• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
= 0.8V (Max), VIH = 2V (Min)
V
IL
- CMOS Input Compatibility, I
= 60MHz at VCC = 5V, CL = 15pF,
MAX
= 30%, NIH = 30% of V
IL
≤ 1µA at VOL, V
l
o
C to 125oC
CC
OH
CD74HCT73
Dual J-K Flip-Flop with Reset
Negative-Edge Trigger
Description
The Harris CD74HC73 and CD74HCT73 utilize silicon gate
CMOS technology to achieve operating speeds equivalent to
LSTTL parts. They exhibit the low power consumption of
standard CMOS integrated circuits, together with the ability
to drive 10 LSTTL loads.
These flip-flops have independent J, K, Reset and Clock
inputs and Q and
negative-going transition of the clock pulse. Reset is
accomplished asynchronously by a low level input. This
device is functionally identical to the HC/HCT107 but differs
in terminal assignment and in some parametric limits.
The 74HCT logic family is functionally as well as pin
compatible with the standard 74LS logic family.
Ordering Information
PART NUMBER
CD74HC73E-55 to 12514 Ld PDIPE14.3
CD74HCT73E-55 to 12514 Ld PDIPE14.3
CD74HC73M-55 to 12514 Ld SOICM14.15
NOTES:
6. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
7. Wafer and die for this part number is available which meets all
electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
Q outputs. They change state on the
TEMP. RANGE
(oC)PACKAGE
PKG.
NO.
Pinout
CD74HC73, CD74HCT73
(PDIP, SOIC)
TOP VIEW
1CP
1
1R
2
3
1K
V
4
CC
2CP
5
2R
6
2J
7
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
8. θJA is measured with the component mounted on an evaluation PC board in free air.
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 2. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tr = 6nstf = 6ns
t
PHL
90%
50%
10%
t
90%
50%
10%
PLH
INPUT
t
INVERTING
OUTPUT
THL
1.3V
I
fC
L
3V
GND
trCL= 6ns
CLOCK
0.3V
2.7V
1.3V
0.3V
t
t
fCL
WL
= 6ns
1.3V
t
WH
t
WL
+ tWH=
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table. For f
, input duty cycle = 50%.
MAX
FIGURE 3. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
PHL
2.7V
1.3V
0.3V
FIGURE 4. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
FIGURE 5. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
6
CD74HC73, CD74HCT73
Test Circuits and Waveforms
90%
t
PLH
IC
t
TLH
tfC
L
50%
C
50pF
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
trC
L
90%
10%
t
H(H)
50%
(Continued)
t
H(L)
t
SU(L)
t
THL
90%
50%
10%
t
PHL
L
V
CC
GND
V
CC
50%
GND
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
OUTPUT
t
REM
3V
SET, RESET
OR PRESET
trC
90%
t
PLH
IC
1.3V
t
TLH
tfC
L
1.3V
t
H(L)
1.3V
t
SU(L)
t
THL
90%
1.3V
10%
t
PHL
C
L
50pF
3V
GND
3V
GND
GND
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
1.3V
FIGURE 6. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
FIGURE 7. HCT SETUP TIMES, HOLD TIMES, REMOVALTIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
IMPORTANT NOTICE
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any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1998, Texas Instruments Incorporated
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