Texas Instruments CD74HCT563M, CD74HCT563E, CD74HCT533E, CD74HC533E, CD74HC563M Datasheet

...
CD74HC533, CD74HCT533,
[ /Title (CD74H C533, CD74H CT533, CD74H C563, CD74H CT563) /Subject (High Speed
Data sheet acquired from Harris Semiconductor SCHS187
January 1998
Features
• Common Latch-Enable Control
• Common Three-State Output Enable Control
• Buffered Inputs
• Three-State Outputs
• Typical Propagation Delay = 13ns at V C
= 15pF, TA = 25oC (Data to Output)
L
• Fanout (Over Temperature Range)
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
1µA at VOL, V
l
CC
= 5V,
o
CD74HC563, CD74HCT563
High Speed CMOS Logic Octal Inverting
Transparent Latch, Three-State Outputs
Description
The Harris CD74HC533, CD74HCT533, CD74HC563, and CD74HCT563 are high speed Octal Transparent Latches manufactured with silicon gate CMOS technology. They pos­sess the low power consumption of standard CMOS inte­grated circuits, as well as the ability to drive 15 LSTTL devices.
The outputs are transparent to the inputs when the latch
C to 125oC
CC
OH
enable ( data is latched. The output enable ( state outputs. When the output enable ( outputs are in the high impedance state. The latch operation is independent to the state of the output enable.
The CD74HC533 and CD74HCT533 are identical in function to the CD74HC563 and CD74HCT563 but have different pinouts. The CD74HC533 and CD74HCT533 are similar to the CD74HC373 and CD74HCT373; the latter are non­inverting types.
Ordering Information
NOTES:
LE) is high. When the latch enable (LE) goes lo w the
OE) controls the three-
OE) is high the
TEMP. RANGE
PART NUMBER
CD74HC533E -55 to 125 20 Ld PDIP F20.3 CD74HCT533E -55 to 125 20 Ld PDIP E20.3 CD74HC563E -55 to 125 20 Ld PDIP E20.3 CD74HCT563E -55 to 125 20 Ld PDIP E20.3 CD74HCT563M -55 to 125 20 Ld SOIC M20.3
1. When ordering, use the entire part number. Add the suffix 96 to obtain the variant in the tape and reel.
2. Wafer and die for this part number are available which meets all electrical specifications. Please contact your local sales office or Harris customer service for ordering information.
(oC) PACKAGE
PKG.
NO.
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright
© Harris Corporation 1998
1
File Number 1599.1
Pinouts
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
CD74HC533, CD74HCT533
(PDIP, SOIC)
TOP VIEW
1
OE
Q0
2
D0
3
D1
4
Q1
5
Q2
6
D2
7 8
D3
9
Q3
GND
10
Functional Block Diagram
LE
D
0
D G
D
O
CD74HC563, CD74HCT563
(PDIP, SOIC)
TOP VIEW
V
20
CC
Q7
19
D7
18
D6
17
Q6
16
Q5
15
D5
14
D4
13 12
Q4
11
LE 11
OE
D0 D1 D2 D3 D4 D5 D6 D7
GND
1 2 3 4 5 6 7 8 9
10
CD74HC/HCT533
1
D
2
O
D G
D
3
O
D G
D
4
O
D G
D
5
O
D G
D
6
O
D G
D G
V
20
CC
Q0
19
Q1
18
Q2
17
Q3
16
Q4
15
Q5
14
Q6
13 12
Q7 LE
D
7
O
O
D G
OE
O
0
O
1
O
2
O
3
O
4
O
5
O
6
O
7
TRUTH TABLE
OUTPUT ENABLE LATCH ENABLE DATA Q OUTPUT
LHHL LHLH LLlH LLhL
HXXZ
NOTE: H = High Voltage Level, L = Low VoltageLevel, X = Don’t Care, Z = High Impedance State, l = Low voltage level one set-up time prior to the high to low latch enable transition, h = High voltage level one set-up time prior to the high to low latch enable transition.
