• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
≤ 1µA at VOL, V
l
CC
= 5V,
o
CD74HC563, CD74HCT563
High Speed CMOS Logic Octal Inverting
Transparent Latch, Three-State Outputs
Description
The Harris CD74HC533, CD74HCT533, CD74HC563, and
CD74HCT563 are high speed Octal Transparent Latches
manufactured with silicon gate CMOS technology. They possess the low power consumption of standard CMOS integrated circuits, as well as the ability to drive 15 LSTTL
devices.
The outputs are transparent to the inputs when the latch
C to 125oC
CC
OH
enable (
data is latched. The output enable (
state outputs. When the output enable (
outputs are in the high impedance state. The latch operation
is independent to the state of the output enable.
The CD74HC533 and CD74HCT533 are identical in function
to the CD74HC563 and CD74HCT563 but have different
pinouts. The CD74HC533 and CD74HCT533 are similar to
the CD74HC373 and CD74HCT373; the latter are noninverting types.
Ordering Information
NOTES:
LE) is high. When the latch enable (LE) goes lo w the
OE) controls the three-
OE) is high the
TEMP. RANGE
PART NUMBER
CD74HC533E-55 to 12520 Ld PDIPF20.3
CD74HCT533E-55 to 12520 Ld PDIPE20.3
CD74HC563E-55 to 12520 Ld PDIPE20.3
CD74HCT563E-55 to 12520 Ld PDIPE20.3
CD74HCT563M-55 to 12520 Ld SOICM20.3
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer and die for this part number are available which meets all
electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
(oC)PACKAGE
PKG.
NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
NOTE: H = High Voltage Level, L = Low VoltageLevel, X = Don’t Care, Z = High Impedance State, l = Low voltage level one set-up time prior
to the high to low latch enable transition, h = High voltage level one set-up time prior to the high to low latch enable transition.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETERSYMBOL
HC TYPES
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
VCC (V)
o
25
C-40oC TO 85oC-55oC TO 125oC
--21.5--1.5-1.5-V
4.53.15--3.15 -3.15-V
64.2--4.2-4.2-V
--2--0.5-0.5-0.5V
4.5--1.35-1.35-1.35V
6--1.8-1.8-1.8V
VIH or
V
-0.0221.9--1.9-1.9-V
IL
-0.024.54.4--4.4 -4.4-V
-0.0265.9--5.9-5.9-V
-64.53.98--3.84-3.7-V
-7.865.48--5.34-5.2-V
VIH or
V
0.022--0.1-0.1-0.1V
IL
0.024.5--0.1-0.1-0.1V
0.026--0.1-0.1-0.1V
64.5--0.26-0.33-0.4V
7.86--0.26-0.33-0.4V
VCC or
-6--±0.1-±1-±1µA
GND
VCC or
06--8-80-160µA
GND
UNITSV
3
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETERSYMBOL
Three-State Leakage
-V
Current
HCT TYPES
High Level Input
V
IH
Voltage
Low Level Input
Voltage
High Level Output
Voltage
V
IL
V
OH
CMOS Loads
High Level Output
Voltage
TTL Loads
Low Level Output
V
OL
Voltage
CMOS Loads
Low Level Output
Voltage
TTL Loads
Input Leakage
Current
Quiescent Device
Current
Three-State Leakage
I
I
I
CC
-V
Current
Additional Quiescent
Device Current Per
∆I
CC
Input Pin: 1 Unit Load
(Note 4)
NOTE:
4. For dual-supply systems theoretical worst case (V
(V)IO(mA)MINTYPMAXMINMAXMINMAX
I
or
IL
V
VO =
VCCor
IH
GND
--4.5 to
--4.5 to
VIH or
V
-0.024.54.4--4.4-4.4-V
IL
-64.53.98--3.84-3.7-V
VIH or
V
0.024.5--0.1-0.1-0.1V
IL
64.5--0.26-0.33-0.4V
VCC to
-5.5--±0.1-±1-±1µA
GND
VCC or
05.5--8-80-160µA
GND
or
IL
V
VO =
VCCor
IH
GND
V
CC
-4.5 to
-2.1
o
C-40oC TO 85oC-55oC TO 125oC
25
VCC (V)
6--±0.5-±5-±10µA
2-- 2 - 2 - V
5.5
--0.8-0.8-0.8V
5.5
5.5--±0.5-±5-±10µA
-100360-450-490µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
UNITSV
HCT Input Loading Table
INPUTUNIT LOADS
D0 - D70.15
LE0.30
OE0.55
NOTE: Unit Load is ∆ICClimit specified in DC Electrical Specifications table, e.g., 360µA max at 25oC.
