•On-Chip Low-Dropout Output (LDO) for
Low-Noise TCXO Supply
•Serial I2C Interface (Compatible With
High-Speed Mode, 3.4 Mbit/s)
•1.8-V Device Power Supply
•Wide Temperature Range, –30°C to 85°C
•ESD Protection: 2 KV HBM, 750 V CDM, and
100 V MM
•Small 20-Pin Chip-Scale Package: 0.4-mm
DESCRIPTION
The CDC3S04 is a four-channel low-power low-jitter
sine-wave clock buffer. It can be used to buffer a
single master clock to multiple peripherals. The four
sine-wave outputs (CLK1–CLK4) are designed for
minimalchannel-to-channelskewandultralow
additive output jitter.
Each output has its own clock request inputs which
enables the dedicated clock output. These clock
requests are active-high (can also be changed to be
active-low via I2C), and an output signal is generated
that can be sent back to the master clock to request
theclock(MCLK_REQ).MCKL_REQisan
open-source output and supports the wired-OR
function (default mode). It needs an external pulldown
resistor. MCKL_REQ can be changed to wired-AND
or push-pull functionality via I2C.
The CDC3S04 also provides an I2C interface
Pitch WCSP (1.6 mm × 2 mm)(Hs-mode) that can be used to enable or disable the
outputs, select the polarity of the REQ inputs, and
APPLICATIONS
•Cellular Phones
•Smart Phones
•Mobile Handsets
•Portable Systems
allow control of internal decoding.
The CDC3S04 features an on-chip high-performance
LDO that accepts voltages from 2.3 V to 5.5 V and
outputs a 1.8-V supply. This 1.8-V supply can be
used to power an external 1.8-V TCXO. It can be
enabled or disabled for power saving at the TCXO.
•Wireless Modems Including GPS, WLAN,
W-BT, D-TV, DVB-H, FM Radio, WiMAX, and
System Clock
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION (CONTINUED)
A low signal at the RESET input switches the outputs CLK1 and CLK4 into the default state. In this configuration,
CLK1 and CLK4 are ON (see Table 1); the remaining device function is not affected. Also, the RESET input
provides a glitch filter which rejects spikes of typical 300 ns on the RESET line to preserve false reset. A
complete device reset to the default condition can be initiated by a power-up cycle of V
The CDC3S04 operates from two 1.8-V supplies. There is a core supply (VDD_DIG/GND_DIG) for the core logic
and a low-noise analog supply (VDD_ANA/GND_ANA) for the sine-wave outputs. The CDC3S04 is designed for
sequence-less power up. Both supply voltages may be applied in any order.
The CDC3S04 is offered in a 0.4-mm pitch WCSP package (1.6 mm × 2 mm) and is optimized for low standby
current (0.5 µA). It is characterized for operation from –30°C to 85°C.
DEVICE INFORMATION
PIN FUNCTIONS
NAMEBALL NO.TYPEFUNCTION
ADR_A0D4InputSelectable address bit A0 of slave-address register; internal 500-kΩ pulldown resistor
CLK1A4OutputClock output 1
CLK2A2OutputClock output 2
CLK3C4OutputClock output 3
CLK4C2OutputClock output 4
GND_ANAB4GroundGround for sine-wave buffer
GND_DIGD2GroundGround for core logic
MCLK_INB1InputMaster clock input
MCLK_REClock request to the master clock source; active-high; open-source output for wired-OR
Qconnection (default condition). Can be changed to push-pull output or wired-AND output via I2C.
REQ1A3InputClock request from peripheral 1; internal 500-kΩ pulldown resistor
REQ2A1InputClock request from peripheral 2; internal 500-kΩ pulldown resistor
REQ3C3InputClock request from peripheral 3; internal 500-kΩ pulldown resistor
REQ4C1InputClock request from peripheral 4; internal 500-kΩ pulldown resistor
RESETB2InputCLK1 and CLK4 outputs to ON (see Table 1). On-chip LDO is enabled. Internal 1-MΩ pullup
SCLHE4InputI2C clock input – Hs-mode. Internal 1-MΩ pullup resistor
SDAHE3Input/output I2C data input/output – Hs-mode. Internal 1-MΩ pullup resistor
VBATE2PowerSupply pin to internal LDO
VDD_ANAB3Power1.8-V power supply for sine-wave buffer
VDD_DIGD1Power
VLDOE1Output
D3Output
Peripheral reset signal provided by application processor. The signal is active-low and switches
resistor and 300-ns (typ) glitch filter.
1.8-V power supply for core logic. Power up of VDD_DIG resets the whole device to the default
condition.
