•Ultra-Low Power Consumption•Supply Voltage Supervisor/Monitor With
– Active Mode: 270 µA at 1 MHz, 2.2 V
– Standby Mode (VLO): 0.3 µA
– Off Mode (RAM Retention): 0.1 µA
•Ultra-Fast Wake-Up From Standby Mode in
Less Than 1 µs
•16-Bit RISC Architecture, 62.5-ns Instruction
Cycle Time
•Basic Clock Module Configurations:
– Internal Frequencies up to 16 MHz
– Internal Very Low-Power LF Oscillator
– 32-kHz Crystal
– Internal Frequencies up to 16 MHz With
Four Calibrated Frequencies to ±1%– 2KB RAM
– Resonator– MSP430F247, MSP430F2471
– External Digital Clock Source– 32KB+256B Flash Memory
– External Resistor– 4KB RAM
•16-Bit Timer_A With Three Capture/Compare
Registers
•16-Bit Timer_B With Seven Capture/Compare
With Shadow Registers
•Four Universal Serial Communication
Interfaces (USCI)
– USCI_A0 and USCI_A1
– Enhanced UART Supporting Auto-Baudrate
Detection
– IrDA Encoder and Decoder
– Synchronous SPI
– USCI_B0 and USCI_B1
– I2C™
– Synchronous SPIimplemented on the MSP430F24x1.
•On-Chip Comparator
Programmable Level Detection
•Brownout Detector
•Bootstrap Loader
•Serial Onboard Programming, No External
Programming Voltage Needed, Programmable
Code Protection by Security Fuse
•Family Members Include:
– MSP430F233
– 8KB+256B Flash Memory,
– 1KB RAM
– MSP430F235
– 16KB+256B Flash Memory
(1)
– 48KB+256B Flash Memory
– 4KB RAM
– MSP430F249, MSP430F2491
– 60KB+256B Flash Memory
– 2KB RAM
– MSP430F2410
– 56KB+256B Flash Memory
– 4KB RAM
•Available in 64-Pin QFP and 64-Pin QFN
Packages (See Available Options)
•For Complete Module Descriptions, See
MSP430x2xx Family User’s Guide (SLAU144)
(1) The MSP430F24x1 devices are identical to the MSP430F24x
devices, with the exception that the ADC12 module is not
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2MSP430 is a trademark of Texas Instruments.
3All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION
The Texas Instruments MSP430™ family of ultra-low power microcontrollers consists of several devices featuring
different sets of peripherals targeted for various applications. The architecture, combined with five low-power
modes, is optimized to achieve extended battery life in portable measurement applications. The device features a
powerful 16-bit RISC CPU, 16-bit registers, and constant generators that contribute to maximum code efficiency.
The calibrated digitally controlled oscillator (DCO) allows wake-up from low-power modes to active mode in less
than 1 µs.
The MSP430F23x, MSP430F24x(1), and MSP430F2410 series are microcontroller configurations with two builtin 16-bit timers, a fast 12-bit A/D converter (not MSP430F24x1), a comparator, four (two in MSP430F23x)
universal serial communication interface (USCI) modules, and up to 48 I/O pins. The MSP430F24x1 devices are
identical to the MSP430F24x devices, with the exception that the ADC12 module is not implemented. The
MSP430F23x devices are identical to the MSP430F24x devices, with the exception that a reduced Timer_B, one
USCI module, and less RAM are integrated.
Typical applications include sensor systems, industrial control applications, and hand-held meters.
www.ti.com
Table 1. Available Options
T
A
-40°C to 105°CMSP430F248TPMMSP430F248TRGC
(1) For the most current package and ordering information, see the Package Option Addendum at the end
of this document, or see the TI web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
All MSP430 microcontrollers include an Embedded Emulation Module (EEM) allowing advanced debugging and
programming through easy to use development tools. Recommended hardware options include the following:
P3.4/UCA0TXD/ UCA0SIMO32I/O
P3.5/UCA0RXD/General-purpose digital I/O / USCI_A0 receive data input in UART mode, slave data out/master in in SPI
UCA0SOMImode
P3.634I/OGeneral-purpose digital I/O
P3.735I/OGeneral-purpose digital I/O
P4.0/TB036I/OGeneral-purpose digital I/O / Timer_B, capture: CCI0A/B input, compare: Out0 output
P4.1/TB137I/OGeneral-purpose digital I/O / Timer_B, capture: CCI1A/B input, compare: Out1 output
P4.2/TB238I/OGeneral-purpose digital I/O / Timer_B, capture: CCI2A/B input, compare: Out2 output
P4.339I/OGeneral-purpose digital I/O
P4.440I/OGeneral-purpose digital I/O
P4.541I/OGeneral-purpose digital I/O
P4.642I/OGeneral-purpose digital I/O
P4.7/TBCLK43I/OGeneral-purpose digital I/O / Timer_B, clock signal TBCLK input
P5.044I/OGeneral-purpose digital I/O
P5.145I/OGeneral-purpose digital I/O
P5.246I/OGeneral-purpose digital I/O
P5.347I/OGeneral-purpose digital I/O
P5.4/MCLK48I/OGeneral-purpose digital I/O / main system clock MCLK output
P5.5/SMCLK49I/OGeneral-purpose digital I/O / submain system clock SMCLK output
P5.6/ACLK50I/OGeneral-purpose digital I/O / auxiliary clock ACLK output
P5.7/TBOUTH/SVSOUT51I/O
P6.0/A059I/OGeneral-purpose digital I/O / analog input A0 - 12-bit ADC
P6.1/A160I/OGeneral-purpose digital I/O / analog input A1 - 12-bit ADC
P6.2/A261I/OGeneral-purpose digital I/O / analog input A2 - 12-bit ADC
/CA525I/O
OSC
64Analog supply voltage, positive. Supplies only the analog portion of ADC12.
62Analog supply voltage, negative. Supplies only the analog portion of ADC12.
63Digital supply voltage, negative. Supplies all digital parts.
33I/O
I/ODESCRIPTION
1Digital supply voltage, positive. Supplies all digital parts.
General-purpose digital I/O / input for external resistor defining the DCO nominal frequency/Comparator_A
input
General-purpose digital I/O / USCI_B0 slave in/master out in SPI mode, SDA I2C data in I2C mode
General-purpose digital I/O / USCI_B0 slave out/master in in SPI mode, SCL I2C clock in I2C mode
General-purpose digital I/O / USCI_A0 transmit data output in UART mode, slave data in/master out in SPI
mode
General-purpose digital I/O / switch all PWM digital output ports to high impedance - Timer_B TB0 to
TB6/SVS comparator output
P6.3/A32I/OGeneral-purpose digital I/O / analog input A3 - 12-bit ADC
P6.4/A43I/OGeneral-purpose digital I/O / analog input A4 - 12-bit ADC
P6.5/A54I/OGeneral-purpose digital I/O / analog input A5 - 12-bit ADC
P6.6/A65I/OGeneral-purpose digital I/O / analog input A6 - 12-bit ADC
P6.7/A7/SVSIN6I/OGeneral-purpose digital I/O / analog input A7 - 12-bit ADC/SVS input
XT2OUT52OOutput terminal of crystal oscillator XT2
XT2IN53IInput port for crystal oscillator XT2
RST/NMI58IReset input, nonmaskable interrupt input, or bootstrap loader start (in flash devices)
TCK57ITest clock (JTAG). TCK is the clock input port for device programming test and bootstrap loader start.
TDI/TCLK55ITest data input or test clock input. The device protection fuse is connected to TDI/TCLK.
TDO/TDI54I/OTest data output. TDO/TDI data output or programming data input terminal.
TMS56ITest mode select. TMS is used as an input port for device programming and test.
V
eREF+
V
REF+
V
REF-/VeREF-
XIN8IInput for crystal oscillator XT1. Standard or watch crystals can be connected.
XOUT9OOutput for crystal oscillator XT1. Standard or watch crystals can be connected.
