Texas Instruments CD74HCT30M96, CD74HCT30M, CD74HCT30E, CD74HC30E, CD74HC30PWR Datasheet

...
Data sheet acquired from Harris Semiconductor
/
SCHS121
August 1997
CD54HC30, CD74HC30,
CD74HCT30
High Speed CMOS Logic
8-Input NAND Gate
[ /Title (CD54H C30, CD74H C30, CD74H CT30)
Subject (High Speed CMOS Logic 8-
Features
• Buffered Inputs
• Typical Propagation Delay: 10ns at V C
= 15pF, TA = 25oC
L
• Fanout (Over Temperature Range)
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads
• Wide Operating Temperature Range . . . -55
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
1µA at VOL, V
l
CC
= 5V,
o
C to 125oC
OH
Description
The Harris CD74HC30, CD74HCT30, each contain an 8-input NAND gate in one package. They provide the system designer with the direct implementation of the positive logic 8-input NAND function. Logic gates utilize silicon gate CMOS technology to achieve operating speeds similar to LSTTL gates with the low power consumption of standard CMOS integrated circuits. All devices have the ability to drive 10 LSTTL loads. The 74HCT logic family is functionally pin compatible with the standard 74LS logic family.
Ordering Information
TEMP.RANGE
CC
PART NUMBER
CD74HC30E -55 to 125 14 Ld PDIP E14.3 CD74HCT30E -55 to 125 14 Ld PDIP E14.3 CD74HC30M -55 to 125 14 Ld SOIC M14.15 CD74HCT30M -55 to 125 14 Ld SOIC M14.15 CD54HCT30H -55 to 125 Die
NOTES:
1. When ordering,use the entire partnumber. Add the suffix 96 to obtain the variant in the tape and reel.
2. Die for this part number is available which meets all electrical specifications. Please contact your local sales office or Harris customer service for ordering information.
(oC) PACKAGE
PKG.
NO.
Pinout
CD54HC30, CD74HC30, CD74HCT30
(PDIP, CERDIP, SOIC)
TOP VIEW
A
1 2
B C
3
D
4
E
5
F
6
GND
7
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures. Copyright
© Harris Corporation 1997
1
V
14
CC
NC
13
H
12
G
11
NC
10
NC
9
Y
8
File Number 1652.1
Functional Diagram
LXXXXXXX H XLXXXXXX H XXLXXXXX H XXXLXXXX H
CD54HC30, CD74HC30, CD74HCT30
1
A
2
B
3
C
4
D
5
E
6
F
11
G
12
H
TRUTH TABLE
INPUTS
8
Y =
ABCDEFGH
Y
OUTPUTABCDEFGH
Logic Symbol
XXXXLXXX H XXXXXLXX H XXXXXXLX H XXXXXXXL H HHHHHHHH L
NOTE: H = HIGH Voltage Level, L = LOW Voltage Level, X = Irrelevant
1
A
2
B
3
C
4
D
5
E
6
F
11
G
8
Y
12
H
2
CD54HC30, CD74HC30, CD74HCT30
Absolute Maximum Ratings Thermal Information
DC Supply Voltage, VCC. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V
DC Input Diode Current, I
IK
For VI < -0.5V or VI > VCC + 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Diode Current, I
OK
For VO < -0.5V or VO > VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±20mA
DC Output Source or Sink Current per Output Pin, I
O
For VO > -0.5V or VO < VCC + 0.5V . . . . . . . . . . . . . . . . . . . .±25mA
DC VCC or Ground Current, I
CC orIGND
. . . . . . . . . . . . . . . . . .±50mA
Operating Conditions
Temperature Range (TA) . . . . . . . . . . . . . . . . . . . . . -55oC to 125oC
Supply Voltage Range, V
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V
DC Input or Output Voltage, VI, VO . . . . . . . . . . . . . . . . . 0V to V
Input Rise and Fall Time
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
CC
Thermal Resistance (Typical, Note 3) θJA (oC/W) θJC (oC/W)
PDIP Package. . . . . . . . . . . . . . . . . . . 100 N/A
CERDIP Package . . . . . . . . . . . . . . . . 130 55
SOIC Package. . . . . . . . . . . . . . . . . . . 180 N/A
Maximum Junction Temperature (Hermetic Pac kage or Die) . . .175oC
Maximum Junction Temperature (Plastic Package) . . . . . . . . 150oC
Maximum Storage Temperature Range . . . . . . . . . .-65oC to 150oC
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . .300oC
(SOIC - Lead Tips Only)
CC
DC Electrical Specifications
PARAMETER SYMBOL
HC TYPES
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage CMOS Loads
High Level Output Voltage TTL Loads
