CY74FCT163245
CY74FCT163H245
2
Maximum Ratings
[3, 4]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ................................. –55°C to +125°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage Range........................................0.5V to 4.6V
DC Input Voltage ........................................... –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin) ........................–60 to +120 mA
Power Dissipation..........................................................1.0W
Pin Description
Name Description
OE Three-State Output Enable Inputs (Active LOW)
DIR Direction Control
A Inputs or Three-State Outputs
[1]
B Inputs or Three-State Outputs
[1]
Function Table
[2]
Inputs
OutputsOE DIR
L L Bus B Data to Bus A
L H Bus A Data to Bus B
H X High Z State
Operating Range
Range
Ambient
Temperature V
CC
Industrial –40°C to +85°C 2.7V to 3.6V
Electrical Characteristics for Non Bus Hold Devices Over the Operating Range V
CC
=2.7V to 3.6V
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
IH
Input HIGH Voltage All Inputs 2.0 5.5 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[6]
100 mV
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V
I
IH
Input HIGH Current VCC=Max., VI=5.5 ±1 µA
I
IL
Input LOW Current VCC=Max., VI=GND ±1 µA
I
OZH
High Impedance Output Current
(Three-State Output pins)
VCC=Max., V
OUT
=5.5V ±1 µA
I
OZL
High Impedance Output Current
(Three-State Output pins)
VCC=Max., V
OUT
=GND ±1 µA
I
OS
Short Circuit Current
[7]
VCC=Max., V
OUT
=GND –60 –135 –240 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
≤4.5V ±100 µA
I
CC
Quiescent Power Supply Current VIN≤0.2V,
V
IN>VCC
–0.2V
VCC=Max. 0.1 10 µA
∆I
CC
Quiescent Power Supply Current
(TTL inputs HIGH)
VIN=VCC–0.6V
[8]
VCC=Max. 2.0 30 µA
Note:
1. On the CY74FCT163H245, these pins have bus hold.
2. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = High Impedance.
3. Operation beyond the limits set forth may impair the useful life of the device. Unless otherwise noted, these limits are over the operating free-air temperature
range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
5. Typical values are at V
CC
=3.3V, TA = +25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internalchip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
8. Per TTL driven input; all other inputs at V
CC
or GND.