• Full-Speed Universal Serial Bus (USB)
– Integrated USB-PHY
– Integrated 3.3-V and 1.8-V USB Power System
– Integrated USB-PLL
– Eight Input and Eight Output Endpoints
• 12-Bit Analog-to-Digital Converter (ADC)
(MSP430F552x Only) With Internal Reference,
Sample-and-Hold, and Autoscan Feature
• Comparator
• Hardware Multiplier Supports 32-Bit Operations
• Serial Onboard Programming, No External
Programming Voltage Needed
• Three-Channel Internal DMA
• Basic Timer With RTC Feature
• Section 3 Summarizes Available Family Members
• For Complete Module Descriptions, See the
MSP430x5xx and MSP430x6xx Family User's
Guide (SLAU208)
1.2Applications
•Analog and Digital Sensor Systems•Connection to USB Hosts
•Data Loggers
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
The TI MSP430™ family of ultra-low-power microcontrollers consists of several devices featuring
peripheral sets targeted for a variety of applications. The architecture, combined with extensive low-power
modes, is optimized to achieve extended battery life in portable measurement applications. The
microcontroller features a powerful 16-bit RISC CPU, 16-bit registers, and constant generators that
contribute to maximum code efficiency. The digitally controlled oscillator (DCO) allows the devices to wake
up from low-power modes to active mode in 3.5 µs (typical).
The MSP430F5529, MSP430F5527, MSP430F5525, and MSP430F5521 microcontrollers have integrated
USB and PHY supporting USB 2.0, four 16-bit timers, a high-performance 12-bit analog-to-digital
converter (ADC), two universal serial communication interfaces (USCI), a hardware multiplier, DMA, a
real-time clock (RTC) module with alarm capabilities, and 63 I/O pins. The MSP430F5528,
MSP430F5526, MSP430F5524, and MSP430F5522 microcontrollers include all of these peripherals but
have 47 I/O pins.
The MSP430F5519, MSP430F5517, and MSP430F5515 microcontrollers have integrated USB and PHY
supporting USB 2.0, four 16-bit timers, two universal serial communication interfaces (USCI), a hardware
multiplier, DMA, an RTC module with alarm capabilities, and 63 I/O pins. The MSP430F5514 and
MSP430FF5513 microcontrollers include all of these peripherals but have 47 I/O pins.
Typical applications include analog and digital sensor systems, data loggers, and others that require
connectivity to various USB hosts.
www.ti.com
Device Information
PART NUMBERPACKAGEBODY SIZE
MSP430F5529PNLQFP (80)12 mm × 12 mm
MSP430F5528RGCVQFN (64)9 mm× 9 mm
MSP430F5528YFFDSBGA (64)3.5 mm × 3.5 mm
MSP430F5528ZQEMicroStar Junior™ BGA (80)5 mm × 5 mm
(1) For the most current part, package, and ordering information for all available devices, see the Package Option Addendum in Section 8,
or see the TI website at www.ti.com.
(2) The sizes shown here are approximations. For the package dimensions with tolerances, see the Mechanical Data in Section 8.
5.7Schmitt-Trigger Inputs – General-Purpose I/O
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to
P8.2, PJ.0 to PJ.3, RST/NMI)....................... 24
5.8Inputs – Ports P1 and P2
(P1.0 to P1.7, P2.0 to P2.7)......................... 24
5.9Leakage Current – General-Purpose I/O
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to
P8.2, PJ.0 to PJ.3, RST/NMI)....................... 24
5.10 Outputs – General-Purpose I/O (Full Drive Strength)
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to5.49 JTAG and Spy-Bi-Wire Interface.................... 49
P8.2, PJ.0 to PJ.3) .................................. 24
5.11 Outputs – General-Purpose I/O (Reduced Drive
Strength)
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to
P8.2, PJ.0 to PJ.3) .................................. 25
5.12 Output Frequency – General-Purpose I/O
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to
P8.2, PJ.0 to PJ.3) .................................. 25
(1) For the most current part, package, and orderinginformation forall availabledevices, seethe Package Option Addendum inSection 8, or see the TIwebsite atwww.ti.com.
