TEXAS INSTRUMENTS SCDC3S04 Technical data

VDD_ANA
LDO
VBAT
MCLK_IN
VLDO
REQ1
CLK1
REQ2
CLK2
REQ3
CLK3
I C
2
Control
Register
ADR_A0
MCLK_REQ
SCLH
SDAH
GND_ANA
GND_DIG
RESET
Reset
REQ4
CLK4
Decoder
1 2
D
C
A
WCSP
B
TopView
(SolderBallUnderneath)
3
4
E
CLK1CLK2
REQ1
CLK3
CLK4
REQ3
GND_
DIG
VLDO
REQ4
REQ2
ADR_
A0
VDD_
DIG
MCLK_
IN
MCLK_
REQ
RESET
VDD_
ANA
GND_
ANA
SCLHVBAT SDAH
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CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
Quad Sine-Wave Clock Buffer With LDO
Check for Samples: CDC3S04
1

FEATURES

1:4 Low-Jitter Clock Buffer
Single-Ended Sine-Wave Clock Input and Outputs
Ultralow Phase Noise and Standby Current
Individual Clock Request Inputs for Each Output
On-Chip Low-Dropout Output (LDO) for Low-Noise TCXO Supply
Serial I2C Interface (Compatible With High-Speed Mode, 3.4 Mbit/s)
1.8-V Device Power Supply
Wide Temperature Range, –30°C to 85°C
ESD Protection: 2 KV HBM, 750 V CDM, and 100 V MM
Small 20-Pin Chip-Scale Package: 0.4-mm

DESCRIPTION

The CDC3S04 is a four-channel low-power low-jitter sine-wave clock buffer. It can be used to buffer a single master clock to multiple peripherals. The four sine-wave outputs (CLK1–CLK4) are designed for minimal channel-to-channel skew and ultralow additive output jitter.
Each output has its own clock request inputs which enables the dedicated clock output. These clock requests are active-high (can also be changed to be active-low via I2C), and an output signal is generated that can be sent back to the master clock to request the clock (MCLK_REQ). MCKL_REQ is an open-source output and supports the wired-OR function (default mode). It needs an external pulldown resistor. MCKL_REQ can be changed to wired-AND or push-pull functionality via I2C.
The CDC3S04 also provides an I2C interface
Pitch WCSP (1.6 mm × 2 mm) (Hs-mode) that can be used to enable or disable the
outputs, select the polarity of the REQ inputs, and

APPLICATIONS

Cellular Phones
Smart Phones
Mobile Handsets
Portable Systems
allow control of internal decoding. The CDC3S04 features an on-chip high-performance
LDO that accepts voltages from 2.3 V to 5.5 V and outputs a 1.8-V supply. This 1.8-V supply can be used to power an external 1.8-V TCXO. It can be enabled or disabled for power saving at the TCXO.
Wireless Modems Including GPS, WLAN, W-BT, D-TV, DVB-H, FM Radio, WiMAX, and System Clock
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright © 2009–2010, Texas Instruments Incorporated
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

DESCRIPTION (CONTINUED)

A low signal at the RESET input switches the outputs CLK1 and CLK4 into the default state. In this configuration, CLK1 and CLK4 are ON (see Table 1); the remaining device function is not affected. Also, the RESET input provides a glitch filter which rejects spikes of typical 300 ns on the RESET line to preserve false reset. A complete device reset to the default condition can be initiated by a power-up cycle of V
The CDC3S04 operates from two 1.8-V supplies. There is a core supply (VDD_DIG/GND_DIG) for the core logic and a low-noise analog supply (VDD_ANA/GND_ANA) for the sine-wave outputs. The CDC3S04 is designed for sequence-less power up. Both supply voltages may be applied in any order.
The CDC3S04 is offered in a 0.4-mm pitch WCSP package (1.6 mm × 2 mm) and is optimized for low standby current (0.5 µA). It is characterized for operation from –30°C to 85°C.

DEVICE INFORMATION

PIN FUNCTIONS
NAME BALL NO. TYPE FUNCTION
ADR_A0 D4 Input Selectable address bit A0 of slave-address register; internal 500-kΩ pulldown resistor CLK1 A4 Output Clock output 1 CLK2 A2 Output Clock output 2 CLK3 C4 Output Clock output 3 CLK4 C2 Output Clock output 4 GND_ANA B4 Ground Ground for sine-wave buffer GND_DIG D2 Ground Ground for core logic MCLK_IN B1 Input Master clock input MCLK_RE Clock request to the master clock source; active-high; open-source output for wired-OR
Q connection (default condition). Can be changed to push-pull output or wired-AND output via I2C. REQ1 A3 Input Clock request from peripheral 1; internal 500-kΩ pulldown resistor REQ2 A1 Input Clock request from peripheral 2; internal 500-kΩ pulldown resistor REQ3 C3 Input Clock request from peripheral 3; internal 500-kΩ pulldown resistor REQ4 C1 Input Clock request from peripheral 4; internal 500-kΩ pulldown resistor
RESET B2 Input CLK1 and CLK4 outputs to ON (see Table 1). On-chip LDO is enabled. Internal 1-MΩ pullup
SCLH E4 Input I2C clock input – Hs-mode. Internal 1-MΩ pullup resistor SDAH E3 Input/output I2C data input/output – Hs-mode. Internal 1-MΩ pullup resistor VBAT E2 Power Supply pin to internal LDO VDD_ANA B3 Power 1.8-V power supply for sine-wave buffer
VDD_DIG D1 Power
VLDO E1 Output
D3 Output
Peripheral reset signal provided by application processor. The signal is active-low and switches resistor and 300-ns (typ) glitch filter.
1.8-V power supply for core logic. Power up of VDD_DIG resets the whole device to the default condition.
1.8-V supply for external TCXO; LDO is enabled if RESET (default mode) or REQx is active. LDO is not enabled if only VBAT is on.
DD_DIG
.
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FUNCTION SELECTION TABLES

CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
Table 1. Reset and Request (REQx) Conditions for Clock Outputs
(2)
RESET
0 On On
1
PRIORITY BIT
(3)
0 Controlled by REQ2 Controlled by REQ3 1 Controlled by REQ2INT Controlled by REQ3INT 0 Controlled by REQ1 Controlled by REQ2 Controlled by REQ3 Controlled by REQ4 1 Controlled by REQ1INT Controlled by REQ2INT Controlled by REQ3INT Controlled by REQ4INT
CLK1 CLK2 CLK3 CLK4
(1)
(1) Shaded cells show the default setting after power up. (2) RESET resets REQ1PRIO/REQ4PRIO and REQ1INT/REQ4INT bits to their default values (CLK1/4 is ON) but does not change the
remaining internal SW bits. During RESET, any I2C operation is blocked until RESET is deactivated. A minimum pulse duration of 500 ns must be applied to activate RESET (the internal glitch-filter suppresses spikes of typical 300 ns).
(3) Priority bit defines if the external control pins (HW controlled) or the SW bits (SW controlled) have priority. It can be set in the
configuration register, Byte 2, Bits 0–3.
(1)
(3)
REQ-Signals
Table 2. Request Signal Condition for Clock Outputs
(2)
REQx CLKx
(REQ1/2/3/4) (CLK1/2/3/4)
MCLK_REQ LDO
Active-low 0 Clock High On
1 Disabled to high Low (if all REQx are high) Off (if all REQx are high)
Active-high
0 Disabled to high 1 Clock
(4)
(4)
Low (if all REQx are low) Off (if all REQx are low)
High On
(1) Shaded cells show the default setting after power up. (2) Polarity of REQ1, REQ2, REQ3, and REQ4 are register-configurable via I2C (see Table 3, Byte 0, Bits 0–3). Default setting is
active-high. (3) The LDO is controlled by an on-chip decoder, but can also be SW controlled (see Table 3, Byte 2, Bits 4–5). (4) CLK1 and CLK4 are ON after device power up (default condition). CLK2 and CLK3 are controlled by external REQ2 and REQ3,
respectively.

POWER GROUPS

NAME DESCRIPTION
VBAT Supply pin for LDO provided by main battery. LDO is not working if only VBAT is on. VLDO
VDD_DIG
1.8-V low-drop output voltage for external TCXO. LDO is enabled if VBAT and VDD_DIG are on and REQx or RESET is active (see Table 2).
1.8-V power supply for core logic and I2C logic. VDD_DIG must be supplied for correct device operation. Power up of VDD_DIG resets the whole device to the default condition.
1.8-V power supply for sine-wave buffers. For correct sine-wave buffer function, all three power supplies (VBAT, V
VDD_ANA and V
to high-impedance.
) must be on. But, V
DD_ANA
can be switched on and off at any time. If off, the sine-wave outputs are switched
DD_ANA

POWER-UP SEQUENCE

The CDC3S04 is designed for sequence-less power up. VBAT, V order. Recommended power-on sequence is VBAT first, followed by V power-off sequence is in reverse order.
DD_DIG
, and V
DD_DIG
DD_ANA
and V
DD_DIG
may be applied in any
. Recommended
DD_ANA
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CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

ABSOLUTE MAXIMUM RATINGS

over operating free-air temperature range (unless otherwise noted)
V
DD_ANA
V
DD_DIG
V
BAT
V
I
V
O
V
LDO
I
O
I
LDO
T
stg
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
(2) The input and output negative voltage ratings may be exceeded if the input and output clamp-current ratings are observed. (3) The input VIand output VOpositive voltages are limited to the absolute maximum rating for VDD= 2.5 V.
Supply voltage range –0.5 to 2.5 V Battery supply voltage range –0.5 to 6.5 V
Input voltage range Output voltage range
(2) (3)
(2) (3)
Output voltage range –0.5 to V Input current (Vi< 0, Vi> VDD) ±20 mA Continuous output current ±20 mA Continuous output current ±20 mA Storage temperature range –65 to 150 °C
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
(1)
VALUE UNIT
–0.5 to VDD+ 0.5 V –0.5 to VDD+ 0.5 V
+ 0.5 V
BAT
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THERMAL CHARACTERISTICS for 20-pin WCSP (YFF)

PARAMETER UNIT
(1)
AIRFLOW 20-PIN
(lfm) WCSP
0 71
T
Thermal resistance, junction-to-ambient 200 62 °C/W
JA
400 59 T T T
Thermal resistance, junction-to- case 17.5 °C/W
JC
Thermal resistance, junction-to-board 20.5 °C/W
JB
Maximum junction temperature 125 °C
J
(1) The package thermal impedance is calculated in accordance with JESD 51 and JEDEC2S2P (high-k board).

