The Harris CD54HC245, CD54HCT245, and CD74HC245,
CD74HCT245 are high-speed octal three-state bidirectional
transceiversintendedfortwo-wayasynchronous
communication between data buses. They have high drive
current outputs which enable high-speed operation while
driving large bus capacitances. They provide the low power
consumption of standard CMOS circuits with speeds and
drive capabilities comparable to that of LSTTL circuits.
TheCD54HC245,CD54HCT245,CD74HC245and
CD74HCT245 allow data transmission of the B bus or from
the B bus to the A bus. The logic level at the direction input
(DIR) determines the direction. The output enable input
(
OE), when high, puts the I/O ports in the high-impedance
state.
The HC/HCT245 is similar in operation to the HC/HCT640
Functional Diagram
A0
A1
A2
A3
A4
A5
A6
A7
2
3
4
5
6
7
8
9
and the HC/HCT643.
Ordering Information
TEMP.
PART NUMBER
RANGE (oC)PACKAGE
CD54HC245F-55 to 12520 Ld CERDIPF20.3
CD54HCT245F-55 to 12520 Ld CERDIPF20.3
CD74HC245E-55 to 12520 Ld PDIPE20.3
CD74HCT245E-55 to 12520 Ld PDIPE20.3
CD74HC245M-55 to 12520 Ld SOICM20.3
CD74HCT245M-55 to 12520 Ld SOICM20.3
NOTES:
1. When ordering,use theentire part number. Addthe suffix96 to
obtain the variant in the tape and reel.
2. Waferor die forthis part numberisavailable which meetsall electrical specifications. Please contact your local sales office or
Harris customer service for ordering information.
18
B0
17
B1
16
B2
15
B3
14
B4
13
B5
12
B6
11
B7
PKG.
NO.
DIR
OE
TRUTH TABLE
CONTROL INPUTS
OPERATIONOEDIR
LLB Data to A Bus
LHA Data to B Bus
HXIsolation
H = High Level, L = Low Level, X = Irrelevant
To prevent excess currents in the High-Z (Isolation) modes all I/O
terminals should be terminated with 10kΩ to 1MΩ resistors.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
3. θJA is measured with the component mounted on an evaluation PC board in free air.
are the same as those for three-state shown on the left. The test circuit is Output RL=1kΩto
PZL
VCC, CL = 50pF.
FIGURE 5. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT
IC WITH
THREE-
STATE
OUTPUT
FIGURE 4. HCT THREE-STATE PROPAGATION DELAY
WAVEFORM
OUTPUT
R
= 1kΩ
L
C
L
50pF
VCC FOR t
GND FOR t
PLZ
PHZ
AND t
AND t
PZL
PZH
6
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TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
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BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
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intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 1999, Texas Instruments Incorporated
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