TEXAS INSTRUMENTS SCDC3S04 Technical data

VDD_ANA
LDO
VBAT
MCLK_IN
VLDO
REQ1
CLK1
REQ2
CLK2
REQ3
CLK3
I C
2
Control
Register
ADR_A0
MCLK_REQ
SCLH
SDAH
GND_ANA
GND_DIG
RESET
Reset
REQ4
CLK4
Decoder
1 2
D
C
A
WCSP
B
TopView
(SolderBallUnderneath)
3
4
E
CLK1CLK2
REQ1
CLK3
CLK4
REQ3
GND_
DIG
VLDO
REQ4
REQ2
ADR_
A0
VDD_
DIG
MCLK_
IN
MCLK_
REQ
RESET
VDD_
ANA
GND_
ANA
SCLHVBAT SDAH
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CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
Quad Sine-Wave Clock Buffer With LDO
Check for Samples: CDC3S04
1

FEATURES

1:4 Low-Jitter Clock Buffer
Single-Ended Sine-Wave Clock Input and Outputs
Ultralow Phase Noise and Standby Current
Individual Clock Request Inputs for Each Output
On-Chip Low-Dropout Output (LDO) for Low-Noise TCXO Supply
Serial I2C Interface (Compatible With High-Speed Mode, 3.4 Mbit/s)
1.8-V Device Power Supply
Wide Temperature Range, –30°C to 85°C
ESD Protection: 2 KV HBM, 750 V CDM, and 100 V MM
Small 20-Pin Chip-Scale Package: 0.4-mm

DESCRIPTION

The CDC3S04 is a four-channel low-power low-jitter sine-wave clock buffer. It can be used to buffer a single master clock to multiple peripherals. The four sine-wave outputs (CLK1–CLK4) are designed for minimal channel-to-channel skew and ultralow additive output jitter.
Each output has its own clock request inputs which enables the dedicated clock output. These clock requests are active-high (can also be changed to be active-low via I2C), and an output signal is generated that can be sent back to the master clock to request the clock (MCLK_REQ). MCKL_REQ is an open-source output and supports the wired-OR function (default mode). It needs an external pulldown resistor. MCKL_REQ can be changed to wired-AND or push-pull functionality via I2C.
The CDC3S04 also provides an I2C interface
Pitch WCSP (1.6 mm × 2 mm) (Hs-mode) that can be used to enable or disable the
outputs, select the polarity of the REQ inputs, and

APPLICATIONS

Cellular Phones
Smart Phones
Mobile Handsets
Portable Systems
allow control of internal decoding. The CDC3S04 features an on-chip high-performance
LDO that accepts voltages from 2.3 V to 5.5 V and outputs a 1.8-V supply. This 1.8-V supply can be used to power an external 1.8-V TCXO. It can be enabled or disabled for power saving at the TCXO.
Wireless Modems Including GPS, WLAN, W-BT, D-TV, DVB-H, FM Radio, WiMAX, and System Clock
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright © 2009–2010, Texas Instruments Incorporated
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DESCRIPTION (CONTINUED)

A low signal at the RESET input switches the outputs CLK1 and CLK4 into the default state. In this configuration, CLK1 and CLK4 are ON (see Table 1); the remaining device function is not affected. Also, the RESET input provides a glitch filter which rejects spikes of typical 300 ns on the RESET line to preserve false reset. A complete device reset to the default condition can be initiated by a power-up cycle of V
The CDC3S04 operates from two 1.8-V supplies. There is a core supply (VDD_DIG/GND_DIG) for the core logic and a low-noise analog supply (VDD_ANA/GND_ANA) for the sine-wave outputs. The CDC3S04 is designed for sequence-less power up. Both supply voltages may be applied in any order.
The CDC3S04 is offered in a 0.4-mm pitch WCSP package (1.6 mm × 2 mm) and is optimized for low standby current (0.5 µA). It is characterized for operation from –30°C to 85°C.