RECOMMENDED OPERATING CONDITIONS

MIN NOM MAX UNIT
V
DD_ANA
V
DD_DIG
V
IH
V
IL
V
IS
C
L
C
OUT
T
A
(1) 10 pF is the typical load-driving capability. The drive capability can be optimized for 30 pF by the I2C register (Byte 3, Bits 7–4).
Device supply voltage 1.65 1.8 1.95 V Device supply voltage 1.65 1.8 1.95 V
0.65 V
Input voltage ADR_A0, REQx, RESET
DD_DIG
0.35 V
DD_DIG
Sine-wave input voltage – MCLK_IN; ac-coupled amplitude 0.5 1.2 V Sine-wave output load
(1)
10 30 pF LDO output capacitance (stabilize the internal control loop) 0.8 2.2 µF Operating free-air temperature –30 85 °C
V V
PP
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ELECTRICAL CHARACTERISTICS

over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
OVERALL PARAMETER
V
= 5.5 V; Off (no REQ) 0.1 0.2
BAT
I
DD_ANA
Analog supply current
(1)
(seeFigure 8 through Figure 12)
V LDO is on; VIS= 1 VPP; mA f RL= 10 kΩ; CL= 10 pF
V
I
DD_DIG
Digital supply current (see Figure 8 through 0.1 mA
Figure 12)
= off; LDO = off; VIS= 1 Vpp; f
MHz; CL= 10 pF; RL= 10 kΩ
V All outputs disabled (no input clock; LDO
I
SB
Standby current off; no REQ; RESET is inactive; I2C is in 0.5 10 µA
idle mode); includes 1-MΩ pullup at I2C and RESET
f
MCLK_IN
Input frequency Sine wave 0.01 38.4 52 MHz
Wired-OR output;
V
OH
MCLK_REQ high-level output voltage
IOH= –2 mA; V
Figure 3.)
Push-pull output; V IOH= –2 mA
Wired-AND output; IOL= 2 mA
V
OL
MCLK_REQ low-level output voltage
V Push-pull output; V
IOL= 2 mA
V
IK
LVCMOS input voltage V Input current ADR_A0, REQx
I
IH
(500-kΩ pulldown) Input current RESET (1-MΩ
VI= V
pullup) Input current ADR_A0, REQx
I
IL
(500-kΩ pulldown) Input current RESET (1-MΩ
VI= 0 V; V
pullup)
C
I
V
IK
I
I
V
IH
V
IL
V
hys
V
OL
C
I
Input capacitance ADR_A0, REQx, RESET
SCLH/SDAH input clamp voltage
VI= 0 V or V
V
SCLH/SDAH input current 0.1 V SDA/SCL input high voltage 0.7 V SDAH/SCLH input low voltage 0.3 V Hysteresis of Schmitt-trigger
inputs SDAH low-level output voltage IOL= 3 mA, V SCLH input capacitance VI= 0 V or VI= V SDAH input capacitance VI= 0 V or VI= V
(1) The total current consumption when no output is active is calculated by I (2) For CL= 30 pF, the typical current for one output is 2.2 mA (see Figure 8). (3) The I2C standard specifies a maximum CIof 10 pF.
= 1.95 V;
DD_ANA
= 38.4 MHz;
MCLK_IN
= 5.5 V; V
BAT
= 5.5 V; V
BAT
DD_DIG
DD_DIG
DD_DIG
DD_DIG
DD_DIG/VDD_ANA
DD_DIG
DD_DIG
= 1.65 V
DD_DIG
= 1.65 V; II= –18 mA –1.2 V
; V
DD_DIG
= 1.95 V µA
DD_DIG
DD_DIG
Per output 2 2.6
(2)
= 1.95 V; V
MCLK_IN
DD_ANA
= 38.4
= 1.95 V;
= 1.65 V (See V
= 1.65 V,
= 1.65 V,
= 1.95 V µA
SDAH/SCLH PARAMETER (Hs-Mode)
= 1.65 V; II= –18 mA –1.2 V
DD_DIG
< VI< 0.9 V
DD_DIG
DD_DIG
DD_DIG
= 1.65 V 0.2 V
(3)
DD_DIG
(3)
DD_DIG
(off) + I
