Datasheet CY74FCT163543CPVCT, CY74FCT163543CPVC, CY74FCT163543CPAC, CY74FCT163543APVCT, CY74FCT163543APVC Datasheet (Texas Instruments)

16-Bit Latched Transceiver
CY74FCT163543
SCCS063A - June 1997 - Revised April 2000
Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.
Copyright © 2000, Texas Instruments Incorporated
1CY74FCT163543
Features
• 5V tolerant inputs and outputs
• 24 mA balanced drive outputs
• Power-off disable outputs permits live insertion
• Edge-rate control circuitry for reduced noise
• FCT-C speed at 5.1 ns
• Latch-up performance exceedsJEDEC standard no. 17
• ESD > 2000V per MIL-STD-883D, Method 3015
• Typical output skew < 250 ps
• Industrial temperature range of –40˚C to +85˚C
• TSSOP (19.6-mil pitch) or SSOP (25-mil pitch)
• TypicalV
olp
(groundbounce)performanceexceedsMil
Std 883D
•V
CC
= 2.7V to 3.6V
Functional Description
The CY74FCT163543 is a 16-bit, high-speed, low power latched transceiverthatisorganizedastwoindependent 8-bitD-type latched transceivers,containingtwosetsof eightD-typelatches withseparate LatchEnable(
LEAB,LEAB)and OutputEnable (OEAB,OEAB) con­trols for each set to permit independent control of inputting and out­putting in either direction of data flow . For data flow from A to B, for example, the A-to-B input Enable (
CEAB) must be LOW in order to enterdata fromA orto takedata fromB, asindicated inthe truth table. With
CAEB LOW ,a LOWsignal on the A-to-BLatch Enable(LEAB) makes the A-to-B latches transparent; a subsequent LOW-to-HIGH transition of the
LEAB signal putsthe A latches in the storage mode
andtheiroutputs nolonger followtheA inputs.With
CEABandOEAB both LOW,the three-state B output buffersare activeand reflect the data present at the output of the A latches. Control of data from B to A is similar, but uses
CEAB, LEAB, and OEAB inputs.
The CY74FCT163543 has 24-mA balanced output drivers with current limiting resistors in the outputs. This reduces the need for external terminating resistors and provides for minimal undershoot and reduced ground bounce. The inputs and outputs arecapable of being driven by5.0V buses,allow­ing them to be used in mixed voltage systems as translators. The outputs are also designed witha power off disable feature enabling them to be used in applications requiring live inser­tion. Flow-through pinout and small shrinkpackaging simplifyboard design.
Logic Block Diagrams PinConfiguration
1
OEAB
SSOP/TSSOP
Top View
GND
V
CC
TO 7 OTHERCHANNELS
D
C
1B1
1
OEBA
1A1
1
CEBA
1
LEAB
1
OEAB
1
LEBA
1
CEAB
D
C
D
C
2B1
2
OEBA
2A1
2
CEBA
2
OEAB
2
LEBA
2
CEAB
1
LEAB
1
CEAB
1A1
V
CC
GND
2
LEAB
1A2
1A3
1A5
1A4
1A6 1A7
1A8
GND
2A1 2A2
2A3
2A4 2A5
2A6
2A7 2A8
GND
2
OEAB
2
CEAB
2
LEAB
1 2 3 4 5 6 7 8 9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28
56 55 54 53 52 51 50 49 48
47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29
1
OEBA
GND
V
CC
1
LEBA
1
CEBA
1B1
V
CC
GND
1B2
1B3
1B5
1B4
1B6 1B7
1B8
GND
2B1 2B2 2B3
2B4
2B6
2B7 2B8
GND
2
OEBA
2
CEBA
2
LEBA
2B5
D
C
TO 7 OTHER CHANNELS
CY74FCT163543
2
Maximum Ratings
[3, 4]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .............................. 55°C to +125°C
Ambient Temperature with
Power Applied.......................................... 55°C to +125°C
Supply Voltage Range ..................................... 0.5V to +4.6V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage..............................................−0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin)...........................−60 to +120 mA
Power Dissipation..........................................................1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Pin Description
Name Description
OEAB A-to-B Output Enable Input (Active LOW) OEBA B-to-A Output Enable Input (Active LOW) CEAB A-to-B Enable Input (Active LOW) CEBA B-to-A Enable Input (Active LOW) LEAB A-to-B Latch Enable Input (Active LOW) LEBA B-to-A Latch Enable Input (Active LOW) A A-to-B Data Inputs or B-to-A Three-State Outputs B B-to-A Data Inputs or A-to-B Three-State Outputs
Function Table
[1]
Inputs
Latch
Status
Output
Buffers
CEAB LEAB OEAB A to B B
H X X Storing High Z X H X Storing X X X H X High Z
L L L Transparent Current A
Inputs
L H L Storing Previous A
Inputs
[2]
Operating Range
Range
Ambient
Temperature V
CC
Industrial 40°C to +85°C 2.7V to 3.6V
CY74FCT163543
3
Electrical Characteristics Over the Operating Range V
CC
=2.7V to 3.6V
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
IH
Input HIGH Voltage 2.0 5.5 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[6]
100 mV
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=18 mA 0.7 1.2 V
I
IH
Input HIGH Current VCC=Max., VCC=5.5V +1 µA
I
IL
Input LOW Current VCC=Max., VCC=GND +1 µA
I
OZH
High Impedance Output Current (Three-State pins)
VCC=Max., V
OUT
=5.5V +1 µA
I
OZL
High Impedance Output Current (Three-State pins)
VCC=Max., V
OUT
=GND +1 µA
I
ODL
Output LOW Current
[7]
VCC=3.3V, V
OUT
=1.5V
V
IN=VIH
or VIL, 50 90 200 mA
I
ODH
Output HIGH Current
[7]
VCC=3.3V, V
OUT
=1.5V
V
IN=VIH
or VIL, 36 60 110 mA
V
OH
Output HIGH Voltage VCC=Min., IOH=0.1 mA VCC−0.2 V
V
CC
=3.0V, IOH=8 mA 2.4 3.0
V
CC
=3.0V, IOH=24 mA 2.0 3.0
V
OL
Output LOW Voltage VCC=Min., IOL=0.1mA 0.2 V
V
CC
=Min., IOL=24mA 3.0 0.5
I
OS
Short Circuit Current
[7]
VCC=Max., V
OUT
=GND 60 135 240 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
<4.5V +100 µA
Notes:
1. A-to-B data flow shown; B-to-A flow control is the same, except using
CEBA, LEBA, and OEBA.
