Low Output Skew for Clock-Distribution
and Clock-Generation Applications
D
Operates at 3.3-V V
D
Distributes One Clock Input to Twelve
Outputs
D
Two Select Inputs Configure Up to Nine
Outputs to Operate at One-Half or Double
the Input Frequency
D
No External RC Network Required
D
External Feedback (FBIN) Synchronizes the
Outputs to the Clock Input
CC
CDC2586
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
D
Application for Synchronous DRAM,
High-Speed Microprocessor
D
TTL-Compatible Inputs and Outputs
D
Outputs Have Internal 26-Ω Series
Resistors to Dampen Transmission-Line
Effects
D
State-of-the-Art
Significantly Reduces Power Dissipation
D
Distributed VCC and Ground Pins Reduce
Switching Noise
D
Packaged in 52-Pin Thin Quad Flat Package
EPIC-ΙΙB
BiCMOS Design
GND
1Y1
V
CC
GND
1Y2
V
CC
GND
1Y3
V
CC
GND
GND
2Y1
V
CC
GND
SEL1
51 50 49 48 475246
1
2
3
4
5
6
7
8
9
10
11
12
13
15 16
14
2Y2
GND
PAH PACKAGE
(TOP VIEW)
GND
SEL0
FBIN
A
18 19 20 21
17
CC
V
2Y3
GND
CC
AGND
AV
CC
V
GND
CC
CLKIN
NCVOE
A
44 43 4245
22 23 24 25 26
3Y1
GND
V
41 40
CC
GND
TEST
CLR
39
38
37
36
35
34
33
32
31
30
29
28
27
CC
V
3Y2
V
CC
4Y3
GND
V
CC
4Y2
GND
V
CC
4Y1
GND
GND
V
CC
3Y3
GND
NC – No internal connection
description
The CDC2586 is a high-performance, low-skew, low-jitter clock driver. It uses a phase-lock loop (PLL) to
precisely align, in both frequency and phase, the clock output signals to the clock input (CLKIN) signal. It is
specifically designed for use with popular microprocessors operating at speeds from 50 MHz to 100 MHz or
down to 25 MHz on outputs configured for half-frequency operation. Each output has an internal 26-Ω series
resistor that improves the signal integrity at the load. The CDC2586 operates at nominal 3.3-V V
The feedback input (FBIN) synchronizes the output clocks in frequency and phase to CLKIN. One of the twelve
output clocks must be fed back to FBIN for the PLL to maintain synchronization between CLKIN and the outputs.
The output used as feedback is synchronized to the same frequency as CLKIN.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC-ΙΙΒ is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 1998, Texas Instruments Incorporated
CC
.
1
CDC2586
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
description (continued)
The Y outputs can be configured to switch in phase and at the same frequency as CLKIN. Select inputs
(SEL1, SEL0) configure up to nine Y outputs, in banks of three, to operate at one-half or double the CLKIN
frequency depending on which output is fed back to FBIN (see Tables 1 and 2). All output signal duty cycles
are adjusted to 50% independent of the duty cycle at CLKIN.
Output-enable (OE
When OE
the PLL. TEST should be strapped to GND for normal operation.
Unlike many products containing PLLs, the CDC2586 does not require external RC networks. The loop filter
for the PLL is included on-chip, minimizing component count, board space, and cost.
Because it is based on PLL circuitry, the CDC2586 requires a stabilization time to achieve phase lock of the
feedback signal to the reference signal. This stabilization time is required following power up and application
of a fixed-frequency, fixed-phase signal at CLKIN, as well as following any changes to the PLL reference or
feedback signals. Such changes occur upon change of the select inputs, enabling of the PLL via TEST , and upon
enable of all outputs via OE
The CDC2586 is characterized for operation from 0°C to 70°C.
is low, the outputs are active. TEST is used for factory testing of the device and can be used to bypass
) provides output control. When OE is high, the outputs are in the high-impedance state.
.
detailed description of output configurations
The voltage-controlled oscillator (VCO) used in the CDC2586 PLL has a frequency range of 100 MHz to
200 MHz, twice the operating frequency range of the CDC2586 outputs. The output of the VCO is divided by
two and four to provide reference frequencies with a 50% duty cycle of one-half and one-fourth the VCO
frequency. The SEL0 and SEL1 inputs select which of the two signals are buffered to each bank of device
outputs.