QFN PadNANAQFN package pad connection to DVSSrecommended
10IInput for an external reference voltage
11I
I/ODESCRIPTION
7OOutput of positive terminal of the reference voltage in the ADC12
Negative terminal for the reference voltage for both sources, the internal reference voltage, or an external
applied reference voltage
P3.4/UCA0TXD/UCA0SIMO32I/O
P3.5/UCA0RXD/General-purpose digital I/O / USCI_A0 receive data input in UART mode, slave data out/master in in SPI
UCA0SOMImode
P3.6/UCA1TXD/UCA1SIMO34I/O
P3.7/UCA1RXD/General-purpose digital I/O / USCI_A1 receive data input in UART mode, slave data out/master in in SPI
UCA1SOMImode
P4.0/TB036I/OGeneral-purpose digital I/O / Timer_B, capture: CCI0A/B input, compare: Out0 output
P4.1/TB137I/OGeneral-purpose digital I/O / Timer_B, capture: CCI1A/B input, compare: Out1 output
P4.2/TB238I/OGeneral-purpose digital I/O / Timer_B, capture: CCI2A/B input, compare: Out2 output
P4.3/TB339I/OGeneral-purpose digital I/O / Timer_B, capture: CCI3A/B input, compare: Out3 output
P4.4/TB440I/OGeneral-purpose digital I/O / Timer_B, capture: CCI4A/B input, compare: Out4 output
P4.5/TB541I/OGeneral-purpose digital I/O / Timer_B, capture: CCI5A/B input, compare: Out5 output
P4.6/TB642I/OGeneral-purpose digital I/O / Timer_B, capture: CCI6A input, compare: Out6 output
P4.7/TBCLK43I/OGeneral-purpose digital I/O / Timer_B, clock signal TBCLK input
P5.0/UCB1STE/UCA1CLK44I/OGeneral-purpose digital I/O / USCI_B1 slave transmit enable / USCI_A1 clock input/output
P5.1/UCB1SIMO/UCB1SDA45I/O
P5.2/UCB1SOMI/UCB1SCL46I/O
P5.3/UCB1CLK/UCA1STE47I/OGeneral-purpose digital I/O / USCI_B1 clock input/output, USCI_A1 slave transmit enable
P5.4/MCLK48I/OGeneral-purpose digital I/O / main system clock MCLK output
P5.5/SMCLK49I/OGeneral-purpose digital I/O / submain system clock SMCLK output
P5.6/ACLK50I/OGeneral-purpose digital I/O / auxiliary clock ACLK output
P5.7/TBOUTH/SVSOUT51I/O
P6.0/A059I/OGeneral-purpose digital I/O / analog input A0 - 12-bit ADC
/CA525I/O
OSC
64Analog supply voltage, positive terminal. Supplies only the analog portion of ADC12.
62Analog supply voltage, negative terminal. Supplies only the analog portion of ADC12.
63Digital supply voltage, negative terminal. Supplies all digital parts.
33I/O
35I/O
I/ODESCRIPTION
1Digital supply voltage, positive terminal. Supplies all digital parts.
General-purpose digital I/O / Input for external resistor defining the DCO nominal frequency / Comparator_A
input
General-purpose digital I/O / USCI_B0 slave in/master out in SPI mode, SDA I2C data in I2C mode
General-purpose digital I/O / USCI_B0 slave out/master in in SPI mode, SCL I2C clock in I2C mode
General-purpose digital I/O / USCI_A- transmit data output in UART mode, slave data in/master out in SPI
mode
General-purpose digital I/O / USCI_A1 transmit data output in UART mode, slave data in/master out in SPI
mode
General-purpose digital I/O / USCI_B1 slave in/master out in SPI mode, SDA I2C data in I2C mode
General-purpose digital I/O / USCI_B1 slave out/master in in SPI mode, SCL I2C clock in I2C mode
General-purpose digital I/O / switch all PWM digital output ports to high impedance - Timer_B TB0 to
TB6/SVS comparator output
P6.1/A160I/OGeneral-purpose digital I/O / analog input A1 - 12-bit ADC
P6.2/A261I/OGeneral-purpose digital I/O / analog input A2 - 12-bit ADC
P6.3/A32I/OGeneral-purpose digital I/O / analog input A3 - 12-bit ADC
P6.4/A43I/OGeneral-purpose digital I/O / analog input A4 - 12-bit ADC
P6.5/A54I/OGeneral-purpose digital I/O / analog input A5 - 12-bit ADC
P6.6/A65I/OGeneral-purpose digital I/O / analog input A6 - 12-bit ADC
P6.7/A7/SVSIN6I/OGeneral-purpose digital I/O / analog input A7 - 12-bit ADC/SVS input
XT2OUT52OOutput of crystal oscillator XT2
XT2IN53IInput for crystal oscillator XT2
RST/NMI58IReset input, nonmaskable interrupt input, or bootstrap loader start (in flash devices)
TCK57ITest clock (JTAG). TCK is the clock input port for device programming test and bootstrap loader start.
TDI/TCLK55ITest data input or test clock input. The device protection fuse is connected to TDI/TCLK.
TDO/TDI54I/OTest data output. TDO/TDI data output or programming data input terminal.
TMS56ITest mode select. TMS is used as an input port for device programming and test.
V
eREF+
V
REF+
V
REF-/VeREF-
XIN8IInput for crystal oscillator XT1. Standard or watch crystals can be connected.
XOUT9OOutput for crystal oscillator XT1. Standard or watch crystals can be connected.
QFN PadNANAQFN package pad connection to DVSSrecommended (RGC package only)
10IInput for an external reference voltage
11I
I/ODESCRIPTION
7OPositive output of the reference voltage in the ADC12
Negative input for the reference voltage for both sources, the internal reference voltage, or an external
applied reference voltage
P3.4/UCA0TXD/UCA0SIMO32I/O
P3.5/UCA0RXD/General-purpose digital I/O / USCI_A0 receive data input in UART mode, slave data out/master in in SPI
UCA0SOMImode
P3.6/UCA1TXD/UCA1SIMO34I/O
P3.7/UCA1RXD/General-purpose digital I/O / USCI_A1 receive data input in UART mode, slave data out/master in in SPI
UCA1SOMImode
P4.0/TB036I/OGeneral-purpose digital I/O / Timer_B, capture: CCI0A/B input, compare: Out0 output
P4.1/TB137I/OGeneral-purpose digital I/O / Timer_B, capture: CCI1A/B input, compare: Out1 output
P4.2/TB238I/OGeneral-purpose digital I/O / Timer_B, capture: CCI2A/B input, compare: Out2 output
P4.3/TB339I/OGeneral-purpose digital I/O / Timer_B, capture: CCI3A/B input, compare: Out3 output
P4.4/TB440I/OGeneral-purpose digital I/O / Timer_B, capture: CCI4A/B input, compare: Out4 output
P4.5/TB541I/OGeneral-purpose digital I/O / Timer_B, capture: CCI5A/B input, compare: Out5 output
P4.6/TB642I/OGeneral-purpose digital I/O / Timer_B, capture: CCI6A input, compare: Out6 output
P4.7/TBCLK43I/OGeneral-purpose digital I/O / Timer_B, clock signal TBCLK input
P5.0/UCB1STE/UCA1CLK44I/OGeneral-purpose digital I/O / USCI_B1 slave transmit enable/USCI_A1 clock input/output
P5.1/UCB1SIMO/UCB1SDA45I/O
P5.2/UCB1SOMI/UCB1SCL46I/O
P5.3/UCB1CLK/UCA1STE47I/OGeneral-purpose digital I/O / USCI_B1 clock input/output, USCI_A1 slave transmit enable
P5.4/MCLK48I/OGeneral-purpose digital I/O / main system clock MCLK output
P5.5/SMCLK49I/OGeneral-purpose digital I/O / submain system clock SMCLK output
P5.6/ACLK50I/OGeneral-purpose digital I/O / auxiliary clock ACLK output
P5.7/TBOUTH/SVSOUT51I/O
P6.059I/OGeneral-purpose digital I/O
/CA525I/O
OSC
64Analog supply voltage, positive. Supplies only the analog portion of ADC12.
62Analog supply voltage, negative. Supplies only the analog portion of ADC12.
63Digital supply voltage, negative. Supplies all digital parts.
33I/O
35I/O
I/ODESCRIPTION
1Digital supply voltage, positive. Supplies all digital parts.
General-purpose digital I/O / input for external resistor defining the DCO nominal frequency / Comparator_A
input
General-purpose digital I/O / USCI_B0 slave in/master out in SPI mode, SDA I2C data in I2C mode
General-purpose digital I/O / USCI_B0 slave out/master in in SPI mode, SCL I2C clock in I2C mode
General-purpose digital I/O / USCI_A0 transmit data output in UART mode, slave data in/master out in SPI
mode
General-purpose digital I/O / USCI_A1 transmit data output in UART mode, slave data in/master out in SPI
mode
General-purpose digital I/O / USCI_B1 slave in/master out in SPI mode, SDA I2C data in I2C mode
General-purpose digital I/O / USCI_B1 slave out/master in in SPI mode, SCL I2C clock in I2C mode
General-purpose digital I/O / switch all PWM digital output ports to high impedance - Timer_B TB0 to
TB6/SVS comparator output
P6.160I/OGeneral-purpose digital I/O
P6.261I/OGeneral-purpose digital I/O
P6.32I/OGeneral-purpose digital I/O
P6.43I/OGeneral-purpose digital I/O
P6.54I/OGeneral-purpose digital I/O
P6.65I/OGeneral-purpose digital I/O
P6.7/SVSIN6I/OGeneral-purpose digital I/O / SVS input
XT2OUT52OOutput terminal of crystal oscillator XT2
XT2IN53IInput port for crystal oscillator XT2
RST/NMI58IReset input, nonmaskable interrupt input, or bootstrap loader start (in flash devices).