1.8-V supply for external TCXO; LDO is enabled if RESET (default mode) or REQx is active.
LDO is not enabled if only VBAT is on.
Table 1. Reset and Request (REQx) Conditions for Clock Outputs
(2)
RESET
0OnOn
1
PRIORITY BIT
(3)
0Controlled by REQ2Controlled by REQ3
1Controlled by REQ2INTControlled by REQ3INT
0Controlled by REQ1Controlled by REQ2Controlled by REQ3Controlled by REQ4
1Controlled by REQ1INTControlled by REQ2INTControlled by REQ3INTControlled by REQ4INT
CLK1CLK2CLK3CLK4
(1)
(1) Shaded cells show the default setting after power up.
(2) RESET resets REQ1PRIO/REQ4PRIO and REQ1INT/REQ4INT bits to their default values (CLK1/4 is ON) but does not change the
remaining internal SW bits. During RESET, any I2C operation is blocked until RESET is deactivated. A minimum pulse duration of
500 ns must be applied to activate RESET (the internal glitch-filter suppresses spikes of typical 300 ns).
(3) Priority bit defines if the external control pins (HW controlled) or the SW bits (SW controlled) have priority. It can be set in the
configuration register, Byte 2, Bits 0–3.
(1)
(3)
REQ-Signals
Table 2. Request Signal Condition for Clock Outputs
(2)
REQxCLKx
(REQ1/2/3/4)(CLK1/2/3/4)
MCLK_REQLDO
Active-low0ClockHighOn
1Disabled to highLow (if all REQx are high) Off (if all REQx are high)
Active-high
0Disabled to high
1Clock
(4)
(4)
Low (if all REQx are low)Off (if all REQx are low)
HighOn
(1) Shaded cells show the default setting after power up.
(2) Polarity of REQ1, REQ2, REQ3, and REQ4 are register-configurable via I2C (see Table 3, Byte 0, Bits 0–3). Default setting is
active-high.
(3) The LDO is controlled by an on-chip decoder, but can also be SW controlled (see Table 3, Byte 2, Bits 4–5).
(4) CLK1 and CLK4 are ON after device power up (default condition). CLK2 and CLK3 are controlled by external REQ2 and REQ3,
respectively.
POWER GROUPS
NAMEDESCRIPTION
VBATSupply pin for LDO provided by main battery. LDO is not working if only VBAT is on.
VLDO
VDD_DIG
1.8-V low-drop output voltage for external TCXO. LDO is enabled if VBAT and VDD_DIG are on and REQx or RESET is
active (see Table 2).
1.8-V power supply for core logic and I2C logic. VDD_DIG must be supplied for correct device operation. Power up of
VDD_DIG resets the whole device to the default condition.
1.8-V power supply for sine-wave buffers. For correct sine-wave buffer function, all three power supplies (VBAT, V
VDD_ANAand V
to high-impedance.
) must be on. But, V
DD_ANA
can be switched on and off at any time. If off, the sine-wave outputs are switched
DD_ANA
POWER-UP SEQUENCE
The CDC3S04 is designed for sequence-less power up. VBAT, V
order. Recommended power-on sequence is VBAT first, followed by V
power-off sequence is in reverse order.
over operating free-air temperature range (unless otherwise noted)
V
DD_ANA
V
DD_DIG
V
BAT
V
I
V
O
V
LDO
I
O
I
LDO
T
stg
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
(2) The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
(3) The input VIand output VOpositive voltages are limited to the absolute maximum rating for VDD= 2.5 V.
Supply voltage range–0.5 to 2.5V
Battery supply voltage range–0.5 to 6.5V
Input voltage range
Output voltage range
(2) (3)
(2) (3)
Output voltage range–0.5 to V
Input current (Vi< 0, Vi> VDD)±20mA
Continuous output current±20mA
Continuous output current±20mA
Storage temperature range–65 to 150°C
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
(1)
VALUEUNIT
–0.5 to VDD+ 0.5V
–0.5 to VDD+ 0.5V
+ 0.5V
BAT
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THERMAL CHARACTERISTICS for 20-pin WCSP (YFF)
PARAMETERUNIT
(1)
AIRFLOW20-PIN
(lfm)WCSP
071
T
Thermal resistance, junction-to-ambient20062°C/W
JA
40059
T
T
T
Thermal resistance, junction-to- case–17.5°C/W
JC
Thermal resistance, junction-to-board–20.5°C/W
JB
Maximum junction temperature–125°C
J
(1) The package thermal impedance is calculated in accordance with JESD 51 and JEDEC2S2P (high-k board).
