is specified, per zone basis, by the Lead, Active,
and Trail periods in the XTIMINGx registers. NOTE: The XRD
and XWE signals are mutually exclusive.
Read Not Write Strobe. Normally held high. When low, XR/W
indicates write cycle is active; when high, XR/W indicates read
cycle is active.
is active (low).
pin is ignored
request. All XINTF
18
March 2004 − Revised October 2004SGUS051A
Introduction
Table 2−2. Signal Descriptions
PIN NO.
‡
NAMEDESCRIPTIONPU/PD
NAMEDESCRIPTIONPU/PD
XREADYB6161−IPU
X1/XCLKINK97758I
X2M97657OOscillator Output
XCLKOUTF1111987O−
TESTSELA1313497IPDTest Pin. Reserved for TI. Must be connected to ground.
179-PIN
GHH
176-PIN
PGF
128-PIN
PBK
XINTF SIGNALS (2812 ONLY) (CONTINUED)
JTAG AND MISCELLANEOUS SIGNALS
I/O/Z
I/O/Z
‡
†
(Continued)
§
§
Ready Signal. Indicates peripheral is ready to complete the
access when asserted to 1. XREADY can be configured to be
a synchronous or an asynchronous input. See the timing
diagrams for more details.
Oscillator Input − input to the internal oscillator. This pin is also
used to feed an e x t e r n a l clock. The 28x can be operated with
an external clock source, provided that the proper voltage
levels be driven on the X1/XCLKIN pin. It should be noted that
the X1/XCLKIN pin is referenced to the 1.8-V (or 1.9-V) core
digital power supply (VDD), rather than the 3.3-V I/O supply
(V
). A clamping diode may be used to clamp a buffered
DDIO
clock signal to ensure that the logic-high level does not
exceed VDD (1.8 V or 1.9 V) or a 1.8-V oscillator may be used.
Output clock derived from SYSCLKOUT to be used for
external wait-state generation and as a general-purpose clock
source. XCLKOUT is either the same frequency, 1/2 the
frequency, or 1/4 the frequency of SYSCLKOUT. At reset,
XCLKOUT = SYSCLKOUT/4. The XCLKOUT signal can be
turned of f by setting bit 3 (CLKOFF) of the XINTCNF2 register
to 1.
Device Reset (in) and Watchdog Reset (out).
Device reset. XRS causes the device to terminate execution.
The PC will point to the address contained at the location
0x3FFFC0. When XRS
begins at the location pointed to by the PC. This pin is driven
XRSD6160113I/OPU
TEST1M76751I/O−
TEST2N76650I/O−
†
Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
low by the DSP when a watchdog reset occurs. During
watchdog reset, the XRS
watchdog reset duration of 512 XCLKIN cycles.
The output buffer of this pin is an open-drain with an internal
pullup (100 µA, typical). It is recommended that this pin be
driven by an open-drain device.
Test Pin. Reserved for TI. On F281x devices, TEST1 must be
left unconnected. On C281x devices, this pin is a “no connect
(NC)” (i.e., this pin is not connected to any circuitry internal
to the device).
Test Pin. Reserved for TI. On F281x devices, TEST2 must be
left unconnected. On C281x devices, this pin is a “no connect
(NC)” (i.e., this pin is not connected to any circuitry internal
to the device).
is brought to a high level, execution
pin will be driven low for the
March 2004 − Revised October 2004SGUS051A
19
Introduction
pins should not be driven before V
, V
, and V
pins have been fully powered up.
Table 2−2. Signal Descriptions
PIN NO.
‡
NAMEDESCRIPTIONPU/PD
NAMEDESCRIPTIONPU/PD
TRSTB1213598IPD
TCKA1213699IPUJTAG test clock with internal pullup
Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
179-PIN
GHH
176-PIN
PGF
128-PIN
PBK
ADC ANALOG INPUT SIGNALS
I/O/Z
I/O/Z
‡
JTAG
†
(Continued)
§
§
JTAG test reset with internal pulldown. TRST, when driven
high, gives the scan system control of the operations of the
device. If this signal is not connected or driven low , the device
operates in its functional mode, and the test reset signals are
ignored.
NOTE: Do not use pullup resistors on TRST
pulldown device. In a low-noise environment, TRST
left floating. In a high-noise environment, an additional
pulldown resistor may be needed. The value of this resistor
should be based on drive strength of the debugger pods
applicable to the design. A 2.2-kΩ resistor generally offers
adequate protection. Since this is application-specific, it is
recommended that each target board is validated for proper
operation of the debugger and the application.