TCK57ITest clock (JTAG). TCK is the clock input for device programming test and bootstrap loader start.
TDI/TCLK55ITest data input or test clock input. The device protection fuse is connected to TDI/TCLK.
TDO/TDI54I/OTest data output. TDO/TDI data output or programming data input terminal.
TMS56ITest mode select. TMS is used as an input port for device programming and test.
DV
SS
Reserved7OReserved, do not connect externally
DV
SS
XIN8IInput for crystal oscillator XT1. Standard or watch crystals can be connected.
XOUT9OOutput for crystal oscillator XT1. Standard or watch crystals can be connected.
QFN PadNANAQFN package pad connection to DVSSrecommended (RGC package only)
The MSP430 CPU has a 16-bit RISC architecture
that is highly transparent to the application. All
operations, other than program-flow instructions, are
performed as register operations in conjunction with
seven addressing modes for source operand and four
addressing modes for destination operand.
The CPU is integrated with 16 registers that provide
reduced instruction execution time. The register-toregister operation execution time is one cycle of the
CPU clock.
Four of the registers, R0 to R3, are dedicated as
program counter, stack pointer, status register, and
constant generator,respectively.The remaining
registers are general-purpose registers.
Peripherals are connected to the CPU using data,
address, and control buses, and can be handled with
all instructions.
MSP430F23x
MSP430F24x(1)
MSP430F2410
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
Instruction Set
The instruction set consists of 51 instructions with
three formats and seven address modes. Each
instruction can operate on word and byte data.
Table 5 shows examples of the three types of
instruction formats; Table 6 shows the address
modes.
Dual operands, source-destinationADD R4,R5R4 + R5 → R5
Single operands, destination onlyCALL R8PC → (TOS), R8 → PC
Relative jump, unconditional/conditionalJNEJump-on-equal bit = 0
The MSP430 has one active mode and five software-selectable low-power modes of operation. An interrupt
event can wake up the device from any of the five low-power modes, service the request, and restore back to the
low-power mode on return from the interrupt program.
The following six operating modes can be configured by software:
•Active mode (AM)
– All clocks are active.
•Low-power mode 0 (LPM0)
– CPU is disabled.
– ACLK and SMCLK remain active. MCLK is disabled.
•Low-power mode 1 (LPM1)
– CPU is disabled ACLK and SMCLK remain active. MCLK is disabled.
– DCO dc-generator is disabled if DCO not used in active mode.
•Low-power mode 2 (LPM2)
– CPU is disabled.
– MCLK and SMCLK are disabled.
– DCO dc-generator remains enabled.
– ACLK remains active.
•Low-power mode 3 (LPM3)
– CPU is disabled.
– MCLK and SMCLK are disabled.
– DCO dc-generator is disabled.
– ACLK remains active.
•Low-power mode 4 (LPM4)
– CPU is disabled.
– ACLK is disabled.
– MCLK and SMCLK are disabled.
– DCO dc-generator is disabled.
– Crystal oscillator is stopped.
The interrupt vectors and the power-up starting address are located in the address range 0xFFFF to 0xFFC0.
The vector contains the 16-bit address of the appropriate interrupt-handler instruction sequence. If the reset
vector (0xFFFE) contains 0xFFFF (for example, if flash is not programmed) the CPU enters LPM4 after powerup.
WatchdogRSTIFGReset0xFFFE31, highest
Flash key violationKEYV
PC out of range
NMINMIIFG(Non)maskable
Oscillator faultOFIFG(Non)maskable0xFFFC30
Flash memory access violationACCVIFG
Timer_B7
Timer_B7
Comparator_A+CAIFGMaskable0xFFF627
Watchdog timer+WDTIFGMaskable0xFFF426
Timer_A3TACCR0 CCIFG
Timer_A3Maskable0xFFF024
USCI_A0/USCI_B0 receive
USCI_B0 I2C status
USCI_A0/USCI_B0 transmit
USCI_B0 I2C receive / transmit
ADC12
I/O port P2 (eight flags)P2IFG.0 to P2IFG.7
I/O port P1 (eight flags)P1IFG.0 to P1IFG.7
USCI_A1/USCI_B1 receive
USCI_B1 I2C status
USCI_A1/USCI_B1 transmit
USCI_B1 I2C receive / transmit
Reserved
(1) A reset is generated if the CPU tries to fetch instructions from within the module register memory address range (0x0000 to 0x01FF) or
from within unused address range.
(2) Multiple source flags
(3) (Non)maskable: The individual interrupt-enable bit can disable an interrupt event, but the general-interrupt enable cannot.
(4) Timer_B7 in MSP430F24x(1)/MSP430F2410 family has seven CCRs, Timer_B3 in MSP430F23x family has three CCRs. In Timer_B3,
there are only interrupt flags TBCCR0 CCIFG, TBCCR1 CCIFG, and TBCCR2 CCIFG, and the interrupt enable bits TBCCTL0 CCIE,
TBCCTL1 CCIE, and TBCCTL2 CCIE.
(5) Interrupt flags are located in the module.
(6) In SPI mode: UCB0RXIFG. In I2C mode: UCALIFG, UCNACKIFG, ICSTTIFG, UCSTPIFG.
(7) In UART/SPI mode: UCB0TXIFG. In I2C mode: UCB0RXIFG, UCB0TXIFG.
(8) ADC12 is not implemented in the MSP430F24x1 family.
(9) The address 0xFFDE is used as bootstrap loader security key (BSLSKEY). A 0xAA55 at this location disables the BSL completely. A
zero disables the erasure of the flash if an invalid password is supplied.
(10) The interrupt vectors at addresses 0xFFDE to 0xFFC0 are not used in this device and can be used for regular program code if
Most interrupt enable bits are collected in the lowest address space. Special-function register bits not allocated to
a functional purpose are not physically present in the device. This arrangement provides simple software access.
Legend
rwBit can be read and written.
rw-0, 1Bit can be read and written. It is Reset or Set by PUC.
rw-(0), (1)Bit can be read and written. It is Reset or Set by POR.
SFR bit is not present in device.
Table 8. Interrupt Enable 1
Address76543210
00hACCVIENMIIEOFIEWDTIE
rw-0rw-0rw-0rw-0
www.ti.com
WDTIEWatchdog timer interrupt enable. Inactive if watchdog mode is selected. Active if watchdog timer is configured in interval
WDTIFGSet on watchdog timer overflow (in watchdog mode) or security key violation.
Reset on VCCpower-up or a reset condition at RST/NMI pin in reset mode.
OFIFGFlag set on oscillator fault
RSTIFGExternal reset interrupt flag. Set on a reset condition at RST/NMI pin in reset mode. Reset on VCCpower up.
PORIFGPower-on reset interrupt flag. Set on VCCpower up.