(2) Package drawings, thermal data, and symbolization are availableat www.ti.com/packaging.
(3) The additional 2KB USB SRAM that is listedcan beused asgeneral-purpose SRAMwhen USB is not in use.
(4) Each number in the sequence represents an instantiationof Timer_Awith itsassociated numberof capture/compare registers and PWMoutput generatorsavailable. Forexample, a
number sequence of 3, 5 wouldrepresent two instantiations of Timer_A,the firstinstantiation having3 andthe second instantiation having 5capture/compare registersand PWMoutput
generators, respectively.
(5) Each number in the sequence represents an instantiationof Timer_Bwith itsassociated numberof capture/compare registers and PWMoutput generatorsavailable. Forexample, a
number sequence of 3, 5 wouldrepresent two instantiations of Timer_B,the firstinstantiation having3 andthe second instantiation having 5capture/compare registersand PWMoutput
generators, respectively.
Analog input A4 – ADC (not available on F551x devices)
General-purpose digital I/O
Analog input A5 – ADC (not available on F551x devices)
General-purpose digital I/O
Analog input A6 – ADC (not available on F551x devices)
General-purpose digital I/O
Analog input A7 – ADC (not available on F551x devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
F5513 devices)
Analog input A12 – ADC (not available on F551x devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
F5513 devices)
Analog input A13 – ADC (not available on F551x devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
F5513 devices)
Analog input A14 – ADC (not available on F551x devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
F5513 devices)
Analog input A15 – ADC (not available on F551x devices)
General-purpose digital I/O
Output of reference voltage to the ADC (not available on F551x devices)
Input for an external reference voltage to the ADC (not available on F551x devices)
Analog input A8 – ADC (not available on F551x devices)
General-purpose digital I/O
Negative terminal for the ADC reference voltage for both sources, the internal
devices)
Analog input A9 – ADC (not available on F551x devices)
General-purpose digital I/O
Input terminal for crystal oscillator XT1
General-purpose digital I/O
Output terminal of crystal oscillator XT1
P1.6/TA1CLK/CBOUT2724D7G5I/OTA1 clock signal TA1CLK input
P1.7/TA1.02825D8H5I/O
P2.0/TA1.12926E5J5I/O
P2.1/TA1.23027E8G6I/O
P2.2/TA2CLK/SMCLK3128E7J6I/OTA2 clock signal TA2CLK input
P2.3/TA2.03229E6H6I/O
P2.4/TA2.13330F8J7I/O
P2.5/TA2.23431F7J8I/O
P2.6/RTCCLK/DMAE03532F6J9I/ORTC clock output for calibration
P2.7/UCB0STE/UCA0CLK3633H8H7I/O
P3.0/UCB0SIMO/UCB0SDA3734G8H8I/O
PNRGCYFFZQE
2017B8J2Regulated core power supply output (internal use only, no external current loading)
NO.I/O
(1)
General-purpose digital I/O with port interrupt
ACLK output (divided by 1, 2, 4, 8, 16, or 32)
General-purpose digital I/O with port interrupt
BSL transmit output
General-purpose digital I/O with port interrupt
BSL receive input
General-purpose digital I/O with port interrupt
TA0 CCR2 capture: CCI2A input, compare: Out2 output
General-purpose digital I/O with port interrupt
TA0 CCR3 capture: CCI3A input compare: Out3 output
General-purpose digital I/O with port interrupt
TA0 CCR4 capture: CCI4A input, compare: Out4 output
General-purpose digital I/O with port interrupt
Comparator_B output
General-purpose digital I/O with port interrupt
TA1 CCR0 capture: CCI0A input, compare: Out0 output
General-purpose digital I/O with port interrupt
TA1 CCR1 capture: CCI1A input, compare: Out1 output