4
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Prerequisite For Switching Specifications
TEST
PARAMETERSYMBOL
HC TYPES
LE Pulse Widtht
Set-up Time Data to
Hold Time, Data to
LEt
LE
(533)
Hold Time, Data to
LE
(563)
HCT TYPES
LE Pulse Widtht
Set-up Time Data to
Hold Time, Data to
Hold Time, Data to
LEt
LE (533)t
LE (563)t
SU
t
t
CONDITIONS
W
H
H
w
w
H
H
o
C-40oC TO 85oC -55oCTO125oC
V
CC
(V)
25
UNITSMIN TYP MAXMINMAXMINMAX
-280--100-120-ns
4.516--20-24-ns
614--17-20-ns
-250--65-75-ns
4.510--13-15-ns
69--11-13-ns
-235--45-55-ns
4.57--9-11-ns
66--8-7-ns
-24--4-4-ns
4.54--4-4-ns
64--4-4-ns
-4.516--20-24-ns
-4.510--13-15-ns
-4.58--10-12-ns
-4.55--5-5-ns
Switching Specifications Input t
PARAMETERSYMBOL
HC TYPES
Propagation Delay,
Data to Qn
(HC533)
Propagation Delay,
Data to Qn
(HC563)
Propagation Delay,
LE to Qn
(HC533)
Propagation Delay,
LE to Qn
(HC563)
, t
t
PLH
PHL
t
PLH,tPHL
t
PLH,tPHL
t
PLH,tPHL
, tf = 6ns
r
-55oC TO
125oC
TEST
o
25
C-40oC TO 85oC
CONDITIONSVCC (V)
CL= 50pF2-165205250ns
4.5-334150ns
6-283543ns
= 15pF513---ns
C
L
CL= 50pF2-150190225ns
4.5-303845ns
6-263338ns
= 15pF512---ns
C
L
CL= 50pF2-175220265ns
4.5-354453ns
6-303745ns
= 15pF514---ns
C
L
CL= 50pF2-165205250ns
4.5-334150ns
6-283543ns
= 15pF513---ns
C
L
UNITSTYPMAXMAXMAX
5
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Switching Specifications Input t
PARAMETERSYMBOL
Enable Times
(HC533)
Disable Times
(HC533)
Enable and Disable Times
(HC563)
Input CapacitanceC
Three-State Output
Capacitance
Power Dissipation
Capacitance
(Notes 5, 6)
HCT TYPES
Propagation Delay,
Data to Qn
(HC/HCT533)
Propagation Delay,
Data to Qn
(HC/HCT563)
Propagation Delay,
LE to Qn
(HC/HCT533)
Propagation Delay,
LE to Qn
(HC/HCT563)
Enable Times
(HC/HCT533)
Disable Times
(HC/HCT533)
Enable and Disable Times
(HC/HCT563)
Input CapacitanceC
Power Dissipation
Capacitance
(Notes 5, 6)
NOTES:
5. C
is used to determine the no-load dynamic power consumption, per latch.