NMIIFGSet via RST/NMI pin
Address76543210
03hUCB0TXIFG UCB0RXIFG UCA0TXIFG UCA0RXIFG
UCA0RXIFGUSCI_A0 receive-interrupt flag
UCA0TXIFGUSCI_A0 transmit-interrupt flag
UCB0RXIFGUSCI_B0 receive-interrupt flag
UCB0TXIFGUSCI_B0 transmit-interrupt flag
MemorySize8KB16KB60KB
Main: interrupt vectorFlash0xFFFF to 0xFFC00xFFFF to 0xFFC00xFFFF to 0xFFC0
Main: code memoryFlash0xFFFF to 0xE0000xFFFF to 0xC0000xFFFF to 0x1100
RAM (Total)Size1KB2KB2KB
0x05FF to 0x02000x09FF to 0x02000x09FF to 0x0200
Information memorySize256 Byte256 Byte256 Byte
Flash0x10FF to 0x10000x10FF to 0x10000x10FF to 0x1000
Boot memorySize1KB1KB1KB
ROM0x0FFF to 0x0C000x0FFF to 0x0C000x0FFF to 0x0C00
RAMSize1KB2KB2KB
0x05FF to 0x02000x09FF to 0x02000x09FF to 0x0200
Peripherals16 bit0x01FF to 0x01000x01FF to 0x01000x01FF to 0x0100
8 bit0x00FF to 0x00100x00FF to 0x00100x00FF to 0x0010
SFR0x000F to 0x00000x000F to 0x00000x000F to 0x0000
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
MSP430F249
MSP430F2491
MSP430F247MSP430F248
MSP430F2471MSP430F2481
MemorySize32KB48KB56KB
Main: interrupt vectorFlash0xFFFF to 0xFFC00xFFFF to 0xFFC00xFFFF to 0xFFC0
Main: code memoryFlash0xFFFF to 0x80000xFFFF to 0x40000xFFFF to 0x2100
RAM (total)Size4KB4KB4KB
0x20FF to 0x11000x20FF to 0x11000x20FF to 0x1100
ExtendedSize2KB2KB2KB
0x20FF to 0x19000x20FF to 0x19000x20FF to 0x1900
MirroredSize2KB2KB2KB
0x18FF to 0x11000x18FF to 0x11000x18FF to 0x1100
Information memorySize256 Byte256 Byte256 Byte
Flash0x10FF to 0x10000x10FF to 0x10000x10FF to 0x1000
Boot memorySize1KB1KB1KB
ROM0x0FFF to 0x0C000x0FFF to 0x0C000x0FFF to 0x0C00
RAM (mirrored atSize2KB2KB2KB
0x18FF to 0x1100)0x09FF to 0x02000x09FF to 0x02000x09FF to 0x0200
Peripherals16 bit0x01FF to 0x01000x01FF to 0x01000x01FF to 0x0100
8 bit0x00FF to 0x00100x00FF to 0x00100x00FF to 0x0010
SFR0x000F to 0x00000x000F to 0x00000x000F to 0x0000
MSP430F2410
Bootstrap Loader (BSL)
The MSP430 bootstrap loader (BSL) enables users to program the flash memory or RAM using a UART serial
interface. Access to the MSP430 memory via the BSL is protected by user-defined password. For complete
description of the features of the BSL and its implementation, see the MSP430 Programming Via the BootstrapLoader User’s Guide (SLAU319).
Flash Memory
The flash memory can be programmed via the JTAG port, the bootstrap loader, or in-system by the CPU. The
CPU can perform single-byte and single-word writes to the flash memory. Features of the flash memory include:
•Flash memory has n segments of main memory and four segments of information memory (A to D) of
64 bytes each. Each segment in main memory is 512 bytes in size.
•Segments 0 to n may be erased in one step, or each segment may be individually erased.
•Segments A to D can be erased individually, or as a group with segments 0 to n.
Segments A to D are also called information memory.
•Segment A contains calibration data. After reset, segment A is protected against programming and erasing. It
can be unlocked, but care should be taken not to erase this segment if the device-specific calibration data is
required.
Peripherals are connected to the CPU through data, address, and control buses and can be handled using all
instructions. For complete module descriptions, see the MSP430x2xx Family User's Guide (SLAU144).
Oscillator and System Clock
The clock system is supported by the basic clock module that includes support for a 32768-Hz watch crystal
oscillator, an internal very-low-power low-frequency oscillator, an internal digitally-controlled oscillator (DCO), and
a high-frequency crystal oscillator. The basic clock module is designed to meet the requirements of both low
system cost and low power consumption. The internal DCO provides a fast turn-on clock source and stabilizes in
less than 1 µs. The basic clock module provides the following clock signals:
•Auxiliary clock (ACLK), sourced from a 32768-Hz watch crystal, a high-frequency crystal, or the internal verylow-power LF oscillator.
•Main clock (MCLK), the system clock used by the CPU.
•Sub-Main clock (SMCLK), the sub-system clock used by the peripheral modules.
Calibration Data Stored in Information Memory Segment A
Calibration data is stored for the DCO and for the ADC12. It is organized in a tag-length-value (TLV) structure.
Table 14. Tags Used by the ADC Calibration Tags
NAMEADDRESSVALUEDESCRIPTION
TAG_DCO_300x10F60x01DCO frequency calibration at VCC= 3 V andTA= 25°C at calibration
TAG_ADC12_10x10DA0x10ADC12_1 calibration tag
TAG_EMPTY-0xFEIdentifier for empty memory areas
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
Table 15. Labels Used by the ADC Calibration Tags
LABELCONDITION AT CALIBRATION / DESCRIPTIONSIZEADDRESS OFFSET
The brownout circuit is implemented to provide the proper internal reset signal to the device during power on and
power off. The SVS circuitry detects if the supply voltage drops below a user-selectable level and supports both
supply voltage supervision (the device is automatically reset) and supply voltage monitoring (SVM, the device is
not automatically reset).
The CPU begins code execution after the brownout circuit releases the device reset. However, VCCmay not have
ramped to V
reaches V
at that time. The user must ensure that the default DCO settings are not changed until V
CC(min)
. If desired, the SVS circuit can be used to determine when VCCreaches V
CC(min)
.
CC
MSP430F23x
MSP430F24x(1)
MSP430F2410
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
Digital I/O
There are up to six 8-bit I/O ports implemented—ports P1 through P6:
•All individual I/O bits are independently programmable.
•Any combination of input, output, and interrupt condition is possible.
•Edge-selectable interrupt input capability for all eight bits of port P1 and P2.
•Read/write access to port-control registers is supported by all instructions.
•Each I/O has an individually programmable pullup/pulldown resistor.
Watchdog Timer (WDT+)
The primary function of the WDT+ module is to perform a controlled system restart after a software problem
occurs. If the selected time interval expires, a system reset is generated. If the watchdog function is not needed
in an application, the module can be disabled or configured as an interval timer and can generate interrupts at
selected time intervals.
Hardware Multiplier
The multiplication operation is supported by a dedicated peripheral module. The module performs 16x16, 16x8,
8x16, and 8x8 bit operations. The module is capable of supporting signed and unsigned multiplication as well as
signed and unsigned multiply and accumulate operations. The result of an operation can be accessed
immediately after the operands have been loaded into the peripheral registers. No additional clock cycles are
required.
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Timer_A3
Timer_A3 is a 16-bit timer/counter with three capture/compare registers. Timer_A3 can support multiple
capture/compares, PWM outputs, and interval timing. Timer_A3 also has extensive interrupt capabilities.
Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare
registers.
Timer_B7 is a 16-bit timer/counter with seven capture/compare registers. Timer_B7 can support multiple
capture/compares, PWM outputs, and interval timing. Timer_B7 also has extensive interrupt capabilities.
Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare
registers.
Timer_B3 is a 16-bit timer/counter with three capture/compare registers. Timer_B3 can support multiple
capture/compares, PWM outputs, and interval timing. Timer_B3 also has extensive interrupt capabilities.
Interrupts may be generated from the counter on overflow conditions and from each of the capture/compare
registers.
The USCI modules are used for serial data communication. The USCI module supports synchronous
communication protocols, such as SPI (3 or 4 pin) or I2C, and asynchronous combination protocols, such as
UART, enhanced UART with automatic baudrate detection (LIN), and IrDA.
The USCI A module provides support for SPI (3 or 4 pin), UART, enhanced UART, and IrDA.
The USCI B module provides support for SPI (3 or 4 pin) and I2C.
Comparator_A+
The primary function of the comparator_A+ module is to support precision slope analog-to-digital conversions,
battery-voltage supervision, and monitoring of external analog signals.
ADC12 (MSP430F23x, MSP430F24x, and MSP430F2410 Devices)
The ADC12 module supports fast, 12-bit analog-to-digital conversions. The module implements a 12-bit SAR
core, sample select control, reference generator, and a 16-word conversion-and-control buffer. The conversionand-control buffer allows up to 16 independent ADC samples to be converted and stored without any CPU
intervention.