General-purpose digital I/O with port interrupt
TA1 CCR2 capture: CCI2A input, compare: Out2 output
General-purpose digital I/O with port interrupt
SMCLK output
General-purpose digital I/O with port interrupt
TA2 CCR0 capture: CCI0A input, compare: Out0 output
General-purpose digital I/O with port interrupt
TA2 CCR1 capture: CCI1A input, compare: Out1 output
General-purpose digital I/O with port interrupt
TA2 CCR2 capture: CCI2A input, compare: Out2 output
General-purpose digital I/O with port interrupt
DMA external trigger input
General-purpose digital I/O with port interrupt
Slave transmit enable – USCI_B0 SPI mode
Clock signal input – USCI_A0 SPI slave mode
Clock signal output – USCI_A0 SPI master mode
General-purpose digital I/O
Slave in, master out – USCI_B0 SPI mode
I2C data – USCI_B0 I2C mode
DESCRIPTION
(2) VCORE is for internal use only. No external current loading is possible. VCORE should only be connected to the recommended
P3.3/UCA0TXD/UCA0SIMO4037G6G9I/OTransmit data – USCI_A0 UART mode
P3.4/UCA0RXD/UCA0SOMI4138G5G7I/OReceive data – USCI_A0 UART mode
P3.5/TB0.542N/AN/AN/AI/O
P3.6/TB0.643N/AN/AN/AI/O
P3.7/TB0OUTH/SVMOUT44N/AN/AN/AI/OSwitch all PWM outputs high impedance input – TB0 (not available on F5528,
P4.0/PM_UCB1STE/
PM_UCA1CLK
P4.1/PM_UCB1SIMO/
PM_UCB1SDA
P4.2/PM_UCB1SOMI/
PM_UCB1SCL
P4.3/PM_UCB1CLK/
PM_UCA1STE
DVSS24939H6F9Digital ground supply
DVCC25040H5E9Digital power supply
P4.4/PM_UCA1TXD/
PM_UCA1SIMO
P4.5/PM_UCA1RXD/
PM_UCA1SOMI
P4.6/PM_NONE5347F3C8I/O
P4.7/PM_NONE5448E4C7I/O
PNRGCYFFZQE
4541F5E8I/O
4642H4E7I/O
4743G4D9I/O
4844F4D8I/O
5145H3D7I/ODefault mapping: Transmit data – USCI_A1 UART mode
5246G3C9I/ODefault mapping: Receive data – USCI_A1 UART mode
NO.I/O
(1)
General-purpose digital I/O
Slave out, master in – USCI_B0 SPI mode
I2C clock –USCI_B0 I2C mode
General-purpose digital I/O
Clock signal input – USCI_B0 SPI slave mode
Clock signal output – USCI_B0 SPI master mode
Slave transmit enable – USCI_A0 SPI mode
General-purpose digital I/O
Slave in, master out – USCI_A0 SPI mode
General-purpose digital I/O
Slave out, master in – USCI_A0 SPI mode
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR5 capture: CCI5A input, compare: Out5 output
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR6 capture: CCI6A input, compare: Out6 output
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
F5526, F5524, F5522, F5514, F5513 devices)
SVM output (not available on F5528, F5526, F5524, F5522, F5514, F5513 devices)
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: Slave transmit enable – USCI_B1 SPI mode
Default mapping: Clock signal input – USCI_A1 SPI slave mode
Default mapping: Clock signal output – USCI_A1 SPI master mode
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: Slave in, master out – USCI_B1 SPI mode
Default mapping: I2C data – USCI_B1 I2C mode
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: Slave out, master in – USCI_B1 SPI mode
Default mapping: I2C clock –USCI_B1 I2C mode
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: Clock signal input – USCI_B1 SPI slave mode
Default mapping: Clock signal output – USCI_B1 SPI master mode
Default mapping: Slave transmit enable – USCI_A1 SPI mode
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: Slave in, master out – USCI_A1 SPI mode
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: Slave out, master in – USCI_A1 SPI mode
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: no secondary function.
General-purpose digital I/O with reconfigurable port mapping secondary function
Default mapping: no secondary function.