DEVICE INFORMATION

PIN FUNCTIONS
NAME BALL NO. TYPE FUNCTION
ADR_A0 D4 Input Selectable address bit A0 of slave-address register; internal 500-kΩ pulldown resistor CLK1 A4 Output Clock output 1 CLK2 A2 Output Clock output 2 CLK3 C4 Output Clock output 3 CLK4 C2 Output Clock output 4 GND_ANA B4 Ground Ground for sine-wave buffer GND_DIG D2 Ground Ground for core logic MCLK_IN B1 Input Master clock input MCLK_RE Clock request to the master clock source; active-high; open-source output for wired-OR
Q connection (default condition). Can be changed to push-pull output or wired-AND output via I2C. REQ1 A3 Input Clock request from peripheral 1; internal 500-kΩ pulldown resistor REQ2 A1 Input Clock request from peripheral 2; internal 500-kΩ pulldown resistor REQ3 C3 Input Clock request from peripheral 3; internal 500-kΩ pulldown resistor REQ4 C1 Input Clock request from peripheral 4; internal 500-kΩ pulldown resistor
RESET B2 Input CLK1 and CLK4 outputs to ON (see Table 1). On-chip LDO is enabled. Internal 1-MΩ pullup
SCLH E4 Input I2C clock input – Hs-mode. Internal 1-MΩ pullup resistor SDAH E3 Input/output I2C data input/output – Hs-mode. Internal 1-MΩ pullup resistor VBAT E2 Power Supply pin to internal LDO VDD_ANA B3 Power 1.8-V power supply for sine-wave buffer
VDD_DIG D1 Power
VLDO E1 Output
D3 Output
Peripheral reset signal provided by application processor. The signal is active-low and switches resistor and 300-ns (typ) glitch filter.
1.8-V power supply for core logic. Power up of VDD_DIG resets the whole device to the default condition.
1.8-V supply for external TCXO; LDO is enabled if RESET (default mode) or REQx is active. LDO is not enabled if only VBAT is on.
DD_DIG
.
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FUNCTION SELECTION TABLES

CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
Table 1. Reset and Request (REQx) Conditions for Clock Outputs
(2)
RESET
0 On On
1
PRIORITY BIT
(3)
0 Controlled by REQ2 Controlled by REQ3 1 Controlled by REQ2INT Controlled by REQ3INT 0 Controlled by REQ1 Controlled by REQ2 Controlled by REQ3 Controlled by REQ4 1 Controlled by REQ1INT Controlled by REQ2INT Controlled by REQ3INT Controlled by REQ4INT
CLK1 CLK2 CLK3 CLK4
(1)
(1) Shaded cells show the default setting after power up. (2) RESET resets REQ1PRIO/REQ4PRIO and REQ1INT/REQ4INT bits to their default values (CLK1/4 is ON) but does not change the
remaining internal SW bits. During RESET, any I2C operation is blocked until RESET is deactivated. A minimum pulse duration of 500 ns must be applied to activate RESET (the internal glitch-filter suppresses spikes of typical 300 ns).
(3) Priority bit defines if the external control pins (HW controlled) or the SW bits (SW controlled) have priority. It can be set in the
configuration register, Byte 2, Bits 0–3.
(1)
(3)
REQ-Signals
Table 2. Request Signal Condition for Clock Outputs
(2)
REQx CLKx
(REQ1/2/3/4) (CLK1/2/3/4)
MCLK_REQ LDO
Active-low 0 Clock High On
1 Disabled to high Low (if all REQx are high) Off (if all REQx are high)
Active-high
0 Disabled to high 1 Clock
(4)
(4)
Low (if all REQx are low) Off (if all REQx are low)
High On
(1) Shaded cells show the default setting after power up. (2) Polarity of REQ1, REQ2, REQ3, and REQ4 are register-configurable via I2C (see Table 3, Byte 0, Bits 0–3). Default setting is
active-high. (3) The LDO is controlled by an on-chip decoder, but can also be SW controlled (see Table 3, Byte 2, Bits 4–5). (4) CLK1 and CLK4 are ON after device power up (default condition). CLK2 and CLK3 are controlled by external REQ2 and REQ3,
respectively.

POWER GROUPS

NAME DESCRIPTION
VBAT Supply pin for LDO provided by main battery. LDO is not working if only VBAT is on. VLDO
VDD_DIG
1.8-V low-drop output voltage for external TCXO. LDO is enabled if VBAT and VDD_DIG are on and REQx or RESET is active (see Table 2).
1.8-V power supply for core logic and I2C logic. VDD_DIG must be supplied for correct device operation. Power up of VDD_DIG resets the whole device to the default condition.
1.8-V power supply for sine-wave buffers. For correct sine-wave buffer function, all three power supplies (VBAT, V
VDD_ANA and V
to high-impedance.
) must be on. But, V
DD_ANA
can be switched on and off at any time. If off, the sine-wave outputs are switched
DD_ANA