Capture/compare register 5TBCCR50x019C
Capture/compare register 4TBCCR40x019A
Capture/compare register 3TBCCR30x0198
Capture/compare register 2TBCCR20x0196
Capture/compare register 1TBCCR10x0194
Capture/compare register 0TBCCR00x0192
Timer_B registerTBR0x0190
Capture/compare control 6TBCCTL60x018E
Capture/compare control 5TBCCTL50x018C
Capture/compare control 4TBCCTL40x018A
Capture/compare control 3TBCCTL30x0188
Capture/compare control 2TBCCTL20x0186
Capture/compare control 1TBCCTL10x0184
Capture/compare control 0TBCCTL00x0182
Timer_B controlTBCTL0x0180
Timer_B interrupt vectorTBIV0x011E
Capture/compare register 1TBCCR10x0194
Capture/compare register 0TBCCR00x0192
Timer_B registerTBR0x0190
Capture/compare control 2TBCCTL20x0186
Capture/compare control 1TBCCTL10x0184
Capture/compare control 0TBCCTL00x0182
Timer_B controlTBCTL0x0180
Timer_B interrupt vectorTBIV0x011E
Capture/compare register 1TACCR10x0174
Capture/compare register 0TACCR00x0172
Timer_A registerTAR0x0170
Reserved0x016E
Reserved0x016C
Reserved0x016A
Reserved0x0168
Capture/compare control 2TACCTL20x0166
Capture/compare control 1TACCTL10x0164
Capture/compare control 0TACCTL00x0162
Timer_A controlTACTL0x0160
Timer_A interrupt vectorTAIV0x012E
Result high wordRESHI0x013C
Result low wordRESLO0x013A
Second operandOP20x0138
Multiply signed + accumulate/operand1MACS0x0136
Multiply + accumulate/operand1MAC0x0134
Multiply signed/operand1MPYS0x0132
Multiply unsigned/operand1MPY0x0130
Port P3 selectionP3SEL0x001B
Port P3 directionP3DIR0x001A
Port P3 outputP3OUT0x0019
Port P3 inputP3IN0x0018
Port P2Port P2 resistor enableP2REN0x002F
Port P2 selectionP2SEL0x002E
Port P2 interrupt enableP2IE0x002D
Port P2 interrupt-edge selectP2IES0x002C
Port P2 interrupt flagP2IFG0x002B
Port P2 directionP2DIR0x002A
Port P2 outputP2OUT0x0029
Port P2 inputP2IN0x0028
Port P1Port P1 resistor enableP1REN0x0027
Port P1 selectionP1SEL0x0026
Port P1 interrupt enableP1IE0x0025
Port P1 interrupt-edge selectP1IES0x0024
Port P1 interrupt flagP1IFG0x0023
Port P1 directionP1DIR0x0022
Port P1 outputP1OUT0x0021
Port P1 inputP1IN0x0020
Voltage applied at VCCto V
Voltage applied to any pin
SS
(2)
(1)
-0.3 V to 4.1 V
-0.3 V to VCC+ 0.3 V
Diode current at any device terminal±2 mA
Storage temperature, T
stg
(3)
Unprogrammed device-55°C to 150°C
Programmed device-55°C to 150°C
(1) Stresses beyond those listed under absolute maximum ratingsmay cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operatingconditionsis not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS. The JTAG fuse-blow voltage, VFB, is allowed to exceed the absolute maximum rating. The voltage is
applied to the TEST pin when blowing the JTAG fuse.
(3) Higher temperature may be applied during board soldering process according to the current JEDEC J-STD-020 specification with peak
reflow temperatures not higher than classified on the device label on the shipping boxes or reels.
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Recommended Operating Conditions
(1)(2)
Typical values are specified at VCC= 3.3 V and TA= 25°C (unless otherwise noted)
MINNOMMAX UNIT
During program
V
CC
Supply voltage
(3)
AVCC= DVCC= V
CC
execution
During program or erase
flash memory
V
SS
T
A
f
SYSTEM
Supply voltageAVSS= DVSS= V
Operating free-air temperature°C
Processor frequency
(maximum MCLK frequency)
(see Figure 1)
(1) The MSP430 CPU is clocked directly with MCLK. Both the high and low phase of MCLK must not exceed the pulse duration of the
specified maximum frequency.
(2) Modules might have a different maximum input clock specification. See the specification of the respective module in this data sheet.
(3) It is recommended to power AVCCand DVCCfrom the same source. A maximum difference of 0.3 V between AVCCand DVCCcan be
tolerated during power-up.
1.83.6V
2.23.6V
0V
NOTE: Minimum processor frequency is defined by system clock. Flash program or erase operations require a minimum V
(1) All inputs are tied to 0 V or VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external
load capacitance is chosen to closely match the required 9 pF.
(1) All inputs are tied to 0 V or VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external
load capacitance is chosen to closely match the required 9 pF.
(3) Current for Brownout and WDT+ is included. The WDT+ is clocked by SMCLK.
(4) Current for Brownout and WDT+ is included. The WDT+ is clocked by ACLK.
(5) Current for Brownout is included.
(1) An external signal sets the interrupt flag every time the minimum interrupt pulse width t
shorter than t
(int)
.
is met. It may be set even with trigger signals
(int)
CC
2.2 V8
3 V10
2.2 V8
3 V10
MSP430F23x
MSP430F24x(1)
MSP430F2410
0.75 V
CC
0.55 V
CC
5pF
MINMAX UNIT
MHz
Leakage Current (Ports P1, P2, P3, P4, P5, P6)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
lkg(Px.y)
PARAMETERTEST CONDITIONSV
High-impedance leakage currentSee
(1) (2)
CC
2.2 V, 3 V±50nA
(1) The leakage current is measured with VSSor VCCapplied to the corresponding pins, unless otherwise noted.
(2) The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is
disabled.
MINMAX UNIT
Standard Inputs (RST/NMI)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
V
High-level output voltageV
OH
Low-level output voltageV
OL
(1) The maximum total current, I
specified.
(2) The maximum total current, I
specified.
OH(max)
OH(max)
I
OH(max)
I
OH(max)
I
OH(max)
I
OH(max)
I
OL(max)
I
OL(max)
I
OL(max)
I
OL(max)
and I
and I
= -1.5 mA
= -6 mA
= -1.5 mA
= -6 mA
= 1.5 mA
= 6 mA
= 1.5 mA
= 6 mA
OL(max)
OL(max)
(1)
(2)
(1)
(2)
(1)
(2)
(1)
(2)
, for all outputs combined, should not exceed ±12 mA to hold the maximum voltage drop
, for all outputs combined, should not exceed ±48 mA to hold the maximum voltage drop
CC
2.2 V
3 V
2.2 V
3 V
Output Frequency (Ports P1, P2, P3, P4, P5, P6)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
f
Px.y
f
Port°CLK
t
(Xdc)
PARAMETERTEST CONDITIONSV
Port output2.2 VDC10
frequency withP1.4/SMCLK, CL= 20 pF, RL= 1 kΩ
SVS (Supply Voltage Supervisor and Supply Voltage Monitor)
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
t
(SVSR)
t
d(SVSon)
t
settle
V
(SVSstart)
V
hys(SVS_IT-)
V
(SVS_IT-)
(3)
I
CC(SVS)
(1) t
is the settling time that the comparator output needs to have a stable level after VLD is switched from VLD ≠ 0 to a different VLD
settle
value somewhere between 2 and 15. The overdrive is assumed to be > 50 mV.
(2) The recommended operating voltage range is limited to 3.6 V.
(3) The current consumption of the SVS module is not included in the ICCcurrent consumption data.
dVCC/dt > 30 V/ms (see Figure 12)1150
dVCC/dt ≤ 30 V/ms2000
SVSon, switch from VLD = 0 to VLD ≠ 0, VCC= 3 V150300µs
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
f
LFXT1,LF
f
LFXT1,LF,logic
OA
LF
C
L,eff
f
Fault,LF
(1) To improve EMI on the XT1 oscillator, the following guidelines should be observed.
(a) Keep the trace between the device and the crystal as short as possible.
(b) Design a good ground plane around the oscillator pins.
(c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT.
(d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins.
(e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins.
(f) If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This
signal is no longer required for the serial programming adapter.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin).
Because the PCB adds additional capacitance, it is recommended to verify the correct load by measuring the ACLK frequency. For a
correct setup, the effective load capacitance should always match the specification of the crystal that is used.
(3) Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag.
Frequencies in between might set the flag.