DD_ANA
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
– 0.45
DD_DIG
V
DD_DIG
DD_DIG
0.1 V
– 0.45
0.45
0.45
6
2
–2
–3
3 pF
10 µA
DD_DIG
DD_DIG
DD_DIG
DD_DIG
3 5 8 10
.
V
V
V V
V V
pF
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2 2
t = (t t )
jitout(rms) jitin(rms)
jitadd(rms)
-
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
ELECTRICAL CHARACTERISTICS (continued)
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SINE-WAVE PARAMETER (MCLK_IN is sine-wave signal, CL= 10 pF)
f
OUT
V
OS
t
jitadd(rms)
pn
add
R
IN
C
IN
V
BAT
V
LDO
ΔV
LDO
I
LOAD
I
LCL
I
LGND
I
LSHDN
PSRR dB
V
N
(4) Additive rms jitter is the integrated rms jitter that the device adds to the signal chain. It is calculated by
Output frequency 52 MHz Output gain level 0.5 V
(see Figure 17) 1.2 V Output voltage VIS= 0.5 V
Additive rms jitter
(4)
MCLK_IN-to-CLKx; 10 kΩ, 10 pF; ac-coupled; f
10 Hz to 10 MHz; f 10 kHz to 10 MHz; f
MCLK_IN
> 1 MHz
= 38.4 MHz 0.3 0.6
OUT
= 38.4 MHz 0.1 0.2
OUT
PP
IS
PP
–1 –0.3 0 dB
445 490 500 mV
At offset = 1 kHz –142 –135
Additive phase noise at f
38.4 MHz
(5)
OUT
=
At offset = 10 kHz –152 –145 dBc/Hz
At offset = 100 kHz –157 –150 Input resistance At dc level 12 15 kΩ Input capacitance f
ELECTRICAL CHARACTERISTIC of LDO (C
= 38.4 MHz 5 7 pF
MCLK_IN
= 0.8 to 2.7 µF)
OUT
(6)
Input voltage range 2.3 5.5 V LDO output voltage Maximum line regulation 2.3 V < V
Maximum load regulation 0.5% Load current C
LDO output current limit V LDO ground pin current LDO shutdown current 2.3 V < V
(7)
(8)
2.3 V < V
0 < I
LOAD
TJ= 25°C
OUT LDO
V
BAT
< 5.5 V, l
BAT
5.5 V, l
BAT
< 5 mA, V
= 5 mA 1.72 1.8 1.9 V
LOAD
= 5 mA 0.5%
LOAD
= 2.3 V or 5.5 V;
BAT
= 0.8 µF to 2.7 µF 0 5 mA = 0.9 × V
= 3.6 V; 0 < I
LDO(TYP)
< 5 mA 50 150 µA
LOAD
< 5.5 V 0.2 µA
BAT
10 60 mA
100 Hz 60 68 1 kHz 55 62 10 kHz 45 52 100 kHz 33 40 1 MHz 37 46
Power-supply rejection ratio (ripple rejection) (see Figure 20)
V
= 2.3 V (for min)
BAT
V
= 2.5 V (for typ)
BAT
V
= 1.8 V
LDO
I
= 5 mA
LOAD
V
= 0.1 Vpp
ripple
10 MHz 60 67
Output noise voltage (see BW = 10 Hz to 100 kHz; V
Figure 21) I
LOAD
= 5 mA
LDO
= 1.8 V;
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ps
30 µV
PP
RMS
RMS
(5) Additive phase noise is the amount of phase noise that the device adds to the signal chain. It is calculated by
L
(dB) = 10 log (10
add
(6) Minimum C (7) LDO output voltage includes maximum line and load regulation.
should be 100 nF to allow for stable LDO operation.
OUT
(8) LDO ground pin current does not change over V
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0.1 Lout
– 10
0.1 Lin
. Specified with the supply ripple noise of 30 µV(rms) from 10 Hz to 100 kHz.
).
.
BAT
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TIMING REQUIREMENTS