One device output must be externally wired to FBIN to complete the PLL. The VCO operates such that the
frequency and phase of this output matches that of the CLKIN signal. In the case that a VCO/2 output is wired
to FBIN, the VCO must operate at twice the CLKIN frequency resulting in device outputs that operate at either
the same or one-half the CLKIN frequency. If a VCO/4 output is wired to FBIN, the device outputs operate at
twice or the same as the CLKIN frequency.
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
output configuration A
Output configuration A is valid when any output configured as a 1 frequency output in Table 1 is fed back to
FBIN. The input frequency range for CLKIN is 50 MHz to 100 MHz when using output configuration A. Outputs
configured as 1/2 outputs operate at half the CLKIN frequency, while outputs configured as 1 outputs
operate at the same frequency as CLKIN.
Output configuration B is valid when any output configured as a 1 frequency output in Table 2 is fed back to
FBIN. The input frequency range for CLKIN is 25 MHz to 50 MHz when using output configuration B. Outputs
configured as 1 outputs operate at the CLKIN frequency , while outputs configured as 2 outputs operate at
double the frequency of CLKIN.
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
functional block diagram
OE
CLR
FBIN
CLK
TEST
SEL0
SEL1
Phase-Lock Loop
Select
Logic
÷2
CLR
÷2
One of Four Identical
Outputs – 1Yn
1Y1–1Y3
One of Four Identical
Outputs – 2Yn
One of Four Identical
Outputs – 3Yn
One of Four Identical
Outputs – 4Yn
2Y1–2Y3
3Y1–3Y3
4Y1–4Y3
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
I/O
DESCRIPTION
Terminal Functions
TERMINAL
NAMENO.
Clock input. CLKIN is the clock signal to be distributed by the CDC2586 clock-driver circuit. CLKIN provides
the reference signal to the integrated PLL that generates the clock output signals. CLKIN must have a fixed
CLKIN45I
CLR40ICLR is used for testing purposes only.
FBIN48I
OE42I
SEL1, SEL051, 50I
TEST41I
1Y1–1Y3
2Y1–2Y3
3Y1–3Y3
4Y1–4Y332, 35, 38O
2, 5, 8
12, 15, 18
22, 25, 28
frequency and fixed phase for the PLL to obtain phase lock. Once the circuit is powered up and a valid CLKIN
signal is applied, a stabilization time is required for the PLL to phase lock the feedback signal to its reference
signal.
Feedback input. FBIN provides the feedback signal to the internal PLL. FBIN must be hardwired to one of
the twelve clock outputs to provide frequency and phase lock. The internal PLL adjusts the output clocks
to obtain zero phase delay between FBIN and CLKIN.
Output enable. OE is the output enable for all outputs. When OE is low, all outputs are enabled. When OE
is high, all outputs are in the high-impedance state. Since the feedback signal for the PLL is taken directly
from an output, placing the outputs in the high-impedance state interrupts the feedback loop; therefore,
when a high-to-low transition occurs at OE
the PLL obtains phase lock.
Output configuration select. SEL0 and SEL1 select the output configuration for each output bank (e.g., 1/2× ,
1×, or 2×) (see Tables 1 and 2).
TEST is used to bypass the PLL circuitry for factory testing of the device. When TEST is low, all outputs
operate using the PLL circuitry. When TEST is high, the outputs are placed in a test mode that bypasses
the PLL circuitry. TEST should be strapped to GND for normal operation.
Output ports. These outputs are configured by the select inputs (SEL1, SEL0) to transmit one-half or
one-fourth the frequency of the VCO. The relationship between the CLKIN frequency and the output
frequency is dependent on the select inputs and the frequency of the output being fed back to FBIN
O
(see T ables 1 and 2). The duty cycle of the Y output signals is nominally 50%, independent of the duty cycle
of CLKIN. Each output has an internal series resistor to dampen transmission-line effects and improve the
signal integrity at the load.
Output ports. 4Y1–4Y3 transmit one-half the frequency of the VCO regardless of the state of the select
inputs. The relationship between the CLKIN frequency and the output frequency is dependent on the
frequency of the output being fed back to FBIN (see T ables 1 and 2). The duty cycle of the Y output signals
is nominally 50%, independent of the duty cycle of CLKIN. Each output has an internal series resistor to
dampen transmission-line effects and improve the signal integrity at the load.
CDC2586
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
, enabling the output buffers, a stabilization time is required before
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
Input voltage range, V
Voltage range applied to any output in the high state or power-off state, V
Current into any output in the low state, I
Input clamp current, I
Output clamp current, I
Maximum power dissipation at T
Storage temperature range, T
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 75 mils.
