CY74FCT16501T
CY74FCT162501T
CY74FCT162H501T
3
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[8]
Max. Unit
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Input Hysteresis
[9]
100 mV
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
I
IH
Input HIGH Current Standard VCC=Max., VI=V
CC
±1 µA
Bus Hold ±100
I
IL
Input LOW Current Standard VCC=Max., VI=GND ±1 µA
Bus Hold ±100 µA
I
BBH
I
BBL
Bus Hold Sustain Current on Bus Hold Input
[10]
VCC=Min., VI=2.0V −50 µA
VI=0.8V +50 µA
I
BHHO
I
BHLO
Bus Hold Overdrive Current on Bus Hold Input
[10]
VCC=Max., VI=1.5V TBD mA
I
OZH
High Impedance Output Current
(Three-State Output pins)
VCC=Max., V
OUT
=2.7V ±1 µA
I
OZL
High Impedance Output Current
(Three-State Output pins)
VCC=Max., V
OUT
=0.5V ±1 µA
I
OS
Short Circuit Current
[11]
VCC=Max., V
OUT
=GND −80 −140 −200 mA
I
O
Output Drive Current
[11]
VCC=Max., V
OUT
=2.5V −50 −180 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
≤4.5V
[12]
±1 µA
Output Drive Characteristics for CY74FCT16501T
Parameter Description Test Conditions Min. Typ.
[8]
Max. Unit
V
OH
Output HIGH Voltage VCC=Min., IOH=−3 mA 2.5 3.5 V
VCC=Min., IOH=−15 mA 2.4 3.5
VCC=Min., IOH=−32 mA 2.0 3.0
V
OL
Output LOW Voltage VCC=Min., IOL=64 mA 0.2 0.55 V
Output Drive Characteristics for CY74FCT162501T, CY74FCT162H501T
Parameter Description Test Conditions Min. Typ.
[8]
Max. Unit
I
ODL
Output LOW Current
[11]
VCC=5V, VIN=VIH or VIL, V
OUT
=1.5V 60 115 150 mA
I
ODH
Output HIGH Current
[11]
VCC=5V, VIN=VIH or VIL, V
OUT
=1.5V −60 −115 −150 mA
V
OH
Output HIGH Voltage VCC=Min., IOH=−24 mA 2.4 3.3 V
V
OL
Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V
Notes:
8. Typical values are at V
CC
= 5.0V, TA= +25˚C ambient.
9. This parameter is specified but not tested.
10. Pins with bus hold are described in Pin Description.
11. Not more than one output should be shorted at a time. Duration of short should not exceed one second.The use of high-speed test apparatus and/or sample
and hold techniques are preferablein order to minimize internal chip heating and more accuratelyreflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
12. Tested at +25˚C.