POWER-UP SEQUENCE

The CDC3S04 is designed for sequence-less power up. VBAT, V order. Recommended power-on sequence is VBAT first, followed by V power-off sequence is in reverse order.
DD_DIG
, and V
DD_DIG
DD_ANA
and V
DD_DIG
may be applied in any
. Recommended
DD_ANA
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CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)
V
DD_ANA
V
DD_DIG
V
BAT
V
I
V
O
V
LDO
I
O
I
LDO
T
stg
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
(2) The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed. (3) The input VIand output VOpositive voltages are limited to the absolute maximum rating for VDD= 2.5 V.
Supply voltage range –0.5 to 2.5 V Battery supply voltage range –0.5 to 6.5 V
Input voltage range Output voltage range
(2) (3)
(2) (3)
Output voltage range –0.5 to V Input current (Vi< 0, Vi> VDD) ±20 mA Continuous output current ±20 mA Continuous output current ±20 mA Storage temperature range –65 to 150 °C
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
(1)
VALUE UNIT
–0.5 to VDD+ 0.5 V –0.5 to VDD+ 0.5 V
+ 0.5 V
BAT
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THERMAL CHARACTERISTICS for 20-pin WCSP (YFF)

PARAMETER UNIT
(1)
AIRFLOW 20-PIN
(lfm) WCSP
0 71
T
Thermal resistance, junction-to-ambient 200 62 °C/W
JA
400 59 T T T
Thermal resistance, junction-to- case 17.5 °C/W
JC
Thermal resistance, junction-to-board 20.5 °C/W
JB
Maximum junction temperature 125 °C
J
(1) The package thermal impedance is calculated in accordance with JESD 51 and JEDEC2S2P (high-k board).

RECOMMENDED OPERATING CONDITIONS

MIN NOM MAX UNIT
V
DD_ANA
V
DD_DIG
V
IH
V
IL
V
IS
C
L
C
OUT
T
A
(1) 10 pF is the typical load-driving capability. The drive capability can be optimized for 30 pF by the I2C register (Byte 3, Bits 7–4).
Device supply voltage 1.65 1.8 1.95 V Device supply voltage 1.65 1.8 1.95 V
0.65 V
Input voltage ADR_A0, REQx, RESET
DD_DIG
0.35 V
DD_DIG
Sine-wave input voltage – MCLK_IN; ac-coupled amplitude 0.5 1.2 V Sine-wave output load
(1)
10 30 pF LDO output capacitance (stabilize the internal control loop) 0.8 2.2 µF Operating free-air temperature –30 85 °C
V V
PP
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ELECTRICAL CHARACTERISTICS