For more information, refer to the
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
timing requirements over recommended ranges of supply voltage and operating free-air
temperature
MINMAXUNIT
clock
Input clock duty cycle40%60%
†
Time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its reference signal. In order for phase lock to be obtained,
a fixed-frequency, fixed-phase reference signal must be present at CLKIN. Until phase lock is obtained, the specifications for propagation delay
and skew parameters given in the switching characteristics table are not applicable.
y
on time
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature, C
PARAMETER
f
max
Duty cycleY45%55%
t
phase error
jitter
t
sk(o)
t
sk(pr)
t
r
t
‡
The propagation delay, t
and t
NOTE 4: The specifications for parameters in this table are applicable only after any appropriate stabilization time has elapsed.
f
specifications are valid only for equal loading of all outputs.
sk(pr)
= 15 pF (see Note 4 and Figures 1 through 3)
L
FROM
(INPUT)
‡
‡
‡
phase error
, is dependent on the feedback path from any output to FBIN. The t
CLKIN↑Y↑–500+500ps
CLKIN↑Y↑200ps
VCO operating at four times the CLKIN frequency2550
VCO operating at double the CLKIN frequency
After SEL1, SEL050
After OE↓50
After power up50
After CLKIN50
TO
(OUTPUT)
50100
MINMAXUNIT
100MHz
0.5ns
1.4ns
1.4ns
phase error
1ns
, t
z
µs
sk(o)
,
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
7
CDC2586
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
From Output
Under Test
CL = 15 pF
(see Note A)
LOAD CIRCUIT
500 Ω
Input
t
phase error
Output
1.5 V1.5 V
2 V
0.8 V
t
r
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
1.5 V
2 V
t
f
0.8 V
3 V
0 V
V
V
OH
OL
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 100 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf≤ 2.5 ns.
C. The outputs are measured one at a time with one transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
8
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Outputs
Operating
at 1/2 CLKIN
Frequency
CLKIN
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
t
phase error 1
t
phase error 2
t
phase error 3
CDC2586
WITH 3-STATE OUTPUTS
Outputs
Operating
at CLKIN
Frequency
NOTES: A. Output skew, t
– The difference between the fastest and slowest of t
– The difference between the fastest and slowest of t
B. Process skew, t
– The difference between the maximum and minimum t
operating conditions
– The difference between the maximum and minimum t
operating conditions
C. For configuration A, see Table 1
t
phase error 4
t
phase error 5
t
phase error 6
, is calculated as the greater of:
sk(o)
, is calculated as the greater of:
sk(pr)
phase error n
phase error n
phase error n
phase error n
Figure 2. Waveforms for Calculation of t
t
phase error 7
t
phase error 8
t
phase error 9
(n = 1, 2,...6)
(n = 7, 8, 9)
(n = 1, 2,...6) across multiple devices under identical
(n = 7, 8, 9) across multiple devices under identical
for Configuration A
sk(o)
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
9
CDC2586
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
PARAMETER MEASUREMENT INFORMATION
CLKIN
t
phase error 10
Outputs
Operating
at CLKIN
Frequency
t
phase error 11
t
phase error 12
Outputs
Operating
at 2 CLKIN
Frequency
NOTES: A. Output skew, t
– The difference between the fastest and slowest of t
B. Process skew, tsk(pr), is calculated as the greater of:
– The difference between the maximum and minimum t
operating conditions
C. For configuration B, see Table 2
t
phase error 13
t
phase error 14
t
phase error 15
, is calculated as the greater of:
sk(o)
phase error n
phase error n
Figure 3. Waveforms for Calculation of t
(n = 10, 11,...15)
(n = 10, 11,. . . 15) across multiple devices under identical
for Configuration B
sk(o)
10
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
CDC2586
3.3-V PHASE-LOCK LOOP CLOCK DRIVER
WITH 3-STATE OUTPUTS
SCAS337C – FEBRUARY 1993 – REVISED OCTOBER 1998
MECHANICAL DATA
PAH (S-PQFP-G52)PLASTIC QUAD FLATPACK
40
52
0,65
1,05
0,95
39
0,38
0,22
27
26
14
1
7,80 TYP
10,20
SQ
9,80
12,20
SQ
11,80
13
M
0,13
Seating Plane
0,05 MIN
0,13 NOM
Gage Plane
0,25
0°–7°
0,75
0,45
1,20 MAX
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
0,10
4040281/C 11/96
11
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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