JTAG test-mode select (TMS) with internal pullup. This serial
control input is clocked into the TAP controller on the rising
edge of TCK.
JTAG test data input (TDI) with internal pullup. TDI is clocked
into the selected register (instruction or data) on a rising e dg e
of TCK.
JTAG scan out, test data output (TDO). The contents of the
selected register (instruction or data) is shifted out of TDO on
the falling edge of TCK.
Emulator pin 0. When TRST is driven high, this pin is used
as an interrupt to or from the emulator system and is
defined as input/output through the JTAG scan.
Emulator pin 1. When TRST is driven high, this pin is used
as an interrupt to or from the emulator system and is
defined as input/output through the JTAG scan.
8-Channel analog inputs for Sample-and-Hold A. The ADC
ADCRESEXTF21616OADC External Current Bias Resistor (24.9 kΩ ±5%)
ADCBGREFINE6164116ITest Pin. Reserved for TI. Must be left unconnected.
AVSSREFBGE31212IADC Analog GND
AVDDREFBGE11313IADC Analog Power (3.3-V)
ADCLOB3175127ICommon Low Side Analog Input. Connect to analog ground.
V
SSA1
V
SSA2
V
DDA1
V
DDA2
V
SS1
V
DD1
V
DDAIO
V
SSAIO
†
Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
179-PIN
GHH
F31515IADC Analog GND
C5165117IADC Analog GND
F41414IADC Analog 3.3-V Supply
A5166118IADC Analog 3.3-V Supply
C6163115IADC Digital GND
A6162114IADC Digital 1.8-V (or 1.9-V) Supply
B2113.3-V Analog I/O Power Pin
A2176128Analog I/O Ground Pin
176-PIN
PGF
128-PIN
PBK
ADC ANALOG INPUT SIGNALS (CONTINUED)
I/O/Z
I/O/Z
‡
†
(Continued)
§
§
8-Channel Analog Inputs for Sample-and-Hold B. The ADC
DDA1
ADC Voltage Reference Output (2 V). Requires a low ESR
(50 mΩ − 1.5 Ω) ceramic bypass capacitor of 10 µF to analog
ground. (Can accept external reference input (2 V) if the
software bit is enabled for this mode. 1−10 µF low ESR
capacitor can be used in the external reference mode.)
ADC Voltage Reference Output (1 V). Requires a low ESR
(50 mΩ − 1.5 Ω) ceramic bypass capacitor of 10 µF to analog
ground. (Can accept external reference input (1 V) if the
software bit is enabled for this mode. 1−10 µF low ESR
capacitor can be used in the external reference mode.)
DDA2
March 2004 − Revised October 2004SGUS051A
21
Introduction
,
Recommended Operating Conditions, for voltage
requirements.
Table 2−2. Signal Descriptions
PIN NO.
‡
NAMEDESCRIPTIONPU/PD
NAMEDESCRIPTIONPU/PD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
DD
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
DDIO
V
DDIO
V
DDIO
V
DDIO
V
DDIO
V
DDIO
V
DD3VFL
†
Typical drive strength of the output buffer for all pins is 4 mA except for TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins, which are 8 mA.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
1.8-V or 1.9-V Core Digital Power Pins. See Section 6.2
Core and Digital I/O Ground Pins
3.3-V I/O Digital Power Pins
3.3-V Flash Core Power Pin. This pin should be connected to
3.3 V at all times after power-up sequence requirements have
been met. This pin is used as VDDIO in ROM parts and must
be connected to 3.3 V in ROM parts as well.
22
March 2004 − Revised October 2004SGUS051A
Table 2−2. Signal Descriptions† (Continued)
§
PIN NO.
