• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High NoiseImmunity: N
V
= 5V
CC
= 30%, NIH= 30%of VCCat
IL
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
≤ 1µA at VOL, V
l
o
C to 125oC
OH
CD74HCT688
High Speed CMOS Logic
8-Bit Magnitude Comparator
Description
The Harris CD74HC688 and CD74HCT688 are 8-bit
magnitude comparators designed for use in computer and
logic applications that require the comparison of two 8-bit
binary words. When the compared words are equal the
output (Y) is low and can be used as the enabling input for
the next device in a cascaded application.
Ordering Information
PKG.
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC688E-55 to 12520 Ld PDIPE20.3
CD74HCT688E-55 to 12520 Ld PDIPE20.3
CD74HC688M-55 to 12520 Ld SOICM20.3
CD74HCT688M-55 to 12520 Ld SOICM20.3
CD54HC688-55 to 125Wafer
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Die for this part number is available which meets all electrical
specifications. Please contact your local sales office or Harris
customer service for ordering information.
NO.
Pinout
CD74HC688, CD74HCT688
(PDIP, SOIC)
TOP VIEW
1
E
A0
2
B0
3
A1
4
B1
5
A2
6
B2
7
8
A3
9
B3
GND
10
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETERSYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
V
CC
(V)
o
C-40oC TO 85oC -55oCTO125oC
25
UNITSV
--21.5--1.5-1.5-V
4.53.15--3.15 -3.15-V
64.2--4.2-4.2-V
--2--0.5-0.5-0.5V
4.5--1.35-1.35-1.35V
6--1.8-1.8-1.8V
VIHor VIL-0.0221.9--1.9-1.9-V
-0.024.54.4--4.4 -4.4-V
-0.0265.9--5.9-5.9-V
- - ---- - - - V
-44.53.98--3.84-3.7-V
-5.265.48--5.34-5.2-V
VIHor VIL0.022--0.1-0.1-0.1V
0.024.5--0.1-0.1-0.1V
0.026--0.1-0.1-0.1V
- - ---- - - - V
44.5--0.26-0.33-0.4V
5.26--0.26-0.33-0.4V
VCC or
-6--±0.1-±1-±1µA
GND
VCC or
06--8-80-160µA
GND
4
CD74HC688, CD74HCT688
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETERSYMBOL
HCT TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
V
IH
V
IL
V
OH
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
V
OL
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
Additional Quiescent
Device Current Per
I
I
I
CC
∆I
CC
(Note)
Input Pin: 1 Unit Load
NOTE: For dual-supply systems theoretical worst case (V
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
--4.5 to
--4.5 to
VIHor VIL-0.024.54.4--4.4-4.4-V
-44.53.98--3.84-3.7-V
VIHor VIL0.024.5--0.1-0.1-0.1V
44.5--0.26-0.33-0.4V
VCCand
05.5--±0.1-±1-±1µA
GND
VCC or
05.5--8-80-160µA
GND
V
CC
-4.5 to
-2.1
o
C-40oC TO 85oC -55oCTO125oC
V
CC
25
(V)
2--2- 2 - V
5.5
--0.8-0.8-0.8V
5.5
-100360-450-490µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
UNITSV
HCT Input Loading Table
INPUTUNIT LOADS
Enable0.7
Data Inputs0.35
NOTE: Unit Load is ∆ICClimit specified in DC Electrical Table,e.g.,
360µA max at 25oC.
Switching Specifications Input t
PARAMETERSYMBOL
HC TYPES
Propagation Delay (Figure 1)t
An to Output4.5--34-42-51ns
Bn to Outputt
PLH,
t
PHL
PLH,
t
PHL
, tf = 6ns
r
o
C-40oC TO 85oC -55oC TO 125oC
TEST
CONDITIONS
V
CC
(V)
25
CL= 50pF2--170-210-255ns
C
=15pF5-14-----ns
L
= 50pF6--29-36-43ns
C
L
CL= 50pF2--170-210-255ns
4.5--34-42-51ns
C
=15pF5-14-----ns
L
C
= 50pF6--29-36-43ns
L
UNITSMINTYP MAXMINMAXMINMAX
5
CD74HC688, CD74HCT688
Switching Specifications Input t
PARAMETERSYMBOL
E to Outputt
Output Transition Time
(Figure 1)
Input CapacitanceC
Power Dissipation Capacitance
(Notes 4, 5)
HCT TYPES
Propagation Delay (Figure 1)t
An to OutputC
Bn to Outputt
E to Outputt
Output Transition Time
(Figure 1)
Input CapacitanceC
Power Dissipation Capacitance
(Notes 4, 5)
NOTES:
4. C
is used to determine the dynamic power consumption, per gate.
PD
5. PD = V
2
fi(CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
PLH,
t
PHL
t
TLH,tTHLCL
C
PD
PLH,
t
PHL
PLH,
t
PHL
PLH,
t
PHL
t
TLH,tTHLCL
C
PD
, tf = 6ns (Continued)
r
o
C-40oC TO 85oC -55oC TO 125oC
TEST
CONDITIONS
V
CC
(V)
25
CL= 50pF2--120-150-180ns
4.5--24-30-36ns
C
=15pF5-9-----ns
L
C
= 50pF6--20-26-30ns
L
= 50pF2--75-95-110ns
4.5--15-19-22ns
6--13-16-19ns
CL= 50pF---10-10-10pF
IN
CL=15pF5-22-----pF
CL= 50pF4.5--34-42-51ns
=15pF5-14-----ns
L
CL= 50pF4.5--34-42-51ns
C
=15pF5-14-----ns
L
CL= 50pF4.5--24-30-36ns
C
=15pF5-9-----ns
L
= 50pF4.5--15-19-22ns
CL= 50pF---10-10-10pF
IN
CL=15pF5-22-----pF
UNITSMINTYP MAXMINMAXMINMAX
Test Circuit and Waveform
tr = 6ns
ANY INPUT
A OR B
OUTPUT Y
FIGURE 1. PROPAGATION DELAY AMD TRANSITION TIMES
t
PLH
t
TLH
tf = 6ns
INPUT LEVEL
90%
V
S
10%
t
PHL
t
THL
GND
V
S
6
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
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Copyright 1999, Texas Instruments Incorporated
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