over operating free-air temperature range (unless otherwise noted) V
PARAMETER TEST CONDITIONS MIN TYP
TIMING PARAMETER
t
PD
t
LH
t
CLK
t
SP
t
sk(o)
t
LDO
(1) All typical values are at nominal V (2) CLK on-time is measured with valid input signal (VIS= 1 Vpp). In case a TXCO is used, the LDO and TCXO are already on. (3) Pulses above 500 ns are interpreted as a valid reset signal. Total time from RESET-to-CLKx is the sum of tSP+ t (4) Output skew is calculated as the greater of the difference between the fastest and the slowest t
(5) LDO off-time depends on the discharge time of the R-C components (seeFigure 4).
Propagation delay time MCLK_IN-to-CLKx; f Propagation delay time, low-to-high 15 ns CLKx on-time – REQ-to-CLKx 0.3 0.4 µs
CLKx on-time – RESET-to-CLKx
(2)
CLKx off-time – REQ-to-CLKx 25 ns CLKx on-time – V
DD_ANA
to-CLKx f
REQx-to-MCLK_REQ (wired-OR, CL= 15 pF, RL= 10 kΩ);
f
(3)
VIS= 1 V; VOS= –1 dB (see Figure 5 and 0.6 0.8 µs
MCLK_IN
= 38.4 MHz; V
Figure 6)
= 38.4 MHz ; VIS= 1 V;
MCLK_IN
VOS= –1 dB; measurement starts when V
is 90% of 1.7 V (see Figure 7)
DD_ANA
Pulse duration of spikes that must be suppressed by the input filter for 100 ns
(3)
RESET
PHL
(4)
(5)
DD_ANA
and V
f
MCLK_IN
V
LDO
2.3 V < V
DD_DIG
= 38.4 MHz; CLK1-to-CLK4 25 50 ps
= 1.7 V, I
BAT
= 5 mA,
LDO
< 5.5 V; C
.
.
Output skew LDO on-time
– REQ-to-LDO; 100 300 µs – RESET-to-LDO
and the slowest t
= 1.8 V; CL= 10 pF; RL= 10 kΩ
LDO
= 38.4 MHz 3 ns
MCLK_IN
VDD_ANA
is on;
(1)
20 50 µs
= 2.7 µF
OUT
or the difference between the fastest
PLH
CLK_/RESET
MAX UNIT
CDC3S04
.
PARAMETER MIN MAX UNIT
f
SCLH
t
su(START)
t
h(START)
t
LOW
t
HIGH
t
h(SDAH)
t
su(SDAH)
t
r
t
f
t
su(STOP)
t
SP
SDAH/SCLH TIMING REQUIREMENTS, Hs-Mode (C
SCLH clock frequency 0 3.4 MHz START setup time (SCLH high before SDAH low) 160 ns START hold time (SCLH low after SDAH low) 160 ns Low period of the SCLH clock 160 ns High period of the SCLH clock 60 ns SDAH hold time (SDAH valid after SCLH low) 0 SDAH setup time 10 ns SCLH rise time 10 40 ns SDAH rise time 10 80 SCLH fall time 10 40 ns SDAH fall time 10 80 STOP setup time 160 ns Pulse duration of spikes that must be suppressed by the input filter for SDAH and
SCLH
= 100 pF for each I2C line; see Figure 24 and Figure 25)
BUS
(1)
0 10 ns
70 ns
(1) A device must internally provide a data hold time to bridge the undefined period between VIHand VILof the falling edge of the SCLH
signal. An input circuit with a threshold as low as possible for the falling edge of the SCLH signal minimizes this hold time.
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TCXO
10 nF
15 K
15 K
10kW
100 nF
10 pF
MeasuringPoint
2.2 mF
VLDO
TCXO
200
W
i.e. timeconstant(RxC) is 440 msfor 63% discharge.
LDO
10kW
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

PARAMETER MEASUREMENT INFORMATION

Figure 1. Input Circuit Figure 2. Output Circuit
Figure 3. Wired OR Figure 4. LDO Output Circuit
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RESET
CLKx
CLKxon Time
90%ofFinal Amplitude
REQx
CLKx
CLKxon Time
90%ofFinal Amplitude
100 sm 200 sm 300 sm 400 sm 500 sm 600 sm 700 sm 800 sm 900 sm
CLKx
VDD_ANA
CLKx on Time
90% of Final Amplitude
90% of 1.7 V
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CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