(4) Measured with logic-level input frequency but also applies to operation with crystals.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERV
f
VLO
df
/dTVLO frequency temperature drift
VLO
df
/dV
VLO
CC
VLO frequency2.2 V, 3 V41220kHz
VLO frequency supply voltage drift
(1)
(2)
CC
2.2 V, 3 V0.5%/°C
1.8 V to 3.6 V4%/V
(1) Calculated using the box method:
I version: (MAX(-40 to 85°C) - MIN(-40 to 85°C))/MIN(-40 to 85°C)/(85°C - (-40°C))
T version: (MAX(-40 to 105°C) - MIN(-40 to 105°C))/MIN(-40 to 105°C)/(105°C - (-40°C))
(2) Calculated using the box method: (MAX(1.8 to 3.6 V) - MIN(1.8 to 3.6 V))/MIN(1.8 to 3.6 V)/(3.6 V - 1.8 V)
Oscillation allowance for HF
crystals (see Figure 23 and800Ω
Figure 24)
XTS = 1, XCAPx = 0, LFXT1Sx = 1,
f
f
LFXT1,HF
LFXT1,HF
= 1 MHz, C
= 4 MHz, C
XTS = 1, XCAPx = 0, LFXT1Sx = 2,
Integrated effective load
capacitance, HF mode
f
XTS = 1, XCAPx = 0
(2)
LFXT1,HF
= 16 MHz, C
XTS = 1, XCAPx = 0,
Measured at P1.4/SMCLK,405060
Duty cycle, HF mode2.2 V, 3 V%
f
XTS = 1, XCAPx = 0,
LFXT1,HF
= 10 MHz
Measured at P1.4/SMCLK,405060
Oscillator fault frequency
f
(4)
XTS = 1, LFXT1Sx = 3, XCAPx = 0
LFXT1,HF
= 16 MHz
(1)
L,eff
L,eff
(3)
= 15 pF
= 15 pF
L,eff
= 15 pF
MSP430F24x(1)
MSP430F2410
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
CC
1.8 V to 3.6 V210
3 V to 3.6 V216
1.8 V to 3.6 V0.410
3 V to 3.6 V0.416
(5)
2.2 V, 3 V30300kHz
MINTYPMAX UNIT
2700
300
1pF
MSP430F23x
(1) To improve EMI on the XT2 oscillator the following guidelines should be observed:
(a) Keep the trace between the device and the crystal as short as possible.
(b) Design a good ground plane around the oscillator pins.
(c) Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT.
(d) Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins.
(e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XIN and XOUT pins.
(f) If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(g) Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This
signal is no longer required for the serial programming adapter.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is
recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should
always match the specification of the used crystal.
(3) Requires external capacitors at both terminals. Values are specified by crystal manufacturers.
(4) Frequencies below the MIN specification set the fault flag, frequencies above the MAX specification do not set the fault flag, and
frequencies in between might set the flag.
(5) Measured with logic-level input frequency, but also applies to operation with crystals.
XT2 oscillator logic-level square-wave
input frequency
XT2Sx = 01.8 V to 3.6 V0.41MHz
XT2Sx = 11.8 V to 3.6 V14MHz
XT2Sx = 22.2 V to 3.0 V212 MHz
XT2Sx = 32.2 V to 3.0 V0.412MHz
XT2Sx = 0, f
C
= 15 pF
L,eff
Oscillation allowance (see Figure 25XT2Sx = 1, f
and Figure 26)C
L,eff
= 15 pF
XT2Sx = 2, f
C
= 15 pF
L,eff
Integrated effective load capacitance,
HF mode
(2)
See
(3)
= 1 MHz,
XT2
= 4 MHz,
XT2
= 16 MHz,
XT2
Measured at P1.4/SMCLK,
f
= 10 MHz
XT2
Measured at P1.4/SMCLK,
f
= 16 MHz
XT2
(4)
XT2Sx = 3
(5)
f
Fault
Duty cycle2.2 V, 3 V%
Oscillator fault frequency, HF mode
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
CC
MINTYPMAX UNIT
1.8 V to 2.2 V210
3.0 V to 3.6 V216
1.8 V to 2.2 V0.410
3.0 V to 3.6 V0.416
2700
300
1pF
405060
405060
2.2 V, 3 V30300kHz
(1) To improve EMI on the XT2 oscillator the following guidelines should be observed:
(a) Keep the trace between the device and the crystal as short as possible.
(b) Design a good ground plane around the oscillator pins.
(c) Prevent crosstalk from other clock or data lines into oscillator pins XT2IN and XT2OUT.
(d) Avoid running PCB traces underneath or adjacent to the XT2IN and XT2OUT pins.
(e) Use assembly materials and praxis to avoid any parasitic load on the oscillator XT2IN and XT2OUT pins.
(f) If conformal coating is used, ensure that it does not induce capacitive or resistive leakage between the oscillator pins.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin). Because the PCB adds additional capacitance, it is
recommended to verify the correct load by measuring the ACLK frequency. For a correct setup, the effective load capacitance should
always match the specification of the used crystal.
(3) Requires external capacitors at both terminals. Values are specified by crystal manufacturers.
(4) Frequencies below the MIN specification set the fault flag, frequencies above the MAX specification do not set the fault flag, and
frequencies in between might set the flag.
(5) Measured with logic-level input frequency, but also applies to operation with crystals.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERCONDITIONSV
CC
Internal: SMCLK, ACLK
f
USCI
f
BITCLK
t
τ
USCI input clock frequencyExternal: UCLKf
Duty cycle = 50% ± 10%
BITCLK clock frequency
(equals baud rate in MBaud)
UART receive deglitch time
(1)
(2)
2.2 V, 3 V1MHz
2.2 V50150
3 V50100
(1) The DCO wake-up time must be considered in LPM3/4 for baudrates above 1 MHz.
(2) Pulses on the UART receive input (UCxRX) shorter than the UART receive deglitch time are suppressed.
MINTYPMAX UNIT
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SYSTEM
MHz
ns
USCI (SPI Master Mode)
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 27 and Figure 28)
PARAMETERTEST CONDITIONSV
f
USCI
t
SU,MI
t
HD,MI
t
VALID,MO
(1) f
For the slave's parameters t
USCI input clock frequencyf
SOMI input data setup timens
SOMI input data hold timens
SIMO output data valid timens
UCxCLK
= 1/2t
LO/HI
with t
LO/HI
USCI (SPI Slave Mode)
≥ max(t
SU,SI(Slave)
(1)
VALID,MO(USCI)
and t
VALID,SO(Slave)
SMCLK, ACLK
Duty cycle = 50% ± 10%
UCLK edge to SIMO valid,
CL= 20 pF
+ t
SU,SI(Slave)
, t
SU,MI(USCI)
, see the SPI parameters of the attached slave.
+ t
VALID,SO(Slave)
CC
2.2 V110
3 V75
2.2 V0
3 V0
2.2 V30
3 V20
).
MINTYPMAX UNIT
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
(see Figure 29 and Figure 30)
t
STE,LEAD
t
STE,LAG
t
STE,ACC
t
STE,DIS
t
SU,SI
t
HD,SI
t
VALID,SO
(1) f
For the master's parameters t
STE lead time, STE low to clock2.2 V, 3 V50ns
STE lag time, Last clock to STE high2.2 V, 3 V10ns
STE access time, STE low to SOMI data out2.2 V, 3 V50ns
STE disable time, STE high to SOMI high
(see Figure 32 and Figure 33)
TA= 25°C, Overdrive 10 mV,2.2 V1.41.92.8
Without filter: CAF = 1
(3)
(see Figure 32 and Figure 33)
(1) The leakage current for the Comparator_A+ terminals is identical to I
(2) The input offset voltage can be cancelled by using the CAEX bit to invert the Comparator_A+ inputs on successive measurements. The
lkg(Px.y)
specification.
CC
2.2 V2540
3 V4560
2.2 V3050
3 V4571
2.2 V, 3 V0.230.240.25
2.2 V, 3 V0.470.480.5
3 V400490550
2.2 V, 3 V-3030mV
3 V0.91.52.2
two successive measurements are then summed together.
(3) The response time is measured at P2.2/CAOUT/TA0/CA4 with an input voltage step, with Comparator_A+ already enabled (CAON = 1).
If CAON is set at the same time, a settling time of up to 300 ns is added to the response time.
12-bit ADC, Power Supply and Input Range Conditions
(1)
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETERTEST CONDITIONSV
AV
CC
V
(P6.x/Ax)
I
ADC12
I
REF+
C
I
R
I
Analog supply voltageAVSSand DVSSare connected together2.23.6V
Analog input voltageselected in ADC12MCTLx register,
(2)
range
Operating supply current
into AVCCterminal
Operating supply current
into AVCCterminal
Input capacitance
Input MUX ON
resistance
(3)
(4)
(5)
(5)
(1) The leakage current is defined in the leakage current table with P6.x/Ax parameter.
(2) The analog input voltage range must be within the selected reference voltage range VR+to VR–for valid conversion results.
(3) The internal reference supply current is not included in current consumption parameter I
(4) The internal reference current is supplied via terminal AVCC. Consumption is independent of the ADC12ON control bit, unless a
conversion is active. The REFON bit enables settling of the built-in reference before starting an A/D conversion.
(5) Not production tested, limits verified by design.