2. Data prior to LEAB LOW-to-HIGH Transition H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = High Impedance.
3. Operation beyond the limits set forth may impair the useful life of the device. Unless noted, these limits are over the operating free-air temperature range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
5. Typical values are at V
CC
= 3.3V, TA= +25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shortedat a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of a high output may raise the chip temperature well abovenormal and thereby cause invalidreadings in other parametric tests. In any sequence of parameter tests, I
OS
tests should be performed last.
Capacitance
[6]
(TA = +25˚C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.
[5]
Max. Unit
C
IN
Input Capacitance VIN= 0V 4.5 6.0 pF
C
OUT
Output Capacitance V
OUT
= 0V 5.5 8.0 pF
CY74FCT163543
4
Power Supply Characteristics
Parameter Description Test Conditions Typ.
[5]
Max. Unit
I
CC
QuiescentPowerSupply Current VCC=Max. VIN≤0.2V,
V
IN≥VCC
0.2V
0.1 10 µA
I
CC
QuiescentPowerSupplyCurrent (TTL inputs HIGH)
VCC=Max. VIN=VCC-0.6V
[8]
2.0 30 µA
I
CCD
Dynamic Power Supply Current
[9]
VCC=Max., One Input Toggling, 50% Duty Cycle, Outputs Open,
OE=GND
VIN=VCC or V
IN
=GND
50 75 µA/MHz
I
C
Total Power Supply Current
[10]
VCC=Max., f1=10 MHz, 50% Duty Cycle, Outputs Open, One Bit Toggling, OE=GND
VIN=VCC or V
IN
=GND
0.5 0.8 mA
VIN=VCC-0.6Vor V
IN
=GND
0.5 0.8 mA
VCC=Max., f1=2.5 MHz, 50% Duty Cycle, Outputs Open, Sixteen Bits Toggling, OE=GND
VIN=VCC or V
IN
=GND
2.0 3.0
[11]
mA
VIN=VCC-0.6Vor V
IN
=GND
2.0 3.3
[11]
mA
Switching Characteristics Over the Operating Range V
CC
= 3.0V to 3.6V
[12,15]
CY74FCT163543A CY74FCT163543C
Fig. No.
[13]
Parameter Description Min. Max. Min. Max. Unit
t
PLH
t
PHL
Propagation Delay, Transparent Mode A to B or B to A
1.5 6.5 1.5 5.1 ns 1, 3
t
PLH
t
PHL
Propagation Delay LEBA to A, LEAB to B
1.5 8.0 1.5 5.6 ns 1, 5
t
PZH
t
PZL
Output Enable Time OEBA or OEAB to A or B CEBA or CEAB to A or B
1.5 9.0 1.5 7.8 ns 1, 7, 8
t
PHZ
t
PLZ
Output Disable Time OEBA or OEAB to A or B CEBA or CEAB to A or B
1.5 7.5 1.5 6.5 ns 1, 7, 8
t
SU
Set-up Time HIGH or LOW A or B to
LEAB or LEBA
2.0 2.0 ns 4
t
H
Hold Time HIGH or LOW A or B to
LEAB or LEBA
2.0 2.0 ns 4
t
W
LEBA or LEAB Pulse Width LOW 4.0 4.0 ns 5
t
SK(O)
Output Skew
[14]
0.5 0.5 ns
Notes:
8. Per TTL driven input; all other inputs at V
CC
or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. = I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
IC=ICC+ICCDHNT+I
CCD(f0NC
/2 + f1N1)
I
CC
= Quiescent Current with CMOS input levels
I
CC
= Power Supply Current for a TTL HIGH input (VIN=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
H
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
N
C
= Number of clock inputs changing at f
1
f1= Input signal frequency N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the I
CC
formula. These limits are specified but not tested.
12. Minimum limits are specified but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information section.
14. Skew between any two outputs of the same package switching in the same directional. This parameter is ensured by design.
15. For VCC=2.7, propagation delay, output enable and output disable times should be degraded by 20%.
CY74FCT163543
5
Ordering Information CY74FCT163543
Speed
(ns) Ordering Code
Package
Name Package Type
Operating
Range
5.1 CY74FCT163543CPACT Z56 56-Lead (240-Mil) TSSOP Industrial CY74FCT163543CPVC/PVCT O56 56-Lead (300-Mil) SSOP
6.5 CY74FCT163543APVC/PVCT O56 56-Lead (300-Mil) SSOP Industrial
Package Diagrams
56-Lead Shrunk Small Outline Package O56
CY74FCT163543
6
Package Diagrams (continued)
56-Lead Thin Shrunk Small Outline Package
Z56
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TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
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Copyright 2000, Texas Instruments Incorporated
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