TYPICAL CHARACTERISTICS

Figure 5. CLKx On-Time From RESET Off-to-On
Figure 6. CLKx On-Time From REQ Off-to-On
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Figure 7. CLKx On-Time From V
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DD_ANA
Off-to-On
10
SupplyCurrent – mA
9
8
7
6
5
4
3
2
1
0
0 10 15
5
20 25 30 35 40
45
50
OutputLoad – pF
IDD_ANA /CLK1&CLK2&CLK3&CLK4
IDD_ANA /CLK1&CLK2&CLK3
IDD_ANA /CLK1&CLK2
IDD_ANA /CLK1
IDD_ANA /CLKxoff
IDD_DIG
10
SupplyCurrent – mA
9
8
7
6
5
4
3
2
1
0
0 10 15
5
20 25 30 35 40
45
50
OutputLoad – pF
IDD_ANA /CLK1&CLK2&CLK3&CLK4
IDD_ANA /CLK1&CLK2&CLK3
IDD_ANA /CLK1&CLK2
IDD_ANA /CLK1
IDD_ANA /CLKxoff
IDD_DIG
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
www.ti.com
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
OUTPUT LOAD (CL) AT 38.4 MHz INPUT CLOCK
Figure 8.
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
OUTPUT LOAD (CL) AT 26 MHz INPUT CLOCK
Figure 9.
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Product Folder Link(s) :CDC3S04
SupplyCurrent – mA
9
8
7
6
5
4
3
2
1
0
0
1
10
100
InputFrequency – MHz
IDD_ANA /CLK1&CLK2&CLK3&CLK4
IDD_ANA /CLK1&CLK2&CLK3
IDD_ANA /CLK1&CLK2
IDD_ANA /CLK1
IDD_ANA /CLKxoff IDD_DIG
SupplyCurrent – mA
9
8
7
6
5
4
3
2
1
0
0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2
InputVoltageLevel – V
PP
IDD_ANA /CLK1&CLK2&CLK3&CLK4
IDD_ANA /CLK1&CLK2&CLK3
IDD_ANA /CLK1&CLK2
IDD_ANA /CLK1
IDD_ANA /CLKxoff IDD_DIG
www.ti.com
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
INPUT FREQUENCY (MCLK_IN)
Figure 10.
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
INPUT VOLTAGE LEVEL AT 38.4 MHz INPUT CLOCK
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Figure 11.
vs
SupplyCurrent – mA
9
8
7
6
5
4
3
2
1
0
0.5 0.6 0.7 0.8 0.9 1.0 1.1 1.2
InputVoltageLevel – V
PP
IDD_ANA /CLK1&CLK2&CLK3&CLK4
IDD_ANA /CLK1&CLK2&CLK3
IDD_ANA /CLK1&CLK2
IDD_ANA /CLK1
IDD_ANA /CLKxoff IDD_DIG
MCLK_INinputsignalfrom TCXO
CDC3S04outputsignalatCLKx
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
www.ti.com
SUPPLY CURRENT (IDD_ANA, IDD_DIG)
vs
INPUT VOLTAGE LEVEL AT 26 MHz INPUT CLOCK
Figure 12.
TCXO INPUT CLOCK
vs
OUTPUT CLOCK AT 38.4 MHz
Figure 13.
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Product Folder Link(s) :CDC3S04
MCLK_INinputsignalfrom TCXO
CDC3S04outputsignalatCLKx
MCLK_INsinusoidalinputsignal
CDC3S04outputsignalatCLKx
www.ti.com
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
TCXO INPUT CLOCK
vs
OUTPUT CLOCK AT 26 MHz
Figure 14.
SINE WAVE INPUT CLOCK
vs
OUTPUT CLOCK AT 38.4 MHz
Figure 15.
Copyright © 2009–2010, Texas Instruments Incorporated Submit Documentation Feedback 13
Product Folder Link(s) :CDC3S04
MCLK_INsinusoidalinputsignal
CDC3S04outputsignalatCLKx
–7
–6
–5
–4
–3
–2
-1
0
1
1k 10k 100k 1M 10M 100M
InputFrequency – Hz
OutputGain – dB
VIS=1V V =1.8V
PP
DD_ANA
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
www.ti.com
SINE WAVE INPUT CLOCK
vs
OUTPUT CLOCK AT 26 MHz
Figure 16.
OUTPUT GAIN
vs
INPUT FREQUENCY (MCLK_IN)
14 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated
Figure 17.
Product Folder Link(s) :CDC3S04
CLKxOutput
MCLK_INInput
CLKxOutputHighdrive
CLKxOutput
MCLK_INInput
CLKxOutputHighdrive
www.ti.com
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
INPUT
vs
OUTPUT PHASE-NOISE PERFORMANCE WITH 38.4-MHz TCXO
Figure 18.
INPUT
vs
OUTPUT PHASE-NOISE PERFORMANCE WITH 26-MHz TCXO
Figure 19.
Copyright © 2009–2010, Texas Instruments Incorporated Submit Documentation Feedback 15
Product Folder Link(s) :CDC3S04
REF50.000dB
START 100Hz 1kHz 10kHz 100kHz 1MHz STOP 10MHz
5.000dB/div
80dB
75dB
70dB
65dB
60dB
55dB
50dB
45dB
40dB
0
200
400
800
1000
1200
1400
1800
10 100 1k 10k 100k
Frequency – Hz
1600
600
SpectralNoiseDensity –
nV/Hz
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
TYPICAL CHARACTERISTICS (continued)
www.ti.com
LDO POWER SUPPLY REJECTION
vs
FREQUENCY (PSRR)
Figure 20.
LDO OUTPUT SPECTRAL NOISE DENSITY
vs
FREQUENCY
Figure 21.
16 Submit Documentation Feedback Copyright © 2009–2010, Texas Instruments Incorporated
Product Folder Link(s) :CDC3S04
Sr Slave Address
R/W
A A A P
Data Data
0(Write) Data Transferred
(nBytes+ Acknowledge)
FromMastertoSlave
FromSlavetoMaster
A = Acknowledge(SDAHLOW) A = Acknowledge(SDAHHIGH) S=START Condition P =STOP Condition
S MasterCode
A
00001XXX
(Hs-ModeMasterCode)
F/S-Mode Hs-Mode
Sr Slave Address
R/W
A P
Data Data
1(Read) Data Transferred
(nBytes+ Acknowledge)
FromMastertoSlave
FromSlavetoMaster
A = Acknowledge(SDAHLOW) A = Acknowledge(SDAHHIGH) S=START Condition P =STOP Condition
S MasterCode
A
00001XXX
(Hs-ModeMasterCode)
F/S-Mode Hs-Mode
A A
CDC3S04
www.ti.com

DETAILED DESCRIPTION

SDAH/SCLH SERIAL INTERFACE (Hs-Mode)

This section describes the SDAH/SCLH interface of the CDC3S04 device. The CDC3S04 operates as a slave device of the two-wire serial SDAH/SCLH bus, compatible with the popular I2C specification (UM10204-I2C-bus specification and user manual Rev. 03–19 June 2007). It operates in the high-speed mode (up to 3.4 Mbit/s) and supports 7-bit addressing. The CDC3S04 is fully downward compatible with fast- and standard-mode (F/S) devices for bidirectional communication in a mixed-speed bus system.

