Texas Instruments CY74FCT163500CPACT, CY74FCT163500CPAC, CY74FCT163500APVCT, CY74FCT163500APVC, CY74FCT163500CPVCT Datasheet

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18-Bit Registered Transceive
r
CY74FCT163500
SCCS066 - June 1997 - Revised March 2000
Data sheet acquired from Cypress Semiconductor Corporation. Data sheet modified to remove devices not offered.
Copyright © 2000, Texas Instruments Incorporated
• Low power, pin-compatible replacement for LCX and LPT families
• 5V tolerant inputs and outputs
• 24 mA balanced drive outputs
• Power-off disable outputs permits live insertion
• Edge-rate control circuitry for reduced noise
• FCT-C speed at 4.6 ns
• Latch-up performance exceedsJEDEC standard no. 17
• ESD > 2000V per MIL-STD-883D, Method 3015
• Typical output skew < 250ps
• Industrial temperature range of –40˚C to +85˚C
• TSSOP (19.6-mil pitch) or SSOP (25-mil pitch)
• TypicalV
olp
(groundbounce)performanceexceedsMil
Std 883D
•V
CC
= 2.7V to 3.6V
Functional Description
The CY74FCT163500 is an 18-bit universal bus transceiver that can be operated in transparent, latched, or clock modes bycombining D-type latches and D-type flip-flops. Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch enable (LEAB and LEBA), and clock inputs (
CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in transparent mode when LEAB is HIGH. When LEAB is LOW,theA data is latched if
CLKAB is held at a HIGH or LOW logic level. If LEAB is LOW,theA bus data is stored in the latch/flip-flop on the HIGH-to-LOW transition of
CLKAB. OEAB performs the output enable function on the B port. Data flow from B-to-A is similar to that of A-to-B and is controlled by OEBA, LEBA, and CLKBA.
The CY74FCT163500 has 24-mA balanced output drivers with current limiting resistors in the outputs. This reduces the need for external terminating resistors and provides for minimal undershoot and reduced ground bounce.The inputs and outputs are capable of being driven by 5.0V busses, allowing them to be used in mixed voltage systems as translators. The outputs are also designed with a power off disable feature enabling them to be used in applications requiring live insertion.
GND
LogicBlock Diagram Pin Configuration
1 2 3 4 5 6 7 8 9 10 11 12
33 32 31 30 29
36 35
OEAB
34
SSOP/TSSOP
Top View
13 14
15 16 17 18 19 20 21 22 23 24
45 44 43 42 41
37
38
39
40
48 47 46
LEAB
A
1
A
2
A
3
B
1
B
2
B
3
GND
GND
GND
V
CC
A
6
A
7
A
4
A
5
B
4
B
5
B
6
B
7
V
CC
GND
A
10
A
11
A
8
A
9
B
8
B
9
B
11
B
12
GND
A
12
V
CC
A
16
GND
A
14
V
CC
A
15
A
17
TO 17 OTHER CHANNELS
LEAB
OEBA
LEBA
CLKAB
CLKBA
OEAB
C D
C D
C D
C D
A
1
B
1
25 26 27 28
49
52 51 50
A
13
OEBA
LEBA
GND
A
18
CLKAB
53
56 55 54
B
10
GND
B
14
B
15
B
13
B
16
B
17
GND B
18
CLKBA
CY74FCT163500
2
Maximum Ratings
[5, 6]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ................................ 55°C to +125°C
Ambient Temperature with
Power Applied................................................. −55°C to +125°C
Supply Voltage Range..................................... 0.5V to +4.6V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage..............................................−0.5V to +7.0V
DC Output Current
(Maximum Sink Current/Pin)...........................−60 to +120 mA
Power Dissipation..........................................................1.0W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Notes:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care. Z = HIGH Impedance. = HIGH-to-LO W Tr ansition.
2. A-to-B data flow is shown, B-to-A data flow is similar but uses
OEBA, LEBA, and CLKBA.
3. Output level before the indicated steady-state input conditions were established.
4. Output level before the indicated steady-state input conditions were established, provided that CLKAB was LOW before LEAB w ent LO W .
5. Operation beyond the limits set forth may impair the useful life of the device. Unless noted, these limits are over the operating free-air temperature range.
6. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
Pin Summary
Name Description
OEAB A-to-B Output Enable Input OEBA B-to-A Output Enable Input (Active LOW) LEAB A-to-B Latch Enable Input LEBA B-to-A Latch Enable Input CLKAB A-to-B Clock Input (Active LOW) CLKBA B-to-A Clock Input (Active LOW) A A-to-B Data Inputs or B-to-A Three-State Outputs B B-to-A Data Inputs or A-to-B Three-State Outputs
Function Table
[1, 2]
Inputs Outputs
OEAB LEAB CLKAB A B
L X X X Z H H X L L H H X H H H L L L H L H H H L H X B
[3]
H L L X B
[4]
Operating Range
Range
Ambient
Temperature V
CC
Industrial 40°C to +85°C 2.7V to 3.6V
CY74FCT163500
3
Electrical Characteristics Over the Operating Range V
CC
=2.7V to 3.6V
Parameter Description Test Conditions Min. Typ.
[7]
Max. Unit
V
IH
Input HIGH Voltage All Inputs 2.0 5.5 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[8]
100 mV
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=18 mA 0.7 1.2 V
I
IH
Input HIGH Current VCC=Max., VI=5.5V ±1 µA
I
IL
Input LOW Current VCC=Max., VI=GND. ±1 µA
I
OZH
High Impedance Output Current (Three-State Output pins)
VCC=Max., V
OUT
=5.5V ±1 µA
I
OZL
High Impedance Output Current (Three-State Output pins)
VCC=Max., V
OUT
=GND ±1 µA
I
ODL
Output LOW Current
[9]
VCC=3.3V, VIN=V
IH
or VIL, V
OUT
=1.5V
45 180 mA
I
ODH
Output HIGH Current
[9]
VCC=3.3V, VIN=V
IH
or VIL, V
OUT
=1.5V
–45 –180 mA
V
OH
Output HIGH Voltage VCC=Min., IOH= –0.1 mA VCC–0.2 V
VCC=3.0V, IOH= –8 mA 2.4 3.0 V VCC=3.0V, IOH= –24 mA 2.0 3.0 V
V
OL
Output LOW Voltage VCC=Min., IOL= 0.1mA 0.2 V
VCC=Min., IOL= 24 mA 0.3 0.5
I
OS
Short Circuit Current
[9]
VCC=Max., V
OUT
=GND –60 –135 –240 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
4.5V ±100 µA
Capacitance
[8]
(TA = +25˚C, f = 1.0 MHz)
Parameter Description Test Conditions Typ.
[7]
Max. Unit
C
IN
Input Capacitance VIN = 0V 4.5 6.0 pF
C
OUT
Output Capacitance V
OUT
= 0V 5.5 8.0 pF
Notes:
7. Typical values are at V
CC
=3.3V, TA = +25˚C ambient.
8. This parameter is specified but not tested.
9. Not morethan one output shouldbe shorted at a time.Duration of short should notexceed one second. The use of high-speed testapparatus and/or sample and holdtechniques are preferablein order tominimize internal chip heating and more accurately reflectoperational values. Otherwiseprolonged shorting of a high output mayraise the chip temperature well abovenormal and thereby cause invalid readings in other parametric tests. In any sequence of parameter tests, I
OS
tests should be performed last.
CY74FCT163500
4
Power Supply Characteristics
Parameter Description Test Conditions Typ.
[7]
Max. Unit
I
CC
Quiescent Power Supply Cur­rent
VCC=Max. VIN≤0.2V,
V
IN≥VCC
0.2V
0.1 10 µA
I
CC
Quiescent Power Supply Cur­rent (TTL inputs HIGH)
VCC=Max. VIN=VCC–0.6V
[10]
2.0 30 µA
I
CCD
Dynamic Power Supply Current
[11]
VCC=Max.,OneInput T oggling, 50%DutyCycle,OutputsOpen, OEAB=
OEBA=VCC or GND
VIN=VCC or V
IN
=GND
50 75 µA/MHz
I
C
Total Power Supply Current
[12]
VCC=Max., f0=10 MHz (
CLKAB), f1=5 MHz, 50% Duty Cycle, Outputs Open, One Bit T oggling, OEAB=
OEBA=V
CC
LEAB=GND
VIN=VCC or V
IN
=GND
0.5 0.8 mA
VIN=VCC–0.6V or V
IN
=GND
0.5 0.8 mA
VCC=Max., f0=10 MHz, f
1
=2.5 MHz, 50% Duty Cycle, Outputs Open, Eighteen Bits T oggling, OEAB=
OEBA=V
CC
LEAB=GND
VIN=VCC or V
IN
=GND
2.5 3.8
[13]
mA
VIN=VCC–0.6V or V
IN
=GND
2.6 4.1
[13]
mA
Notes:
10. Per TTL driven input; all other inputs at V
CC
or GND.
11. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
12. IC=I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
IC=ICC+ICCDHNT+I
CCD(f0NC
/2 + f1N1)
I
CC
= Quiescent Current with CMOS input levels
I
CC
= Power Supply Current for a TTL HIGH input (VIN=3.4V)
D
H
= Duty Cycle for TTL inputs HIGH
N
T
= Number of TTL inputs at D
H
I
CCD
= Dynamic Current caused by an input transition pair (HLH or LHL)
f
0
= Clock frequency for registered devices, otherwise zero
N
C
= Number of clock inputs changing at f
1
f1= Input signal frequency N
1
= Number of inputs changing at f
1
All currents are in milliamps and all frequencies are in megahertz.
13. Values for these conditions are examples of the I
CC
formula. These limits are specified but not tested.
CY74FCT163500
5
Switching Characteristics Over the Operating Range V
CC
= 3.0V to 3.6V
[,14, 15]
CY74FCT163500A CY74FCT163500C
Fig. No.
[16]
Parameter Description Min. Max. Min. Max. Unit
f
MAX
CLKAB or CLKBA frequency 150 150 MHz
t
PLH
t
PHL
Propagation Delay A to B or B to A
1.5 5.1 1.5 4.6 ns 1, 3
t
PLH
t
PHL
Propagation Delay LEBA to A, LEAB to B
1.5 5.6 1.5 5.3 ns 1, 5
t
PLH
t
PHL
Propagation Delay CLKBA to A, CLKAB to B
1.5 5.6 1.5 5.3 ns 1, 5
t
PZH
t
PZL
Output Enable Time OEBA to A, OEAB to B
1.5 6.0 1.5 5.4 ns 1, 7, 8
t
PHZ
t
PLZ
Output Disable Time OEBA to A, OEAB to B
1.5 5.6 1.5 5.2 ns 1, 7, 8
t
SU
Set-Up Time, HIGH or LOW A to
CLKAB, B to CLKBA
3.0 3.0 ns 9
t
H
Hold Time, HIGH or LOW A to
CLKAB, B to CLKBA
0 0 ns 9
t
SU
Set-Up Time, HIGH or LOW A to LEAB, B to LEBA
Clock HIGH 3.0 3.0 ns 4 Clock LOW 1.5 1.5 ns 4
t
H
Hold Time, HIGH or LOW A to LEAB, B to LEBA
1.5 1.5 ns 4
t
W
LEAB or LEBA Pulse Width HIGH 3.0 2.5 ns 5
t
W
CLKAB or CLKBA Pulse Width HIGH or LOW 3.0 3.0 ns 5
t
SK(O)
Output Skew
[17]
0.5 0.5 ns
Ordering Information CY74FCT163500
Speed
(ns) Ordering Code
Package
Name Package Type
Operating
Range
4.6 CY74FCT163500CPACT Z56 56-Lead (240-Mil) TSSOP Industrial CY74FCT163500CPVC/PVCT O56 56-Lead (300-Mil) SSOP
5.1 CY74FCT163500APVC/PVCT O56 56-Lead (300-Mil) SSOP Industrial
Notes:
14. Minimum limits are specified but not tested on Propagation Delays.
15. For V
CC
=2.7, propagation delay, output enable and output disable times should be degraded by 20%.
16. See “Parameter Measurement Information” in the General Information section.
17. Skew between any two outputs of the same package switching in the same direction. This parameter is ensured by design.
CY74FCT163500
6
Package Diagrams
56-Lead Shrunk Small Outline Package O56
56-Lead Thin Shrunk Small Outline Package Z56
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Copyright 2000, Texas Instruments Incorporated
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