Low Level Output Voltage CMOS Loads
Low Level Output Voltage TTL Loads
Input Leakage Current
V
IH
V
IL
V
OH
V
OL
I
I
TEST
CONDITIONS
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
VCC (V)
o
25
C -40oC TO +85oC -55oC TO 125oC
- - 2 1.5 - - 1.5 - 1.5 - V
4.5 3.15 - - 3.15 - 3.15 - V 6 4.2 - - 4.2 - 4.2 - V
- - 2 - - 0.5 - 0.5 - 0.5 V
4.5 - - 1.35 - 1.35 - 1.35 V 6 - - 1.8 - 1.8 - 1.8 V
VIH or
V
-0.02 2 1.9 - - 1.9 - 1.9 - V
IL
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
-0.02 6 5.9 - - 5.9 - 5.9 - V
---------V
-4 4.5 3.98 - - 3.84 - 3.7 - V
-5.2 6 5.48 - - 5.34 - 5.2 - V
VIH or
V
0.02 2 - - 0.1 - 0.1 - 0.1 V
IL
0.02 4.5 - - 0.1 - 0.1 - 0.1 V
0.02 6 - - 0.1 - 0.1 - 0.1 V
---------V
4 4.5 - - 0.26 - 0.33 - 0.4 V
5.2 6 - - 0.26 - 0.33 - 0.4 V
VCC or
-6--±0.1 - ±1-±1µA
GND
UNITSV
3
CD54HC30, CD74HC30, CD74HCT30
DC Electrical Specifications (Continued)
TEST
CONDITIONS
PARAMETER SYMBOL
Quiescent Device Current
I
CC
(V) IO(mA) MIN TYP MAX MIN MAX MIN MAX
I
VCC or
0 6 - - 2 - 20 - 40 µA
GND
HCT TYPES
High Level Input
V
IH
- - 4.5 to
Voltage Low Level Input
V
IL
- - 4.5 to
Voltage High Level Output
Voltage
V
OH
VIH or
V
-0.02 4.5 4.4 - - 4.4 - 4.4 - V
IL
CMOS Loads High Level Output
-4 4.5 3.98 - - 3.84 - 3.7 - V Voltage TTL Loads
Low Level Output Voltage
V
OL
VIH or
V
IL
-0.02 4.5 - - 0.1 - 0.1 - 0.1 V
CMOS Loads Low Level Output
4 4.5 - - 0.26 - 0.33 - 0.4 V Voltage TTL Loads
Input Leakage Current
I
I
V
CC
- 5.5 - ±0.1 - ±1-±1µA
and
GND
Quiescent Device Current
Additional Quiescent Device Current Per
I
CC
VCC or
GND
I
CC
V
CC
-2.1
0 5.5 - - 2 - 20 - 40 µA
- 4.5 to
Input Pin: 1 Unit Load (Note 4)
NOTE:
4. For dual-supply systems theorectical worst case (V
HCT Input Loading Table
INPUT UNIT LOADS
All 0.6
NOTE: Unit Load is ICClimit specified in DC Electrical Specifications table, e.g. 360µA max at 25oC.
o
25
C -40oC TO +85oC -55oC TO 125oC
V
(V)
CC
2-- 2 - 2 - V
5.5
- - 0.8 - 0.8 - 0.8 V
5.5
- 100 360 - 450 - 490 µA
5.5
= 2.4V, VCC = 5.5V) specification is 1.8mA.
I
UNITSV
Switching Specifications Input t
PARAMETER SYMBOL
HC TYPES
Propagation Delay,Input to Output (Figure 1)
PropagationDelay,DataInputto Output Y
t
PLH
t
PLH
, tf = 6ns
r
, t
PHLCL
, t
PHLCL
o
25
TEST
CONDITIONS
V
CC
(V)
C -40oC TO 85oC -55oCTO125oC
UNITSMIN TYP MAX MIN MAX MIN MAX
= 50pF 2 - - 130 - 165 - 195 ns
4.5 - - 26 - 33 - 39 ns 6 - - 22 - 28 - 33 ns
= 15pF 5 - 10 - ----ns
4
CD54HC30, CD74HC30, CD74HCT30
Switching Specifications Input t
PARAMETER SYMBOL
Transition Times (Figure 1) t
Input Capacitance C Power Dissipation Capacitance
(Notes 5, 6)
HCT TYPES
Propagation Delay, Input to Output (Figure 2)
PropagationDelay,DataInputto Output Y
Transition Times (Figure 2) t Input Capacitance C Power Dissipation Capacitance
(Notes 5, 6)
NOTES:
5. C
is used to determine the dynamic power consumption, per gate.
PD
6. PD = V
2
fi (CPD + CL) where fi = Input Frequency, CL = Output Load Capacitance, VCC = Supply Voltage.
CC
TLH
t
RHL
t
PLH
TLH
, tf = 6ns (Continued)
r
TEST
CONDITIONS
, t
I
C
PD
, t
, t
, t
I
C
PD
THLCL
PHLCL
PHLCL
THLCL
= 50pF 2 - - 75 - 95 - 110 ns
- - - - 10 - 10 - 10 pF
- 5-25-----pF
= 50pF 4.5 - - 28 - 35 - 42 ns
= 15pF 5 - 11 - ----ns
= 50pF 4.5 - - 15 - 19 - 22 ns
- - - - 10 - 10 - 10 pF
- 5-26-----pF
o
25
V
CC
(V)
C -40oC TO 85oC -55oCTO125oC
UNITSMIN TYP MAX MIN MAX MIN MAX
4.5 - - 15 - 19 - 22 ns 6 - - 13 - 16 - 19 ns
Test Circuits and Waveforms
tr = 6ns tf = 6ns
V
t
CC
GND
TLH
t
PHL
90% 50% 10%
t
90%
50%
10%
PLH
INPUT
t
INVERTING
OUTPUT
THL
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-
TION DELAY TIMES, COMBINATION LOGIC
= 6ns
t
PLH
t
f
1.3V
10%
90%
t
3V
GND
TLH
tr = 6ns
INPUT
t
INVERTING
OUTPUT
THL
t
2.7V
1.3V
0.3V
PHL
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
5
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.
CERT AIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
Loading...