Data Protocol

The device supports byte-write and byte-read operations only. There is no block-write or block-read operation supported; therefore, no command code byte is needed.
When a byte has been sent, it is written into the internal register and is immediately effective.

Slave Receiver Address (7 bits)

SCAS883A –OCTOBER 2009–REVISED JULY 2010
Device A6 A5 A4 A3 A2 A1 A0
CDC3S04 1 1 0 1 1 0 0 1/0
(1) Address bit A0 is selectable by the ADR_A0 input (pin D1). This allows addressing of two devices
connected to the same I2C bus. The default value is 0, set by an internal pulldown resistor.

Byte-Write Programming Sequence

Byte-Read Programming Sequence

Figure 22. Byte-Write Protocol
(1)
R/W
Copyright © 2009–2010, Texas Instruments Incorporated Submit Documentation Feedback 17
Figure 23. Byte-Read Protocol
Product Folder Link(s) :CDC3S04
SDAH
SrSr
P
SCLH
=MCScurrent source pull-up
=Rpresistorpull-up
t
f(DA)
t
h(DAT)
t
r(CL1)
(1)
t
r(CL1)
(1)
t
r(CL)
t
su(STA)
t
(High)
t
(High)
t
su(STO)
t
r(DA)
t
h(STA)
t
su(DAT)
t
(Low)
t
(Low)
T0451-01
t
f(CL)
C
BUSCBUS
R
p
R
p
SDAH
SCLH
Master
CDC3S04
Slave
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
(1) First rising edge of the SCLH signal after Sr and after each acknowledge bit.
Figure 24. Definition of Timing for a Complete Hs-Mode Transfer
www.ti.com
The following diagram shows how the CDC3S04 clock buffer is connected to the SDAH/SCLH serial interface bus. Multiple devices can be connected to the bus, but the speed may need to be reduced (3.4 MHz is the maximum) if many devices are connected.
Note that the pullup resistors (RP) depend on the supply voltage, bus capacitance, and number of connected devices. For more details, see the I2C bus specification.
Figure 25. SDAH/SCLH Hardware Interface