PUR6351G2B7I/Oinvoke the default USB BSL. Recommended 1-MΩ resistor to ground. See
PU.1/DM6452G1A8I/O
VBUS6553F2A7USB LDO input (connect to USB power source)
VUSB6654F1A6USB LDO output
V186755E2B6USB regulated power (internal use only, no external current loading)
AVSS26856D2A5Analog ground supply
P5.2/XT2IN6957E1B5I/O
P5.3/XT2OUT7058D1B4I/O
TEST/SBWTCK
PJ.0/TDO
PJ.1/TDI/TCLK
PJ.2/TMS
(3)
(4)
(4)
(4)
PNRGCYFFZQE
7159E3A4I
7260D3C5I/O
7361D4C4I/OJTAG test data input
7462C1A3I/O
NO.I/O
B8,
B9
(1)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR0 capture: CCI0A input, compare: Out0 output (not available on F5528,
F5526, F5524, F5522, F5514, F5513 devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR1 capture: CCI1A input, compare: Out1 output (not available on F5528,
F5526, F5524, F5522, F5514, F5513 devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR2 capture: CCI2A input, compare: Out2 output (not available on F5528,
F5526, F5524, F5522, F5514, F5513 devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR3 capture: CCI3A input, compare: Out3 output (not available on F5528,
F5526, F5524, F5522, F5514, F5513 devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 CCR4 capture: CCI4A input, compare: Out4 output (not available on F5528,
F5526, F5524, F5522, F5514, F5513 devices)
General-purpose digital I/O (not available on F5528, F5526, F5524, F5522, F5514,
F5513 devices)
TB0 clock signal TBCLK input (not available on F5528, F5526, F5524, F5522,
F5514, F5513 devices)
MCLK output (not available on F5528, F5526, F5524, F5522, F5514, F5513
devices)
General-purpose digital I/O. Controlled by USB control register
USB data terminal DP
USB pullup resistor pin (open drain). The voltage level at the PUR pinis used to
Section 6.5.1 for more information.
General-purpose digital I/O. Controlled by USB control register
USB data terminal DM
General-purpose digital I/O
Input terminal for crystal oscillator XT2
General-purpose digital I/O
Output terminal of crystal oscillator XT2
Test mode pin – Selects four wire JTAG operation
Spy-Bi-Wire input clock when Spy-Bi-Wire operation activated
General-purpose digital I/O
JTAG test data output port
General-purpose digital I/O
Test clock input
General-purpose digital I/O
JTAG test mode select
DESCRIPTION
(3) See Section 6.5and Section 6.6 for use with BSL and JTAG functions.
(4) See Section 6.6for use with JTAG function.
ReservedN/AN/AN/A
QFN PadN/APadN/AN/AQFN package pad. TIrecommends connecting to VSS.
(4)
(3)
PNRGCYFFZQE
7563C2B3I/O
7664D5A2I/ONonmaskable interrupt input
NO.I/O
(6)
(5) When this pin is configured as reset, the internal pullup resistor is enabled by default.
(6) C6, D4, D5, D6, E3, E4, E5, E6, F3, F4, F5, F6, F7, F8, G3 are reserved and should be connected to ground.
(1)
General-purpose digital I/O
JTAG test clock
Reset input, active low
Spy-Bi-Wire data input/output when Spy-Bi-Wire operation activated
General-purpose digital I/O
Analog input A0 – ADC (not available on F551x devices)
General-purpose digital I/O
Analog input A1 – ADC (not available on F551x devices)
General-purpose digital I/O
Analog input A2 – ADC (not available on F551x devices)
General-purpose digital I/O
Analog input A3 – ADC (not available on F551x devices)
Reserved. Connect to ground.
over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
Voltage applied at VCCto V
SS
Voltage applied to any pin (excluding VCORE, VBUS, V18)
(2)
–0.34.1V
–0.3VCC+ 0.3V
Diode current at any device pin±2mA
Maximum operating junction temperature, T
Storage temperature, T
(3)
stg
J
–55150°C
95°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS. VCORE is for internal device use only. No external DC loading or voltage should be applied.
(3) Higher temperature may be applied during board soldering according to the current JEDEC J-STD-020 specification with peak reflow
temperatures not higher than classified on the device label on the shipping boxes or reels.