RECOMMENDED OPERATING CONDITIONS
MINNOMMAXUNIT
V
DD_ANA
V
DD_DIG
V
IH
V
IL
V
IS
C
L
C
OUT
T
A
(1) 10 pF is the typical load-driving capability. The drive capability can be optimized for 30 pF by the I2C register (Byte 3, Bits 7–4).
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
OVERALL PARAMETER
V
= 5.5 V;Off (no REQ)0.10.2
BAT
I
DD_ANA
Analog supply current
(1)
(seeFigure 8 through Figure 12)
V
LDO is on; VIS= 1 VPP;mA
f
RL= 10 kΩ; CL= 10 pF
V
I
DD_DIG
Digital supply current
(see Figure 8 through0.1mA
Figure 12)
= off;
LDO = off; VIS= 1 Vpp; f
MHz;
CL= 10 pF; RL= 10 kΩ
V
All outputs disabled (no input clock; LDO
I
SB
Standby currentoff; no REQ; RESET is inactive; I2C is in0.510µA
idle mode); includes 1-MΩ pullup at I2C
and RESET
f
MCLK_IN
Input frequencySine wave0.0138.452MHz
Wired-OR output;
V
OH
MCLK_REQ high-level output
voltage
IOH= –2 mA; V
Figure 3.)
Push-pull output; V
IOH= –2 mA
Wired-AND output; IOL= 2 mA
V
OL
MCLK_REQ low-level output
voltage
V
Push-pull output; V
IOL= 2 mA
V
IK
LVCMOS input voltageV
Input current ADR_A0, REQx
I
IH
(500-kΩ pulldown)
Input current RESET (1-MΩ
VI= V
pullup)
Input current ADR_A0, REQx
I
IL
(500-kΩ pulldown)
Input current RESET (1-MΩ
VI= 0 V; V
pullup)
C
I
V
IK
I
I
V
IH
V
IL
V
hys
V
OL
C
I
Input capacitance ADR_A0,
REQx, RESET
SCLH/SDAH input clamp
voltage
VI= 0 V or V
V
SCLH/SDAH input current0.1 V
SDA/SCL input high voltage0.7 V
SDAH/SCLH input low voltage0.3 V
Hysteresis of Schmitt-trigger
inputs
SDAH low-level output voltageIOL= 3 mA, V
SCLH input capacitanceVI= 0 V or VI= V
SDAH input capacitanceVI= 0 V or VI= V
(1) The total current consumption when no output is active is calculated by I
(2) For CL= 30 pF, the typical current for one output is 2.2 mA (see Figure 8).
(3) The I2C standard specifies a maximum CIof 10 pF.
. Specified with the supply ripple noise of 30 µV(rms) from 10 Hz to 100 kHz.
).
.
BAT
Product Folder Link(s) :CDC3S04
www.ti.com
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TIMING REQUIREMENTS
over operating free-air temperature range (unless otherwise noted) V
PARAMETERTEST CONDITIONSMINTYP
TIMING PARAMETER
t
PD
t
LH
t
CLK
t
SP
t
sk(o)
t
LDO
(1) All typical values are at nominal V
(2) CLK on-time is measured with valid input signal (VIS= 1 Vpp). In case a TXCO is used, the LDO and TCXO are already on.
(3) Pulses above 500 ns are interpreted as a valid reset signal. Total time from RESET-to-CLKx is the sum of tSP+ t
(4) Output skew is calculated as the greater of the difference between the fastest and the slowest t
(5) LDO off-time depends on the discharge time of the R-C components (seeFigure 4).
Propagation delay timeMCLK_IN-to-CLKx; f
Propagation delay time, low-to-high15ns
CLKx on-time – REQ-to-CLKx0.30.4µs
Pulse duration of spikes that must be
suppressed by the input filter for100ns
(3)
RESET
PHL
(4)
(5)
DD_ANA
and V
f
MCLK_IN
V
LDO
2.3 V < V
DD_DIG
= 38.4 MHz; CLK1-to-CLK42550ps
= 1.7 V, I
BAT
= 5 mA,
LDO
< 5.5 V; C
.
.
Output skew
LDO on-time
– REQ-to-LDO;100300µs
– RESET-to-LDO
and the slowest t
= 1.8 V; CL= 10 pF; RL= 10 kΩ
LDO
= 38.4 MHz3ns
MCLK_IN
VDD_ANA
is on;
(1)
2050µs
= 2.7 µF
OUT
or the difference between the fastest
PLH
CLK_/RESET
MAXUNIT
CDC3S04
.