2
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Absolute Maximum Ratings Thermal Information
DC Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, I
IK
For VI < -0.5V or VI > VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, I
OK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Drain Current, per Output, I
O
For -0.5V < VO < VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA
DC Output Source or Sink Current per Output Pin, I
O
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, ICC . . . . . . . . . . . . . . . . . . . . . . . . .±50mA
Operating Conditions
Temperature Range, TA . . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, V
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to V
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
CC
Thermal Resistance (Typical, Note 3) θJA (oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETER SYMBOL
HC TYPES
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage CMOS Loads
High Level Output Voltage TTL Loads
Low Level Output Voltage CMOS Loads
Low Level Output Voltage TTL Loads
Input Leakage Current
Quiescent Device Current
V
IH
V
IL
V
OH
V
OL
I
I
I
CC
TEST
CONDITIONS
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
VCC (V)
o
25
C -40oC TO 85oC -55oC TO 125oC
- - 2 1.5 - - 1.5 - 1.5 - V
4.5 3.15 - - 3.15 - 3.15 - V 6 4.2 - - 4.2 - 4.2 - V
- - 2 - - 0.5 - 0.5 - 0.5 V
4.5 - - 1.35 - 1.35 - 1.35 V 6 - - 1.8 - 1.8 - 1.8 V
VIH or
V
-0.02 2 1.9 - - 1.9 - 1.9 - V
IL
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
-0.02 6 5.9 - - 5.9 - 5.9 - V
-6 4.5 3.98 - - 3.84 - 3.7 - V
-7.8 6 5.48 - - 5.34 - 5.2 - V
VIH or
V
0.02 2 - - 0.1 - 0.1 - 0.1 V
IL
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
0.02 6 - - 0.1 - 0.1 - 0.1 V 6 4.5 - - 0.26 - 0.33 - 0.4 V
7.8 6 - - 0.26 - 0.33 - 0.4 V
VCC or
-6--±0.1 - ±1-±1µA
GND
VCC or
0 6 - - 8 - 80 - 160 µA
GND
UNITSV
3
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETER SYMBOL
Three-State Leakage
-V
Current
HCT TYPES
High Level Input
V
IH
Voltage Low Level Input
Voltage High Level Output
Voltage
V
IL
V
OH
CMOS Loads High Level Output
Voltage TTL Loads
Low Level Output
V
OL
Voltage CMOS Loads
Low Level Output Voltage TTL Loads
Input Leakage Current
Quiescent Device Current
Three-State Leakage
I
I
I
CC
-V
Current
Additional Quiescent Device Current Per
I
CC
Input Pin: 1 Unit Load (Note 4)
NOTE:
4. For dual-supply systems theoretical worst case (V
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
or
IL
V
VO =
VCCor
IH
GND
- - 4.5 to
- - 4.5 to
VIH or
V
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
IL
-6 4.5 3.98 - - 3.84 - 3.7 - V
VIH or
V
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
IL
6 4.5 - - 0.26 - 0.33 - 0.4 V
VCC to
- 5.5 - - ±0.1 - ±1-±1µA
GND
VCC or
0 5.5 - - 8 - 80 - 160 µA
GND
or
IL
V
VO =
VCCor
IH
GND
V
CC
- 4.5 to
-2.1
o
C -40oC TO 85oC -55oC TO 125oC
25
VCC (V)
6--±0.5 - ±5-±10 µA
2-- 2 - 2 - V
5.5
- - 0.8 - 0.8 - 0.8 V
5.5
5.5 - - ±0.5 - ±5-±10 µA
- 100 360 - 450 - 490 µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
UNITSV
HCT Input Loading Table
INPUT UNIT LOADS
D0 - D7 0.15
LE 0.30
OE 0.55
NOTE: Unit Load is ICClimit specified in DC Electrical Specifica­tions table, e.g., 360µA max at 25oC.