5.2ESD Ratings
VALUEUNIT
V
Electrostatic dischargeV
(ESD)
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
Charged-device model (CDM), per JEDEC specification JESD22-C101
(1)
(2)
±1000
±250
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Pins listed as
±1000 V may actually have higher performance.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Pins listed as ±250 V
may actually have higher performance.
5.3Recommended Operating Conditions
Typical values are specified at VCC= 3.3 V and TA= 25°C (unless otherwise noted)
MINNOMMAX UNIT
PMMCOREVx = 01.83.6
V
CC
V
CC, USB
V
SS
T
A
T
J
C
VCORE
C
DVCC
C
VCORE
Supply voltage during program execution and flash
programming (AVCC= DV
CC1/2
= DVCC)
(1)(2)
Supply voltage during USB operation, USB PLL disabled,
USB_EN = 1, UPLLEN = 0
Supply voltage during USB operation, USB PLL enabled
USB_EN = 1, UPLLEN = 1
(1) TI recommends powering AVCC and DVCC from the same source. A maximum difference of 0.3 V between AVCC and DVCC can be
tolerated during power up and operation.
(2) The minimum supply voltage is defined by the supervisor SVS levels when it is enabled. See the Section 5.22 threshold parameters for
the exact values and further details.
(3) USB operation with USB PLL enabled requires PMMCOREVx ≥ 2 for proper operation.
(4) A capacitor tolerance of ±20% or better is required.
5.4Active Mode Supply Current Into VCCExcluding External Current
over recommended operating free-air temperature (unless otherwise noted)
PARAMETERV
I
AM, Flash
I
AM, RAM
(1) All inputs are tied to 0 V or to VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal MS1V-T1K crystal with a load capacitance of 12.5 pF. The internal and external load
capacitance are chosen to closely match the required 12.5 pF.
(3) Characterized with program executing typical data processing. USB disabled (VUSBEN = 0, SLDOEN = 0).
(1) All inputs are tied to 0 V or to VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal MS1V-T1K crystal with a load capacitance of 12.5 pF. The internal and external load
capacitance are chosen to closely match the required 12.5 pF.
(3) Current for watchdog timer clocked by SMCLK included. ACLK = low frequency crystal operation (XTS = 0, XT1DRIVEx = 0).
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3, RST/NMI)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
V
V
R
C
Positive-going input threshold voltageV
IT+
Negative-going input threshold voltageV
IT–
Input voltage hysteresis (V
hys
Pullup and pulldown resistor
Pull
Input capacitanceVIN= VSSor V
I
IT+
– V
)V
IT–
(2)
For pullup: VIN= V
For pulldown: VIN= V
SS
CC
CC
CC
1.8 V0.801.40
3 V1.502.10
1.8 V0.451.00
3 V0.751.65
1.8 V0.30.85
3 V0.41.0
(1) Same parametrics apply to clock input pin when crystal bypass mode is used on XT1 (XIN) or XT2 (XT2IN).
(2) Also applies toRST pin when pullup or pulldown resistor is enabled.
5.8Inputs – Ports P1 and P2
(1)
MINTYPMAX UNIT
203550kΩ
(P1.0 to P1.7, P2.0 to P2.7)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
t
External interrupt timing
(int)
(2)
External trigger pulse duration to set interrupt flag2.2 V, 3 V20ns
(1) Some devices may contain additional ports with interrupts. See the block diagram and terminal function descriptions.
(2) An external signal sets the interrupt flag every time the minimum interrupt pulse duration t
shorter than t
(int)
.
is met. It may be set by trigger signals
(int)
CC
5pF
MINMAX UNIT
5.9Leakage Current – General-Purpose I/O
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3, RST/NMI)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
lkg(Px.x)
PARAMETERTEST CONDITIONSV
High-impedance leakage current
(1) (2)
CC
1.8 V, 3 V–5050nA
(1) The leakage current is measured with VSSor VCCapplied to the corresponding pin(s), unless otherwise noted.
(2) The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup or pulldown resistor is
disabled.
MINMAX UNIT
5.10 Outputs – General-Purpose I/O (Full Drive Strength)
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
V
High-level output voltageV
OH
Low-level output voltageV
OL
(1) The maximum total current, I
specified.