PARAMETERMINMAXUNIT
f
SCLH
t
su(START)
t
h(START)
t
LOW
t
HIGH
t
h(SDAH)
t
su(SDAH)
t
r
t
f
t
su(STOP)
t
SP
SDAH/SCLH TIMING REQUIREMENTS, Hs-Mode (C
SCLH clock frequency03.4MHz
START setup time (SCLH high before SDAH low)160ns
START hold time (SCLH low after SDAH low)160ns
Low period of the SCLH clock160ns
High period of the SCLH clock60ns
SDAH hold time (SDAH valid after SCLH low)0
SDAH setup time10ns
SCLH rise time1040ns
SDAH rise time1080
SCLH fall time1040ns
SDAH fall time1080
STOP setup time160ns
Pulse duration of spikes that must be suppressed by the input filter for SDAH and
SCLH
= 100 pF for each I2C line; see Figure 24 and Figure 25)
BUS
(1)
010ns
70ns
(1) A device must internally provide a data hold time to bridge the undefined period between VIHand VILof the falling edge of the SCLH
signal. An input circuit with a threshold as low as possible for the falling edge of the SCLH signal minimizes this hold time.
A = Acknowledge(SDAHLOW)
A = Acknowledge(SDAHHIGH)
S=START Condition
P =STOP Condition
SMasterCode
A
00001XXX
(Hs-ModeMasterCode)
F/S-ModeHs-Mode
SrSlave Address
R/W
AP
DataData
1(Read)Data Transferred
(nBytes+ Acknowledge)
FromMastertoSlave
FromSlavetoMaster
A = Acknowledge(SDAHLOW)
A = Acknowledge(SDAHHIGH)
S=START Condition
P =STOP Condition
SMasterCode
A
00001XXX
(Hs-ModeMasterCode)
F/S-ModeHs-Mode
AA
CDC3S04
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DETAILED DESCRIPTION
SDAH/SCLH SERIAL INTERFACE (Hs-Mode)
This section describes the SDAH/SCLH interface of the CDC3S04 device. The CDC3S04 operates as a slave
device of the two-wire serial SDAH/SCLH bus, compatible with the popular I2C specification (UM10204-I2C-bus
specification and user manual Rev. 03–19 June 2007). It operates in the high-speed mode (up to 3.4 Mbit/s) and
supports 7-bit addressing. The CDC3S04 is fully downward compatible with fast- and standard-mode (F/S)
devices for bidirectional communication in a mixed-speed bus system.
Data Protocol
The device supports byte-write and byte-read operations only. There is no block-write or block-read operation
supported; therefore, no command code byte is needed.
When a byte has been sent, it is written into the internal register and is immediately effective.
Slave Receiver Address (7 bits)
SCAS883A –OCTOBER 2009–REVISED JULY 2010
DeviceA6A5A4A3A2A1A0
CDC3S0411011001/0
(1) Address bit A0 is selectable by the ADR_A0 input (pin D1). This allows addressing of two devices
connected to the same I2C bus. The default value is 0, set by an internal pulldown resistor.
(1) First rising edge of the SCLH signal after Sr and after each acknowledge bit.
Figure 24. Definition of Timing for a Complete Hs-Mode Transfer
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The following diagram shows how the CDC3S04 clock buffer is connected to the SDAH/SCLH serial interface
bus. Multiple devices can be connected to the bus, but the speed may need to be reduced (3.4 MHz is the
maximum) if many devices are connected.
Note that the pullup resistors (RP) depend on the supply voltage, bus capacitance, and number of connected
devices. For more details, see the I2C bus specification.
Figure 25. SDAH/SCLH Hardware Interface
SDAH/SCLH Configuration Registers
The output stages are user configurable. Table 3 explains the programmable functions of the CDC3S04.
(1) All data is transferred with the MSB first.
(2) A device reset to default condition is initiated by a V
(3) "–" means that dedicated bits do not change at RESET.
(4) Inactive as long as the REQxPRIO bit is low, external REQx pins are valid (see Figure 26)
(5) Writing data beyond 03h may affect device function.
Changes from Original (October 2009) to Revision APage
•Changed the format on page 1 (moved 2 paragraphs from page 2 to page 1) .................................................................... 1
•Changed the X axis from 0.1us to 100us....900us ............................................................................................................... 9
•Changed Offset 00h Bit 4 Default value from 0h to 1h ....................................................................................................... 19
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
Status
(1)
Package Type Package
Drawing
PinsPackage Qty
Eco Plan
& no Sb/Br)
(2)
Lead/
Ball Finish
SNAGCULevel-1-260C-UNLIMRequest Free Samples
MSL Peak Temp
(3)
Samples
(Requires Login)
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
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In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
D: Max =
1990 µm, Min =
1930 µm
E: Max =
1590 µm, Min =
1530 µm
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