4
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Prerequisite For Switching Specifications
TEST
PARAMETER SYMBOL
HC TYPES
LE Pulse Width t
Set-up Time Data to
Hold Time, Data to
LE t
LE
(533)
Hold Time, Data to
LE
(563)
HCT TYPES
LE Pulse Width t Set-up Time Data to Hold Time, Data to Hold Time, Data to
LE t LE (533) t LE (563) t
SU
t
t
CONDITIONS
W
H
H
w w H H
o
C -40oC TO 85oC -55oCTO125oC
V
CC
(V)
25
UNITSMIN TYP MAX MIN MAX MIN MAX
- 2 80 - - 100 - 120 - ns
4.5 16 - - 20 - 24 - ns 6 14 - - 17 - 20 - ns
- 2 50 - - 65 - 75 - ns
4.5 10 - - 13 - 15 - ns 6 9 - - 11 - 13 - ns
- 2 35 - - 45 - 55 - ns
4.5 7 - - 9 - 11 - ns 66--8-7-ns
-24--4-4-ns
4.5 4 - - 4 - 4 - ns 64--4-4-ns
- 4.5 16 - - 20 - 24 - ns
- 4.5 10 - - 13 - 15 - ns
- 4.5 8 - - 10 - 12 - ns
- 4.5 5 - - 5 - 5 - ns
Switching Specifications Input t
PARAMETER SYMBOL
HC TYPES
Propagation Delay, Data to Qn (HC533)
Propagation Delay, Data to Qn (HC563)
Propagation Delay, LE to Qn (HC533)
Propagation Delay, LE to Qn (HC563)
, t
t
PLH
PHL
t
PLH,tPHL
t
PLH,tPHL
t
PLH,tPHL
, tf = 6ns
r
-55oC TO 125oC
TEST
o
25
C -40oC TO 85oC
CONDITIONS VCC (V)
CL= 50pF 2 - 165 205 250 ns
4.5 - 33 41 50 ns 6 - 28 35 43 ns
= 15pF 5 13 - - - ns
C
L
CL= 50pF 2 - 150 190 225 ns
4.5 - 30 38 45 ns 6 - 26 33 38 ns
= 15pF 5 12 - - - ns
C
L
CL= 50pF 2 - 175 220 265 ns
4.5 - 35 44 53 ns 6 - 30 37 45 ns
= 15pF 5 14 - - - ns
C
L
CL= 50pF 2 - 165 205 250 ns
4.5 - 33 41 50 ns 6 - 28 35 43 ns
= 15pF 5 13 - - - ns
C
L
UNITSTYP MAX MAX MAX
5
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Switching Specifications Input t
PARAMETER SYMBOL
Enable Times (HC533)
Disable Times (HC533)
Enable and Disable Times (HC563)
Input Capacitance C Three-State Output
Capacitance Power Dissipation
Capacitance (Notes 5, 6)
HCT TYPES
Propagation Delay, Data to Qn (HC/HCT533)
Propagation Delay, Data to Qn (HC/HCT563)
Propagation Delay, LE to Qn (HC/HCT533)
Propagation Delay, LE to Qn (HC/HCT563)
Enable Times (HC/HCT533)
Disable Times (HC/HCT533)
Enable and Disable Times (HC/HCT563)
Input Capacitance C Power Dissipation
Capacitance (Notes 5, 6)
NOTES:
5. C
is used to determine the no-load dynamic power consumption, per latch.