SDAH/SCLH Configuration Registers

The output stages are user configurable. Table 3 explains the programmable functions of the CDC3S04.
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Product Folder Link(s) :CDC3S04
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SCAS883A –OCTOBER 2009–REVISED JULY 2010
Table 3. Configuration Register (Shaded Cells Marks Power-Up/Default Setting)
Offset BIT
00h R/W
01h R/W
02h R/W
03h 5 HIGHDRIVE2 0h Enables high-drive capability CLK2 Typical High R/W
(5)
04h–Bh
(1)
7 REQ4INT 1h 1h CLK4 off/on 6 REQ3INT 0h CLK3 off/on 5 REQ2INT 0h CLK2 off/on 4 REQ1INT 1h 1h CLK1 off/on 3 REQ4POL 1h Selects polarity of REQ4 Active-low Active-high 2 REQ3POL 1h Selects polarity of REQ3 Active-low Active-high 1 REQ2POL 1h Selects polarity of REQ2 Active-low Active-high 0 REQ1POL 1h Selects polarity of REQ1 Active-low Active-high
7 MREQ4 1h
6 MREQ3 1h
5 MREQ2 1h
4 MREQ1 1h – 3 MCLKOUT1 Selects MCLK_REQ output type
2 MCLKOUT0
0–1 0h Reserved
7 MREQCTRL1 MCLK_REQ generation (see Figure 27)
6 MREQCTRL0
5 LDOEN1 Switches LDO on or off:
4 LDOEN0
3 REQ4PRIO 1h 1h Defines external vs internal REQ4 priority REQ4 REQ4INT 2 REQ3PRIO 0h Defines external vs internal REQ3 priority REQ3 REQ3INT 1 REQ2PRIO 0h Defines external vs internal REQ2 priority REQ2 REQ2INT 0 REQ1PRIO 1h 1h Defines external vs internal REQ1 priority REQ1 REQ1INT 7 HIGHDRIVE4 0h Enables high-drive capability CLK4 Typical High 6 HIGHDRIVE3 0h Enables high-drive capability CLK3 Typical High
4 HIGHDRIVE1 0h Enables high-drive capability CLK1 Typical High
0–3 0h Reserved
Acronym Default
Reserved R/W
(1) All data is transferred with the MSB first. (2) A device reset to default condition is initiated by a V (3) "–" means that dedicated bits do not change at RESET. (4) Inactive as long as the REQxPRIO bit is low, external REQx pins are valid (see Figure 26) (5) Writing data beyond 03h may affect device function.
(2)
RESET
0h
0h
0h
(3)
Description 0 1 Type
Defines if REQ4 is used to decode MCLK_REQ
Defines if REQ3 is used to decode MCLK_REQ
Defines if REQ2 is used to decode MCLK_REQ
Defines if REQ1 is used to decode MCLK_REQ
00 = wired-OR (default setting) 01 = wired-AND 1x = push-pull
0x = decoder controlled (default setting) 10 = low 11 = high
00 = LDO is on (default setting) 01 = LDO is off 1x = decoder controlled (see Figure 27)
power-up sequence.
DD_DIG
(4) (4) (4) (4)
Off On Off On Off On Off On
Not used for Used for
decoding decoding
CDC3S04
Copyright © 2009–2010, Texas Instruments Incorporated Submit Documentation Feedback 19
Product Folder Link(s) :CDC3S04
signalfrom externelpin
internalsignalsor
bits from configurationregister
REQ1
REQ1POL
REQ1
REQ1INT
REQ1PRIO
XNOR
CLK1
enabled
0
1
REQ2
REQ2POL
REQ2
REQ2INT
REQ2PRIO
XNOR
0
1
REQ3
REQ3POL
REQ3
REQ3INT
REQ3PRIO
XNOR
0
1
REQ4
REQ4POL
REQ4
REQ4INT
REQ4PRIO
XNOR
CLK4
enabled
0
1
‘1’
‘1’
‘x’
‘x’
‘1’
‘1’
active-high
active-high
active-high
active-high
‘1’
‘1’
CLK2
enabledifREQ2=’1' disabledifREQ2=’0'
CLK3
enabledifREQ3=’1' disabledifREQ3=’0'
0
REQ1
REQ1POL
REQ2
REQ2POL
REQ3
REQ3POL
REQ4
REQ4POL
MREQ1
MREQ2
REQ1
MREQ3
MREQ4
LDOEN0
OR
REQ1INT
REQ1PRIO
REQ2
REQ2INT
REQ2PRIO
REQ3
REQ3INT
REQ3PRIO
REQ4
REQ4INT
REQ4PRIO
XNOR
XNOR
MCLK_REQ
0
1
1
0
1
LDOEN1
MREQ CTRL0
1
MREQCTRL1
LDO is
enabled
‘0’
‘1’
‘1
‘1’
‘1’
‘1’
‘1’
‘1’
‘1’
‘x’
‘x’
‘1’
‘1’
signalfrom/to
externelpin
internalsignalsor
bits from configurationregister
active-high
‘1’
active-high
‘1’
active-high
active-high
AND
0
AND
AND
AND
1
0
0
1
XNOR
XNOR
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010
Figure 26. Clock Output Enable Signal
(Shaded Line Marks Power-Up/Default Setting)
www.ti.com
Figure 27. Decoding Scheme for MCLK_REQ and LDOEN
(Shaded Line Marks Power-Up/Default Setting)
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Product Folder Link(s) :CDC3S04
VDD_ANA
VBAT
MCLK_IN
VLDO
REQ1
CLK1
REQ2
CLK2
REQ3
CLK3
VDD_DIG
MCLK_REQ
GND_ANA
GND_DIG
RESET
REQ4
CLK4
I C(Hs-mode)
2
Peripheral 1
Peripheral 2
Peripheral 3
Peripheral 4
TCXO
38.4MHz
Battery
LDO
www.ti.com
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

APPLICATION INFORMATION

Figure 28. Clock Distribution Scheme
Copyright © 2009–2010, Texas Instruments Incorporated Submit Documentation Feedback 21
Product Folder Link(s) :CDC3S04
CDC3S04
SCAS883A –OCTOBER 2009–REVISED JULY 2010

REVISION HISTORY

Changes from Original (October 2009) to Revision A Page
Changed the format on page 1 (moved 2 paragraphs from page 2 to page 1) .................................................................... 1
Changed the X axis from 0.1us to 100us....900us ............................................................................................................... 9
Changed Offset 00h Bit 4 Default value from 0h to 1h ....................................................................................................... 19
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Product Folder Link(s) :CDC3S04
PACKAGE OPTION ADDENDUM
www.ti.com
17-Jul-2010
PACKAGING INFORMATION
Orderable Device
CDC3S04YFFR ACTIVE DSBGA YFF 20 3000 Green (RoHS
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device.
Status
(1)
Package Type Package
Drawing
Pins Package Qty
Eco Plan
& no Sb/Br)
(2)
Lead/
Ball Finish
SNAGCU Level-1-260C-UNLIM Request Free Samples
MSL Peak Temp
(3)
Samples
(Requires Login)
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
D: Max =
1990 µm, Min =
1930 µm
E: Max =
1590 µm, Min =
1530 µm
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