(2) The maximum total current, I
drop specified.
(OHmax)
(OHmax)
and I
and I
I
= –3 mA
(OHmax)
I
= –10 mA
(OHmax)
I
= –5 mA
(OHmax)
I
= –15 mA
(OHmax)
I
= 3 mA
(OLmax)
I
= 10 mA
(OLmax)
I
= 5 mA
(OLmax)
I
= 15 mA
(OLmax)
, for all outputs combined should not exceed ±48 mA to hold the maximum voltage drop
(OLmax)
, for all outputs combined should not exceed ±100 mA to hold the maximum voltage
5.11 Outputs – General-Purpose I/O (Reduced Drive Strength)
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
I
(OHmax)
I
V
V
High-level output voltageV
OH
Low-level output voltageV
OL
(OHmax)
I
(OHmax)
I
(OHmax)
I
(OLmax)
I
(OLmax)
I
(OLmax)
I
(OLmax)
(1) Selecting reduced drive strength may reduce EMI.
(2) The maximum total current, I
specified.
(3) The maximum total current, I
drop specified.
(OHmax)
(OHmax)
and I
and I
(OLmax)
(OLmax)
= –1 mA
= –3 mA
= –2 mA
= –6 mA
= 1 mA
= 3 mA
= 2 mA
= 6 mA
(2)
(3)
(2)
(3)
(2)
(3)
(2)
(3)
, for all outputs combined, should not exceed ±48 mA to hold the maximum voltage drop
, for all outputs combined, should not exceed ±100 mA to hold the maximum voltage
5.12 Output Frequency – General-Purpose I/O
(P1.0 to P1.7, P2.0 to P2.7, P3.0 to P3.7, P4.0 to P4.7)
(P5.0 to P5.7, P6.0 to P6.7, P7.0 to P7.7, P8.0 to P8.2, PJ.0 to PJ.3)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSMINMAX UNIT
VCC= 1.8 V,
f
Px.y
Port output frequency
(with load)
See
(1)(2)
PMMCOREVx = 0
VCC= 3 V,
PMMCOREVx = 3
VCC= 1.8 V,
PMMCOREVx = 0
VCC= 3 V,
PMMCOREVx = 3
f
Port_CLK
ACLK,
Clock output frequencyMHz
SMCLK,
MCLK,
CL= 20 pF
(2)
(1) A resistive divider with 2 × R1 between VCCand VSSis used as load. The output is connected to the center tap of the divider. For full
drive strength, R1 = 550 Ω. For reduced drive strength, R1 = 1.6 kΩ. CL= 20 pF is connected to the output to VSS.
(2) The output voltage reaches at least 10% and 90% VCCat the specified toggle frequency.
(1) To improve EMI on the XT1 oscillator, the following guidelines should be observed.
• Keep the trace between the device and the crystal as short as possible.
• Design a good ground plane around the oscillator pins.
• Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT.
• Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins.
• Use assembly materials and processes that avoid any parasitic load on the oscillator XIN and XOUT pins.
• If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(2) When XT1BYPASS is set, XT1 circuits are automatically powered down. Input signal is a digital square wave with parametrics defined in
the Schmitt-trigger Inputs section of this data sheet.
(3) Maximum frequency of operation of the entire device cannot be exceeded.
(4) Oscillation allowance is based on a safety factor of 5 for recommended crystals. The oscillation allowance is a function of the
XT1DRIVEx settings and the effective load. In general, comparable oscillator allowance can be achieved based on the following
guidelines, but should be evaluated based on the actual crystal selected for the application:
• For XT1DRIVEx = 0, C
• For XT1DRIVEx = 1, 6 pF ≤ C
• For XT1DRIVEx = 2, 6 pF ≤ C
• For XT1DRIVEx = 3, C
(5) Includes parasitic bond and package capacitance (approximately 2 pF per pin).
L,eff
L,eff
≤ 6 pF.
L,eff
L,eff
≥ 6 pF.
≤ 9 pF.
≤ 10 pF.
Because the PCB adds additional capacitance, TI recommends verifying the correct load by measuring the ACLK frequency. For a
correct setup, the effective load capacitance should always match the specification of the used crystal.