GPIOPERIPHERAL SIGNAL
GPIOA0PWM1 (O)M129268I/O/ZPUGPIO or PWM Output Pin #1
GPIOA1PWM2 (O)M149369I/O/ZPUGPIO or PWM Output Pin #2
GPIOA2PWM3 (O)L129470I/O/ZPUGPIO or PWM Output Pin #3
GPIOA3PWM4 (O)L139571I/O/ZPUGPIO or PWM Output Pin #4
GPIOA4PWM5 (O)K119872I/O/ZPUGPIO or PWM Output Pin #5
GPIOA5PWM6 (O)K1410175I/O/ZPUGPIO or PWM Output Pin #6
GPIOA6T1PWM_T1CMP (I)J1110276I/O/ZPUGPIO or Timer 1 Output
GPIOA7T2PWM_T2CMP (I)J1310477I/O/ZPUGPIO or Timer 2 Output
GPIOA8CAP1_QEP1 (I)H1010678I/O/ZPUGPIO or Capture Input #1
GPIOA9CAP2_QEP2 (I)H1110779I/O/ZPUGPIO or Capture Input #2
GPIOA10CAP3_QEPI1 (I)H1210980I/O/ZPUGPIO or Capture Input #3
GPIOA11TDIRA (I)F1411685I/O/ZPUGPIO or Timer Direction
GPIOA12TCLKINA (I)F1311786I/O/ZPUGPIO or Timer Clock Input
GPIOA13C1TRIP (I)E1312289I/O/ZPUGPIO or Compare 1 Output Trip
GPIOA14C2TRIP (I)E1112390I/O/ZPUGPIO or Compare 2 Output Trip
GPIOA15C3TRIP (I)F1012491I/O/ZPUGPIO or Compare 3 Output Trip
GPIOB0PWM7 (O)N24533I/O/ZPUGPIO or PWM Output Pin #7
GPIOB1PWM8 (O)P24634I/O/ZPUGPIO or PWM Output Pin #8
GPIOB2PWM9 (O)N34735I/O/ZPUGPIO or PWM Output Pin #9
GPIOB3PWM10 (O)P34836I/O/ZPUGPIO or PWM Output Pin #10
GPIOB4PWM11 (O)L44937I/O/ZPUGPIO or PWM Output Pin #11
GPIOB5PWM12 (O)M45038I/O/ZPUGPIO or PWM Output Pin #12
GPIOB6T3PWM_T3CMP (I)K55340I/O/ZPUGPIO or Timer 3 Output
GPIOB7T4PWM_T4CMP (I)N55541I/O/ZPUGPIO or Timer 4 Output
GPIOB8CAP4_QEP3 (I)M55743I/O/ZPUGPIO or Capture Input #4
GPIOB9CAP5_QEP4 (I)M65944I/O/ZPUGPIO or Capture Input #5
GPIOB10CAP6_QEPI2 (I)P66045I/O/ZPUGPIO or Capture Input #6
GPIOB11TDIRB (I)L87154I/O/ZPUGPIO or Timer Direction
GPIOB12TCLKINB (I)K87255I/O/ZPUGPIO or Timer Clock Input
GPIOB13C4TRIP (I)N66146I/O/ZPUGPIO or Compare 4 Output Trip
GPIOB14C5TRIP (I)L66247I/O/ZPUGPIO or Compare 5 Output Trip
GPIOB15C6TRIP (I)K76348I/O/ZPUGPIO or Compare 6 Output Trip
†
Typical drive strength of the output buffer for all pins [except TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins] is 4 mA typical.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
GPIOE0XINT1_XBIO (I)D9149106I/O/Z−GPIO or XINT1 or XBIO input
GPIOE1XINT2_ADCSOC (I)D8151108I/O/Z−GPIO or XINT2 or ADC start of conversion
GPIOE2XNMI_XINT13 (I)E8150107I/O/ZPUGPIO or XNMI or XINT13
GPIOF0SPISIMOA (O)M14031I/O/Z−GPIO or SPI slave in, master out
GPIOF1SPISOMIA (I)N14132I/O/Z−GPIO or SPI slave out, master in
GPIOF2SPICLKA (I/O)K23427I/O/Z−GPIO or SPI clock
GPIOF3SPISTEA (I/O)K43528I/O/Z−GPIO or SPI slave transmit enable
GPIOF4SCITXDA (O)C7155111I/O/ZPU
GPIOF5SCIRXDA (I)A7157112I/O/ZPU
GPIOF6CANTXA (O)N128764I/O/ZPUGPIO or eCAN transmit data
GPIOF7CANRXA (I)N138965I/O/ZPUGPIO or eCAN receive data
GPIOF8MCLKXA (I/O)J12823I/O/ZPUGPIO or transmit clock
GPIOF9MCLKRA (I/O)H22521I/O/ZPUGPIO or receive clock
GPIOF10MFSXA (I/O)H42622I/O/ZPUGPIO or transmit frame synch
GPIOF11MFSRA (I/O)J22924I/O/ZPUGPIO or receive frame synch
GPIOF12MDXA (O)G12219I/O/Z−GPIO or transmitted serial data
GPIOF13MDRA (I)G22018I/O/ZPUGPIO or received serial data
†
Typical drive strength of the output buffer for all pins [except TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins] is 4 mA typical.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
179-PIN
GHH
176-PIN
PGF
GPIOD OR EVA SIGNALS
GPIOD OR EVB SIGNALS
GPIOE OR INTERRUPT SIGNALS
GPIOF OR SPI SIGNALS
GPIOF OR SCI-A SIGNALS
GPIOF OR CAN SIGNALS
GPIOF OR McBSP SIGNALS
128-PIN
PBK
I/O/Z‡PU/PD
DESCRIPTION
Timer 2 Compare Output Trip or External
ADC Start-of-Conversion EV-A
Timer 4 Compare Output Trip or External
ADC Start-of-Conversion EV-B
GPIO or SCI asynchronous serial port TX
data
GPIO or SCI asynchronous serial port RX
data
24
March 2004 − Revised October 2004SGUS051A
Table 2−2. Signal Descriptions† (Continued)
§
PIN NO.