PD
6. PD (total power per latch) = CPD V
Capacitance, VCC = Supply Voltage.
t
PZH,tPZL
t
PHZ,tPLZ
t
PZH,tPZL,
t
PHZ,tPLZ
I
C
O
C
PD
, t
t
PLH
PHL
t
, t
PLH
PHL
t
, t
PLH
PHL
t
, t
PZL
PZH
t
, t
PLZ
PZH
, t
t
TLH
THL
t
PZH,tPZL,
t
PHZ,tPLZ
I
C
PD
, tf = 6ns (Continued)
r
TEST
CONDITIONSVCC (V)
CL= 50pF2-150190225ns
= 15pF512---ns
C
L
CL= 50pF2-150190225ns
= 15pF512---ns
C
L
CL= 50pF2-150190225ns
C
= 15pF512---ns
L
---1010 10pF
---2020 20pF
-542---pF
CL= 50pF4.5-344351ns
= 15pF514---ns
C
L
CL= 50pF4.5-303845ns
C
= 15pF512---ns
L
CL= 50pF4.5-384857ns
= 15pF516---ns
C
L
CL= 50pF4.5-354453ns
= 15pF514---ns
C
L
CL= 50pF4.5-354453ns
= 15pF514---ns
C
L
CL= 50pF4.5-303845ns
= 15pF512---ns
C
L
CL= 50pF4.5-354453ns
= 15pF514---ns
C
L
---1010 10pF
-542---pF
2
fi + Σ CLV
CC
CC
2
o
C-40oC TO 85oC
25
-55oC TO
125oC
4.5-303845ns
6-263338ns
4.5-303845ns
6-263338ns
4.5-303845ns
6-263338ns
fo where fi = Input Frequency, fo = Output Frequency, CL = Output Load
UNITSTYPMAXMAXMAX
6
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Test Circuits and Waveforms
trC
L
CLOCK
10%
90%
50%
10%
tfC
t
L
WL
tWL+ tWH=
50%
t
WH
fC
50%
1.3V
I
fC
L
3V
GND
+ tWH=
t
t
WL
WH
I
L
V
CC
GND
t
rCL
CLOCK
= 6ns
0.3V
2.7V
1.3V
0.3V
= 6ns
t
fCL
1.3V
t
WL
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table.For f
, input duty cycle = 50%.
MAX
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tr = 6nstf = 6ns
V
t
CC
GND
TLH
INPUT
t
90%
50%
10%
THL
90%
t
PLH
50%
10%
INVERTING
OUTPUT
t
PHL
FIGURE 3. HC TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfC
L
V
CC
50%
GND
t
H(L)
V
CC
50%
t
SU(L)
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
90%
10%
t
H(H)
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table.For f
, input duty cycle = 50%.
MAX
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
= 6ns
tr = 6ns
INPUT
t
2.7V
1.3V
0.3V
THL
t
f
3V
GND
t
TLH
90%
t
PLH
1.3V
10%
INVERTING
OUTPUT
t
PHL
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
tfC
L
3V
1.3V
GND
t
H(L)
3V
1.3V
t
SU(L)
GND
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
50%
90%
t
PLH
IC
t
TLH
t
THL
90%
50%
10%
t
PHL
GND
C
L
50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
OUTPUT
t
REM
3V
SET, RESET
1.3V
90%
1.3V
t
t
PLH
TLH
90%
1.3V
10%
t
PHL
t
THL
OR PRESET
IC
C
L
50pF
FIGURE 6. HCTSETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
GND
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Test Circuits and Waveforms
6ns6ns
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
50%
t
t
OUTPUTS
ENABLED
PLZ
PHZ
90%
10%
90%
OUTPUTS
DISABLED
(Continued)
10%
t
PZL
t
PZH
FIGURE 7. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
50%
50%
OUTPUTS
ENABLED
IC WITH
THREE-
STATE
OUTPUT
V
CC
GND
OUTPUT
R
0.3
t
t
6ns
PZL
PZH
t
r
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
t
t
OUTPUTS
ENABLED
6nst
PLZ
PHZ
10%
90%
f
2.7
1.3
OUTPUTS
DISABLED
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
= 1kΩ
L
C
L
50pF
VCC FOR t
GND FOR t
PLZ
PHZ
AND t
AND t
PZL
PZH
3V
GND
1.3V
1.3V
OUTPUTS
ENABLED
NOTE: Open drain waveforms t
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
PLZ
and t
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩto
PZL
8
IMPORTANT NOTICE
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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Copyright 1999, Texas Instruments Incorporated
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