I2C Serial Interface Provides Individual
Enable Control for Each Output
D
Operates at 3.3 V
D
Distributed VCC and Ground Pins Reduce
Switching Noise
D
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015
D
Packaged in 28-Pin Shrink Small Outline
V
CC
1Y0
1Y1
GND
V
CC
1Y2
1Y3
GND
V
CC
3Y0
GND
V
CC
SDATA
A
DB PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
V
2Y3
2Y2
GND
V
2Y1
2Y0
GND
OE
V
3Y1
GND
GND
SCLOCK
(DB) Package
description
The CDC319 is a high-performance clock buffer that distributes one input (A) to 10 outputs (Y) with minimum
skew for clock distribution. The CDC319 operates from a 3.3-V power supply , and is characterized for operation
from 0°C to 70°C.
The device provides a standard mode (100K-bits/s) I2C serial interface for device control. The implementation
is as a slave/receiver. The device address is specified in the I2C device address table. Both of the I2C inputs
(SDATA and SCLOCK) provide integrated pullup resistors (typically 140 kΩ) and are 5-V tolerant.
CC
CC
CC
Three 8-bit I2C registers provide individual enable control for each of the outputs. All outputs default to enabled
at powerup. Each output can be placed in a disabled mode with a low-level output when a low-level control bit
is written to the control register. The registers are write only and must be accessed in sequential order (i.e.,
random access of the registers is not supported).
The CDC319 provides 3-state outputs for testing and debugging purposes. The outputs can be placed in a
high-impedance state via the output-enable (OE) input. When OE is high, all outputs are in the operational state.
When OE is low, the outputs are placed in a high-impedance state. OE provides an integrated pullup resistor.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Intel is a trademark of Intel Corporation
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1997, Texas Instruments Incorporated
1
CDC319
I/O
DESCRIPTION
1-LINE TO 10-LINE CLOCK DRIVER
WITH I
SCAS590 – DECEMBER 1997
logic diagram (positive logic)
2
C CONTROL INTERFACE
INPUTS
OEA1Y0–1Y32Y0–2Y33Y0–3Y1
LXHi-ZHi-ZHi-Z
HLLLL
HHH
†
The function table assumes that all outputs are enabled via the appropriate I2C
configuration register bit. If the output is disabled via the appropriate configuration bit,
then the output is driven to a low state, regardless of the state of the A input.
When the value of the bit is high, the output is enabled.
When the value of the bit is low, the output is forced to a
low state. The default value of all bits is high.
When the value of the bit is high, the output is enabled.
When the value of the bit is low, the output is forced to a
low state. The default value of all bits is high.
When the value of the bit is high, the output is enabled.
When the value of the bit is low, the output is forced to a
low state. The default value of all bits is high.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
DEFINITIONDEFAULT VALUE
†
3
CDC319
1-LINE TO 10-LINE CLOCK DRIVER
WITH I
SCAS590 – DECEMBER 1997
2
C CONTROL INTERFACE
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Input voltage range, V
Output voltage range, V
Voltage range applied to any output in the high-impedance or power-off state, VO –0.5 V to VCC +0.5 V. . .
Current into any output in the low state (except SDATA), I
Package thermal impedance, θ
Storage temperature range, T
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds260_C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with EIA/JEDEC Std JESD51, except for through-hole packages,
which use a trace length of zero.
Bus free time4.7µs
STAR T setup time4.7µs
STAR T hold time4µs
SCLOCK low pulse duration4.7µs
SCLOCK high pulse duration4µs
SDATA input rise time1000ns
SDATA input fall time300ns
SDATA setup time250ns
SDATA hold time0ns
STOP setup time4µs
Operating free-air temperature070°C
CC
SDATA, SCLOCK
(see Note 3)
A, OE–0.30.8V
SDATA, SCLOCK
(see Note 3)
SDATA, SCLOCK
(see Note 3)
2.25.5V
01.04V
140kΩ
†
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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