AVCCand DVCCare connected together
V
(AVSS)
= V
(DVSS)
= 0 V
All P6.0/A0 to P6.7/A7 terminals, Analog inputs
P6Sel.x = 1, 0 ≤ × ≤ 7,
V
≤ V
(AVSS)
f
ADC12CLK
ADC12ON = 1, REFON = 0,mA
≤ V
P6.x/Ax
(AVCC)
= 5 MHz,2.2 V0.650.8
SHT0 = 0, SHT1 = 0, ADC12DIV = 0
f
ADC12CLK
ADC12ON = 0, REFON = 1, REF2_5V = 1
f
ADC12CLK
ADC12ON = 0, REFON = 1, REF2_5V = 0
= 5 MHz,
= 5 MHz,
Only one terminal can be selected at one time,
P6.x/Ax
0 V ≤ VAx≤ V
AVCC
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
CC
MINTYPMAX UNIT
0V
AVCC
3 V0.81
3 V0.50.7mA
2.2 V0.50.7
3 V0.50.7
2.2 V40pF
3 V2000Ω
.
ADC12
V
mA
12-Bit ADC, External Reference
(1)
over recommended operating free-air temperature range (unless otherwise noted)
V
eREF+
V
REF–/VeREF–
(V
–
eREF+
V
REF–/VeREF–
I
VeREF+
I
VREF–/VeREF–
PARAMETERTEST CONDITIONSV
Positive external reference voltage inputV
Negative external reference voltage inputV
Differential external reference voltage inputV
)
Static leakage current0 V ≤ V
Static leakage current0 V ≤ V
eREF+
eREF+
eREF+
> V
REF–/VeREF–
> V
REF–/VeREF–
> V
REF–/VeREF–
eREF+
eREF–
≤ V
≤ V
(2)
(3)
(4)
AVCC
AVCC
CC
2.2 V, 3 V±1µA
2.2 V, 3 V±1µA
(1) The external reference is used during conversion to charge and discharge the capacitance array. The input capacitance, CI, is also the
dynamic load for an external reference during conversion. The dynamic impedance of the reference supply should follow the
recommendations on analog-source impedance to allow the charge to settle for 12-bit accuracy.
(2) The accuracy limits the minimum positive external reference voltage. Lower reference voltage levels may be applied with reduced
accuracy requirements.
(3) The accuracy limits the maximum negative external reference voltage. Higher reference voltage levels may be applied with reduced
accuracy requirements.
(4) The accuracy limits minimum external differential reference voltage. Lower differential reference voltage levels may be applied with
over recommended operating free-air temperature range (unless otherwise noted)
V
PARAMETERTEST CONDITIONST
REF2_5V = 1 for 2.5 V,
REF+
Positive built-in
reference voltageV
output
I
VREF+
max ≤ I
VREF+
≤ I
REF2_5V = 0 for 1.5 V,
I
VREF+
max ≤ I
VREF+
≤ I
VREF+
VREF+
min
min
A
-40°C to 85°C2.42.52.6
105°C2.372.52.64
-40°C to 85°C1.441.51.56
105°C1.421.51.57
REF2_5V = 0,2.2
I
AV
CC(min)
I
VREF+
I
L(VREF)+
max ≤ I
AVCCminimum
VREF+
voltage, positiveREF2_5V = 1,2.8
built-in reference-0.5 mA ≤ I
active
REF2_5V = 1,2.9
-1 mA ≤ I
VREF+
VREF+
Load current out of
V
terminal
REF+
I
= 500 µA ± 100 µA,2.2 V±2
VREF+
Load-current3 V±2
regulation, V
terminal
REF+
(1)
Analog input voltage ≈ 0.75 V,LSB
REF2_5V = 0
I
= 500 µA ± 100 µA,
VREF+
Analog input voltage ≈ 1.25 V,3 V±2LSB
VREF+
≤ I
≤ I
VREF+
≤ I
VREF+
VREF+
min
min
min
REF2_5V = 1
I
DL(VREF) +
C
VREF+
T
REF+
Load currentI
regulation, V
terminal
Capacitance at pinREFON = 1,
V
REF+
REF+
(2)
(3)
Temperature
coefficient of built-in2.2 V, 3 V±100 ppm/°C
reference
(2)
= 100 µA → 900 µA,
VREF+
C
= 5 µF, ax ≈ 0.5 × V
VREF+
Error of conversion result ≤ 1 LSB
0 mA ≤ I
I
VREF+
0 mA ≤ I
≤ I
VREF+
VREF+
is a constant in the range of
≤ 1 mA
VREF+
REF+
max
,3 V20ns
Settle time of
t
REFON
internal referenceI
voltage (seeV
Figure 39 )
(4) (2)
VREF+
REF+
= 0.5 mA, C
= 1.5 V, V
VREF+
AVCC
= 10 µF,
= 2.2 V
(1) Not production tested, limits characterized.
(2) Not production tested, limits verified by design.
(3) The internal buffer operational amplifier and the accuracy specifications require an external capacitor. All INL and DNL tests uses two
capacitors between pins V
(4) The condition is that the error in a conversion started after t
capacitive load.
and AVSSand V
REF+
REF-–/VeREF–
and AVSS: 10 µF tantalum and 100 nF ceramic.
is less than ±0.5 LSB. The settling time depends on the external
REFON
V
CC
MINNOMMAXUNIT
3 V
2.2 V, 3 V
2.2 V0.01-0.5
3 V0.01-1
2.2 V, 3 V510µF
2.2 V17ms
www.ti.com
V
mA
Figure 39. Typical Settling Time of Internal Reference t
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETERTEST CONDITIONSV
I
SENSOR
V
TC
t
I
V
(2)(3)
SENSOR
(3)
SENSOR
SENSOR(sample)
VMID
MID
current into AV
(1)
terminal
Sample time2.2 V30
(3)
required if channelµs
10 is selected
Current into divider
at channel 11
AVCCdivider atADC12ON = 1, INCH = 0Bh,
channel 11V
Sample time2.2 V1400
Operating supply2.2 V40120
t
VMID(sample)
(1) The sensor current I
high). Therefore it includes the constant current through the sensor and the reference.
required if channelns
11 is selected
is consumed if (ADC12ON = 1 and REFON = 1), or (ADC12ON = 1 AND INCH = 0Ah and sample signal is
SENSOR
REFON = 0, INCH = 0Ah,
CC
ADC12ON = 1, TA= 25°C
ADC12ON = 1, INCH = 0Ah, TA= 0°CmV
ADC12ON = 1, INCH = 0AhmV/°C
ADC12ON = 1, INCH = 0Ah,
Error of conversion result ≤ 1 LSB
(4)
ADC12ON = 1, INCH = 0BhµA
(5)
is ~0.5 × V
MID
AVCC
ADC12ON = 1, INCH = 0Bh,
Error of conversion result ≤ 1 LSB
(6)
CC
3V60160
2.2 V986
3V986
2.2 V3.553.55 ± 3%
3V3.553.55 ± 3%
3V30
2.2 VNA
3VNA
2.2 V1.11.1 ± 0.04
3V1.51.5 ± 0.04
3 V1220
(2) The temperature sensor offset can be as much as ±20°C. A single-point calibration is recommended to minimize the offset error of the
built-in temperature sensor.
(3) Limits characterized
(4) The typical equivalent impedance of the sensor is 51 kΩ. The sample time required includes the sensor-on time t
(5) No additional current is needed. The V
(6) The on-time t
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
V
CC (PGM/ERASE)
f
FTG
I
PGM
I
ERASE
t
CPT
t
CMErase
PARAMETERTEST CONDITIONSV
Program and erase supply voltage2.23.6V
Flash timing generator frequency257476kHz
Supply current from VCCduring program2.2 V/3.6 V15mA
Supply current from VCCduring erase2.2 V/3.6 V17mA
Cumulative program time
(1)
Cumulative mass erase time2.2 V/3.6 V20ms
CC
2.2 V/3.6 V10ms
Program/Erase endurance10
t
Retention
t
Word
t
Block, 0
t
Block, 1-63
t
Block, End
t
Mass Erase
t
Seg Erase
Data retention durationTJ= 25°C100years
Word or byte program time
Block program time for first byte or word
Block program time for each additional
byte or word
Block program end-sequence wait time
Mass erase time
Segment erase time
(2)
(2)
(2)
(2)
(2)
(2)
(1) The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming
methods: individual word/byte write and block write modes.
(2) These values are hardwired into the flash controller's state machine (t
FTG
= 1/f
FTG
).
MINTYPMAXUNIT
4
10
5
30t
25t
18t
6t
10593t
4819t
www.ti.com
cycles
FTG
FTG
FTG
FTG
FTG
FTG
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSMINMAX UNIT
V
(RAMh)
RAM retention supply voltage
(1) This parameter defines the minimum supply voltage VCCwhen the data in RAM remains unchanged. No program execution should
happen during this supply voltage condition.