GPIOPERIPHERAL SIGNAL
GPIOF14XF_XPLLDIS (O)A11140101I/O/ZPU
GPIOG4SCITXDB (O)P149066I/O/Z−
GPIOG5SCIRXDB (I)M139167I/O/Z−
†
Typical drive strength of the output buffer for all pins [except TDO, XCLKOUT, XF, XINTF, EMU0, and EMU1 pins] is 4 mA typical.
‡
I = Input, O = Output, Z = High impedance
§
PU = pin has internal pullup; PD = pin has internal pulldown
179-PIN
GHH
176-PIN
PGF
GPIOF OR XF CPU OUTPUT SIGNAL
GPIOG OR SCI-B SIGNALS
128-PIN
PBK
I/O/Z‡PU/PD
DESCRIPTION
This pin has three functions:
1. XF − General-purpose output pin.
2. XPLLDIS − This pin will be sampled
during reset to check if the PLL needs
to be disabled. The PLL will be
disabled if this pin is sensed low. HALT
and STANDBY modes cannot be used
when the PLL is disabled.
3. GPIO − GPIO function
GPIO or SCI asynchronous serial port
transmit data
GPIO or SCI asynchronous serial port
receive data
NOTE:
Other than the power supply pins, no pin should be driven before the 3.3-V rail has reached
recommended operating conditions. However , i t i s acceptable for an I/O pin to ramp along with
the 3.3-V supply.
Introduction
March 2004 − Revised October 2004SGUS051A
25
Functional Overview
3Functional Overview
Memory Bus
GPIO Pins
TINT0
TINT1
G
P
I
O
M
U
X
XINT13
XNMI
CPU-Timer 0
CPU-Timer 1
CPU-Timer 2
TINT2
PIE
(96 interrupts)
External Interrupt
Control
(XINT1/2/13, XNMI)
SCIA/SCIB
SPIFIFO
McBSP
eCAN
EVA/EVB
†
FIFO
FIFO
INT14
INT[12:1]
INT13
NMI
C28x CPU
Real-Time JTAG
External
Interface
‡
(XINTF)
M0 SARAM
1K x 16
M1 SARAM
1K x 16
L0 SARAM
4K x 16
L1 SARAM
4K x 16
Flash
128K x 16 (F2812)
128K x 16 (F2811)
64K x 16 (F2810)
Control
Address(19)
Data(16)
XRS
X1/XCLKIN
X2
XF_XPLLDIS
†
45 of the possible 96 interrupts are used on the devices.
‡
XINTF is available on the F2812 and C2812 devices only.
§
On C281x devices, the OTP is replaced with a 1K X 16 block of ROM
Only one of these vector maps—M0 vector, PIE vector, BROM vector, XINTF vector—should be enabled at a time.
NOTES: A. Memory blocks are not to scale.
B. Reserved locations are reserved for future expansion. Application should not access these areas.
C. Boot ROM and Zone 7 memory maps are active either in on-chip or XINTF zone depending on MP/MC
D. Peripheral Frame 0, Peripheral Frame 1, and Peripheral Frame 2 memory maps are restricted to data memory only. User program
cannot access these memory maps in program space.
E. “Protected” means the order of Write followed by Read operations is preserved rather than the pipeline order.
F. Certain memory ranges are EALLOW protected against spurious writes after configuration.
G. Zones 0 and 1 and Zones 6 and 7 share the same chip select; hence, these memory blocks have mirrored locations.
Figure 3−2. F2812/C2812 Memory Map (See Notes A through E)
Only one of these vector maps—M0 vector, PIE vector, BROM vector, XINTF vector—should be enabled at a time.