PD
6. PD (total power per latch) = CPD V Capacitance, VCC = Supply Voltage.
t
PZH,tPZL
t
PHZ,tPLZ
t
PZH,tPZL,
t
PHZ,tPLZ
I
C
O
C
PD
, t
t
PLH
PHL
t
, t
PLH
PHL
t
, t
PLH
PHL
t
, t
PZL
PZH
t
, t
PLZ
PZH
, t
t
TLH
THL
t
PZH,tPZL,
t
PHZ,tPLZ
I
C
PD
, tf = 6ns (Continued)
r
TEST
CONDITIONS VCC (V)
CL= 50pF 2 - 150 190 225 ns
= 15pF 5 12 - - - ns
C
L
CL= 50pF 2 - 150 190 225 ns
= 15pF 5 12 - - - ns
C
L
CL= 50pF 2 - 150 190 225 ns
C
= 15pF 5 12 - - - ns
L
---1010 10pF
---2020 20pF
- 5 42 - - - pF
CL= 50pF 4.5 - 34 43 51 ns
= 15pF 5 14 - - - ns
C
L
CL= 50pF 4.5 - 30 38 45 ns C
= 15pF 5 12 - - - ns
L
CL= 50pF 4.5 - 38 48 57 ns
= 15pF 5 16 - - - ns
C
L
CL= 50pF 4.5 - 35 44 53 ns
= 15pF 5 14 - - - ns
C
L
CL= 50pF 4.5 - 35 44 53 ns
= 15pF 5 14 - - - ns
C
L
CL= 50pF 4.5 - 30 38 45 ns
= 15pF 5 12 - - - ns
C
L
CL= 50pF 4.5 - 35 44 53 ns
= 15pF 5 14 - - - ns
C
L
---1010 10pF
- 5 42 - - - pF
2
fi + Σ CLV
CC
CC
2
o
C -40oC TO 85oC
25
-55oC TO 125oC
4.5 - 30 38 45 ns 6 - 26 33 38 ns
4.5 - 30 38 45 ns 6 - 26 33 38 ns
4.5 - 30 38 45 ns 6 - 26 33 38 ns
fo where fi = Input Frequency, fo = Output Frequency, CL = Output Load
UNITSTYP MAX MAX MAX
6
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Test Circuits and Waveforms
trC
L
CLOCK
10%
90%
50%
10%
tfC
t
L
WL
tWL+ tWH=
50%
t
WH
fC
50%
1.3V
I
fC
L
3V
GND
+ tWH=
t
t
WL
WH
I
L
V
CC
GND
t
rCL
CLOCK
= 6ns
0.3V
2.7V
1.3V
0.3V
= 6ns
t
fCL
1.3V
t
WL
NOTE: Outputs should be switching from 10% VCC to 90% VCC in accordance with device truth table.For f
, input duty cycle = 50%.
MAX
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tr = 6ns tf = 6ns
V
t
CC
GND
TLH
INPUT
t
90% 50% 10%
THL
90%
t
PLH
50%
10%
INVERTING
OUTPUT
t
PHL
FIGURE 3. HC TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfC
L
V
CC
50%
GND
t
H(L)
V
CC
50%
t
SU(L)
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
90%
10%
t
H(H)
NOTE: Outputs should be switching from 10% VCC to 90% VCC in accordance with device truth table.For f
, input duty cycle = 50%.
MAX
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
= 6ns
tr = 6ns
INPUT
t
2.7V
1.3V
0.3V
THL
t
f
3V
GND
t
TLH
90%
t
PLH
1.3V
10%
INVERTING
OUTPUT
t
PHL
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
tfC
L
3V
1.3V GND
t
H(L)
3V
1.3V
t
SU(L)
GND
OUTPUT
t
REM
V
CC
SET, RESET OR PRESET
50%
90%
t
PLH
IC
t
TLH
t
THL
90%
50%
10% t
PHL
GND
C
L
50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS
OUTPUT
t
REM
3V
SET, RESET
1.3V
90%
1.3V t
t
PLH
TLH
90%
1.3V 10%
t
PHL
t
THL
OR PRESET
IC
C
L
50pF
FIGURE 6. HCTSETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
GND
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563
Test Circuits and Waveforms
6ns 6ns
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
50%
t
t
OUTPUTS ENABLED
PLZ
PHZ
90%
10%
90%
OUTPUTS
DISABLED
(Continued)
10%
t
PZL
t
PZH
FIGURE 7. HC THREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
50%
50%
OUTPUTS ENABLED
IC WITH
THREE-
STATE
OUTPUT
V
CC
GND
OUTPUT R
0.3
t
t
6ns
PZL
PZH
t
r
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
t
t
OUTPUTS ENABLED
6ns t
PLZ
PHZ
10%
90%
f
2.7
1.3
OUTPUTS
DISABLED
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
= 1k
L
C
L
50pF
VCC FOR t GND FOR t
PLZ
PHZ
AND t
AND t
PZL
PZH
3V
GND
1.3V
1.3V OUTPUTS
ENABLED
NOTE: Open drain waveforms t VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
PLZ
and t
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩto
PZL
8
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