(1)
CPU halted1.6V
JTAG Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
f
TCK
R
Internal
(1) f
(2) TMS, TDI/TCLK, and TCK pullup resistors are implemented in all versions.
JTAG Fuse
TCK input frequencySee
Internal pulldown resistance on TESTSee
may be restricted to meet the timing requirements of the module selected.
TCK
(1)
(1)
(2)
CC
2.2 V05
3 V010
2.2 V, 3 V256090kΩ
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSMINMAX UNIT
V
CC(FB)
V
FB
I
FB
t
FB
Supply voltage during fuse-blow conditionTA= 25°C2.5V
Voltage level on TEST for fuse blow67V
Supply current into TEST during fuse blow100mA
Time to blow fuse1ms
MINTYPMAX UNIT
MHz
(1) Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to
(1) X = Don't care
(2) The pin direction is controlled by the USCI module.
(3) UCA0CLK function takes precedence over UCB0STE function. If the pin is required as UCA0CLK input or output, USCI A/B0 is forced to
3-wire SPI mode if 4-wire SPI mode is selected.
(4) If I2C functionality is selected, the output drives only the logical 0 to VSSlevel.
(5) MSP430F24x and MSP430F24x1 devices only
Port P5 Pin Schematic: P5.0 to P5.3, Input/Output With Schmitt Trigger
Table 25. Port P5.0 to P5.3 Pin Functions
CONTROL BITS /
PIN NAME (P5.x)xFUNCTION
P5.0/UCB1STE
P5.1/UCB1SIMO
P5.2/UCB1SOMI
P5.3/UCB1CLK
(2)
/UCA1CLK
(2)
/UCB1SDA
(2)
/UCB1SCL
(2)
/UCA1STE
(2)
(2)
(2)
(2)
0 P5.0 (I/O)I: 0; O: 10
UCB1STE
(2)
/UCA1CLK
(2)(3)(4)
1 P5.1 (I/O)I: 0; O: 10
UCB1SIMO
(2)
/UCB1SDA
(2)(3)(5)
2 P5.2 (I/O)I: 0; O: 10
UCB1SOMI
(2)
/UCB1SCL
(2)(3)(5)
3 P5.3 (I/O)I: 0; O: 10
UCB1CLK
(2)
/UCA1STE
(2)(3)
(1) X = Don't care
(2) MSP430F24x and MSP430F24x1 devices only
(3) The pin direction is controlled by the USCI module.
(4) UCA0CLK function takes precedence over UCB0STE function. If the pin is required as UCA0CLK input or output, USCI A/B0 is forced to
3-wire SPI mode if 4-wire SPI mode is selected.
(5) If I2C functionality is selected, the output drives only the logical 0 to VSSlevel.
MSP430 devices that have the fuse on the TEST terminal have a fuse check mode that tests the continuity of the
fuse the first time the JTAG port is accessed after a power-on reset (POR). When activated, a fuse check
current, ITF, of 1 mA at 3 V, 2.5 mA at 5 V can flow from the TEST pin to ground if the fuse is not burned. Care
must be taken to avoid accidentally activating the fuse check mode and increasing overall system power
consumption.
When the TEST pin is again taken low after a test or programming session, the fuse check mode and sense
currents are terminated.
Activation of the fuse check mode occurs with the first negative edge on the TMS pin after power up or if TMS is
being held low during power up. The second positive edge on the TMS pin deactivates the fuse check mode.
After deactivation, the fuse check mode remains inactive until another POR occurs. After each POR the fuse
check mode has the potential to be activated.
The fuse check current flows only when the fuse check mode is active and the TMS pin is in a low state (see
Figure 42). Therefore, the additional current flow can be prevented by holding the TMS pin high (default
condition).
SLAS547I –JUNE 2007–REVISED DECEMBER 2012
Figure 42. Fuse Check Mode Current
NOTE
The CODE and RAM data protection is ensured if the JTAG fuse is blown and the 256-bit
bootloader access key is used. Also, see the Bootstrap Loader section for more
information.
SLAS547Product Preview release
SLAS547AProduction Data release
Corrected terminal names and descriptions for pins 34 and 35 in "Terminal Functions - MSP430F23x" (page 9)
Corrected terminal names for pins 13, 14, and 15 in "Terminal Functions - MSP430F24x1" (page 13)
SLAS547BChanged index values from 1-3 to 0-2 in Figures 23 to 26 (pages 52 and 54)
SLAS547C
SLAS547DUpdated notes and t
SLAS547EChanged limits on t
SLAS547F
SLAS547GChanged T
SLAS547H
SLAS547I
Corrected interrupt source and flag entries for USCI_A1/USCI_B1 in "interrupt vector addresses" table (page 17)
Changed f
Corrected "Port P1.0 to P1.7 pin functions" table (page 72)
Removed incorrect CAPD.x column in "Port P6.0 to P6.6 pin functions" table (page 80)
Added Development Tool Support section (page 2)
Updated parametric values in "low-power mode supply current into VCCexcluding external current" table (page 34)
Corrected formatting error of TAcolumn in Active Mode Supply Current (both I
Mode Supply Currents (I
Corrected number of capture/compare registers in description in Timer_B3 (MSP430F23x Devices).
Added typical test conditions in Recommended Operating Conditions.
Removed "Timer_A3.CCIxA" entries from P1.5 through P1.7 in Table 20.
max,BITCLK
stg
and tτparameters in "USCI (UART mode)" table (page 56)
MIN value "flash memory" table (page 34)
CMErase
parameter (page 41)
d(SVSon)
, Programmed device, to -55°C to 150°C in Absolute Maximum Ratings
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F233T
REV #
MSP430F233TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F233T
REV #
MSP430F233TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F233TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F233T
MSP430F233TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F233T
MSP430F235TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F235T
REV #
MSP430F235TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F235T
REV #
MSP430F235TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F235TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F235T
MSP430F235TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F235T
MSP430F2410TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2410T
REV #
MSP430F2410TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2410T
REV #
MSP430F2410TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F2410TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2410T
MSP430F2410TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2410T
MSP430F2471TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2471T
REV #
MSP430F2471TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2471T
REV #
MSP430F2471TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F2471TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2471T
PACKAGE OPTION ADDENDUM
www.ti.com
16-Nov-2013
Addendum-Page 2
Orderable DeviceStatus
(1)
Package Type Package
Drawing
Pins Package
Qty
Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C)Device Marking
(4/5)
Samples
MSP430F2471TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2471T
MSP430F247TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F247T
REV #
MSP430F247TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F247T
REV #
MSP430F247TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F247TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F247T
MSP430F247TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F247T
MSP430F2481TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2481T
REV #
MSP430F2481TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2481T
REV #
MSP430F2481TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F2481TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2481T
MSP430F2481TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2481T
MSP430F248TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F248T
REV #
MSP430F248TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F248T
REV #
MSP430F248TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F248TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F248T
MSP430F248TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F248T
MSP430F2491TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2491T
REV #
MSP430F2491TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F2491T
REV #
MSP430F2491TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F2491TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2491T
PACKAGE OPTION ADDENDUM
www.ti.com
16-Nov-2013
Addendum-Page 3
Orderable DeviceStatus
(1)
Package Type Package
Drawing
Pins Package
Qty
Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C)Device Marking
(4/5)
Samples
MSP430F2491TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F2491T
MSP430F249TPMACTIVELQFPPM64160Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F249T
REV #
MSP430F249TPMRACTIVELQFPPM641000 Green (RoHS
& no Sb/Br)
NIPDAU | CU NIPDAU Level-3-260C-168 HR-40 to 105M430F249T
REV #
MSP430F249TRGCOBSOLETEVQFNRGC64TBDCall TICall TI-40 to 105
MSP430F249TRGCRACTIVEVQFNRGC642500Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F249T
MSP430F249TRGCTACTIVEVQFNRGC64250Green (RoHS
& no Sb/Br)
CU NIPDAULevel-3-260C-168 HR-40 to 105M430F249T
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
PACKAGE OPTION ADDENDUM
www.ti.com
16-Nov-2013
Addendum-Page 4
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF MSP430F249 :
•
Enhanced Product: MSP430F249-EP
NOTE: Qualified Version Definitions:
•
Enhanced Product - Supports Defense, Aerospace and Medical Applications
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
D. May also be thermally enhanced plastic with leads connected to the die pads.
0,75
0,45
Seating Plane
0,08
4040152/C 11/96
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