over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
OVERALL PARAMETER
V
= 5.5 V; Off (no REQ) 0.1 0.2
BAT
I
DD_ANA
Analog supply current
(1)
(seeFigure 8 through Figure 12)
V LDO is on; VIS= 1 VPP; mA f RL= 10 kΩ; CL= 10 pF
V
I
DD_DIG
Digital supply current (see Figure 8 through 0.1 mA
Figure 12)
= off; LDO = off; VIS= 1 Vpp; f
MHz; CL= 10 pF; RL= 10 kΩ
V All outputs disabled (no input clock; LDO
I
SB
Standby current off; no REQ; RESET is inactive; I2C is in 0.5 10 µA
idle mode); includes 1-MΩ pullup at I2C and RESET
f
MCLK_IN
Input frequency Sine wave 0.01 38.4 52 MHz
Wired-OR output;
V
OH
MCLK_REQ high-level output voltage
IOH= –2 mA; V
Figure 3.)
Push-pull output; V IOH= –2 mA
Wired-AND output; IOL= 2 mA
V
OL
MCLK_REQ low-level output voltage
V Push-pull output; V
IOL= 2 mA
V
IK
LVCMOS input voltage V Input current ADR_A0, REQx
I
IH
(500-kΩ pulldown) Input current RESET (1-MΩ
VI= V
pullup) Input current ADR_A0, REQx
I
IL
(500-kΩ pulldown) Input current RESET (1-MΩ
VI= 0 V; V
pullup)
C
I
V
IK
I
I
V
IH
V
IL
V
hys
V
OL
C
I
Input capacitance ADR_A0, REQx, RESET
SCLH/SDAH input clamp voltage
VI= 0 V or V
V
SCLH/SDAH input current 0.1 V SDA/SCL input high voltage 0.7 V SDAH/SCLH input low voltage 0.3 V Hysteresis of Schmitt-trigger
inputs SDAH low-level output voltage IOL= 3 mA, V SCLH input capacitance VI= 0 V or VI= V SDAH input capacitance VI= 0 V or VI= V
(1) The total current consumption when no output is active is calculated by I (2) For CL= 30 pF, the typical current for one output is 2.2 mA (see Figure 8). (3) The I2C standard specifies a maximum CIof 10 pF.
= 1.95 V;
DD_ANA
= 38.4 MHz;
MCLK_IN
= 5.5 V; V
BAT
= 5.5 V; V
BAT
DD_DIG
DD_DIG
DD_DIG
DD_DIG
DD_DIG/VDD_ANA
DD_DIG
DD_DIG
= 1.65 V
DD_DIG
= 1.65 V; II= –18 mA –1.2 V
; V
DD_DIG
= 1.95 V µA
DD_DIG
DD_DIG
Per output 2 2.6
(2)
= 1.95 V; V
MCLK_IN
DD_ANA
= 38.4
= 1.95 V;
= 1.65 V (See V
= 1.65 V,
= 1.65 V,
= 1.95 V µA
SDAH/SCLH PARAMETER (Hs-Mode)
= 1.65 V; II= –18 mA –1.2 V
DD_DIG
< VI< 0.9 V
DD_DIG
DD_DIG
DD_DIG
= 1.65 V 0.2 V
(3)
DD_DIG
(3)
DD_DIG
(off) + I
DD_ANA
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
– 0.45
DD_DIG
V
DD_DIG
DD_DIG
0.1 V
– 0.45
0.45
0.45
6
2
–2
–3
3 pF
10 µA
DD_DIG
DD_DIG
DD_DIG
DD_DIG
3 5 8 10
.
V
V
V V
V V
pF
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2 2
t = (t t )
jitout(rms) jitin(rms)
jitadd(rms)
-
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
ELECTRICAL CHARACTERISTICS (continued)
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SINE-WAVE PARAMETER (MCLK_IN is sine-wave signal, CL= 10 pF)
f
OUT
V
OS
t
jitadd(rms)
pn
add
R
IN
C
IN
V
BAT
V
LDO
ΔV
LDO
I
LOAD
I
LCL
I
LGND
I
LSHDN
PSRR dB
V
N
(4) Additive rms jitter is the integrated rms jitter that the device adds to the signal chain. It is calculated by
Output frequency 52 MHz Output gain level 0.5 V
(see Figure 17) 1.2 V Output voltage VIS= 0.5 V
Additive rms jitter
(4)
MCLK_IN-to-CLKx; 10 kΩ, 10 pF; ac-coupled; f
10 Hz to 10 MHz; f 10 kHz to 10 MHz; f
MCLK_IN
> 1 MHz
= 38.4 MHz 0.3 0.6
OUT
= 38.4 MHz 0.1 0.2
OUT
PP
IS
PP
–1 –0.3 0 dB
445 490 500 mV
At offset = 1 kHz –142 –135
Additive phase noise at f
38.4 MHz
(5)
OUT
=
At offset = 10 kHz –152 –145 dBc/Hz
At offset = 100 kHz –157 –150 Input resistance At dc level 12 15 kΩ Input capacitance f
ELECTRICAL CHARACTERISTIC of LDO (C
= 38.4 MHz 5 7 pF
MCLK_IN
= 0.8 to 2.7 µF)
OUT
(6)
Input voltage range 2.3 5.5 V LDO output voltage Maximum line regulation 2.3 V < V
Maximum load regulation 0.5% Load current C
LDO output current limit V LDO ground pin current LDO shutdown current 2.3 V < V
(7)
(8)
2.3 V < V
0 < I
LOAD
TJ= 25°C
OUT LDO
V
BAT
< 5.5 V, l
BAT
5.5 V, l
BAT
< 5 mA, V
= 5 mA 1.72 1.8 1.9 V
LOAD
= 5 mA 0.5%
LOAD
= 2.3 V or 5.5 V;
BAT
= 0.8 µF to 2.7 µF 0 5 mA = 0.9 × V
= 3.6 V; 0 < I
LDO(TYP)
< 5 mA 50 150 µA
LOAD
< 5.5 V 0.2 µA
BAT
10 60 mA
100 Hz 60 68 1 kHz 55 62 10 kHz 45 52 100 kHz 33 40 1 MHz 37 46
Power-supply rejection ratio (ripple rejection) (see Figure 20)
V
= 2.3 V (for min)
BAT
V
= 2.5 V (for typ)
BAT
V
= 1.8 V
LDO
I
= 5 mA
LOAD
V
= 0.1 Vpp
ripple
10 MHz 60 67
Output noise voltage (see BW = 10 Hz to 100 kHz; V
Figure 21) I
LOAD
= 5 mA
LDO
= 1.8 V;
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ps
30 µV
PP
RMS
RMS
(5) Additive phase noise is the amount of phase noise that the device adds to the signal chain. It is calculated by
L
(dB) = 10 log (10
add
(6) Minimum C (7) LDO output voltage includes maximum line and load regulation.
should be 100 nF to allow for stable LDO operation.
OUT
(8) LDO ground pin current does not change over V
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0.1 Lout
– 10
0.1 Lin
. Specified with the supply ripple noise of 30 µV(rms) from 10 Hz to 100 kHz.
).
.
BAT
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TIMING REQUIREMENTS