NOTES: A. Memory blocks are not to scale.
B. Reserved locations are reserved for future expansion. Application should not access these areas.
C. Peripheral Frame 0, Peripheral Frame 1, and Peripheral Frame 2 memory maps are restricted to data memory only. User program
cannot access these memory maps in program space.
D. “Protected” means the order of Write followed by Read operations is preserved rather than the pipeline order.
E. Certain memory ranges are EALLOW protected against spurious writes after configuration.
0x3D 7800
0x3D 7C00
0x3D 8000
0x3F 7FF8
0x3F 8000
0x3F A000
0x3F F000
0x3F FFC0
Reserved
OTP (or ROM) (1K × 16, Secure Block)
Reserved (1K)
Flash (or ROM) (128K × 16, Secure Block)
128-Bit Password
H0 SARAM (8K × 16)
Reserved
Boot ROM (4K × 16)
(Enabled if MP/MC
BROM Vector - ROM (32 × 32)
(Enabled if VMAP = 1, MP/MC
= 0)
= 0, ENPIE = 0)
28
Figure 3−3. F2811/C2811 Memory Map (See Notes A through E)
Only one of these vector maps—M0 vector, PIE vector, BROM vector—should be enabled at a time.
NOTES: A. Memory blocks are not to scale.
B. Reserved locations are reserved for future expansion. Application should not access these areas.
C. Peripheral Frame 0, Peripheral Frame 1, and Peripheral Frame 2 memory maps are restricted to data memory only. User program
cannot access these memory maps in program space.
D. “Protected” means the order of Write followed by Read operations is preserved rather than the pipeline order.
E. Certain memory ranges are EALLOW protected against spurious writes after configuration.
0x3D 7800
0x3D 7C00
0x3E 8000
0x3F 7FF8
0x3F 8000
0x3F A000
0x3F F000
0x3F FFC0
Reserved
OTP (or ROM) (1K × 16, Secure Block)
Reserved
Flash (or ROM) (64K × 16, Secure Block)
128-Bit Password
H0 SARAM (8K × 16)
Reserved
Boot ROM (4K × 16)
(Enabled if MP/MC
BROM Vector - ROM (32 × 32)
(Enabled if VMAP = 1, MP/MC
= 0)
= 0, ENPIE = 0)
Figure 3−4. F2810/C2810 Memory Map (See Notes A through E)
March 2004 − Revised October 2004SGUS051A
29
Functional Overview
Table 3−1. Addresses of Flash Sectors in F2812 and F2811
ADDRESS RANGEPROGRAM AND DATA SPACE
0x3D 8000
0x3D 9FFF
0x3D A000
0x3D BFFF
0x3D C000
0x3D FFFF
0x3E 0000
0x3E 3FFF
0x3E 4000
0x3E 7FFF
0x3E 8000
0x3E BFFF
0x3E C000
0x3E FFFF
0x3F 0000
0x3F 3FFF
0x3F 4000
0x3F 5FFF
0x3F 6000Sector A, 8K x 16
0x3F 7F80
0x3F 7FF5
0x3F 7FF6
0x3F 7FF7
0x3F 7FF8
0x3F 7FFF
Program to 0x0000 when using the
Boot-to-Flash (or ROM) Entry Point
Sector J, 8K x 16
Sector I, 8K x 16
Sector H, 16K x 16
Sector G, 16K x 16
Sector F, 16K x 16
Sector E, 16K x 16
Sector D, 16K x 16
Sector C, 16K x 16
Sector B, 8K x 16
Code Security Module
(program branch instruction here)
Security Password (128-Bit)
(Do not program to all zeros)
Table 3−2. Addresses of Flash Sectors in F2810
ADDRESS RANGEPROGRAM AND DATA SPACE
0x3E 8000
0x3E BFFF
0x3E C000
0x3E FFFF
0x3F 0000
0x3F 3FFF
0x3F 4000
0x3F 5FFF
0x3F 6000Sector A, 8K x 16
0x3F 7F80
0x3F 7FF5
0x3F 7FF6
0x3F 7FF7
0x3F 7FF8
0x3F 7FFF
Sector E, 16K x 16
Sector D, 16K x 16
Sector C, 16K x 16
Sector B, 8K x 16
Program to 0x0000 when using the
Code Security Module
Boot-to-Flash (or ROM) Entry Point
(program branch instruction here)
Security Password (128-Bit)
(Do not program to all zeros)
30
March 2004 − Revised October 2004SGUS051A
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