(6) Requires external capacitors at both terminals. Values are specified by crystal manufacturers.
(7) Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag.
Frequencies between the MIN and MAX specifications might set the flag.
(8) Measured with logic-level input frequency but also applies to operation with crystals.
mode
Duty cycleMeasured at ACLK, f
Oscillator fault
frequency
(7)
XT2BYPASS = 1
(8)
= 20 MHz40%50%60%
XT2,HF2
(1) Requires external capacitors at both terminals. Values are specified by crystal manufacturers. In general, an effective load capacitance
of up to 18 pF can be supported.
(2) To improve EMI on the XT2 oscillator the following guidelines should be observed.
• Keep the traces between the device and the crystal as short as possible.
• Design a good ground plane around the oscillator pins.
• Prevent crosstalk from other clock or data lines into oscillator pins XT2IN and XT2OUT.
• Avoid running PCB traces underneath or adjacent to the XT2IN and XT2OUT pins.
• Use assembly materials and processes that avoid any parasitic load on the oscillator XT2IN and XT2OUT pins.
• If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(3) This represents the maximum frequency that can be input to the device externally. Maximum frequency achievable on the device
operation is based on the frequencies present on ACLK, MCLK, and SMCLK cannot be exceed for a given range of operation.
(4) When XT2BYPASS is set, the XT2 circuit is automatically powered down. Input signal is a digital square wave with parametrics defined
in the Schmitt-trigger Inputs section of this data sheet.
(5) Oscillation allowance is based on a safety factor of 5 for recommended crystals.
(6) Includes parasitic bond and package capacitance (approximately 2 pF per pin).
Because the PCB adds additional capacitance, TI recommends verifying the correct load by measuring the ACLK frequency. For a
correct setup, the effective load capacitance should always match the specification of the used crystal.
(7) Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag.
Frequencies between the MIN and MAX specifications might set the flag.
(8) Measured with logic-level input frequency but also applies to operation with crystals.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
f
VLO
df
VLO/dT
df
VLO
VLO frequencyMeasured at ACLK1.8 V to 3.6 V69.414kHz
VLO frequency temperature driftMeasured at ACLK
/dVCCVLO frequency supply voltage driftMeasured at ACLK
(1)
(2)
CC
1.8 V to 3.6 V0.5%/°C
1.8 V to 3.6 V4%/V
Duty cycleMeasured at ACLK1.8 V to 3.6 V40%50%60%
(1) Calculated using the box method: (MAX(–40°C to 85°C) – MIN(–40°C to 85°C)) / MIN(–40°C to 85°C) / (85°C – (–40°C))
(2) Calculated using the box method: (MAX(1.8 V to 3.6 V) – MIN(1.8 V to 3.6 V)) / MIN(1.8 V to 3.6 V) / (3.6 V – 1.8 V)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
REFO
PARAMETERTEST CONDITIONSV
REFO oscillator current consumption TA= 25°C1.8 V to 3.6 V3µA
CC
REFO frequency calibratedMeasured at ACLK1.8 V to 3.6 V32768Hz
f
REFO
df
REFO/dT
df
REFO
/dV
REFO absolute tolerance calibrated
REFO frequency temperature driftMeasured at ACLK
REFO frequency supply voltage drift Measured at ACLK
CC
Full temperature range1.8 V to 3.6 V–3.5%3.5%
TA= 25°C3 V–1.5%1.5%
(1)
(2)
1.8 V to 3.6 V0.01%/°C
1.8 V to 3.6 V1.0%/V
Duty cycleMeasured at ACLK1.8 V to 3.6 V40%50%60%
t
START
REFO start-up time40%/60% duty cycle1.8 V to 3.6 V25µs
(1) Calculated using the box method: (MAX(–40°C to 85°C) – MIN(–40°C to 85°C)) / MIN(–40°C to 85°C) / (85°C – (–40°C))
(2) Calculated using the box method: (MAX(1.8 V to 3.6 V) – MIN(1.8 V to 3.6 V)) / MIN(1.8 V to 3.6 V) / (3.6 V – 1.8 V)