over operating free-air temperature range (unless otherwise noted) V
PARAMETER TEST CONDITIONS MIN TYP
TIMING PARAMETER
t
PD
t
LH
t
CLK
t
SP
t
sk(o)
t
LDO
(1) All typical values are at nominal V (2) CLK on-time is measured with valid input signal (VIS= 1 Vpp). In case a TXCO is used, the LDO and TCXO are already on. (3) Pulses above 500 ns are interpreted as a valid reset signal. Total time from RESET-to-CLKx is the sum of tSP+ t (4) Output skew is calculated as the greater of the difference between the fastest and the slowest t
(5) LDO off-time depends on the discharge time of the R-C components (seeFigure 4).
Propagation delay time MCLK_IN-to-CLKx; f Propagation delay time, low-to-high 15 ns CLKx on-time – REQ-to-CLKx 0.3 0.4 µs
CLKx on-time – RESET-to-CLKx
(2)
CLKx off-time – REQ-to-CLKx 25 ns CLKx on-time – V
DD_ANA
to-CLKx f
REQx-to-MCLK_REQ (wired-OR, CL= 15 pF, RL= 10 kΩ);
f
(3)
VIS= 1 V; VOS= –1 dB (see Figure 5 and 0.6 0.8 µs
MCLK_IN
= 38.4 MHz; V
Figure 6)
= 38.4 MHz ; VIS= 1 V;
MCLK_IN
VOS= –1 dB; measurement starts when V
is 90% of 1.7 V (see Figure 7)
DD_ANA
Pulse duration of spikes that must be suppressed by the input filter for 100 ns
(3)
RESET
PHL
(4)
(5)
DD_ANA
and V
f
MCLK_IN
V
LDO
2.3 V < V
DD_DIG
= 38.4 MHz; CLK1-to-CLK4 25 50 ps
= 1.7 V, I
BAT
= 5 mA,
LDO
< 5.5 V; C
.
.
Output skew LDO on-time
– REQ-to-LDO; 100 300 µs – RESET-to-LDO
and the slowest t
= 1.8 V; CL= 10 pF; RL= 10 kΩ
LDO
= 38.4 MHz 3 ns
MCLK_IN
VDD_ANA
is on;
(1)
20 50 µs
= 2.7 µF
OUT
or the difference between the fastest
PLH
CLK_/RESET
MAX UNIT
CDC3S04
.
PARAMETER MIN MAX UNIT
f
SCLH
t
su(START)
t
h(START)
t
LOW
t
HIGH
t
h(SDAH)
t
su(SDAH)
t
r
t
f
t
su(STOP)
t
SP
SDAH/SCLH TIMING REQUIREMENTS, Hs-Mode (C
SCLH clock frequency 0 3.4 MHz START setup time (SCLH high before SDAH low) 160 ns START hold time (SCLH low after SDAH low) 160 ns Low period of the SCLH clock 160 ns High period of the SCLH clock 60 ns SDAH hold time (SDAH valid after SCLH low) 0 SDAH setup time 10 ns SCLH rise time 10 40 ns SDAH rise time 10 80 SCLH fall time 10 40 ns SDAH fall time 10 80 STOP setup time 160 ns Pulse duration of spikes that must be suppressed by the input filter for SDAH and
SCLH
= 100 pF for each I2C line; see Figure 24 and Figure 25)
BUS
(1)
0 10 ns
70 ns
(1) A device must internally provide a data hold time to bridge the undefined period between VIHand VILof the falling edge of the SCLH
signal. An input circuit with a threshold as low as possible for the falling edge of the SCLH signal minimizes this hold time.
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TCXO
10 nF
15 K
15 K
10kW
100 nF
10 pF
MeasuringPoint
2.2 mF
VLDO
TCXO
200
W
i.e. timeconstant(RxC) is 440 msfor 63% discharge.
LDO
10kW
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

PARAMETER MEASUREMENT INFORMATION

Figure 1. Input Circuit Figure 2. Output Circuit
Figure 3. Wired OR Figure 4. LDO Output Circuit
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