• Significant Power Reduction Compared to LSTTL
Logic ICs
• HC Types
- 2V to 6V Operation
- High Noise Immunity: N
at VCC = 5V
• HCT Types
- 4.5V to 5.5V Operation
- Direct LSTTL Input Logic Compatibility,
V
= 0.8V (Max), VIH = 2V (Min)
IL
- CMOS Input Compatibility, I
= 30%, NIH = 30% of V
IL
≤ 1µA at VOL, V
l
CC
= 5V,
o
C to 125oC
OH
Description
The Harris CD74HC259 and CD74HCT259 Addressable
Latch features the low-power consumption associated with
CMOS circuitry and has speeds comparable to low-power
Schottky.
This latches three active modes and one reset mode. When
both the Latch Enable (
low (8-line Demultiplexer mode) the output of the addressed
latch follows the Data input and all other outputs are forced
low . When both
outputs are isolated from the Data input, i.e., all latches hold
the last data presented before the
high. A condition of
mode) allows the addressed latch’s output to follow the data
input; all other latches are unaffected. The Reset mode (all
outputs low) results when
LE) and Master Reset (MR) inputs are
MR and LE are high (Memory Mode), all
LE transition from low to
LE low and MR high (Addressable Latch
LE is high and MR is low.
Ordering Information
CC
PART NUMBER TEMP. RANGE (oC) PACKAGE
CD74HC259E-55 to 12516 Ld PDIPE16.3
CD74HCT259E-55 to 12516 Ld PDIPE16.3
CD74HC259M-55 to 12516 Ld SOICM16.15
CD74HCT259M-55 to 12516 Ld SOICM16.15
PKG.
NO.
Pinout
NOTES:
1. When ordering, use the entire part number. Add the suffix 96 to
obtain the variant in the tape and reel.
2. Wafer or dieforthis part numberis available whichmeetsall electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
CD74HC259, CD74HCT259
(PDIP, SOIC)
TOP VIEW
A0
A1
A2
Q0
Q1
Q2
Q3
GND
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
V
MR
LE
D
Q7
Q6
Q5
Q4
CC
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.
Copyright
NOTE:
H = High Voltage Level
L = Low Voltage Level
D = The level at the data input
Qio= The levelof Qi(i = 0, 1...7, as appropriate) before theindicated
steady-state input conditions were established.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table.For f
, input duty cycle = 50%.
MAX
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
tr = 6nstf = 6ns
V
t
TLH
CC
GND
INPUT
t
90%
50%
10%
THL
90%
t
50%
10%
PLH
INVERTING
OUTPUT
t
PHL
FIGURE 3. HCTRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
tfC
L
V
CC
50%
GND
t
H(L)
V
CC
50%
t
SU(L)
GND
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
90%
10%
t
H(H)
NOTE: Outputs should be switching from 10% VCC to 90% VCC in
accordance with device truth table.For f
, input duty cycle = 50%.
MAX
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND
PULSE WIDTH
= 6ns
tr = 6ns
INPUT
t
2.7V
1.3V
0.3V
THL
t
f
3V
GND
t
TLH
90%
t
PLH
1.3V
10%
INVERTING
OUTPUT
t
PHL
FIGURE 4. HCTTRANSITION TIMES AND PROPAGATION
DELAY TIMES, COMBINATION LOGIC
CLOCK
INPUT
DAT A
INPUT
t
SU(H)
trC
L
2.7V
0.3V
t
H(H)
1.3V
1.3V
tfC
L
3V
1.3V
GND
t
H(L)
3V
1.3V
t
SU(L)
GND
OUTPUT
t
REM
V
CC
SET, RESET
OR PRESET
50%
90%
t
PLH
IC
t
TLH
t
THL
90%
50%
10%
t
PHL
GND
C
L
50pF
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
OUTPUT
t
REM
3V
SET, RESET
1.3V
90%
1.3V
t
t
PLH
TLH
90%
1.3V
10%
t
PHL
t
THL
OR PRESET
IC
C
L
50pF
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,
AND PROPAGATION DELAY TIMES FOR EDGE
TRIGGERED SEQUENTIAL LOGIC CIRCUITS
7
GND
CD74HC259, CD74HCT259
Test Circuits and Waveforms
6ns6ns
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
50%
t
t
OUTPUTS
ENABLED
PLZ
PHZ
90%
10%
90%
OUTPUTS
DISABLED
(Continued)
10%
t
PZL
t
PZH
FIGURE 7. HCTHREE-STATE PROPAGATION DELAY
WAVEFORM
OTHER
INPUTS
TIED HIGH
OR LOW
OUTPUT
DISABLE
50%
50%
OUTPUTS
ENABLED
IC WITH
THREE-
STATE
OUTPUT
V
CC
GND
OUTPUT
R
t
r
OUTPUT
DISABLE
OUTPUT LOW
TO OFF
OUTPUT HIGH
TO OFF
t
t
OUTPUTS
ENABLED
6nst
PLZ
PHZ
10%
90%
f
2.7
1.3
OUTPUTS
DISABLED
0.3
t
t
6ns
PZL
PZH
FIGURE 8. HCTTHREE-STATE PROPAGATION DELAY
WAVEFORM
= 1kΩ
L
C
L
50pF
VCC FOR t
GND FOR t
PLZ
PHZ
AND t
AND t
PZL
PZH
3V
GND
1.3V
1.3V
OUTPUTS
ENABLED
NOTE: Opendrain waveforms t
VCC, CL = 50pF.
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
PLZ
and t
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩ to
PZL
8
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
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Copyright 1998, Texas Instruments Incorporated
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